{"id":"https://openalex.org/W4414229503","doi":"https://doi.org/10.1109/access.2025.3610632","title":"Integrated Fault Diagnosis Method for IGBT Open Circuit Fault and Voltage Sensor Fault in MMC Submodule","display_name":"Integrated Fault Diagnosis Method for IGBT Open Circuit Fault and Voltage Sensor Fault in MMC Submodule","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4414229503","doi":"https://doi.org/10.1109/access.2025.3610632"},"language":"en","primary_location":{"id":"doi:10.1109/access.2025.3610632","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3610632","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2025.3610632","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5050767133","display_name":"Yang Chen","orcid":"https://orcid.org/0000-0002-9347-1295"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Yang Chen","raw_affiliation_strings":["State Grid Jiangsu Electric Power Company Ltd. Research Institute, Nanjing, China","Electric Power Research Institute, State Grid Jiangsu Electric Power Co., Ltd., Nanjing, China"],"affiliations":[{"raw_affiliation_string":"State Grid Jiangsu Electric Power Company Ltd. Research Institute, Nanjing, China","institution_ids":[]},{"raw_affiliation_string":"Electric Power Research Institute, State Grid Jiangsu Electric Power Co., Ltd., Nanjing, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101559802","display_name":"Xuan Feng","orcid":"https://orcid.org/0000-0002-5149-1140"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Xuan Feng","raw_affiliation_strings":["State Grid Jiangsu Electric Power Company Ltd., Nanjing, China","State Grid Jiangsu Electric Power Co., Ltd., Nanjing, China"],"affiliations":[{"raw_affiliation_string":"State Grid Jiangsu Electric Power Company Ltd., Nanjing, China","institution_ids":[]},{"raw_affiliation_string":"State Grid Jiangsu Electric Power Co., Ltd., Nanjing, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100612868","display_name":"Xu Yang","orcid":"https://orcid.org/0000-0002-4383-4756"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yang Xu","raw_affiliation_strings":["State Grid Jiangsu Electric Power Company Ltd. Research Institute, Nanjing, China","Electric Power Research Institute, State Grid Jiangsu Electric Power Co., Ltd., Nanjing, China"],"affiliations":[{"raw_affiliation_string":"State Grid Jiangsu Electric Power Company Ltd. Research Institute, Nanjing, China","institution_ids":[]},{"raw_affiliation_string":"Electric Power Research Institute, State Grid Jiangsu Electric Power Co., Ltd., Nanjing, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100863608","display_name":"Tianxi Xie","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Tianxi Xie","raw_affiliation_strings":["State Grid Jiangsu Electric Power Company Ltd., Nanjing, China","State Grid Jiangsu Electric Power Co., Ltd., Nanjing, China"],"affiliations":[{"raw_affiliation_string":"State Grid Jiangsu Electric Power Company Ltd., Nanjing, China","institution_ids":[]},{"raw_affiliation_string":"State Grid Jiangsu Electric Power Co., Ltd., Nanjing, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100752005","display_name":"Ke Zhao","orcid":"https://orcid.org/0000-0003-3737-7357"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Ke Zhao","raw_affiliation_strings":["State Grid Jiangsu Electric Power Company Ltd. Research Institute, Nanjing, China","Electric Power Research Institute, State Grid Jiangsu Electric Power Co., Ltd., Nanjing, China"],"affiliations":[{"raw_affiliation_string":"State Grid Jiangsu Electric Power Company Ltd. Research Institute, Nanjing, China","institution_ids":[]},{"raw_affiliation_string":"Electric Power Research Institute, State Grid Jiangsu Electric Power Co., Ltd., Nanjing, China","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101238720","display_name":"Jinggang Yang","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jinggang Yang","raw_affiliation_strings":["State Grid Jiangsu Electric Power Company Ltd. Research Institute, Nanjing, China","Electric Power Research Institute, State Grid Jiangsu Electric Power Co., Ltd., Nanjing, China"],"affiliations":[{"raw_affiliation_string":"State Grid Jiangsu Electric Power Company Ltd. Research Institute, Nanjing, China","institution_ids":[]},{"raw_affiliation_string":"Electric Power Research Institute, State Grid Jiangsu Electric Power Co., Ltd., Nanjing, China","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5050767133"],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.7438,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.76970212,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"13","issue":null,"first_page":"173963","last_page":"173975"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14502","display_name":"High-Voltage Power Transmission Systems","score":0.9896000027656555,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14502","display_name":"High-Voltage Power Transmission Systems","score":0.9896000027656555,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9765999913215637,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12451","display_name":"Smart Grid and Power Systems","score":0.9677000045776367,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.6509000062942505},{"id":"https://openalex.org/keywords/insulated-gate-bipolar-transistor","display_name":"Insulated-gate bipolar transistor","score":0.6216999888420105},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6140999794006348},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.588699996471405},{"id":"https://openalex.org/keywords/fault-indicator","display_name":"Fault indicator","score":0.5220999717712402},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.489300012588501},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.47510001063346863},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.46540001034736633},{"id":"https://openalex.org/keywords/bridging","display_name":"Bridging (networking)","score":0.45260000228881836}],"concepts":[{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.6509000062942505},{"id":"https://openalex.org/C28285623","wikidata":"https://www.wikidata.org/wiki/Q176110","display_name":"Insulated-gate