{"id":"https://openalex.org/W4415933704","doi":"https://doi.org/10.1109/access.2025.3629347","title":"Efficient Electromagnetic Near-Field Scanning Using Physics-Informed Gaussian Process Regression","display_name":"Efficient Electromagnetic Near-Field Scanning Using Physics-Informed Gaussian Process Regression","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4415933704","doi":"https://doi.org/10.1109/access.2025.3629347"},"language":"en","primary_location":{"id":"doi:10.1109/access.2025.3629347","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3629347","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2025.3629347","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5084929531","display_name":"Tomas Monopoli","orcid":"https://orcid.org/0009-0008-7623-0781"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Tomas Monopoli","raw_affiliation_strings":["Department of Electronics, Information and Bioengineering, Politecnico di Milano, Milan, Italy","Department of Electronics, Information and Bioengineering, Politecnico di Milano, Milano, Italy"],"raw_orcid":"https://orcid.org/0009-0008-7623-0781","affiliations":[{"raw_affiliation_string":"Department of Electronics, Information and Bioengineering, Politecnico di Milano, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Department of Electronics, Information and Bioengineering, Politecnico di Milano, Milano, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051689043","display_name":"Xinglong Wu","orcid":"https://orcid.org/0000-0002-0564-6690"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Xinglong Wu","raw_affiliation_strings":["Department of Electronics, Information and Bioengineering, Politecnico di Milano, Milan, Italy","Department of Electronics, Information and Bioengineering, Politecnico di Milano, Milano, Italy"],"raw_orcid":"https://orcid.org/0000-0002-0564-6690","affiliations":[{"raw_affiliation_string":"Department of Electronics, Information and Bioengineering, Politecnico di Milano, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Department of Electronics, Information and Bioengineering, Politecnico di Milano, Milano, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010923388","display_name":"Sergio A. Pignari","orcid":"https://orcid.org/0000-0002-6657-1530"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Sergio Amedeo Pignari","raw_affiliation_strings":["Department of Electronics, Information and Bioengineering, Politecnico di Milano, Milan, Italy","Department of Electronics, Information and Bioengineering, Politecnico di Milano, Milano, Italy"],"raw_orcid":"https://orcid.org/0000-0002-6657-1530","affiliations":[{"raw_affiliation_string":"Department of Electronics, Information and Bioengineering, Politecnico di Milano, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Department of Electronics, Information and Bioengineering, Politecnico di Milano, Milano, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041414360","display_name":"Johannes Wolf","orcid":"https://orcid.org/0009-0008-1440-861X"},"institutions":[{"id":"https://openalex.org/I2801994115","display_name":"European Space Agency","ror":"https://ror.org/03wd9za21","country_code":"FR","type":"funder","lineage":["https://openalex.org/I2801994115"]},{"id":"https://openalex.org/I44377176","display_name":"European Space Research and Technology Centre","ror":"https://ror.org/03h3jqn23","country_code":"NL","type":"government","lineage":["https://openalex.org/I2801994115","https://openalex.org/I44377176"]}],"countries":["FR","NL"],"is_corresponding":false,"raw_author_name":"Johannes Wolf","raw_affiliation_strings":["Power Systems, EMC and Space Environment Division, European Space Technology Center (ESTEC), European Space Agency (ESA), Noordwijk, The Netherlands","EMC senior advisor in the Electrical Department, European Space Technology Center (ESTEC), European Space Agency (ESA), Noordwijk, Netherlands"],"raw_orcid":"https://orcid.org/0009-0008-1440-861X","affiliations":[{"raw_affiliation_string":"Power Systems, EMC and Space Environment Division, European Space Technology Center (ESTEC), European Space Agency (ESA), Noordwijk, The Netherlands","institution_ids":["https://openalex.org/I44377176","https://openalex.org/I2801994115"]},{"raw_affiliation_string":"EMC senior advisor in the Electrical Department, European Space Technology Center (ESTEC), European Space Agency (ESA), Noordwijk, Netherlands","institution_ids":["https://openalex.org/I44377176","https://openalex.org/I2801994115"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5079370638","display_name":"Flavia Grassi","orcid":"https://orcid.org/0000-0001-6844-8766"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Flavia Grassi","raw_affiliation_strings":["Department of Electronics, Information and Bioengineering, Politecnico di Milano, Milan, Italy","Department