{"id":"https://openalex.org/W4415707115","doi":"https://doi.org/10.1109/access.2025.3627492","title":"Cryogenic Current-Steering DAC Design and Validation Using Transistor Modeling Based on Physics-Inspired Residual Neural Network","display_name":"Cryogenic Current-Steering DAC Design and Validation Using Transistor Modeling Based on Physics-Inspired Residual Neural Network","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4415707115","doi":"https://doi.org/10.1109/access.2025.3627492"},"language":"en","primary_location":{"id":"doi:10.1109/access.2025.3627492","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3627492","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2025.3627492","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5012846930","display_name":"Yaoyu Li","orcid":"https://orcid.org/0000-0002-6621-1308"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yaoyu Li","raw_affiliation_strings":["School of Integrated Circuits, Tsinghua University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091186752","display_name":"Yanshu Guo","orcid":"https://orcid.org/0000-0002-5800-8799"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Yanshu Guo","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Jurong West, Singapore","School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Jurong West, Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100432258","display_name":"Siqi Zhang","orcid":"https://orcid.org/0000-0002-9815-4395"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Siqi Zhang","raw_affiliation_strings":["School of Integrated Circuits, Tsinghua University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101225895","display_name":"Heyue Li","orcid":null},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Heyue Li","raw_affiliation_strings":["School of Integrated Circuits, Tsinghua University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100356864","display_name":"Zhihua Wang","orcid":"https://orcid.org/0000-0001-6567-0759"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhihua Wang","raw_affiliation_strings":["School of Integrated Circuits, Tsinghua University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016044907","display_name":"Yuanjin Zheng","orcid":"https://orcid.org/0000-0002-5768-367X"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Yuanjin Zheng","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Jurong West, Singapore","School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Jurong West, Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5063888012","display_name":"Hanjun Jiang","orcid":"https://orcid.org/0000-0003-4911-0748"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hanjun Jiang","raw_affiliation_strings":["School of Integrated Circuits, Tsinghua University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5012846930"],"corresponding_institution_ids":["https://openalex.org/I99065089"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.30878406,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"13","issue":null,"first_page":"187226","last_page":"187235"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.906000018119812,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.906000018119812,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.018300000578165054,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11248","display_name":"Advanced Power Amplifier Design","score":0.015799999237060547,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/residual","display_name":"Residual","score":0.6603999733924866},{"id":"https://openalex.org/keywords/multilayer-perceptron","display_name":"Multilayer perceptron","score":0.5976999998092651},{"id":"https://openalex.org/keywords/standard-deviation","display_name":"Standard deviation","score":0.5212000012397766},{"id":"https://openalex.org/keywords/mean-squared-error","display_name":"Mean squared error","score":0.5030999779701233},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.4862000048160553},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.47429999709129333},{"id":"https://openalex.org/keywords/spurious-free-dynamic-range","display_name":"Spurious-free dynamic range","score":0.43630000948905945},{"id":"https://openalex.org/keywords/interpretability","display_name":"Interpretability","score":0.39399999380111694}],"concepts":[{"id":"https://openalex.org/C155512373","wikidata":"https://www.wikidata.org/wiki/Q287450","display_name":"Residual","level":2,"score":0.6603999733924866},{"id":"https://openalex.org/C179717631","wikidata":"https://www.wikidata.org/wiki/Q2991667","display_name":"Multilayer perceptron","level":3,"score":0.5976999998092651},{"id":"https://openalex.org/C22679943","wikidata":"https://www.wikidata.org/wiki/Q159375","display_name":"Standard deviation","level":2,"score":0.5212000012397766},{"id":"https://openalex.org/C139945424","wikidata":"https://www.wikidata.org/wiki/Q1940696","display_name":"Mean squared error","level":2,"score":0.5030999779701233},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.49540001153945923},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.4862000048160553},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.47429999709129333},{"id":"https://openalex.org/C119293636","wikidata":"https://www.wikidata.org/wiki/Q657480","display_name":"Spurious-free