{"id":"https://openalex.org/W4413017592","doi":"https://doi.org/10.1109/access.2025.3596444","title":"A Data-Driven Approach for Predicting Remaining Useful Life of Semiconductor Devices Based on Machine Learning and Synthetic Data Generation: A Review and Case Study on SiC MOSFETs","display_name":"A Data-Driven Approach for Predicting Remaining Useful Life of Semiconductor Devices Based on Machine Learning and Synthetic Data Generation: A Review and Case Study on SiC MOSFETs","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4413017592","doi":"https://doi.org/10.1109/access.2025.3596444"},"language":"en","primary_location":{"id":"doi:10.1109/access.2025.3596444","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3596444","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2025.3596444","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5039907503","display_name":"Yarens J. Cruz","orcid":"https://orcid.org/0000-0002-6115-6071"},"institutions":[{"id":"https://openalex.org/I4210125392","display_name":"Centre for Automation and Robotics","ror":"https://ror.org/02wh02235","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210125392","https://openalex.org/I88060688"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Yarens J. Cruz","raw_affiliation_strings":["Centro de Automática y Robótica, CSIC-Universidad Politécnica de Madrid, Arganda del Rey, Madrid, Spain","Centro de Automática y Robótica,, CSIC-Universidad Politécnica de Madrid, Arganda del Rey, Madrid, Spain"],"raw_orcid":"https://orcid.org/0000-0002-6115-6071","affiliations":[{"raw_affiliation_string":"Centro de Automática y Robótica, CSIC-Universidad Politécnica de Madrid, Arganda del Rey, Madrid, Spain","institution_ids":["https://openalex.org/I4210125392"]},{"raw_affiliation_string":"Centro de Automática y Robótica,, CSIC-Universidad Politécnica de Madrid, Arganda del Rey, Madrid, Spain","institution_ids":["https://openalex.org/I4210125392"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068898971","display_name":"Fernando Casta\u00f1o","orcid":"https://orcid.org/0000-0002-4801-9224"},"institutions":[{"id":"https://openalex.org/I4210125392","display_name":"Centre for Automation and Robotics","ror":"https://ror.org/02wh02235","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210125392","https://openalex.org/I88060688"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Fernando Castano","raw_affiliation_strings":["Centro de Automática y Robótica, CSIC-Universidad Politécnica de Madrid, Arganda del Rey, Madrid, Spain","Centro de Automática y Robótica,, CSIC-Universidad Politécnica de Madrid, Arganda del Rey, Madrid, Spain"],"raw_orcid":"https://orcid.org/0000-0002-4801-9224","affiliations":[{"raw_affiliation_string":"Centro de Automática y Robótica, CSIC-Universidad Politécnica de Madrid, Arganda del Rey, Madrid, Spain","institution_ids":["https://openalex.org/I4210125392"]},{"raw_affiliation_string":"Centro de Automática y Robótica,, CSIC-Universidad Politécnica de Madrid, Arganda del Rey, Madrid, Spain","institution_ids":["https://openalex.org/I4210125392"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019127524","display_name":"Alberto Villalonga","orcid":"https://orcid.org/0000-0002-9268-0175"},"institutions":[{"id":"https://openalex.org/I4210125392","display_name":"Centre for Automation and Robotics","ror":"https://ror.org/02wh02235","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210125392","https://openalex.org/I88060688"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Alberto Villalonga","raw_affiliation_strings":["Centro de Automática y Robótica, CSIC-Universidad Politécnica de Madrid, Arganda del Rey, Madrid, Spain","Centro de Automática y Robótica,, CSIC-Universidad Politécnica de Madrid, Arganda del Rey, Madrid, Spain"],"raw_orcid":"https://orcid.org/0000-0002-9268-0175","affiliations":[{"raw_affiliation_string":"Centro de Automática y Robótica, CSIC-Universidad Politécnica de Madrid, Arganda del Rey, Madrid, Spain","institution_ids":["https://openalex.org/I4210125392"]},{"raw_affiliation_string":"Centro de Automática y Robótica,, CSIC-Universidad Politécnica de Madrid, Arganda del Rey, Madrid, Spain","institution_ids":["https://openalex.org/I4210125392"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076476313","display_name":"Madhav Mishra","orcid":"https://orcid.org/0000-0001-8278-8601"},"institutions":[{"id":"https://openalex.org/I2800664555","display_name":"RISE Research Institutes of Sweden","ror":"https://ror.org/03nnxqz81","country_code":"SE","type":"other","lineage":["https://openalex.org/I2800664555"]}],"countries":["SE"],"is_corresponding":false,"raw_author_name":"Madhav