{"id":"https://openalex.org/W4417169029","doi":"https://doi.org/10.1109/access.2025.3639072","title":"Short Circuit Fault Detection and Categorization for Secondary Distribution Network Using Non-Contact Magnetic Measurements","display_name":"Short Circuit Fault Detection and Categorization for Secondary Distribution Network Using Non-Contact Magnetic Measurements","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4417169029","doi":"https://doi.org/10.1109/access.2025.3639072"},"language":null,"primary_location":{"id":"doi:10.1109/access.2025.3639072","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3639072","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2025.3639072","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5078768978","display_name":"Naveed Jeelani Khan","orcid":"https://orcid.org/0000-0003-3574-8708"},"institutions":[{"id":"https://openalex.org/I929597975","display_name":"National University of Sciences and Technology","ror":"https://ror.org/03w2j5y17","country_code":"PK","type":"education","lineage":["https://openalex.org/I929597975"]}],"countries":["PK"],"is_corresponding":false,"raw_author_name":"Naveed Khan","raw_affiliation_strings":["U.S.-Pakistan Center for Advanced Studies in Energy, National University of Sciences and Technology, Islamabad, Pakistan","U.S.-Pakistan Center for Advanced Studies in Energy, National University of Sciences & Technology, Pakistan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"U.S.-Pakistan Center for Advanced Studies in Energy, National University of Sciences and Technology, Islamabad, Pakistan","institution_ids":["https://openalex.org/I929597975"]},{"raw_affiliation_string":"U.S.-Pakistan Center for Advanced Studies in Energy, National University of Sciences & Technology, Pakistan","institution_ids":["https://openalex.org/I929597975"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102748721","display_name":"Mujahid Kamran","orcid":"https://orcid.org/0000-0002-4036-9019"},"institutions":[{"id":"https://openalex.org/I929597975","display_name":"National University of Sciences and Technology","ror":"https://ror.org/03w2j5y17","country_code":"PK","type":"education","lineage":["https://openalex.org/I929597975"]}],"countries":["PK"],"is_corresponding":false,"raw_author_name":"Kamran Mujahid","raw_affiliation_strings":["U.S.-Pakistan Center for Advanced Studies in Energy, National University of Sciences and Technology, Islamabad, Pakistan","U.S.-Pakistan Center for Advanced Studies in Energy, National University of Sciences & Technology, Pakistan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"U.S.-Pakistan Center for Advanced Studies in Energy, National University of Sciences and Technology, Islamabad, Pakistan","institution_ids":["https://openalex.org/I929597975"]},{"raw_affiliation_string":"U.S.-Pakistan Center for Advanced Studies in Energy, National University of Sciences & Technology, Pakistan","institution_ids":["https://openalex.org/I929597975"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000616894","display_name":"Syed Ali Abbas Kazmi","orcid":"https://orcid.org/0000-0002-9191-8241"},"institutions":[{"id":"https://openalex.org/I929597975","display_name":"National University of Sciences and Technology","ror":"https://ror.org/03w2j5y17","country_code":"PK","type":"education","lineage":["https://openalex.org/I929597975"]}],"countries":["PK"],"is_corresponding":false,"raw_author_name":"Syed Ali Abbas Kazmi","raw_affiliation_strings":["U.S.-Pakistan Center for Advanced Studies in Energy, National University of Sciences and Technology, Islamabad, Pakistan","U.S.-Pakistan Center for Advanced Studies in Energy, National University of Sciences & Technology, Pakistan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"U.S.-Pakistan Center for Advanced Studies in Energy, National University of Sciences and Technology, Islamabad, Pakistan","institution_ids":["https://openalex.org/I929597975"]},{"raw_affiliation_string":"U.S.