{"id":"https://openalex.org/W4414603128","doi":"https://doi.org/10.1109/access.2025.3615447","title":"Thermal Analysis and Switching Performance of a 1.7 kV SiC Power MOSFET Under High-Frequency Operation and Double Pulse Testing","display_name":"Thermal Analysis and Switching Performance of a 1.7 kV SiC Power MOSFET Under High-Frequency Operation and Double Pulse Testing","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4414603128","doi":"https://doi.org/10.1109/access.2025.3615447"},"language":"en","primary_location":{"id":"doi:10.1109/access.2025.3615447","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3615447","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2025.3615447","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5064922557","display_name":"M. Seth","orcid":null},"institutions":[{"id":"https://openalex.org/I32589535","display_name":"Technical University of Malaysia Malacca","ror":"https://ror.org/01xb6rs26","country_code":"MY","type":"education","lineage":["https://openalex.org/I32589535"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"Muhammad Najmi Seth","raw_affiliation_strings":["Faculty of Electronics and Computer Engineering and Technology, Universiti Teknikal Malaysia Melaka, Durian Tunggal, Malaysia","Faculty of Electronics and Computer Engineering and Technology, Universiti Teknikal Malaysia Melaka, Hang Tuah Jaya, Durian Tunggal, Malaysia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Electronics and Computer Engineering and Technology, Universiti Teknikal Malaysia Melaka, Durian Tunggal, Malaysia","institution_ids":["https://openalex.org/I32589535"]},{"raw_affiliation_string":"Faculty of Electronics and Computer Engineering and Technology, Universiti Teknikal Malaysia Melaka, Hang Tuah Jaya, Durian Tunggal, Malaysia","institution_ids":["https://openalex.org/I32589535"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5119761185","display_name":"N. A. Zulkifle","orcid":null},"institutions":[{"id":"https://openalex.org/I32589535","display_name":"Technical University of Malaysia Malacca","ror":"https://ror.org/01xb6rs26","country_code":"MY","type":"education","lineage":["https://openalex.org/I32589535"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"Nurul Amirah Zulkifle","raw_affiliation_strings":["Faculty of Electronics and Computer Engineering and Technology, Universiti Teknikal Malaysia Melaka, Durian Tunggal, Malaysia","Faculty of Electronics and Computer Engineering and Technology, Universiti Teknikal Malaysia Melaka, Hang Tuah Jaya, Durian Tunggal, Malaysia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Electronics and Computer Engineering and Technology, Universiti Teknikal Malaysia Melaka, Durian Tunggal, Malaysia","institution_ids":["https://openalex.org/I32589535"]},{"raw_affiliation_string":"Faculty of Electronics and Computer Engineering and Technology, Universiti Teknikal Malaysia Melaka, Hang Tuah Jaya, Durian Tunggal, Malaysia","institution_ids":["https://openalex.org/I32589535"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074795512","display_name":"Nur Syamimi Noorasid","orcid":null},"institutions":[{"id":"https://openalex.org/I32589535","display_name":"Technical University of Malaysia Malacca","ror":"https://ror.org/01xb6rs26","country_code":"MY","type":"education","lineage":["https://openalex.org/I32589535"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"Nur Syamimi Noorasid","raw_affiliation_strings":["Faculty of Electronics and Computer Engineering and Technology, Universiti Teknikal Malaysia Melaka, Durian Tunggal, Malaysia","Faculty of Electronics and Computer Engineering and Technology, Universiti Teknikal Malaysia Melaka, Hang Tuah Jaya, Durian Tunggal, Malaysia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Electronics and Computer Engineering and Technology, Universiti Teknikal Malaysia Melaka, Durian Tunggal, Malaysia","institution_ids":["https://openalex.org/I32589535"]},{"raw_affiliation_string":"Faculty of Electronics and Computer Engineering and Technology, Universiti Teknikal Malaysia Melaka, Hang Tuah Jaya, Durian Tunggal, Malaysia","institution_ids":["https://openalex.org/I32589535"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Ghazali Omar","orcid":null},"institutions":[{"id":"https://openalex.org/I32589535","display_name":"Technical University of