Mishra","raw_affiliation_strings":["RISE Research Institutes of Sweden, Luleå, Sweden"],"raw_orcid":"https://orcid.org/0000-0001-8278-8601","affiliations":[{"raw_affiliation_string":"RISE Research Institutes of Sweden, Luleå, Sweden","institution_ids":["https://openalex.org/I2800664555"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5076576895","display_name":"Rodolfo E. Haber","orcid":"https://orcid.org/0000-0002-2881-0166"},"institutions":[{"id":"https://openalex.org/I4210125392","display_name":"Centre for Automation and Robotics","ror":"https://ror.org/02wh02235","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210125392","https://openalex.org/I88060688"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Rodolfo E. Haber","raw_affiliation_strings":["Centro de Automática y Robótica, CSIC-Universidad Politécnica de Madrid, Arganda del Rey, Madrid, Spain","Centro de Automática y Robótica,, CSIC-Universidad Politécnica de Madrid, Arganda del Rey, Madrid, Spain"],"raw_orcid":"https://orcid.org/0000-0002-2881-0166","affiliations":[{"raw_affiliation_string":"Centro de Automática y Robótica, CSIC-Universidad Politécnica de Madrid, Arganda del Rey, Madrid, Spain","institution_ids":["https://openalex.org/I4210125392"]},{"raw_affiliation_string":"Centro de Automática y Robótica,, CSIC-Universidad Politécnica de Madrid, Arganda del Rey, Madrid, Spain","institution_ids":["https://openalex.org/I4210125392"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":2.3331,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.89353866,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":98,"max":99},"biblio":{"volume":"13","issue":null,"first_page":"138834","last_page":"138850"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.989799976348877,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.989799976348877,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9768000245094299,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9767000079154968,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5790756940841675},{"id":"https://openalex.org/keywords/data-modeling","display_name":"Data modeling","score":0.4539967179298401},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.42847275733947754},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.4237593412399292},{"id":"https://openalex.org/keywords/semiconductor-device","display_name":"Semiconductor device","score":0.41281378269195557},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3623877167701721},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.24753454327583313},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.18445757031440735},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16814500093460083},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.1561264991760254},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.12696009874343872},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.07945993542671204}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5790756940841675},{"id":"https://openalex.org/C67186912","wikidata":"https://www.wikidata.org/wiki/Q367664","display_name":"Data modeling","level":2,"score":0.4539967179298401},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.42847275733947754},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.4237593412399292},{"id":"https://openalex.org/C79635011","wikidata":"https://www.wikidata.org/wiki/Q175805","display_name":"Semiconductor device","level":3,"score":0.41281378269195557},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3623877167701721},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.24753454327583313},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.18445757031440735},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16814500093460083},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.1561264991760254},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.12696009874343872},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.07945993542671204},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/access.2025.3596444","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3596444","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:digital.csic.es:10261/416009","is_oa":true,"landing_page_url":"http://hdl.handle.net/10261/416009","pdf_url":null,"source":{"id":"https://openalex.org/S4306400616","display_name":"DIGITAL.CSIC (Spanish National Research Council (CSIC))","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I134820265","host_organization_name":"Consejo Superior de Investigaciones