bipolar transistor","level":3,"score":0.6216999888420105},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6140999794006348},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.588699996471405},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5357000231742859},{"id":"https://openalex.org/C21267803","wikidata":"https://www.wikidata.org/wiki/Q5438159","display_name":"Fault indicator","level":4,"score":0.5220999717712402},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.489300012588501},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.47510001063346863},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.46540001034736633},{"id":"https://openalex.org/C174348530","wikidata":"https://www.wikidata.org/wiki/Q188635","display_name":"Bridging (networking)","level":2,"score":0.45260000228881836},{"id":"https://openalex.org/C144655898","wikidata":"https://www.wikidata.org/wiki/Q1161128","display_name":"Voltage source","level":3,"score":0.3691999912261963},{"id":"https://openalex.org/C68583231","wikidata":"https://www.wikidata.org/wiki/Q206907","display_name":"Short circuit","level":3,"score":0.3621000051498413},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.3515999913215637},{"id":"https://openalex.org/C2780704645","wikidata":"https://www.wikidata.org/wiki/Q9251458","display_name":"Observer (physics)","level":2,"score":0.351500004529953},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.33799999952316284},{"id":"https://openalex.org/C2778512005","wikidata":"https://www.wikidata.org/wiki/Q1545300","display_name":"H bridge","level":4,"score":0.3255999982357025},{"id":"https://openalex.org/C57631264","wikidata":"https://www.wikidata.org/wiki/Q1812203","display_name":"Open-circuit voltage","level":3,"score":0.319599986076355},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.3138999938964844},{"id":"https://openalex.org/C44351266","wikidata":"https://www.wikidata.org/wiki/Q1465532","display_name":"Voltage reference","level":3,"score":0.31290000677108765},{"id":"https://openalex.org/C129187525","wikidata":"https://www.wikidata.org/wiki/Q10858078","display_name":"Fault current limiter","level":4,"score":0.3077000081539154},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.29409998655319214},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.29350000619888306},{"id":"https://openalex.org/C2775982562","wikidata":"https://www.wikidata.org/wiki/Q996520","display_name":"Bridge circuit","level":3,"score":0.29089999198913574},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.2863999903202057},{"id":"https://openalex.org/C100776233","wikidata":"https://www.wikidata.org/wiki/Q2532492","display_name":"Bridge (graph theory)","level":2,"score":0.2784000039100647}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2025.3610632","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3610632","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:82021a234ce042c0b04d8b97b711d6f0","is_oa":true,"landing_page_url":"https://doaj.org/article/82021a234ce042c0b04d8b97b711d6f0","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 13, Pp 173963-173975 (2025)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2025.3610632","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3610632","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W1915388693","https://openalex.org/W2007244578","https://openalex.org/W2021871997","https://openalex.org/W2042876774","https://openalex.org/W2061146253","https://openalex.org/W2071760299","https://openalex.org/W2129242370","https://openalex.org/W2133617722","https://openalex.org/W2142351866","https://openalex.org/W2768367027","https://openalex.org/W2800911105","https://openalex.org/W2900706455","https://openalex.org/W2905963134","https://openalex.org/W2946091921","https://openalex.org/W2947775995","https://openalex.org/W2979435001","https://openalex.org/W3024005278","https://openalex.org/W3092459809","https://openalex.org/W3119945407","https://openalex.org/W3198746209","https://openalex.org/W4214862803","https://openalex.org/W4292979794","https://openalex.org/W4312730971","https://openalex.org/W4364321982","https://openalex.org/W4385834436","https://openalex.org/W4386175760","https://openalex.org/W4396505392"],"related_works":[],"abstract_inverted_index":{"The":[0,6,150],"MMC":[1],"system":[2,25],"contains":[3],"numerous":[4],"submodules.":[5],"frequent":[7],"occurrence":[8,74],"of":[9,75,90,147,154],"switch":[10],"open-circuit":[11,37,140],"fault":[12,20,51,76,119,145,157],"and":[13,39,64,77,138,142,152],"submodule":[14,35,89,104,126],"voltage":[15,40,62,69,106,128,148],"sensor":[16,41],"faults":[17,38,42,141],"have":[18],"similar":[19],"characteristics,":[21],"leads":[22],"to":[23,71,78,81,101,115,120,132],"degraded":[24],"reliability.":[26],"This":[27],"paper":[28],"proposes":[29],"an":[30],"integrated":[31],"diagnosis":[32,158],"method":[33],"for":[34,87],"IGBT":[36,136],"based":[43,56],"on":[44,57],"a":[45,95,121],"sliding":[46,96],"mode":[47,97],"observer.":[48],"Firstly,":[49],"the":[50,58,65,73,82,91,103,112,118,125,155],"detection":[52],"variable":[53],"is":[54,99,109,130],"designed":[55,100],"actual":[59],"bridge":[60,67,83,93],"arm":[61,68,84],"values":[63,70],"measured":[66,113],"detect":[72],"locate":[79,117],"it":[80],"level.":[85],"Then,":[86],"each":[88],"faulty":[92],"arm,":[94],"observer":[98],"estimate":[102],"capacitor":[105,127],"value,":[107],"which":[108],"compared":[110],"with":[111],"value":[114],"further":[116],"specific":[122,135],"submodule.":[123],"Finally,":[124],"information":[129],"utilized":[131],"distinguish":[133],"between":[134],"upper":[137],"lower":[139],"three":[143],"typical":[144],"types":[146],"sensors.":[149],"effectiveness":[151],"robustness":[153],"proposed":[156],"algorithm":[159],"are":[160],"validated":[161],"through":[162],"hardware-in-loop":[163],"simulation":[164],"results.":[165]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-03-26T15:22:09.906841","created_date":"2025-10-10T00:00:00"}