-Pakistan Center for Advanced Studies in Energy, National University of Sciences & Technology, Pakistan","institution_ids":["https://openalex.org/I929597975"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024851595","display_name":"Jawad Khan","orcid":"https://orcid.org/0000-0001-8263-7213"},"institutions":[{"id":"https://openalex.org/I12832649","display_name":"Gachon University","ror":"https://ror.org/03ryywt80","country_code":"KR","type":"education","lineage":["https://openalex.org/I12832649"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jawad Khan","raw_affiliation_strings":["School of Computing, Gachon University, Seongnam, Republic of Korea"],"raw_orcid":"https://orcid.org/0000-0001-8263-7213","affiliations":[{"raw_affiliation_string":"School of Computing, Gachon University, Seongnam, Republic of Korea","institution_ids":["https://openalex.org/I12832649"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5088232762","display_name":"Fahad Alturise","orcid":"https://orcid.org/0000-0001-9176-7984"},"institutions":[{"id":"https://openalex.org/I156216236","display_name":"Qassim University","ror":"https://ror.org/01wsfe280","country_code":"SA","type":"education","lineage":["https://openalex.org/I156216236"]}],"countries":["SA"],"is_corresponding":false,"raw_author_name":"Fahad Alturise","raw_affiliation_strings":["Department of Cybersecurity, College of Computer, Qassim University, Buraydah, Saudi Arabia"],"raw_orcid":"https://orcid.org/0000-0001-9176-7984","affiliations":[{"raw_affiliation_string":"Department of Cybersecurity, College of Computer, Qassim University, Buraydah, Saudi Arabia","institution_ids":["https://openalex.org/I156216236"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.6534,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.69900992,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":97},"biblio":{"volume":"13","issue":null,"first_page":"209197","last_page":"209204"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.892300009727478,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.892300009727478,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.03530000150203705,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12510","display_name":"Magneto-Optical Properties and Applications","score":0.023000000044703484,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/magnetic-flux-leakage","display_name":"Magnetic flux leakage","score":0.7495999932289124},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.6581000089645386},{"id":"https://openalex.org/keywords/short-circuit","display_name":"Short circuit","score":0.5523999929428101},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5467000007629395},{"id":"https://openalex.org/keywords/transformer","display_name":"Transformer","score":0.5437999963760376},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.48019999265670776},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.42260000109672546},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.399399995803833},{"id":"https://openalex.org/keywords/fault-indicator","display_name":"Fault indicator","score":0.3978999853134155}],"concepts":[{"id":"https://openalex.org/C20892748","wikidata":"https://www.wikidata.org/wiki/Q4390394","display_name":"Magnetic flux leakage","level":3,"score":0.7495999932289124},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.6581000089645386},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6098999977111816},{"id":"https://openalex.org/C68583231","wikidata":"https://www.wikidata.org/wiki/Q206907","display_name":"Short circuit","level":3,"score":0.5523999929428101},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5467000007629395},{"id":"https://openalex.org/C66322947","wikidata":"https://www.wikidata.org/wiki/Q11658","display_name":"Transformer","level":3,"score":0.5437999963760376},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.48019999265670776},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.43140000104904175},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.42260000109672546},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.399399995803833},{"id":"https://openalex.org/C21267803","wikidata":"https://www.wikidata.org/wiki/Q5438159","display_name":"Fault indicator","level":4,"score":0.3978999853134155},{"id":"https://openalex.org/C117323899","wikidata":"https://www.wikidata.org/wiki/Q1907989","display_name":"Distribution transformer","level":4,"score":0.3546999990940094},{"id":"https://openalex.org/C202374169","wikidata":"https://www.wikidata.org/wiki/Q124291","display_name":"Electrical conductor","level":2,"score":0.3296999931335449},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.32440000772476196},{"id":"https://openalex.org/C157479481","wikidata":"https://www.wikidata.org/wiki/Q177831","display_name":"Magnetic flux","level":3,"score":0.3228999972343445},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.30230000615119934},{"id":"https://openalex.org/C2775846686","wikidata":"https://www.wikidata.org/wiki/Q643012","display_name":"Condition