{"id":"https://openalex.org/W4416286310","doi":"https://doi.org/10.1109/access.2025.3633562","title":"Class Distribution Mismatch-Aware Debiasing for Semi-Supervised Partial Discharge Diagnosis in Gas-Insulated Switchgear","display_name":"Class Distribution Mismatch-Aware Debiasing for Semi-Supervised Partial Discharge Diagnosis in Gas-Insulated Switchgear","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4416286310","doi":"https://doi.org/10.1109/access.2025.3633562"},"language":"en","primary_location":{"id":"doi:10.1109/access.2025.3633562","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3633562","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2025.3633562","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Truong Le Vi Thao","orcid":null},"institutions":[{"id":"https://openalex.org/I119575151","display_name":"Korea National University of Transportation","ror":"https://ror.org/03qqbe534","country_code":"KR","type":"education","lineage":["https://openalex.org/I119575151"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Truong Le Vi Thao","raw_affiliation_strings":["Department of Computer Science and Information, Korea National University of Transportation, Uiwang-si, Gyeonggi-do, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Information, Korea National University of Transportation, Uiwang-si, Gyeonggi-do, Republic of Korea","institution_ids":["https://openalex.org/I119575151"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069839479","display_name":"Young-Woo Youn","orcid":"https://orcid.org/0000-0002-4207-971X"},"institutions":[{"id":"https://openalex.org/I196471810","display_name":"Korea Electrotechnology Research Institute","ror":"https://ror.org/03ctacd45","country_code":"KR","type":"nonprofit","lineage":["https://openalex.org/I196471810"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Young-Woo Youn","raw_affiliation_strings":["Smart Grid Research Division, Korea Electrotechnology Research Institute, Gwangju-si, Republic of Korea"],"raw_orcid":"https://orcid.org/0000-0002-4207-971X","affiliations":[{"raw_affiliation_string":"Smart Grid Research Division, Korea Electrotechnology Research Institute, Gwangju-si, Republic of Korea","institution_ids":["https://openalex.org/I196471810"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5120405828","display_name":"In-Chang You","orcid":null},"institutions":[{"id":"https://openalex.org/I4210116862","display_name":"Il-Yang Pharmaceutical (South Korea)","ror":"https://ror.org/026pdm559","country_code":"KR","type":"company","lineage":["https://openalex.org/I4210116862"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"In-Chang You","raw_affiliation_strings":["YOUHO Electric Industry Company Ltd., Yangju-si, Gyeonggi-do, Republic of Korea","YOUHO Electric IND.CO.,LTD, Yangju-si, Gyeonggi-do, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"YOUHO Electric Industry Company Ltd., Yangju-si, Gyeonggi-do, Republic of Korea","institution_ids":["https://openalex.org/I4210116862"]},{"raw_affiliation_string":"YOUHO Electric IND.CO.,LTD, Yangju-si, Gyeonggi-do, Republic of Korea","institution_ids":["https://openalex.org/I4210116862"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5106601822","display_name":"Ho Trong Tai","orcid":"https://orcid.org/0009-0002-9089-5081"},"institutions":[{"id":"https://openalex.org/I119575151","display_name":"Korea National University of Transportation","ror":"https://ror.org/03qqbe534","country_code":"KR","type":"education","lineage":["https://openalex.org/I119575151"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Ho Trong Tai","raw_affiliation_strings":["Department of Computer Science and Information, Korea National University of Transportation, Uiwang-si, Gyeonggi-do, Republic of Korea"],"raw_orcid":"https://orcid.org/0009-0002-9089-5081","affiliations":[{"raw_affiliation_string":"Department of Computer Science and Information, Korea National University of Transportation, Uiwang-si, Gyeonggi-do, Republic of Korea","institution_ids":["https://openalex.org/I119575151"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100319625","display_name":"Sang-Min Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I119575151","display_name":"Korea National University of Transportation","ror":"https://ror.org/03qqbe534","country_code":"KR","type":"education","lineage":["https://openalex.org/I119575151"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sang-Min Lee","raw_affiliation_strings":["Department of Computer Science and Information, Korea National University of Transportation, Uiwang-si, Gyeonggi-do, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Information, Korea National University of Transportation, Uiwang-si, Gyeonggi-do, Republic of Korea","institution_ids":["https://openalex.org/I119575151"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5039613414","display_name":"Yong\u2010Hwa Kim","orcid":"https://orcid.org/0000-0003-2183-5085"},"institutions":[{"id":"https://openalex.org/I119575151","display_name":"Korea National University of Transportation","ror":"https://ror.org/03qqbe534","country_code":"KR","type":"education","lineage":["https://openalex.org/I119575151"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yong-Hwa Kim","raw_affiliation_strings":["Department of Computer Science and Information, Korea National University of Transportation, Uiwang-si, Gyeonggi-do, Republic of Korea"],"raw_orcid":"https://orcid.org/0000-0003-2183-5085","affiliations":[{"raw_affiliation_string":"Department of Computer Science and Information, Korea National University of Transportation, Uiwang-si, Gyeonggi-do, Republic of Korea","institution_ids":["https://openalex.org/I119575151"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.2904,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.53103903,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":"13","issue":null,"first_page":"195924","last_page":"195936"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.909600019454956,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.909600019454956,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.016200000420212746,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.006599999964237213,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/debiasing","display_name":"Debiasing","score":0.9700000286102295},{"id":"https://openalex.org/keywords/switchgear","display_name":"Switchgear","score":0.7627000212669373},{"id":"https://openalex.org/keywords/classifier","display_name":"Classifier (UML)","score":0.6294999718666077},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4706000089645386},{"id":"https://openalex.org/keywords/class","display_name":"Class (philosophy)","score":0.4699999988079071},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.4350999891757965},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.40139999985694885},{"id":"https://openalex.org/keywords/partial-discharge","display_name":"Partial discharge","score":0.38530001044273376}],"concepts":[{"id":"https://openalex.org/C2779458634","wikidata":"https://www.wikidata.org/wiki/Q24963715","display_name":"Debiasing","level":2,"score":0.9700000286102295},{"id":"https://openalex.org/C93893174","wikidata":"https://www.wikidata.org/wiki/Q1273786","display_name":"Switchgear","level":2,"score":0.7627000212669373},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7621999979019165},{"id":"https://openalex.org/C95623464","wikidata":"https://www.wikidata.org/wiki/Q1096149","display_name":"Classifier (UML)","level":2,"score":0.6294999718666077},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5759000182151794},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4706000089645386},{"id":"https://openalex.org/C2777212361","wikidata":"https://www.wikidata.org/wiki/Q5127848","display_name":"Class (philosophy)","level":2,"score":0.4699999988079071},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.43880000710487366},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.4350999891757965},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.4032000005245209},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.40139999985694885},{"id":"https://openalex.org/C130143024","wikidata":"https://www.wikidata.org/wiki/Q1929972","display_name":"Partial discharge","level":3,"score":0.38530001044273376},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.382099986076355},{"id":"https://openalex.org/C51632099","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Training set","level":2,"score":0.3546000123023987},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.34369999170303345},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.3089999854564667},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.30559998750686646},{"id":"https://openalex.org/C31712484","wikidata":"https://www.wikidata.org/wiki/Q618740","display_name":"Recloser","level":3,"score":0.29269999265670776},{"id":"https://openalex.org/C67186912","wikidata":"https://www.wikidata.org/wiki/Q367664","display_name":"Data modeling","level":2,"score":0.2906999886035919},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.2700999975204468},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.26600000262260437}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2025.3633562","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3633562","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:495665e0a9e844798174a4703d812eff","is_oa":true,"landing_page_url":"https://doaj.org/article/495665e0a9e844798174a4703d812eff","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 13, Pp 195924-195936 (2025)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2025.3633562","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3633562","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G6622023465","display_name":null,"funder_award_id":"20221A10100011","funder_id":"https://openalex.org/F4320335199","funder_display_name":"Korea Institute of Energy Technology Evaluation and Planning"}],"funders":[{"id":"https://openalex.org/F4320335199","display_name":"Korea Institute of Energy Technology Evaluation and Planning","ror":"https://ror.org/02zq38y32"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W2801946776","https://openalex.org/W2896673944","https://openalex.org/W2994928058","https://openalex.org/W3098852188","https://openalex.org/W3142849873","https://openalex.org/W3166048217","https://openalex.org/W4237840213","https://openalex.org/W4243759745","https://openalex.org/W4377021855","https://openalex.org/W4394724823","https://openalex.org/W4401687361","https://openalex.org/W4402117116","https://openalex.org/W4402753972","https://openalex.org/W4404954647","https://openalex.org/W4406240298","https://openalex.org/W4408254321","https://openalex.org/W4409014270","https://openalex.org/W4411216131"],"related_works":[],"abstract_inverted_index":{"Partial":[0],"discharge":[1],"(PD)":[2],"detection":[3],"and":[4,28,68,77,113],"classification":[5,96],"are":[6,26],"essential":[7],"to":[8,30,106],"ensure":[9],"the":[10,54,59,70,74,124,128],"reliability":[11],"of":[12,98,130],"gas-insulated":[13],"switchgear":[14],"(GIS).":[15],"However,":[16],"conventional":[17],"deep":[18],"learning":[19,41],"approaches":[20],"require":[21],"extensive":[22],"labeled":[23],"data,":[24],"which":[25,46],"expensive":[27],"time-consuming":[29],"obtain.":[31],"To":[32],"address":[33],"this":[34],"challenge,":[35],"we":[36],"propose":[37],"a":[38],"novel":[39],"semi-supervised":[40],"(SSL)":[42],"framework":[43,125],"called":[44],"CDMAD-SSL,":[45],"integrates":[47],"class":[48,75],"distribution":[49,78],"mismatch-aware":[50],"debiasing":[51],"(CDMAD)":[52],"into":[53],"SSL":[55,102],"pipeline.":[56],"By":[57],"refining":[58],"pseudo-labels":[60],"through":[61],"classifier":[62],"bias":[63],"correction":[64],"during":[65],"both":[66],"training":[67],"testing,":[69],"proposed":[71],"method":[72],"mitigates":[73],"imbalance":[76],"mismatch\u2014two":[79],"critical":[80],"challenges":[81],"that":[82,91],"hinder":[83],"practical":[84],"PD":[85],"monitoring.":[86],"The":[87],"experimental":[88],"results":[89],"demonstrate":[90],"CDMAD-SSL":[92],"achieves":[93],"an":[94],"overall":[95],"accuracy":[97],"96.64%,":[99],"outperforming":[100],"benchmark":[101],"methods":[103],"by":[104],"up":[105],"2.52%,":[107],"while":[108],"maintaining":[109],"robust":[110],"precision,":[111],"recall,":[112],"<italic":[114],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[115,117],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">F</i><sub":[116],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">1</sub>-scores":[118],"across":[119],"all":[120],"fault":[121],"types.":[122],"Furthermore,":[123],"consistently":[126],"improved":[127],"recognition":[129],"minority":[131],"classes":[132],"under":[133,141],"skewed":[134],"data":[135],"distributions,":[136],"thereby":[137],"validating":[138],"its":[139],"effectiveness":[140],"realistic":[142],"on-site":[143],"conditions.":[144]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-07-15T18:14:33.161393","created_date":"2025-11-17T00:00:00"}