{"id":"https://openalex.org/W4415366466","doi":"https://doi.org/10.1109/access.2025.3623952","title":"Lightweight Feature Mining Network Research Based on LCFMNet for Detection of Defects in Insulators","display_name":"Lightweight Feature Mining Network Research Based on LCFMNet for Detection of Defects in Insulators","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4415366466","doi":"https://doi.org/10.1109/access.2025.3623952"},"language":"en","primary_location":{"id":"doi:10.1109/access.2025.3623952","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3623952","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2025.3623952","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Yan Gao","orcid":"https://orcid.org/0009-0008-5521-4694"},"institutions":[{"id":"https://openalex.org/I49232843","display_name":"Changchun University","ror":"https://ror.org/02an57k10","country_code":"CN","type":"education","lineage":["https://openalex.org/I49232843"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yan Gao","raw_affiliation_strings":["School of Electrical and Information Engineering, Changchun Guanghua University, Changchun, China"],"raw_orcid":"https://orcid.org/0009-0008-5521-4694","affiliations":[{"raw_affiliation_string":"School of Electrical and Information Engineering, Changchun Guanghua University, Changchun, China","institution_ids":["https://openalex.org/I49232843"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Chen Jiang","orcid":null},"institutions":[{"id":"https://openalex.org/I49232843","display_name":"Changchun University","ror":"https://ror.org/02an57k10","country_code":"CN","type":"education","lineage":["https://openalex.org/I49232843"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chen Jiang","raw_affiliation_strings":["Changchun No. 52 Middle School Hexing Experimental School, Changchun, China","Changchun No.52 Middle School Hexing Experimental School, Changchun, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Changchun No. 52 Middle School Hexing Experimental School, Changchun, China","institution_ids":["https://openalex.org/I49232843"]},{"raw_affiliation_string":"Changchun No.52 Middle School Hexing Experimental School, Changchun, China","institution_ids":["https://openalex.org/I49232843"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5107871890","display_name":"Yuanling Liu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210102505","display_name":"Jilin Engineering Normal University","ror":"https://ror.org/018gks972","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210102505"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuanling Liu","raw_affiliation_strings":["College of Electrical and Information Engineering, Jilin Engineering Normal University, Changchun, China"],"raw_orcid":"https://orcid.org/0009-0006-1317-7616","affiliations":[{"raw_affiliation_string":"College of Electrical and Information Engineering, Jilin Engineering Normal University, Changchun, China","institution_ids":["https://openalex.org/I4210102505"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I49232843"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.35617129,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"13","issue":null,"first_page":"185637","last_page":"185644"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14225","display_name":"Advanced Sensor and Control Systems","score":0.8791000247001648,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14225","display_name":"Advanced Sensor and Control Systems","score":0.8791000247001648,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.8062000274658203,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13717","display_name":"Advanced Algorithms and Applications","score":0.8052999973297119,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/insulator","display_name":"Insulator (electricity)","score":0.6230000257492065},{"id":"https://openalex.org/keywords/object-detection","display_name":"Object detection","score":0.5641000270843506},{"id":"https://openalex.org/keywords/convolution","display_name":"Convolution (computer science)","score":0.5616999864578247},{"id":"https://openalex.org/keywords/electric-power-transmission","display_name":"Electric power transmission","score":0.5047000050544739},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.4991999864578247},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.47429999709129333},{"id":"https://openalex.org/keywords/grid","display_name":"Grid","score":0.43309998512268066}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7670999765396118},{"id":"https://openalex.org/C212702","wikidata":"https://www.wikidata.org/wiki/Q178150","display_name":"Insulator (electricity)","level":2,"score":0.6230000257492065},{"id":"https://openalex.org/C2776151529","wikidata":"https://www.wikidata.org/wiki/Q3045304","display_name":"Object detection","level":3,"score":0.5641000270843506},{"id":"https://openalex.org/C45347329","wikidata":"https://www.wikidata.org/wiki/Q5166604","display_name":"Convolution (computer