{"id":"https://openalex.org/W4414404739","doi":"https://doi.org/10.1109/access.2025.3612737","title":"A Noise Immune Physics Informed Data-Driven Digital Twin for Inverter Component Degradation Estimation","display_name":"A Noise Immune Physics Informed Data-Driven Digital Twin for Inverter Component Degradation Estimation","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4414404739","doi":"https://doi.org/10.1109/access.2025.3612737"},"language":"en","primary_location":{"id":"doi:10.1109/access.2025.3612737","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3612737","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2025.3612737","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5067678526","display_name":"Sukanta Roy","orcid":"https://orcid.org/0000-0001-6775-7727"},"institutions":[{"id":"https://openalex.org/I19700959","display_name":"Florida International University","ror":"https://ror.org/02gz6gg07","country_code":"US","type":"education","lineage":["https://openalex.org/I19700959"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sukanta Roy","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Florida International University, Miami, FL, USA"],"raw_orcid":"https://orcid.org/0000-0001-6775-7727","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Florida International University, Miami, FL, USA","institution_ids":["https://openalex.org/I19700959"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5010427742","display_name":"Arif I. Sarwat","orcid":"https://orcid.org/0000-0003-1179-438X"},"institutions":[{"id":"https://openalex.org/I19700959","display_name":"Florida International University","ror":"https://ror.org/02gz6gg07","country_code":"US","type":"education","lineage":["https://openalex.org/I19700959"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Arif Sarwat","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Florida International University, Miami, FL, USA"],"raw_orcid":"https://orcid.org/0000-0003-1179-438X","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Florida International University, Miami, FL, USA","institution_ids":["https://openalex.org/I19700959"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I19700959"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":1.4938,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.82941976,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":98},"biblio":{"volume":"13","issue":null,"first_page":"167165","last_page":"167177"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9556999802589417,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9556999802589417,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9325000047683716,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12576","display_name":"vaccines and immunoinformatics approaches","score":0.9114999771118164,"subfield":{"id":"https://openalex.org/subfields/1312","display_name":"Molecular Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/inverter","display_name":"Inverter","score":0.6434000134468079},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5759000182151794},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.5716000199317932},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.567799985408783},{"id":"https://openalex.org/keywords/ripple","display_name":"Ripple","score":0.5491999983787537},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.5090000033378601},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.48500001430511475},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.4675000011920929},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.4235999882221222}],"concepts":[{"id":"https://openalex.org/C11190779","wikidata":"https://www.wikidata.org/wiki/Q664575","display_name":"Inverter","level":3,"score":0.6434000134468079},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.613099992275238},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5759000182151794},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.5716000199317932},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.567799985408783},{"id":"https://openalex.org/C2779599953","wikidata":"https://www.wikidata.org/wiki/Q1776117","display_name":"Ripple","level":3,"score":0.5491999983787537},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5117999911308289},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.5090000033378601},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.48500001430511475},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.4675000011920929},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.4235999882221222},{"id":"https://openalex.org/C186370098","wikidata":"https://www.wikidata.org/wiki/Q442787","display_name":"Energy (signal processing)","level":2,"score":0.3553999960422516},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.30399999022483826},{"id":"https://openalex.org/C52421305","wikidata":"https://www.wikidata.org/wiki/Q1151499","display_name":"Particle filter","level":3,"score":0.3005000054836273},{"id":"https://openalex.org/C36390408","wikidata":"https://www.wikidata.org/wiki/Q1163067","display_name":"Digital filter","level":3,"score":0.3003999888896942},{"id":"https://openalex.org/C29265498","wikidata":"https://www.wikidata.org/wiki/Q7047719","display_name":"Noise measurement","level":3,"score":0.296099990606308},{"id":"https://openalex.org/C154318817","wikidata":"https://www.wikidata.org/wiki/Q2157249","display_name":"Parasitic capacitance","level":4,"score":0.29580000042915344},{"id":"https://openalex.org/C157808515","wikidata":"https://www.wikidata.org/wiki/Q4781508","display_name":"Filter capacitor","level":4,"score":0.2892000079154968},{"id":"https://openalex.org/C74193536","wikidata":"https://www.wikidata.org/wiki/Q574844","display_name":"Kernel (algebra)","level":2,"score":0.27790001034736633},{"id":"https://openalex.org/C178911571","wikidata":"https://www.wikidata.org/wiki/Q593143","display_name":"Power electronics","level":3,"score":0.2694000005722046},{"id":"https://openalex.org/C14036430","wikidata":"https://www.wikidata.org/wiki/Q3736076","display_name":"Function (biology)","level":2,"score":0.25949999690055847},{"id":"https://openalex.org/C102248274","wikidata":"https://www.wikidata.org/wiki/Q168388","display_name":"Adaptive filter","level":2,"score":0.25690001249313354},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.25429999828338623},{"id":"https://openalex.org/C14485415","wikidata":"https://www.wikidata.org/wiki/Q5384730","display_name":"Equivalent series resistance","level":3,"score":0.2531000077724457},{"id":"https://openalex.org/C84462506","wikidata":"https://www.wikidata.org/wiki/Q173142","display_name":"Digital signal processing","level":2,"score":0.2515999972820282}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2025.3612737","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3612737","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:1c989803f66e4247a087d189952bd667","is_oa":true,"landing_page_url":"https://doaj.org/article/1c989803f66e4247a087d189952bd667","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 13, Pp 167165-167177 (2025)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2025.3612737","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3612737","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G5774116715","display_name":"INTEGRATED APPROACH TO ANCILLARY PV COMPONENT RELIABILITY ASSESSMENT","funder_award_id":"DEEE0009349","funder_id":"https://openalex.org/F4320306084","funder_display_name":"U.S. Department of Energy"}],"funders":[{"id":"https://openalex.org/F4320306084","display_name":"U.S. Department of Energy","ror":"https://ror.org/01bj3aw27"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":36,"referenced_works":["https://openalex.org/W2321511728","https://openalex.org/W2765240847","https://openalex.org/W2906884508","https://openalex.org/W2994781927","https://openalex.org/W3012466011","https://openalex.org/W3023789249","https://openalex.org/W3033928040","https://openalex.org/W3043679992","https://openalex.org/W3048766677","https://openalex.org/W3085501598","https://openalex.org/W3094713455","https://openalex.org/W3111241302","https://openalex.org/W3117693976","https://openalex.org/W3130665833","https://openalex.org/W3191520353","https://openalex.org/W4206210281","https://openalex.org/W4280579169","https://openalex.org/W4280622574","https://openalex.org/W4283763259","https://openalex.org/W4292262010","https://openalex.org/W4309595892","https://openalex.org/W4312637559","https://openalex.org/W4312744427","https://openalex.org/W4384297631","https://openalex.org/W4388019148","https://openalex.org/W4390416024","https://openalex.org/W4391422325","https://openalex.org/W4391424170","https://openalex.org/W4392824843","https://openalex.org/W4400191581","https://openalex.org/W4400233629","https://openalex.org/W4400525348","https://openalex.org/W4401219777","https://openalex.org/W4402978841","https://openalex.org/W4403422130","https://openalex.org/W4408281085"],"related_works":[],"abstract_inverted_index":{"Performance":[0],"deviation":[1],"of":[2,30,155,170],"inverters":[3],"in":[4,78],"grid-connected":[5],"distributed":[6],"energy":[7],"resource":[8],"systems,":[9],"due":[10],"to":[11,68,150],"component":[12],"degradation":[13,65,93],"from":[14,53],"environmental":[15],"stressors,":[16],"is":[17,47,66],"a":[18,25,82,122],"major":[19],"reliability":[20],"concern.":[21],"This":[22,158],"work":[23],"presents":[24],"data-driven":[26,163],"digital":[27,45],"twin":[28],"(DT)":[29],"an":[31],"H-bridge":[32],"inverter":[33,55,156],"with":[34,121],"output":[35],"filtering,":[36],"developed":[37],"using":[38,49],"physics-informed":[39],"machine":[40],"learning":[41],"(PIML).":[42],"A":[43],"\u2018switching\u2019":[44],"model":[46],"created":[48],"experimental":[50],"data":[51],"collected":[52],"the":[54,75,116],"prototype":[56],"and":[57,74,104,126,137,152,166],"optimized":[58],"via":[59],"particle":[60],"swarm":[61],"optimization.":[62],"Later,":[63],"continuous":[64],"introduced":[67,108],"filter":[69,79],"parameters,":[70],"including":[71],"parasitic":[72,111],"resistances":[73],"aging/reliability":[76],"factor":[77],"components,":[80],"generating":[81],"comprehensive":[83],"dataset":[84],"for":[85,90,97,109],"training":[86],"supervised":[87],"ML":[88],"models,":[89],"fast,":[91],"accurate":[92],"estimation.":[94],"To":[95],"account":[96],"real-world":[98],"conditions,":[99],"measurement":[100,139],"noise\u2014such":[101],"as":[102],"ripple":[103],"ground":[105],"loop":[106],"effects\u2014is":[107],"capacitor":[110,131],"resistance.":[112],"In":[113],"this":[114],"scenario,":[115],"proposed":[117],"PIML-DT":[118,159],"approach,":[119],"enhanced":[120],"modified":[123],"loss":[124],"function":[125],"physical":[127],"constraints,":[128],"accurately":[129],"estimates":[130],"equivalent":[132],"series":[133],"resistance":[134],"despite":[135],"partial":[136],"noisy":[138],"data.":[140],"It":[141],"achieves":[142],"anR2of":[143],"0.6918":[144],"andRMSEof":[145],"0.0053,":[146],"demonstrating":[147],"strong":[148],"resilience":[149],"noise":[151],"effective":[153],"tracking":[154],"degradation.":[157],"approach":[160],"supports":[161],"reliable,":[162],"condition":[164],"monitoring":[165],"long-term":[167],"health":[168],"assessment":[169],"power":[171],"electronic":[172],"converters.":[173]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":1}],"updated_date":"2026-08-01T09:00:35.917206","created_date":"2025-10-10T00:00:00"}