dynamic range","level":3,"score":0.43630000948905945},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4041000008583069},{"id":"https://openalex.org/C2781067378","wikidata":"https://www.wikidata.org/wiki/Q17027399","display_name":"Interpretability","level":2,"score":0.39399999380111694},{"id":"https://openalex.org/C71907059","wikidata":"https://www.wikidata.org/wiki/Q223323","display_name":"Root mean square","level":2,"score":0.3849000036716461},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3499000072479248},{"id":"https://openalex.org/C115051666","wikidata":"https://www.wikidata.org/wiki/Q6522493","display_name":"Ranging","level":2,"score":0.33660000562667847},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.328000009059906},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.3246999979019165},{"id":"https://openalex.org/C2778067643","wikidata":"https://www.wikidata.org/wiki/Q166507","display_name":"Interval (graph theory)","level":2,"score":0.30079999566078186},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.29989999532699585},{"id":"https://openalex.org/C2776310492","wikidata":"https://www.wikidata.org/wiki/Q3271420","display_name":"12-bit","level":3,"score":0.29249998927116394},{"id":"https://openalex.org/C179725390","wikidata":"https://www.wikidata.org/wiki/Q192116","display_name":"Cryogenics","level":2,"score":0.27869999408721924},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.257999986410141},{"id":"https://openalex.org/C193523891","wikidata":"https://www.wikidata.org/wiki/Q1771950","display_name":"dBc","level":3,"score":0.2500999867916107}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/access.2025.3627492","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3627492","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:dr.ntu.edu.sg:10356/208353","is_oa":false,"landing_page_url":"https://hdl.handle.net/10356/208353","pdf_url":null,"source":{"id":"https://openalex.org/S4306402609","display_name":"DR-NTU (Nanyang Technological University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I172675005","host_organization_name":"Nanyang Technological University","host_organization_lineage":["https://openalex.org/I172675005"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":null,"raw_type":"Journal Article"},{"id":"pmh:oai:doaj.org/article:5007749133d24c26a0948c9753560054","is_oa":true,"landing_page_url":"https://doaj.org/article/5007749133d24c26a0948c9753560054","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 13, Pp 187226-187235 (2025)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2025.3627492","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3627492","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":[],"abstract_inverted_index":{"This":[0,98],"paper":[1],"presents":[2],"a":[3,7,28,63,78,105,123,141,206],"method":[4,26],"for":[5],"designing":[6],"cryogenic":[8,17,46,202],"current-steering":[9],"digital-to-analog":[10],"converter":[11],"(CS-DAC),":[12],"particularly":[13],"in":[14,49,110,152],"cases":[15],"where":[16],"precise":[18],"device":[19],"models":[20],"are":[21,155],"unavailable.":[22],"The":[23,52,74,130],"proposed":[24,201],"design":[25,104],"utilizes":[27],"physics-inspired":[29,64],"residual":[30,60],"multilayer":[31,56],"perceptron":[32,57],"(Phy-ResMLP)":[33],"network":[34,54],"to":[35,103,165,172,180],"model":[36,76,99],"the":[37,69,95,188,193,200],"current-voltage":[38],"(<italic":[39],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[40],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">I-V</i>)":[41],"and":[42,62,72,175,196],"mismatch":[43],"characteristics":[44],"of":[45,85,94,119,126,144,192,209],"transistor":[47,203],"pairs":[48],"28-nm":[50,153],"technology.":[51],"Phy-ResMLP":[53],"comprises":[55],"(MLP)":[58],"based":[59,198],"blocks":[61],"loss":[65],"function,":[66],"which":[67,88],"improves":[68],"model's":[70],"interpretability":[71],"accuracy.":[73],"established":[75],"demonstrates":[77],"minimum":[79],"root":[80],"mean":[81,207],"square":[82],"error":[83,208],"(RMSE)":[84],"only":[86],"0.95%,":[87],"is":[89,100,137],"27%":[90],"lower":[91],"than":[92,211],"that":[93],"state-of-the-art":[96],"models.":[97],"then":[101],"applied":[102],"10-bit,":[106],"2GS/s":[107],"CS-DAC,":[108],"resulting":[109],"an":[111],"average":[112,131],"simulated":[113,132,194],"differential":[114],"non-linearity":[115,117],"(DNL)/integral":[116],"(INL)":[118],"1.03/2.34":[120],"LSB,":[121,128,167,174],"with":[122,140,159,205],"standard":[124,142],"deviation":[125,143],"0.22/0.63":[127],"respectively.":[129],"spurious-free":[133],"dynamic":[134],"range":[135],"(SFDR)":[136],"50.39":[138],"dBc,":[139],"4.11":[145],"dBc.":[146,182],"In":[147],"addition,":[148],"10":[149],"fabricated":[150],"CS-DACs":[151],"technology":[154],"measured":[156,184],"at":[157],"4K,":[158],"DNL":[160],"ranging":[161],"from":[162,169,177],"0.92":[163],"LSB":[164,171],"1.15":[166],"INL":[168],"2.18":[170],"2.68":[173],"SFDR":[176,197],"49.4":[178],"dBc":[179],"51.3":[181],"These":[183],"values":[185],"fall":[186],"within":[187],"\u00b11-\u03c3":[189],"confidence":[190],"interval":[191],"DNL/INL":[195],"on":[199],"model,":[204],"less":[210],"3%.":[212]},"counts_by_year":[],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-30T00:00:00"}