{"id":"https://openalex.org/W7116716769","doi":"https://doi.org/10.1109/access.2025.3646616","title":"Direct-Writing Meets Spin Coating: Hybrid Process for High-Performance, Low-Voltage OTFTs on Flexible Substrates","display_name":"Direct-Writing Meets Spin Coating: Hybrid Process for High-Performance, Low-Voltage OTFTs on Flexible Substrates","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W7116716769","doi":"https://doi.org/10.1109/access.2025.3646616"},"language":"en","primary_location":{"id":"doi:10.1109/access.2025.3646616","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3646616","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2025.3646616","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5120975575","display_name":"Nur Syahadah Yusof","orcid":null},"institutions":[{"id":"https://openalex.org/I139322472","display_name":"Universiti Sains Malaysia","ror":"https://ror.org/02rgb2k63","country_code":"MY","type":"education","lineage":["https://openalex.org/I139322472"]},{"id":"https://openalex.org/I4528857","display_name":"University of Kuala Lumpur","ror":"https://ror.org/026wwrx19","country_code":"MY","type":"education","lineage":["https://openalex.org/I4528857"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"Nur Syahadah Yusof","raw_affiliation_strings":["Electrical, Electronic and Automation Section, Universiti Kuala Lumpur Malaysian Spanish Institute, Kulim, Kedah, Malaysia"],"raw_orcid":"https://orcid.org/0000-0002-3853-9058","affiliations":[{"raw_affiliation_string":"Electrical, Electronic and Automation Section, Universiti Kuala Lumpur Malaysian Spanish Institute, Kulim, Kedah, Malaysia","institution_ids":["https://openalex.org/I4528857"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5106072054","display_name":"Mohamed A Mohamed","orcid":null},"institutions":[{"id":"https://openalex.org/I139322472","display_name":"Universiti Sains Malaysia","ror":"https://ror.org/02rgb2k63","country_code":"MY","type":"education","lineage":["https://openalex.org/I139322472"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"Mohamed Fauzi Packeer Mohamed","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Engineering Campus, Universiti Sains Malaysia, Nibong Tebal, Penang, Malaysia"],"raw_orcid":"https://orcid.org/0000-0001-6353-0285","affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Engineering Campus, Universiti Sains Malaysia, Nibong Tebal, Penang, Malaysia","institution_ids":["https://openalex.org/I139322472"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113360161","display_name":"Mohamad Khairi Ishak","orcid":null},"institutions":[{"id":"https://openalex.org/I182000528","display_name":"Ajman University","ror":"https://ror.org/01j1rma10","country_code":"AE","type":"education","lineage":["https://openalex.org/I182000528"]}],"countries":["AE"],"is_corresponding":false,"raw_author_name":"Mohamad Khairi Ishak","raw_affiliation_strings":["Department of Electrical and Computer Engineering, College of Engineering and Information Technology, Ajman University, Ajman, United Arab Emirates"],"raw_orcid":"https://orcid.org/0000-0002-3554-0061","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, College of Engineering and Information Technology, Ajman University, Ajman, United Arab Emirates","institution_ids":["https://openalex.org/I182000528"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5120967925","display_name":"Mariatti Jaafar","orcid":null},"institutions":[{"id":"https://openalex.org/I139322472","display_name":"Universiti Sains Malaysia","ror":"https://ror.org/02rgb2k63","country_code":"MY","type":"education","lineage":["https://openalex.org/I139322472"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"Mariatti Jaafar","raw_affiliation_strings":["School of Materials and Mineral Resources Engineering, Engineering Campus, Universiti Sains Malaysia, Nibong Tebal, Penang, Malaysia"],"raw_orcid":"https://orcid.org/0000-0002-5947-1603","affiliations":[{"raw_affiliation_string":"School of Materials and Mineral Resources Engineering, Engineering Campus, Universiti Sains Malaysia, Nibong Tebal, Penang, Malaysia","institution_ids":["https://openalex.org/I139322472"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054157431","display_name":"Suhaidi Shafie","orcid":"https://orcid.org/0000-0002-8867-2754"},"institutions":[{"id":"https://openalex.org/I130343225","display_name":"Universiti Putra Malaysia","ror":"https://ror.org/02e91jd64","country_code":"MY","type":"education","lineage":["https://openalex.org/I130343225"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"Suhaidi Shafie","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Faculty of Engineering, Universiti Putra Malaysia (UPM), Serdang, Selangor, Malaysia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Faculty of Engineering, Universiti Putra Malaysia (UPM), Serdang, Selangor, Malaysia","institution_ids":["https://openalex.org/I130343225"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.50427328,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"13","issue":null,"first_page":"218207","last_page":"218218"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11523","display_name":"Nanomaterials and Printing Technologies","score":0.5437999963760376,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11523","display_name":"Nanomaterials