of Electronics, Information and Bioengineering, Politecnico di Milano, Milano, Italy"],"raw_orcid":"https://orcid.org/0000-0001-6844-8766","affiliations":[{"raw_affiliation_string":"Department of Electronics, Information and Bioengineering, Politecnico di Milano, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Department of Electronics, Information and Bioengineering, Politecnico di Milano, Milano, Italy","institution_ids":["https://openalex.org/I93860229"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5084929531"],"corresponding_institution_ids":["https://openalex.org/I93860229"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.6252,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.75539993,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":98},"biblio":{"volume":"13","issue":null,"first_page":"191781","last_page":"191794"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.9298999905586243,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.9298999905586243,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","score":0.014100000262260437,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10739","display_name":"Electromagnetic Scattering and Analysis","score":0.013399999588727951,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bayesian-optimization","display_name":"Bayesian optimization","score":0.8180999755859375},{"id":"https://openalex.org/keywords/gaussian-process","display_name":"Gaussian process","score":0.7441999912261963},{"id":"https://openalex.org/keywords/kriging","display_name":"Kriging","score":0.7269999980926514},{"id":"https://openalex.org/keywords/kernel","display_name":"Kernel (algebra)","score":0.5537999868392944},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5302000045776367},{"id":"https://openalex.org/keywords/adaptive-sampling","display_name":"Adaptive sampling","score":0.4959999918937683},{"id":"https://openalex.org/keywords/bayesian-probability","display_name":"Bayesian probability","score":0.4867999851703644},{"id":"https://openalex.org/keywords/surrogate-model","display_name":"Surrogate model","score":0.45559999346733093},{"id":"https://openalex.org/keywords/regression","display_name":"Regression","score":0.439300000667572}],"concepts":[{"id":"https://openalex.org/C2778049539","wikidata":"https://www.wikidata.org/wiki/Q17002908","display_name":"Bayesian optimization","level":2,"score":0.8180999755859375},{"id":"https://openalex.org/C61326573","wikidata":"https://www.wikidata.org/wiki/Q1496376","display_name":"Gaussian process","level":3,"score":0.7441999912261963},{"id":"https://openalex.org/C81692654","wikidata":"https://www.wikidata.org/wiki/Q225926","display_name":"Kriging","level":2,"score":0.7269999980926514},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6202999949455261},{"id":"https://openalex.org/C74193536","wikidata":"https://www.wikidata.org/wiki/Q574844","display_name":"Kernel (algebra)","level":2,"score":0.5537999868392944},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5302000045776367},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5026999711990356},{"id":"https://openalex.org/C2781395549","wikidata":"https://www.wikidata.org/wiki/Q4680762","display_name":"Adaptive sampling","level":3,"score":0.4959999918937683},{"id":"https://openalex.org/C107673813","wikidata":"https://www.wikidata.org/wiki/Q812534","display_name":"Bayesian probability","level":2,"score":0.4867999851703644},{"id":"https://openalex.org/C131675550","wikidata":"https://www.wikidata.org/wiki/Q7646884","display_name":"Surrogate model","level":2,"score":0.45559999346733093},{"id":"https://openalex.org/C83546350","wikidata":"https://www.wikidata.org/wiki/Q1139051","display_name":"Regression","level":2,"score":0.439300000667572},{"id":"https://openalex.org/C163716315","wikidata":"https://www.wikidata.org/wiki/Q901177","display_name":"Gaussian","level":2,"score":0.43709999322891235},{"id":"https://openalex.org/C91229774","wikidata":"https://www.wikidata.org/wiki/Q193885","display_name":"Infinitesimal","level":2,"score":0.4090999960899353},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.4034999907016754},{"id":"https://openalex.org/C2776436953","wikidata":"https://www.wikidata.org/wiki/Q5163215","display_name":"Consistency (knowledge bases)","level":2,"score":0.3849000036716461},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.3603000044822693},{"id":"https://openalex.org/C71813955","wikidata":"https://www.wikidata.org/wiki/Q503560","display_name":"Ground-penetrating radar","level":3,"score":0.3513999879360199},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.34689998626708984},{"id":"https://openalex.org/C49937458","wikidata":"https://www.wikidata.org/wiki/Q2599292","display_name":"Probabilistic