Cient\u00edficas","host_organization_lineage":["https://openalex.org/I134820265"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"},{"id":"pmh:oai:doaj.org/article:682ca84a331140a48ac9e879b19ee3d5","is_oa":true,"landing_page_url":"https://doaj.org/article/682ca84a331140a48ac9e879b19ee3d5","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 13, Pp 138834-138850 (2025)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2025.3596444","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3596444","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":38,"referenced_works":["https://openalex.org/W1999959919","https://openalex.org/W2091204867","https://openalex.org/W2749949798","https://openalex.org/W2765562673","https://openalex.org/W2793350103","https://openalex.org/W2884957744","https://openalex.org/W2898585577","https://openalex.org/W2911143483","https://openalex.org/W2951934632","https://openalex.org/W2969475609","https://openalex.org/W3019321032","https://openalex.org/W3080343677","https://openalex.org/W3088910911","https://openalex.org/W3092386127","https://openalex.org/W3177349729","https://openalex.org/W3200629517","https://openalex.org/W4221052747","https://openalex.org/W4309340372","https://openalex.org/W4323664850","https://openalex.org/W4376631572","https://openalex.org/W4381059967","https://openalex.org/W4386987299","https://openalex.org/W4388450404","https://openalex.org/W4392931842","https://openalex.org/W4392958335","https://openalex.org/W4395685145","https://openalex.org/W4396817438","https://openalex.org/W4401246767","https://openalex.org/W4401870248","https://openalex.org/W4403121128","https://openalex.org/W4403632550","https://openalex.org/W4404534242","https://openalex.org/W4406439354","https://openalex.org/W4406858241","https://openalex.org/W4408173655","https://openalex.org/W4408652321","https://openalex.org/W4408659577","https://openalex.org/W6765451912"],"related_works":["https://openalex.org/W2961085424","https://openalex.org/W4306674287","https://openalex.org/W4387369504","https://openalex.org/W4394896187","https://openalex.org/W3170094116","https://openalex.org/W4386462264","https://openalex.org/W3107602296","https://openalex.org/W4364306694","https://openalex.org/W4312192474","https://openalex.org/W4283697347"],"abstract_inverted_index":{"The":[0,111,125],"prediction":[1],"of":[2,7,66,72,84,98,134,178,184],"the":[3,48,62,69,73,82,96,130,160,182,185,189,194],"remaining":[4,131],"useful":[5,132],"life":[6,133],"electronic":[8],"components":[9],"is":[10,163],"a":[11,117,140,156],"crucial":[12],"aspect":[13],"for":[14,50,87,128,159,198],"predictive":[15],"maintenance":[16],"and":[17,23,64,68,95,108,193],"system":[18],"reliability":[19],"across":[20],"multiple":[21],"fields":[22],"applications.":[24],"Data-driven":[25],"approaches,":[26],"particularly":[27],"those":[28],"methods":[29],"based":[30],"on":[31,116],"machine":[32],"learning,":[33],"are":[34,57],"currently":[35],"being":[36],"used":[37],"due":[38],"to":[39,42,165],"their":[40],"ability":[41],"model":[43,141,169],"complex":[44],"degradation":[45],"patterns":[46],"without":[47],"need":[49],"explicit":[51],"physical":[52],"modeling.":[53],"However,":[54],"several":[55],"challenges":[56],"still":[58],"present,":[59],"such":[60],"as":[61,90,92],"availability":[63],"quality":[65],"data":[67,86,190],"uncertainty":[70],"quantification":[71],"results.":[74],"To":[75],"tackle":[76],"these":[77,135],"obstacles,":[78],"this":[79,199],"work":[80],"explores":[81],"use":[83],"synthetic":[85,148],"augmenting":[88],"datasets,":[89],"well":[91],"feature":[93,186],"selection":[94,187],"assessment":[97],"different":[99],"neural":[100,195],"network":[101,196],"architectures,":[102],"including":[103],"models":[104],"with":[105,139,147],"recurrent":[106],"layers":[107],"probabilistic":[109,152],"output.":[110],"proposed":[112],"approach":[113],"was":[114],"evaluated":[115],"silicon":[118],"carbide":[119],"metal-oxide-":[120],"semiconductor":[121],"field-effect":[122],"transistor":[123],"dataset.":[124],"best":[126],"results":[127],"modeling":[129],"devices":[136],"were":[137],"obtained":[138],"trained":[142],"using":[143,174],"an":[144],"augmented":[145],"dataset":[146],"data.":[149],"This":[150,168],"model\u2019s":[151],"output":[153],"allows":[154],"building":[155],"confidence":[157],"interval":[158],"predictions,":[161],"which":[162],"helpful":[164],"identify":[166],"outliers.":[167],"outperformed":[170],"other":[171],"state-of-the-art":[172],"algorithms":[173],"only":[175],"4":[176],"out":[177],"22":[179],"features,":[180],"demonstrating":[181],"effectiveness":[183],"procedure,":[188],"augmentation":[191],"method,":[192],"architecture":[197],"case":[200],"study.":[201]},"counts_by_year":[{"year":2026,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}