Malaysia Malacca","ror":"https://ror.org/01xb6rs26","country_code":"MY","type":"education","lineage":["https://openalex.org/I32589535"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"Ghazali Omar","raw_affiliation_strings":["Faculty of Electronics and Computer Engineering and Technology, Universiti Teknikal Malaysia Melaka, Durian Tunggal, Malaysia","Faculty of Electronics and Computer Engineering and Technology, Universiti Teknikal Malaysia Melaka, Hang Tuah Jaya, Durian Tunggal, Malaysia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Electronics and Computer Engineering and Technology, Universiti Teknikal Malaysia Melaka, Durian Tunggal, Malaysia","institution_ids":["https://openalex.org/I32589535"]},{"raw_affiliation_string":"Faculty of Electronics and Computer Engineering and Technology, Universiti Teknikal Malaysia Melaka, Hang Tuah Jaya, Durian Tunggal, Malaysia","institution_ids":["https://openalex.org/I32589535"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069834528","display_name":"Ahmad Nizamuddin Muhammad Mustafa","orcid":"https://orcid.org/0000-0002-7797-4968"},"institutions":[{"id":"https://openalex.org/I32589535","display_name":"Technical University of Malaysia Malacca","ror":"https://ror.org/01xb6rs26","country_code":"MY","type":"education","lineage":["https://openalex.org/I32589535"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"Ahmad Nizamuddin","raw_affiliation_strings":["Faculty of Electronics and Computer Engineering and Technology, Universiti Teknikal Malaysia Melaka, Durian Tunggal, Malaysia","Faculty of Electronics and Computer Engineering and Technology, Universiti Teknikal Malaysia Melaka, Hang Tuah Jaya, Durian Tunggal, Malaysia"],"raw_orcid":"https://orcid.org/0000-0002-7797-4968","affiliations":[{"raw_affiliation_string":"Faculty of Electronics and Computer Engineering and Technology, Universiti Teknikal Malaysia Melaka, Durian Tunggal, Malaysia","institution_ids":["https://openalex.org/I32589535"]},{"raw_affiliation_string":"Faculty of Electronics and Computer Engineering and Technology, Universiti Teknikal Malaysia Melaka, Hang Tuah Jaya, Durian Tunggal, Malaysia","institution_ids":["https://openalex.org/I32589535"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5079439998","display_name":"Faiz Arith","orcid":"https://orcid.org/0000-0002-6459-8369"},"institutions":[{"id":"https://openalex.org/I32589535","display_name":"Technical University of Malaysia Malacca","ror":"https://ror.org/01xb6rs26","country_code":"MY","type":"education","lineage":["https://openalex.org/I32589535"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"Faiz Arith","raw_affiliation_strings":["Faculty of Electronics and Computer Engineering and Technology, Universiti Teknikal Malaysia Melaka, Durian Tunggal, Malaysia","Faculty of Electronics and Computer Engineering and Technology, Universiti Teknikal Malaysia Melaka, Hang Tuah Jaya, Durian Tunggal, Malaysia"],"raw_orcid":"https://orcid.org/0000-0002-6459-8369","affiliations":[{"raw_affiliation_string":"Faculty of Electronics and Computer Engineering and Technology, Universiti Teknikal Malaysia Melaka, Durian Tunggal, Malaysia","institution_ids":["https://openalex.org/I32589535"]},{"raw_affiliation_string":"Faculty of Electronics and Computer Engineering and Technology, Universiti Teknikal Malaysia Melaka, Hang Tuah Jaya, Durian Tunggal, Malaysia","institution_ids":["https://openalex.org/I32589535"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I32589535"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.3075,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.55164293,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"13","issue":null,"first_page":"172617","last_page":"172625"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.9922999739646912,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9896000027656555,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.7533000111579895},{"id":"https://openalex.org/keywords/power-mosfet","display_name":"Power MOSFET","score":0.6108999848365784},{"id":"https://openalex.org/keywords/inductor","display_name":"Inductor","score":0.5971999764442444},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.536300003528595},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4950000047683716},{"id":"https://openalex.org/keywords/power-semiconductor-device","display_name":"Power