science)","level":3,"score":0.5616999864578247},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5188000202178955},{"id":"https://openalex.org/C140311924","wikidata":"https://www.wikidata.org/wiki/Q200928","display_name":"Electric power transmission","level":2,"score":0.5047000050544739},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.4991999864578247},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.47429999709129333},{"id":"https://openalex.org/C187691185","wikidata":"https://www.wikidata.org/wiki/Q2020720","display_name":"Grid","level":2,"score":0.43309998512268066},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.41920000314712524},{"id":"https://openalex.org/C33441834","wikidata":"https://www.wikidata.org/wiki/Q693004","display_name":"Transmission line","level":2,"score":0.4059000015258789},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.4027999937534332},{"id":"https://openalex.org/C761482","wikidata":"https://www.wikidata.org/wiki/Q118093","display_name":"Transmission (telecommunications)","level":2,"score":0.36640000343322754},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.3662000000476837},{"id":"https://openalex.org/C2983254600","wikidata":"https://www.wikidata.org/wiki/Q1096907","display_name":"Power grid","level":3,"score":0.33559998869895935},{"id":"https://openalex.org/C81669768","wikidata":"https://www.wikidata.org/wiki/Q2359161","display_name":"Precision and recall","level":2,"score":0.3294999897480011},{"id":"https://openalex.org/C64876066","wikidata":"https://www.wikidata.org/wiki/Q5141226","display_name":"Cognitive neuroscience of visual object recognition","level":3,"score":0.290800005197525},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.2872999906539917},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.27410000562667847},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.26409998536109924}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2025.3623952","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3623952","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:18821364e37b4a32a76f8eec38e016fa","is_oa":true,"landing_page_url":"https://doaj.org/article/18821364e37b4a32a76f8eec38e016fa","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 13, Pp 185637-185644 (2025)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2025.3623952","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3623952","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W639708223","https://openalex.org/W2962766617","https://openalex.org/W2990763144","https://openalex.org/W3127379978","https://openalex.org/W3155079234","https://openalex.org/W4285008616","https://openalex.org/W4292387496","https://openalex.org/W4292972665","https://openalex.org/W4293057111","https://openalex.org/W4293704585","https://openalex.org/W4377981744","https://openalex.org/W4383346970","https://openalex.org/W4385370866","https://openalex.org/W4391092744","https://openalex.org/W4396863911","https://openalex.org/W4399946473","https://openalex.org/W4400920396","https://openalex.org/W4405777384","https://openalex.org/W4406094158","https://openalex.org/W4406208448","https://openalex.org/W4409209908","https://openalex.org/W4409343068"],"related_works":[],"abstract_inverted_index":{"Reliable":[0],"and":[1,22,65,73,88,112],"efficient":[2],"identification":[3],"of":[4,26,106,110,115,123],"insulator":[5,41,128],"defects":[6],"in":[7,44,131],"aerial":[8],"transmission":[9],"line":[10],"images":[11],"remains":[12],"challenging,":[13],"largely":[14],"due":[15],"to":[16],"diverse":[17],"environmental":[18],"factors,":[19],"cluttered":[20],"backgrounds,":[21],"the":[23,120],"small":[24],"scale":[25],"targets.":[27],"To":[28],"address":[29],"this,":[30],"we":[31],"introduce":[32],"a":[33,52,62,104,108,113],"lightweight":[34],"detection":[35,101,130],"framework,":[36],"LCFMNet,":[37],"specifically":[38],"designed":[39],"for":[40,58,69,125],"defect":[42,129],"recognition":[43],"drone-acquired":[45],"imagery.":[46],"LCFMNet":[47,96,124],"integrates":[48],"three":[49],"key":[50],"modules:":[51],"Lightweight":[53],"Feature":[54],"Aggregation":[55],"Module":[56],"(LFAM)":[57],"multi-scale":[59],"feature":[60],"refinement,":[61],"Content-Guided":[63],"Convolution":[64],"Self-Attention":[66],"(CGCA)":[67],"mechanism":[68],"enhanced":[70],"spatial-channel":[71],"interaction,":[72],"Focaler-MPDIoU,":[74],"an":[75],"improved":[76],"IoU-based":[77],"loss":[78],"function":[79],"that":[80,95],"emphasizes":[81],"difficult":[82],"samples":[83],"via":[84],"dynamic":[85],"gradient":[86],"reweighting":[87],"position-sensitive":[89],"distance":[90],"constraints.":[91],"Experimental":[92],"evaluation":[93],"demonstrates":[94],"outperforms":[97],"several":[98],"mainstream":[99],"object":[100],"models,":[102],"achieving":[103],"mAP":[105],"91.5%,":[107],"precision":[109],"93.1%,":[111],"recall":[114],"81.6%.":[116],"These":[117],"findings":[118],"demonstrate":[119],"practical":[121],"value":[122],"automated,":[126],"high-precision":[127],"real-world":[132],"power":[133],"grid":[134],"maintenance.":[135]},"counts_by_year":[],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2025-10-21T00:00:00"}