logic","level":2,"score":0.2978000044822693},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.29649999737739563},{"id":"https://openalex.org/C2909720056","wikidata":"https://www.wikidata.org/wiki/Q11406","display_name":"Electromagnetics","level":2,"score":0.27090001106262207},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.26840001344680786},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.26249998807907104},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.25929999351501465},{"id":"https://openalex.org/C147764199","wikidata":"https://www.wikidata.org/wiki/Q6865248","display_name":"Minification","level":2,"score":0.25540000200271606},{"id":"https://openalex.org/C19619285","wikidata":"https://www.wikidata.org/wiki/Q196372","display_name":"Observational error","level":2,"score":0.25189998745918274},{"id":"https://openalex.org/C137836250","wikidata":"https://www.wikidata.org/wiki/Q984063","display_name":"Optimization problem","level":2,"score":0.2502000033855438}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/access.2025.3629347","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3629347","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:f2f827873e794a36aa6c418c97ecb614","is_oa":true,"landing_page_url":"https://doaj.org/article/f2f827873e794a36aa6c418c97ecb614","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 13, Pp 191781-191794 (2025)","raw_type":"article"},{"id":"pmh:oai:re.public.polimi.it:11311/1302985","is_oa":true,"landing_page_url":"https://hdl.handle.net/11311/1302985","pdf_url":null,"source":{"id":"https://openalex.org/S4306400312","display_name":"Virtual Community of Pathological Anatomy (University of Castilla La Mancha)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I79189158","host_organization_name":"University of Castilla-La Mancha","host_organization_lineage":["https://openalex.org/I79189158"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"doi:10.1109/access.2025.3629347","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3629347","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G5191008139","display_name":null,"funder_award_id":"2024-5-E.0","funder_id":"https://openalex.org/F4320322256","funder_display_name":"Agenzia Spaziale Italiana"},{"id":"https://openalex.org/G6897894512","display_name":null,"funder_award_id":"I53D24000060005","funder_id":"https://openalex.org/F4320331528","funder_display_name":"Ministero dell'Universit\u00e0 e della Ricerca"}],"funders":[{"id":"https://openalex.org/F4320322256","display_name":"Agenzia Spaziale Italiana","ror":"https://ror.org/034zgem50"},{"id":"https://openalex.org/F4320331528","display_name":"Ministero dell'Universit\u00e0 e della Ricerca","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W55912154","https://openalex.org/W1969549583","https://openalex.org/W2036032477","https://openalex.org/W2036223281","https://openalex.org/W2099399130","https://openalex.org/W2492260685","https://openalex.org/W2496675188","https://openalex.org/W2997591727","https://openalex.org/W3008301824","https://openalex.org/W3047099336","https://openalex.org/W3048902956","https://openalex.org/W3093491546","https://openalex.org/W4378192127","https://openalex.org/W4388206790","https://openalex.org/W4404688895"],"related_works":[],"abstract_inverted_index":{"This":[0,100],"paper":[1],"proposes":[2],"a":[3,103],"novel":[4],"approach":[5,38,79],"combining":[6],"prior":[7],"physics-based":[8],"Gaussian":[9],"Process":[10],"Regression":[11],"(GPR)":[12],"with":[13,74,80,119],"Bayesian":[14,81],"Optimization":[15,82],"for":[16,83,106],"efficient":[17,107],"and":[18,28,41,89,108,116],"accurate":[19,42,109],"electromagnetic":[20],"near-field":[21,110],"scanning.":[22],"By":[23],"considering":[24],"the":[25,31,36,45,64,114,120],"measurement":[26],"setup":[27],"properties":[29],"of":[30,44,58,67],"Device":[32],"Under":[33],"Test":[34],"(DUT),":[35],"proposed":[37],"enables":[39],"fast":[40],"construction":[43],"radiated":[46],"fields\u2019":[47],"surrogate":[48],"models.":[49],"The":[50],"GPR":[51],"kernel":[52],"parameters":[53],"are":[54],"efficiently":[55],"obtained":[56],"independently":[57],"measured":[59],"data-samples":[60],"by":[61],"fitting":[62],"on":[63],"radiation":[65],"pattern":[66],"suitable":[68],"infinitesimal":[69],"dipoles,":[70],"thus":[71],"ensuring":[72],"consistency":[73],"physical":[75],"behavior.":[76],"Integrating":[77],"this":[78],"adaptive":[84],"sampling":[85],"demonstrates":[86],"improved":[87],"accuracy":[88],"computational":[90],"efficiency":[91],"compared":[92],"to":[93],"traditional":[94],"methods,":[95],"while":[96],"maintaining":[97],"low":[98],"overhead.":[99],"framework":[101],"offers":[102],"powerful":[104],"tool":[105],"scanning,":[111],"potentially":[112],"reducing":[113],"time":[115],"cost":[117],"associated":[118],"scanning":[121],"process.":[122]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2025-11-05T00:00:00"}