{"id":"https://openalex.org/W7106623180","doi":"https://doi.org/10.1109/access.2025.3636825","title":"Continuous Markov-Based Reliability Analysis of Underground Distribution Power Systems Under Temperature and Load-Dependent Failure Rates","display_name":"Continuous Markov-Based Reliability Analysis of Underground Distribution Power Systems Under Temperature and Load-Dependent Failure Rates","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W7106623180","doi":"https://doi.org/10.1109/access.2025.3636825"},"language":null,"primary_location":{"id":"doi:10.1109/access.2025.3636825","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3636825","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2025.3636825","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Uzair Khan","orcid":"https://orcid.org/0009-0008-5322-5541"},"institutions":[{"id":"https://openalex.org/I19700959","display_name":"Florida International University","ror":"https://ror.org/02gz6gg07","country_code":"US","type":"education","lineage":["https://openalex.org/I19700959"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Uzair Khan","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Florida International University, Miami, FL, USA"],"raw_orcid":"https://orcid.org/0009-0008-5322-5541","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Florida International University, Miami, FL, USA","institution_ids":["https://openalex.org/I19700959"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Hasan Iqbal","orcid":"https://orcid.org/0000-0001-5930-025X"},"institutions":[{"id":"https://openalex.org/I19700959","display_name":"Florida International University","ror":"https://ror.org/02gz6gg07","country_code":"US","type":"education","lineage":["https://openalex.org/I19700959"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Hasan Iqbal","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Florida International University, Miami, FL, USA"],"raw_orcid":"https://orcid.org/0000-0001-5930-025X","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Florida International University, Miami, FL, USA","institution_ids":["https://openalex.org/I19700959"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Sukanta Roy","orcid":"https://orcid.org/0000-0001-6775-7727"},"institutions":[{"id":"https://openalex.org/I19700959","display_name":"Florida International University","ror":"https://ror.org/02gz6gg07","country_code":"US","type":"education","lineage":["https://openalex.org/I19700959"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sukanta Roy","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Florida International University, Miami, FL, USA"],"raw_orcid":"https://orcid.org/0000-0001-6775-7727","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Florida International University, Miami, FL, USA","institution_ids":["https://openalex.org/I19700959"]}]},{"author_position":"last","author":{"id":null,"display_name":"Arif Sarwat","orcid":"https://orcid.org/0000-0003-1179-438X"},"institutions":[{"id":"https://openalex.org/I19700959","display_name":"Florida International University","ror":"https://ror.org/02gz6gg07","country_code":"US","type":"education","lineage":["https://openalex.org/I19700959"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Arif Sarwat","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Florida International University, Miami, FL, USA"],"raw_orcid":"https://orcid.org/0000-0003-1179-438X","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Florida International University, Miami, FL, USA","institution_ids":["https://openalex.org/I19700959"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I19700959"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.7779,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.78921204,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":"13","issue":null,"first_page":"207653","last_page":"207671"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12804","display_name":"Thermal Analysis in Power Transmission","score":0.621399998664856,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12804","display_name":"Thermal Analysis in Power Transmission","score":0.621399998664856,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.28839999437332153,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11185","display_name":"Integrated Energy Systems Optimization","score":0.01730000041425228,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dependability","display_name":"Dependability","score":0.678600013256073},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6194000244140625},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.5437999963760376},{"id":"https://openalex.org/keywords/markov-process","display_name":"Markov process","score":0.5224999785423279},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.4487999975681305},{"id":"https://openalex.org/keywords/stochastic-process","display_name":"Stochastic