and Printing Technologies","score":0.5437999963760376,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10045","display_name":"Organic Electronics and Photovoltaics","score":0.32409998774528503,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12141","display_name":"Fluid Dynamics and Thin Films","score":0.030300000682473183,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fabrication","display_name":"Fabrication","score":0.636900007724762},{"id":"https://openalex.org/keywords/thin-film-transistor","display_name":"Thin-film transistor","score":0.5733000040054321},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.5135999917984009},{"id":"https://openalex.org/keywords/flexible-electronics","display_name":"Flexible electronics","score":0.5099999904632568},{"id":"https://openalex.org/keywords/polyethylene-terephthalate","display_name":"Polyethylene terephthalate","score":0.40849998593330383},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.3610000014305115},{"id":"https://openalex.org/keywords/printed-electronics","display_name":"Printed electronics","score":0.35580000281333923},{"id":"https://openalex.org/keywords/roll-to-roll-processing","display_name":"Roll-to-roll processing","score":0.35370001196861267},{"id":"https://openalex.org/keywords/spin-coating","display_name":"Spin coating","score":0.3418000042438507}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8393999934196472},{"id":"https://openalex.org/C136525101","wikidata":"https://www.wikidata.org/wiki/Q5428139","display_name":"Fabrication","level":3,"score":0.636900007724762},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5784000158309937},{"id":"https://openalex.org/C87359718","wikidata":"https://www.wikidata.org/wiki/Q1271916","display_name":"Thin-film transistor","level":3,"score":0.5733000040054321},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.5135999917984009},{"id":"https://openalex.org/C84967400","wikidata":"https://www.wikidata.org/wiki/Q1066289","display_name":"Flexible electronics","level":2,"score":0.5099999904632568},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.47920000553131104},{"id":"https://openalex.org/C2780017307","wikidata":"https://www.wikidata.org/wiki/Q145863","display_name":"Polyethylene terephthalate","level":2,"score":0.40849998593330383},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.3610000014305115},{"id":"https://openalex.org/C25435620","wikidata":"https://www.wikidata.org/wiki/Q1497629","display_name":"Printed electronics","level":3,"score":0.35580000281333923},{"id":"https://openalex.org/C130230600","wikidata":"https://www.wikidata.org/wiki/Q4400004","display_name":"Roll-to-roll processing","level":2,"score":0.35370001196861267},{"id":"https://openalex.org/C115196108","wikidata":"https://www.wikidata.org/wiki/Q1305254","display_name":"Spin coating","level":3,"score":0.3418000042438507},{"id":"https://openalex.org/C105487726","wikidata":"https://www.wikidata.org/wiki/Q622938","display_name":"Photolithography","level":2,"score":0.33000001311302185},{"id":"https://openalex.org/C2777385008","wikidata":"https://www.wikidata.org/wiki/Q448540","display_name":"Parylene","level":3,"score":0.3271999955177307},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.31349998712539673},{"id":"https://openalex.org/C166972891","wikidata":"https://www.wikidata.org/wiki/Q5527011","display_name":"Gate dielectric","level":4,"score":0.31150001287460327},{"id":"https://openalex.org/C202374169","wikidata":"https://www.wikidata.org/wiki/Q124291","display_name":"Electrical conductor","level":2,"score":0.3095000088214874},{"id":"https://openalex.org/C2777046567","wikidata":"https://www.wikidata.org/wiki/Q1540138","display_name":"Nanoimprint lithography","level":4,"score":0.30329999327659607},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.29750001430511475},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.27720001339912415},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.27720001339912415},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.2671000063419342},{"id":"https://openalex.org/C2781448156","wikidata":"https://www.wikidata.org/wiki/Q1570182","display_name":"Coating","level":2,"score":0.26179999113082886},{"id":"https://openalex.org/C156150401","wikidata":"https://www.wikidata.org/wiki/Q5458978","display_name":"Flexible display","level":4,"score":0.260699987411499},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.259799987077713},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.2578999996185303},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.2572000026702881},{"id":"https://openalex.org/C64297162","wikidata":"https://www.wikidata.org/wiki/Q1987070","display_name":"Deposition (geology)","level":3,"score":0.2529999911785126},{"id":"https://openalex.org/C57410435","wikidata":"https://www.wikidata.org/wiki/Q505668","display_name":"Chemical vapor deposition","level":2,"score":0.2524000108242035},{"id":"https://openalex.org/C51807945","wikidata":"https://www.wikidata.org/wiki/Q3503392","display_name":"Electroplating","level":3,"score":0.2515999972820282}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2025.3646616","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3646616","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:416f8cfbd8814718a64edfa3610c6524","is_oa":true,"landing_page_url":"https://doaj.org/article/416f8cfbd8814718a64edfa3610c6524","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 