monitoring","level":2,"score":0.29330000281333923},{"id":"https://openalex.org/C94124525","wikidata":"https://www.wikidata.org/wiki/Q912550","display_name":"Categorization","level":2,"score":0.2912999987602234},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.2865999937057495},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.2782000005245209},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27730000019073486},{"id":"https://openalex.org/C133770746","wikidata":"https://www.wikidata.org/wiki/Q856535","display_name":"Current transformer","level":4,"score":0.272599995136261},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2639000117778778},{"id":"https://openalex.org/C88182573","wikidata":"https://www.wikidata.org/wiki/Q1139740","display_name":"High voltage","level":3,"score":0.26339998841285706},{"id":"https://openalex.org/C24214142","wikidata":"https://www.wikidata.org/wiki/Q118801","display_name":"Magnetic circuit","level":3,"score":0.26179999113082886},{"id":"https://openalex.org/C55000061","wikidata":"https://www.wikidata.org/wiki/Q24894777","display_name":"Current sensor","level":3,"score":0.259799987077713},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.2590999901294708},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.25619998574256897},{"id":"https://openalex.org/C135628077","wikidata":"https://www.wikidata.org/wiki/Q220184","display_name":"Finite element method","level":2,"score":0.2500999867916107}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/access.2025.3639072","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3639072","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1109/access.2025.3639072","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3639072","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1999300672","https://openalex.org/W2014243485","https://openalex.org/W2019125309","https://openalex.org/W2026352646","https://openalex.org/W2072597598","https://openalex.org/W2107912313","https://openalex.org/W2110710005","https://openalex.org/W2115662708","https://openalex.org/W2128683468","https://openalex.org/W2156859338","https://openalex.org/W2163463221","https://openalex.org/W2321674405","https://openalex.org/W2335429435","https://openalex.org/W2344705789","https://openalex.org/W2416072749","https://openalex.org/W2602223014","https://openalex.org/W2605570066","https://openalex.org/W2779977204","https://openalex.org/W2950801707","https://openalex.org/W2970298397","https://openalex.org/W3013335046","https://openalex.org/W3215506111","https://openalex.org/W4285082011","https://openalex.org/W4385493577","https://openalex.org/W4387193551","https://openalex.org/W4387193552"],"related_works":[],"abstract_inverted_index":{"Reliable":[0],"electric":[1],"power":[2],"distribution":[3,11,69,84,134],"strongly":[4],"depends":[5],"on":[6],"rapid":[7],"fault":[8,38,107],"detection.":[9],"Overhead":[10],"conductors":[12],"are":[13,74],"particularly":[14],"prone":[15],"to":[16],"short":[17,36],"circuit":[18,37],"faults":[19],"mainly":[20],"caused":[21],"by":[22],"growing":[23],"vegetation":[24],"and":[25,34,40,124],"other":[26],"environmental":[27],"factors.":[28],"This":[29],"paper":[30],"introduces":[31],"an":[32],"automatic":[33],"non-contact":[35],"detection":[39],"classification":[41],"technique":[42,62],"using":[43,86],"flux":[44,64,127],"leakage":[45,65,128],"measurements":[46,66],"together":[47],"with":[48],"machine":[49],"learning":[50],"algorithms.":[51],"Unlike":[52],"traditional":[53],"current":[54],"or":[55],"voltage":[56],"transformer":[57,85],"based":[58,129],"approaches,":[59],"the":[60,87,93,96,121],"proposed":[61],"uses":[63],"from":[67],"a":[68,81],"transformer.":[70],"Multiple":[71],"sensor":[72],"positions":[73],"explored":[75],"for":[76,131],"optimal":[77],"performance":[78],"via":[79],"simulating":[80],"200":[82],"kVA":[83],"finite":[88],"element":[89],"analysis":[90],"method.":[91],"Among":[92],"tested":[94],"classifiers,":[95],"designed":[97],"neural":[98],"network":[99,135],"algorithm":[100],"achieved":[101],"98%":[102],"accuracy":[103],"across":[104],"10":[105],"distinct":[106],"types":[108],"while":[109],"classifying":[110],"669":[111],"scenarios":[112],"in":[113],"less":[114],"than":[115],"0.16":[116],"seconds.":[117],"The":[118],"results":[119],"demonstrate":[120],"high":[122],"efficiency":[123],"feasibility":[125],"of":[126],"sensing":[130],"real":[132],"time":[133],"protection.":[136]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1}],"updated_date":"2026-07-15T18:14:33.161393","created_date":"2025-12-09T00:00:00"}