process","score":0.38260000944137573},{"id":"https://openalex.org/keywords/allowance","display_name":"Allowance (engineering)","score":0.373199999332428},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.35019999742507935},{"id":"https://openalex.org/keywords/acceleration","display_name":"Acceleration","score":0.3479999899864197},{"id":"https://openalex.org/keywords/markov-chain","display_name":"Markov chain","score":0.3431999981403351}],"concepts":[{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6902999877929688},{"id":"https://openalex.org/C77019957","wikidata":"https://www.wikidata.org/wiki/Q2689057","display_name":"Dependability","level":2,"score":0.678600013256073},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6194000244140625},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.5437999963760376},{"id":"https://openalex.org/C159886148","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov process","level":2,"score":0.5224999785423279},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4668000042438507},{"id":"https://openalex.org/C39432304","wikidata":"https://www.wikidata.org/wiki/Q188847","display_name":"Environmental science","level":0,"score":0.46480000019073486},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.4487999975681305},{"id":"https://openalex.org/C8272713","wikidata":"https://www.wikidata.org/wiki/Q176737","display_name":"Stochastic process","level":2,"score":0.38260000944137573},{"id":"https://openalex.org/C2779268580","wikidata":"https://www.wikidata.org/wiki/Q3447087","display_name":"Allowance (engineering)","level":2,"score":0.373199999332428},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.35019999742507935},{"id":"https://openalex.org/C117896860","wikidata":"https://www.wikidata.org/wiki/Q11376","display_name":"Acceleration","level":2,"score":0.3479999899864197},{"id":"https://openalex.org/C98763669","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov chain","level":2,"score":0.3431999981403351},{"id":"https://openalex.org/C2777027219","wikidata":"https://www.wikidata.org/wiki/Q1284190","display_name":"Constant (computer programming)","level":2,"score":0.3352000117301941},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.335099995136261},{"id":"https://openalex.org/C44154001","wikidata":"https://www.wikidata.org/wiki/Q754940","display_name":"Mean time between failures","level":3,"score":0.33410000801086426},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3314000070095062},{"id":"https://openalex.org/C107094494","wikidata":"https://www.wikidata.org/wiki/Q428453","display_name":"Fault tree analysis","level":2,"score":0.3188999891281128},{"id":"https://openalex.org/C149441793","wikidata":"https://www.wikidata.org/wiki/Q200726","display_name":"Probability distribution","level":2,"score":0.3021000027656555},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.29739999771118164},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.28769999742507935},{"id":"https://openalex.org/C168993435","wikidata":"https://www.wikidata.org/wiki/Q6501125","display_name":"Ground","level":2,"score":0.2777999937534332},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.27559998631477356},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.2702000141143799},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.267300009727478},{"id":"https://openalex.org/C186659197","wikidata":"https://www.wikidata.org/wiki/Q5452195","display_name":"First-hitting-time model","level":2,"score":0.26600000262260437},{"id":"https://openalex.org/C127491075","wikidata":"https://www.wikidata.org/wiki/Q7617825","display_name":"Stochastic modelling","level":2,"score":0.263700008392334},{"id":"https://openalex.org/C23725684","wikidata":"https://www.wikidata.org/wiki/Q616377","display_name":"Maintenance engineering","level":2,"score":0.26190000772476196},{"id":"https://openalex.org/C110507122","wikidata":"https://www.wikidata.org/wiki/Q1356856","display_name":"Renewal theory","level":2,"score":0.26109999418258667},{"id":"https://openalex.org/C2778738651","wikidata":"https://www.wikidata.org/wiki/Q16546687","display_name":"Novelty","level":2,"score":0.2596000134944916},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.2563000023365021},{"id":"https://openalex.org/C14036430","wikidata":"https://www.wikidata.org/wiki/Q3736076","display_name":"Function (biology)","level":2,"score":0.25619998574256897}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/access.2025.3636825","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3636825","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1109/access.2025.3636825","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3636825","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":53,"referenced_works":["https://openalex.org/W188199274","https://openalex.org/W1486460655","https://openalex.org/W1490011997","https://openalex.org/W1997322218","https://openalex.org/W2006789568","https://openalex.org/W2017610386","https://openalex.org/W2089902390","https://openalex.org/W2106664131","https://openalex.org/W2320105767","https://openalex.org/W2401277204","https://openalex.org/W2491576154","https://openalex.org/W2495828739","https://openalex.org/W2543347620","https://openalex.org/W2783300781","https://openalex.org/W2919893614","https://openalex.org/W2950472248","https://openalex.org/W2991587957","https://openalex.org/W2998825859","https://openalex.org/W3010035897","https://openalex.org/W3016628610","https://openalex.org/W3083902495","https://openalex.org/W3130206771","https://openalex.org/W3157591792","https://openalex.org/W3210029275","https://openalex.org/W3217258376","https://openalex.org/W4214941738","https://openalex.org/W4229046802","https://openalex.org/W4286751613","https://openalex.org/W4312573142","https://openalex.org/W4312688267","https://openalex.org/W4319663605","https://openalex.org/W4385274407","https://openalex.org/W4385453217","https://openalex.org/W4386213582","https://openalex.org/W4387449206","https://openalex.org/W4388000077","https://openalex.org/W4388476351","https://openalex.org/W4391130132","https://openalex.org/W4392824843","https://openalex.org/W4393078996","https://openalex.org/W4393148723","https://openalex.org/W4396943744","https://openalex.org/W4401110036","https://openalex.org/W4403723463","https://openalex.org/W4404188808","https://openalex.org/W4405811960","https://openalex.org/W4406045845","https://openalex.org/W4407415303","https://openalex.org/W4409202075","https://openalex.org/W4411070848","https://openalex.org/W4413208836","https://openalex.org/W4413296081","https://openalex.org/W4414404739"],"related_works":[],"abstract_inverted_index":{"In":[0,189],"metropolitan":[1],"and":[2,19,35,99,129,138,156,165,209,238,258,267],"densely":[3],"populated":[4],"areas,":[5],"underground":[6,71,96,108,270],"distribution":[7,72],"is":[8,23,74,232,244],"common":[9],"to":[10,16,28,42,122,145,193],"enhance":[11],"operating":[12,128],"safety":[13],"reduce":[14],"exposure":[15],"the":[17,57,107,115,151,225],"elements":[18],"for":[20,26,70,154,262],"aesthetics.":[21],"There":[22],"limited":[24],"allowance":[25],"heat":[27],"escape":[29],"because":[30],"of":[31,59,104,179,197,220,227,235],"confined":[32],"in":[33,76,106,171,224,269],"conduits":[34],"vaults":[36],"making":[37],"major":[38],"components":[39,73,105],"very":[40],"susceptible":[41],"damage":[43],"by":[44,114,215],"high":[45,203],"temperatures.":[46],"Conventional":[47],"reliability":[48,67,157,248],"assessments":[49],"largely":[50],"assume":[51],"constant":[52],"failure":[53,118,137,180],"rates":[54,119],"leaving":[55],"out":[56,147],"effect":[58],"temperature":[60,237],"stress":[61],"on":[62],"equipment":[63],"performance.":[64],"A":[65],"temperature-aware":[66],"modeling":[68,176,200],"framework":[69,230],"developed":[75],"this":[77,221],"study":[78,222],"using":[79],"a":[80,228,233],"continuous-time":[81],"Markov":[82],"process":[83],"(CTMP)":[84],"approach.":[85],"Pad":[86],"mount":[87,94],"transformers,":[88],"metal-clad":[89],"draw-out":[90],"circuit":[91],"breakers,":[92],"pad":[93],"switches,":[95],"primary":[97],"cables,":[98],"cable":[100],"splices/joints":[101],"are":[102],"examples":[103],"network":[109,265],"being":[110],"studied.":[111],"As":[112],"indicated":[113],"observed":[116],"data,":[117],"were":[120],"adjusted":[121],"reflect":[123],"degradation":[124],"behavior":[125,243],"under":[126],"different":[127],"environmental":[130],"conditions.":[131],"The":[132,218],"CTMP":[133,229],"formulation":[134],"captures":[135],"both":[136,236],"repair":[139],"transitions":[140],"that":[141,202,231],"make":[142],"it":[143],"possible":[144],"carry":[146],"an":[148,254],"assessment":[149],"at":[150],"system":[152,167,211],"level":[153],"availability":[155],"metrics.":[158],"High":[159],"temperatures":[160,204],"significantly":[161,205],"degrade":[162,206],"component":[163,207],"dependability":[164,208],"overall":[166,210],"performance,":[168,212],"as":[169,213,253],"presented":[170],"case":[172,216],"studies":[173],"with":[174,191],"temperature-dependent":[175,199],"predicting":[177],"probabilities":[178],"noticeably":[181],"higher":[182,195],"than":[183],"those":[184],"resulting":[185],"from":[186],"constant-rate":[187],"models.":[188],"fact,":[190],"up":[192],"99%":[194],"probability":[196],"failure,":[198],"reveals":[201],"evidenced":[214],"studies.":[217],"novelty":[219],"lies":[223],"introduction":[226],"function":[234],"load.":[239],"Thus,":[240],"thermal":[241],"acceleration":[242],"introduced":[245],"into":[246],"stochastic":[247],"analysis":[249],"which":[250],"can":[251],"serve":[252],"even":[255],"more":[256],"accurate":[257],"practically":[259],"useful":[260],"basis":[261],"decision-making":[263],"about":[264],"planning":[266],"maintenance":[268],"power":[271],"networks.":[272]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-11-25T00:00:00"}