semiconductor device","score":0.48010000586509705},{"id":"https://openalex.org/keywords/thermal-conduction","display_name":"Thermal conduction","score":0.46209999918937683},{"id":"https://openalex.org/keywords/silicon-carbide","display_name":"Silicon carbide","score":0.46050000190734863},{"id":"https://openalex.org/keywords/dissipation","display_name":"Dissipation","score":0.45739999413490295}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8278999924659729},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.7533000111579895},{"id":"https://openalex.org/C88653102","wikidata":"https://www.wikidata.org/wiki/Q570553","display_name":"Power MOSFET","level":5,"score":0.6108999848365784},{"id":"https://openalex.org/C144534570","wikidata":"https://www.wikidata.org/wiki/Q5325","display_name":"Inductor","level":3,"score":0.5971999764442444},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5871999859809875},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.536300003528595},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4950000047683716},{"id":"https://openalex.org/C129014197","wikidata":"https://www.wikidata.org/wiki/Q906544","display_name":"Power semiconductor device","level":3,"score":0.48010000586509705},{"id":"https://openalex.org/C172100665","wikidata":"https://www.wikidata.org/wiki/Q7465774","display_name":"Thermal conduction","level":2,"score":0.46209999918937683},{"id":"https://openalex.org/C2780722187","wikidata":"https://www.wikidata.org/wiki/Q412356","display_name":"Silicon carbide","level":2,"score":0.46050000190734863},{"id":"https://openalex.org/C135402231","wikidata":"https://www.wikidata.org/wiki/Q898440","display_name":"Dissipation","level":2,"score":0.45739999413490295},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4235999882221222},{"id":"https://openalex.org/C97039730","wikidata":"https://www.wikidata.org/wiki/Q552565","display_name":"Pulsed power","level":3,"score":0.4212000072002411},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.4174000024795532},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.39100000262260437},{"id":"https://openalex.org/C199310435","wikidata":"https://www.wikidata.org/wiki/Q7659121","display_name":"Switching time","level":2,"score":0.34880000352859497},{"id":"https://openalex.org/C129446986","wikidata":"https://www.wikidata.org/wiki/Q542419","display_name":"Thermal analysis","level":3,"score":0.3319999873638153},{"id":"https://openalex.org/C2780167933","wikidata":"https://www.wikidata.org/wiki/Q1550652","display_name":"Pulse (music)","level":3,"score":0.3264000117778778},{"id":"https://openalex.org/C92746544","wikidata":"https://www.wikidata.org/wiki/Q585184","display_name":"Pulse-width modulation","level":3,"score":0.31610000133514404},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.30640000104904175},{"id":"https://openalex.org/C4775677","wikidata":"https://www.wikidata.org/wiki/Q7449393","display_name":"Semiconductor device modeling","level":3,"score":0.2840999960899353},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.2816999852657318},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.2808000147342682},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2806999981403351},{"id":"https://openalex.org/C137693562","wikidata":"https://www.wikidata.org/wiki/Q899628","display_name":"Thermal resistance","level":3,"score":0.28060001134872437},{"id":"https://openalex.org/C88182573","wikidata":"https://www.wikidata.org/wiki/Q1139740","display_name":"High voltage","level":3,"score":0.27900001406669617},{"id":"https://openalex.org/C97346530","wikidata":"https://www.wikidata.org/wiki/Q487005","display_name":"Thermal conductivity","level":2,"score":0.2777999937534332},{"id":"https://openalex.org/C178911571","wikidata":"https://www.wikidata.org/wiki/Q593143","display_name":"Power electronics","level":3,"score":0.2597000002861023},{"id":"https://openalex.org/C167781694","wikidata":"https://www.wikidata.org/wiki/Q6311800","display_name":"Junction temperature","level":3,"score":0.2578999996185303}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2025.3615447","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3615447","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:c539d2ff21764115bf394775e1781c82","is_oa":true,"landing_page_url":"https://doaj.org/article/c539d2ff21764115bf394775e1781c82","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 