{"id":"https://openalex.org/W7117871533","doi":"https://doi.org/10.1109/access.2025.3650430","title":"WECI-YOLO: Multi-Module Enhanced Steel Surface Quality Defect Detection","display_name":"WECI-YOLO: Multi-Module Enhanced Steel Surface Quality Defect Detection","publication_year":2026,"publication_date":"2026-01-01","ids":{"openalex":"https://openalex.org/W7117871533","doi":"https://doi.org/10.1109/access.2025.3650430"},"language":null,"primary_location":{"id":"doi:10.1109/access.2025.3650430","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3650430","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2025.3650430","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5113007244","display_name":"Huixiang Zhou","orcid":null},"institutions":[{"id":"https://openalex.org/I13985625","display_name":"East China Jiaotong University","ror":"https://ror.org/05x2f1m38","country_code":"CN","type":"education","lineage":["https://openalex.org/I13985625"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huixiang Zhou","raw_affiliation_strings":["School of Information and Software Engineering, East China Jiaotong University, Nanchang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Information and Software Engineering, East China Jiaotong University, Nanchang, China","institution_ids":["https://openalex.org/I13985625"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Jian Wang","orcid":"https://orcid.org/0009-0006-3497-3048"},"institutions":[{"id":"https://openalex.org/I13985625","display_name":"East China Jiaotong University","ror":"https://ror.org/05x2f1m38","country_code":"CN","type":"education","lineage":["https://openalex.org/I13985625"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jian Wang","raw_affiliation_strings":["School of Information and Software Engineering, East China Jiaotong University, Nanchang, China"],"raw_orcid":"https://orcid.org/0009-0006-3497-3048","affiliations":[{"raw_affiliation_string":"School of Information and Software Engineering, East China Jiaotong University, Nanchang, China","institution_ids":["https://openalex.org/I13985625"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5121708782","display_name":"Tianxing Jiang","orcid":null},"institutions":[{"id":"https://openalex.org/I13985625","display_name":"East China Jiaotong University","ror":"https://ror.org/05x2f1m38","country_code":"CN","type":"education","lineage":["https://openalex.org/I13985625"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tianxing Jiang","raw_affiliation_strings":["School of Information and Software Engineering, East China Jiaotong University, Nanchang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Information and Software Engineering, East China Jiaotong University, Nanchang, China","institution_ids":["https://openalex.org/I13985625"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I13985625"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.02865668,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"14","issue":null,"first_page":"2955","last_page":"2972"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.5205000042915344,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.5205000042915344,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.4339999854564667,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.007499999832361937,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/upsampling","display_name":"Upsampling","score":0.7641000151634216},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.5300999879837036},{"id":"https://openalex.org/keywords/convolution","display_name":"Convolution (computer science)","score":0.5178999900817871},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.5170000195503235},{"id":"https://openalex.org/keywords/surface","display_name":"Surface (topology)","score":0.4408999979496002},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.4174000024795532},{"id":"https://openalex.org/keywords/function","display_name":"Function (biology)","score":0.41130000352859497},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.4065000116825104},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.391400009393692}],"concepts":[{"id":"https://openalex.org/C110384440","wikidata":"https://www.wikidata.org/wiki/Q1143270","display_name":"Upsampling","level":3,"score":0.7641000151634216},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6481000185012817},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.5300999879837036},{"id":"https://openalex.org/C45347329","wikidata":"https://www.wikidata.org/wiki/Q5166604","display_name":"Convolution (computer science)","level":3,"score":0.5178999900817871},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.5170000195503235},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.4408999979496002},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4228000044822693},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.4174000024795532},{"id":"https://openalex.org/C14036430","wikidata":"https://www.wikidata.org/wiki/Q3736076","display_name":"Function (biology)","level":2,"score":0.41130000352859497},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.4065000116825104},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.391400009393692},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.38989999890327454},{"id":"https://openalex.org/C88796919","wikidata":"https://www.wikidata.org/wiki/Q1142907","display_name":"Backbone network","level":2,"score":0.366100013256073},{"id":"https://openalex.org/C81669768","wikidata":"https://www.wikidata.org/wiki/Q2359161","display_name":"Precision and recall","level":2,"score":0.35600000619888306},{"id":"https://openalex.org/C2778755073","wikidata":"https://www.wikidata.org/wiki/Q10858537","display_name":"Scale (ratio)","level":2,"score":0.3382999897003174},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.33799999952316284},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.33559998869895935},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.32679998874664307},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.31360000371932983},{"id":"https://openalex.org/C90673727","wikidata":"https://www.wikidata.org/wiki/Q901718","display_name":"Product (mathematics)","level":2,"score":0.3111000061035156},{"id":"https://openalex.org/C3019099447","wikidata":"https://www.wikidata.org/wiki/Q19768","display_name":"Tool path","level":3,"score":0.3077000081539154},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.296099990606308},{"id":"https://openalex.org/C36464697","wikidata":"https://www.wikidata.org/wiki/Q451553","display_name":"Visualization","level":2,"score":0.28380000591278076},{"id":"https://openalex.org/C136085584","wikidata":"https://www.wikidata.org/wiki/Q910289","display_name":"Overlay","level":2,"score":0.2694000005722046},{"id":"https://openalex.org/C108882727","wikidata":"https://www.wikidata.org/wiki/Q2991685","display_name":"Solid modeling","level":2,"score":0.25850000977516174},{"id":"https://openalex.org/C129045301","wikidata":"https://www.wikidata.org/wiki/Q7144654","display_name":"Path length","level":2,"score":0.25589999556541443}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/access.2025.3650430","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3650430","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1109/access.2025.3650430","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3650430","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.514384388923645,"id":"https://metadata.un.org/sdg/9"}],"awards":[{"id":"https://openalex.org/G1253864787","display_name":null,"funder_award_id":"62162028","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":36,"referenced_works":["https://openalex.org/W2044465660","https://openalex.org/W2092072518","https://openalex.org/W2094232965","https://openalex.org/W2102605133","https://openalex.org/W2151103935","https://openalex.org/W2161969291","https://openalex.org/W2163352848","https://openalex.org/W2504335775","https://openalex.org/W2536297875","https://openalex.org/W2570343428","https://openalex.org/W2890747436","https://openalex.org/W2920946673","https://openalex.org/W2963037989","https://openalex.org/W2990763144","https://openalex.org/W3012374719","https://openalex.org/W3018757597","https://openalex.org/W3138516171","https://openalex.org/W3140854437","https://openalex.org/W3160447895","https://openalex.org/W3175888430","https://openalex.org/W3195969653","https://openalex.org/W4210598935","https://openalex.org/W4220827132","https://openalex.org/W4238223064","https://openalex.org/W4281790833","https://openalex.org/W4322733148","https://openalex.org/W4323055161","https://openalex.org/W4327521640","https://openalex.org/W4386076325","https://openalex.org/W4391093549","https://openalex.org/W4400409907","https://openalex.org/W4400625112","https://openalex.org/W4402667905","https://openalex.org/W4402716243","https://openalex.org/W4403887646","https://openalex.org/W4405446156"],"related_works":[],"abstract_inverted_index":{"Steel":[0],"surface":[1,185],"quality":[2],"is":[3,58,76],"crucial":[4],"for":[5],"industrial":[6],"product":[7],"performance,":[8],"yet":[9],"defect":[10,186],"detection":[11],"remains":[12],"challenging":[13],"due":[14],"to":[15,49,64,78,125],"type":[16],"diversity,":[17],"scale":[18],"variations,":[19],"and":[20,30,99,110,122,131,138,149,168],"complex":[21],"backgrounds.":[22],"Existing":[23],"deep":[24],"learning":[25],"methods":[26,182],"often":[27],"lack":[28],"accuracy":[29,160],"robustness.":[31],"This":[32],"paper":[33],"proposes":[34],"WECI-YOLO,":[35],"an":[36],"enhanced":[37],"algorithm":[38,176],"based":[39],"on":[40,96,143],"YOLO11n.":[41],"The":[42,145,174],"backbone":[43],"network":[44],"integrates":[45],"a":[46,72,166],"C3k2-WTConv":[47],"module":[48,57,75],"widen":[50],"the":[51,61,82,97,150,157],"receptive":[52],"field.":[53],"A":[54],"lightweight":[55],"EUCB":[56],"embedded":[59],"in":[60,156,171,183],"upsampling":[62],"path":[63],"improve":[65],"multi-level":[66],"feature":[67],"fusion.":[68],"For":[69],"elongated":[70],"defects,":[71],"C2PSA-CAA":[73],"attention":[74],"designed":[77],"optimize":[79],"extraction.":[80],"Additionally,":[81],"Inner-SIoU":[83],"loss":[84],"function":[85],"combines":[86],"SIoU\u2019s":[87],"angle":[88],"perception":[89],"with":[90,114,164],"Inner-IoU\u2019s":[91],"internal":[92],"scaling":[93],"strategy.":[94],"Experiments":[95],"GC10-DET":[98],"Aug-GC10-DET":[100],"datasets":[101],"demonstrate":[102],"that":[103],"WECI-YOLO":[104],"achieves":[105],"recall":[106,127],"rates":[107],"of":[108,120,147],"65.8%":[109],"66.5%,":[111],"respectively,":[112],"along":[113],"mean":[115],"average":[116],"precision":[117,134],"(mAP)":[118],"values":[119],"66.6%":[121],"67.9%.":[123],"Compared":[124],"YOLO11n,":[126],"improved":[128],"by":[129,136],"2.4%":[130],"2.5%,":[132],"while":[133],"increased":[135],"4.0%":[137],"3.6%,":[139],"achieving":[140],"optimal":[141],"performance":[142],"Aug-GC10-DET.":[144],"impacts":[146],"augmentation":[148],"proposed":[151,175],"modules":[152],"are":[153,162],"evaluated":[154],"separately":[155],"experiments.Notably,":[158],"these":[159],"gains":[161],"achieved":[163],"only":[165],"small":[167],"acceptable":[169],"increase":[170],"computational":[172],"cost.":[173],"demonstrates":[177],"clear":[178],"advantages":[179],"over":[180],"existing":[181],"steel":[184],"detection.":[187]},"counts_by_year":[],"updated_date":"2026-01-10T23:39:48.068659","created_date":"2026-01-01T00:00:00"}