13, Pp 218207-218218 (2025)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2025.3646616","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3646616","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2328051336","display_name":null,"funder_award_id":"FRGS/1/2020/TK0/USM/02/30","funder_id":"https://openalex.org/F4320321709","funder_display_name":"Ministry of Higher Education, Malaysia"},{"id":"https://openalex.org/G419226394","display_name":null,"funder_award_id":"FRGS/1/2020/TK0/USM/02/30","funder_id":"https://openalex.org/F4320311039","funder_display_name":"Ministry of Higher Education and Scientific Research"}],"funders":[{"id":"https://openalex.org/F4320311039","display_name":"Ministry of Higher Education and Scientific Research","ror":"https://ror.org/00kab6t91"},{"id":"https://openalex.org/F4320321709","display_name":"Ministry of Higher Education, Malaysia","ror":"https://ror.org/05mcs2t73"},{"id":"https://openalex.org/F4320326062","display_name":"Universiti Kuala Lumpur","ror":null},{"id":"https://openalex.org/F4320330328","display_name":"Ajman University","ror":"https://ror.org/01j1rma10"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":[],"abstract_inverted_index":{"Flexible":[0],"organic":[1,181],"thin":[2],"film":[3],"transistors":[4],"(OTFTs)":[5],"offer":[6],"a":[7,43,122,131,138,188,201,210],"compelling":[8],"pathway":[9,260],"towards":[10,261],"next-generation":[11],"wearable":[12,263],"and":[13,23,39,53,59,90,148,153,172,180,217],"large-area":[14,67],"electronics":[15],"due":[16,85,107],"to":[17,86,108,163],"their":[18],"mechanical":[19],"flexibility,":[20],"lightweight":[21],"nature,":[22],"compatibility":[24],"with":[25,255],"low":[26,109],"processing":[27,232],"temperature.":[28],"However,":[29],"realizing":[30,250],"scalable":[31,262],"fabrication":[32,247],"strategies":[33],"that":[34,141],"deliver":[35],"both":[36],"low-voltage":[37,252],"operation":[38],"high":[40,104],"performance":[41],"remains":[42],"critical":[44],"challenge.":[45],"Conventional":[46],"deposition":[47,78],"techniques,":[48],"such":[49],"as":[50,75,176],"thermal":[51],"evaporation":[52],"photolithography,":[54],"although":[55],"effective,":[56],"require":[57],"high-vacuum":[58],"cleanroom":[60],"environments,":[61],"making":[62],"them":[63],"unsuitable":[64],"for":[65,145,151,249],"cost-effective,":[66],"flexible":[68,132,256],"electronics.":[69],"Similarly,":[70],"inkjet":[71],"printing,":[72],"while":[73,168],"promising":[74],"an":[76,218],"additive":[77],"technique,":[79],"often":[80],"suffers":[81],"from":[82,113],"nozzle":[83],"clogging":[84],"stringent":[87],"ink":[88,160],"requirements":[89],"limited":[91],"viscosity":[92],"ranges,":[93],"which":[94],"in":[95],"turn":[96],"limit":[97],"material":[98],"selection.":[99],"Many":[100],"OTFTs":[101,253],"also":[102],"exhibit":[103],"operating":[105],"voltages":[106],"gate":[110,178],"capacitance":[111],"arising":[112],"low-permittivity":[114],"dielectric":[115,154,179],"layers.":[116],"In":[117],"this":[118,245],"work,":[119],"we":[120],"present":[121],"fully":[123],"solution-processable":[124],"bottom-gate":[125],"bottom-contact":[126],"(BGBC)":[127],"OTFT":[128,186],"fabricated":[129],"on":[130],"Polyethylene":[133],"Terephthalate":[134],"(PET)":[135],"substrate":[136],"using":[137],"hybrid":[139,246],"approach":[140],"integrates":[142],"direct-write":[143],"printing":[144],"electrode":[146],"patterning":[147],"spin":[149],"coating":[150],"active":[152],"layers":[155],"deposition.":[156],"Silver":[157],"nanoparticle":[158],"(AgNP)":[159],"was":[161],"used":[162],"deposit":[164],"the":[165,177,242,259],"conductive":[166],"electrodes,":[167],"Poly(Vinyl)":[169],"Alcohol":[170],"(PVA)":[171],"TIPS-pentacene":[173],"were":[174,234],"employed":[175],"semiconductor,":[182],"respectively.":[183],"The":[184],"BGBC":[185],"demonstrated":[187],"saturation":[189],"mobility":[190],"\u03bcsat":[191],"of":[192,207,214,227,244],"9.91":[193],"\u00d7":[194],"10<sup":[195,228],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[196,199,205,223,225,229],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">-2</sup>":[197],"cm<sup":[198],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>/Vs,":[200],"threshold":[202],"voltage":[203],"V<sub":[204],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">th</sub>":[206],"\u22125":[208],"V,":[209],"subthreshold":[211],"swing":[212],"S":[213],"75.5":[215],"mV/dec,":[216],"on/off":[219],"current":[220],"ratio":[221],"I<sub":[222],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">ON</sub>/I<sub":[224],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">OFF</sub>":[226],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">4</sup>.":[230],"All":[231],"steps":[233],"conducted":[235],"below":[236],"150":[237],"\u00b0C.":[238],"These":[239],"results":[240],"validate":[241],"effectiveness":[243],"strategy":[248],"high-performance,":[251],"compatible":[254],"substrates,":[257],"advancing":[258],"devices.":[264]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-12-22T00:00:00"}