13, Pp 172617-172625 (2025)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2025.3615447","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3615447","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G5881419812","display_name":null,"funder_award_id":"IMAP/2024/FTKEK/ONSEMICONDUCTOR/IM0017","funder_id":"https://openalex.org/F4320321709","funder_display_name":"Ministry of Higher Education, Malaysia"}],"funders":[{"id":"https://openalex.org/F4320321709","display_name":"Ministry of Higher Education, Malaysia","ror":"https://ror.org/05mcs2t73"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1484679062","https://openalex.org/W2000600160","https://openalex.org/W2011681169","https://openalex.org/W2033185403","https://openalex.org/W2097149282","https://openalex.org/W2142491971","https://openalex.org/W2154459981","https://openalex.org/W2407675579","https://openalex.org/W2461874365","https://openalex.org/W2611295827","https://openalex.org/W2613350384","https://openalex.org/W2789058434","https://openalex.org/W2790731429","https://openalex.org/W2899335200","https://openalex.org/W2899484555","https://openalex.org/W2921420867","https://openalex.org/W3006564841","https://openalex.org/W4311222420","https://openalex.org/W4367597649","https://openalex.org/W4391916501","https://openalex.org/W4401766319"],"related_works":[],"abstract_inverted_index":{"This":[0],"study":[1],"presents":[2],"a":[3,147],"comprehensive":[4],"simulation":[5],"analysis":[6],"of":[7,172],"1.7":[8],"kV":[9],"SiC":[10,44,111,168,218],"Power":[11,219],"MOSFETs":[12,19,94,206,220],"(SiC)":[13],"compared":[14,198,235],"to":[15,69,80,199,236],"conventional":[16,237],"Si":[17,93,205,238],"power":[18,97],"(Si1":[20],"and":[21,29,50,99,124,132,151,177,191,211,228],"Si2)":[22],"focusing":[23],"on":[24],"thermal":[25,52,56,101,226],"behavior,":[26],"switching":[27,39],"performance,":[28,162],"efficiency":[30,212],"under":[31,89],"various":[32],"operating":[33],"conditions.":[34],"LTspice":[35],"simulations":[36],"over":[37],"5000":[38],"cycles":[40],"revealed":[41],"that":[42,217],"the":[43,90,110,200],"MOSFET":[45,112],"exhibited":[46],"lower":[47,225],"conduction":[48],"losses":[49],"superior":[51,114,229],"stability,":[53],"with":[54,170],"higher":[55,73,96,223],"fluctuations":[57,79],"at":[58,75,106,127,136,180],"50":[59],"kHz":[60,77],"(<inline-formula>":[61],"<tex-math":[62,82,138,153,182,187,193],"notation=\"LaTeX\">$0.32664~^{\\circ":[63],"}$":[64,84,140,184,189,195],"</tex-math></inline-formula>C":[65,85],"per":[66,86],"cycle)":[67],"due":[68],"prolonged":[70],"on-times,":[71],"while":[72,204],"frequencies":[74],"200":[76],"reduced":[78],"<inline-formula>":[81,137,152,181,186,192],"notation=\"LaTeX\">$0.13397~^{\\circ":[83],"cycle.":[87],"Meanwhile,":[88],"same":[91],"conditions,":[92],"experience":[95],"dissipation":[98],"poorer":[100],"management.":[102],"Double":[103],"pulse":[104],"testing":[105],"varying":[107],"temperatures":[108],"demonstrated":[109],"has":[113],"efficiency,":[115,224],"peaking":[116],"as":[117,119],"high":[118],"99.61":[120],"%,":[121,123],"99.55":[122],"99.44":[125],"%":[126],"500":[128],"V,":[129,131,134,174,176,203],"1000":[130],"1500":[133],"respectively,":[135,197],"notation=\"LaTeX\">$150~^{\\circ":[139,194],"</tex-math></inline-formula>C.":[141],"A":[142],"boost":[143],"converter":[144],"test":[145],"using":[146],"0.5":[148],"mH":[149],"inductor":[150],"notation=\"LaTeX\">$200~\\mu":[154],"$":[155],"</tex-math></inline-formula>F":[156],"capacitor":[157],"further":[158],"evaluated":[159],"energy":[160],"conversion":[161],"showing":[163],"minimal":[164],"voltage":[165,209],"deviation":[166],"in":[167,231],"MOSFETs,":[169],"outputs":[171],"1359.32":[173],"1360.57":[175],"1358.56":[178],"V":[179],"notation=\"LaTeX\">$25~^{\\circ":[183],"</tex-math></inline-formula>C,":[185,190,196],"notation=\"LaTeX\">$100~^{\\circ":[188],"theoretical":[201],"1360":[202],"displayed":[207],"greater":[208],"drops":[210],"losses.":[213],"These":[214],"results":[215],"confirm":[216],"provide":[221],"significantly":[222],"resistance,":[227],"performance":[230],"high-voltage,":[232],"high-power":[233],"applications":[234],"MOSFETs.":[239]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}