{"id":"https://openalex.org/W4412985011","doi":"https://doi.org/10.1109/access.2025.3596142","title":"Mitigating Cascading Failures by Enhancing N-2 Security Using a Unified Preventive-Corrective Generation Rescheduling Approach","display_name":"Mitigating Cascading Failures by Enhancing N-2 Security Using a Unified Preventive-Corrective Generation Rescheduling Approach","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4412985011","doi":"https://doi.org/10.1109/access.2025.3596142"},"language":"en","primary_location":{"id":"doi:10.1109/access.2025.3596142","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3596142","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2025.3596142","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109605964","display_name":"Amirhossein Ramezani","orcid":null},"institutions":[{"id":"https://openalex.org/I48379061","display_name":"Shahid Beheshti University","ror":"https://ror.org/0091vmj44","country_code":"IR","type":"education","lineage":["https://openalex.org/I48379061"]}],"countries":["IR"],"is_corresponding":true,"raw_author_name":"Amirhossein Ramezani","raw_affiliation_strings":["Electrical Engineering Department, Shahid Beheshti University, Tehran, Iran"],"raw_orcid":"https://orcid.org/0009-0007-3521-9626","affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, Shahid Beheshti University, Tehran, Iran","institution_ids":["https://openalex.org/I48379061"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079202723","display_name":"M. R. Aghamohammadi","orcid":"https://orcid.org/0000-0002-8556-2218"},"institutions":[{"id":"https://openalex.org/I48379061","display_name":"Shahid Beheshti University","ror":"https://ror.org/0091vmj44","country_code":"IR","type":"education","lineage":["https://openalex.org/I48379061"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Mohammad Reza Aghamohammadi","raw_affiliation_strings":["Electrical Engineering Department, Shahid Beheshti University, Tehran, Iran"],"raw_orcid":"https://orcid.org/0000-0002-8556-2218","affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, Shahid Beheshti University, Tehran, Iran","institution_ids":["https://openalex.org/I48379061"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5030417698","display_name":"Ali Reza Sobbouhi","orcid":"https://orcid.org/0000-0001-5037-5968"},"institutions":[{"id":"https://openalex.org/I48379061","display_name":"Shahid Beheshti University","ror":"https://ror.org/0091vmj44","country_code":"IR","type":"education","lineage":["https://openalex.org/I48379061"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Alireza Sobbouhi","raw_affiliation_strings":["Electrical Engineering Department, Shahid Beheshti University, Tehran, Iran"],"raw_orcid":"https://orcid.org/0000-0001-5037-5968","affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, Shahid Beheshti University, Tehran, Iran","institution_ids":["https://openalex.org/I48379061"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5109605964"],"corresponding_institution_ids":["https://openalex.org/I48379061"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.6252,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.71987249,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":98},"biblio":{"volume":"13","issue":null,"first_page":"146340","last_page":"146354"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10603","display_name":"Smart Grid Energy Management","score":0.6471999883651733,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10603","display_name":"Smart Grid Energy Management","score":0.6471999883651733,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.6097000241279602,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.5841000080108643,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6351145505905151},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.48827409744262695},{"id":"https://openalex.org/keywords/preventive-maintenance","display_name":"Preventive maintenance","score":0.4491738975048065},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.4356367886066437},{"id":"https://openalex.org/keywords/risk-analysis","display_name":"Risk analysis (engineering)","score":0.42732974886894226},{"id":"https://openalex.org/keywords/business","display_name":"Business","score":0.1803596019744873},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15066814422607422}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6351145505905151},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.48827409744262695},{"id":"https://openalex.org/C24090081","wikidata":"https://www.wikidata.org/wiki/Q1043452","display_name":"Preventive maintenance","level":2,"score":0.4491738975048065},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.4356367886066437},{"id":"https://openalex.org/C112930515","wikidata":"https://www.wikidata.org/wiki/Q4389547","display_name":"Risk analysis (engineering)","level":1,"score":0.42732974886894226},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.1803596019744873},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15066814422607422}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2025.3596142","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3596142","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:026567063e57469281d49229e479e092","is_oa":true,"landing_page_url":"https://doaj.org/article/026567063e57469281d49229e479e092","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 13, Pp 146340-146354 (2025)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2025.3596142","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3596142","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.5699999928474426,"id":"https://metadata.un.org/sdg/13","display_name":"Climate action"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1990199184","https://openalex.org/W2005246195","https://openalex.org/W2015050404","https://openalex.org/W2035579008","https://openalex.org/W2036298426","https://openalex.org/W2040445974","https://openalex.org/W2106021709","https://openalex.org/W2118682758","https://openalex.org/W2126057679","https://openalex.org/W2150763024","https://openalex.org/W2171451677","https://openalex.org/W2395721918","https://openalex.org/W2559953650","https://openalex.org/W2809641578","https://openalex.org/W2909246823","https://openalex.org/W2990082634","https://openalex.org/W3034891084","https://openalex.org/W3192646787","https://openalex.org/W3204170091","https://openalex.org/W4312037285","https://openalex.org/W4385307508","https://openalex.org/W4386941502","https://openalex.org/W4387641064","https://openalex.org/W4401326815","https://openalex.org/W4409339133"],"related_works":["https://openalex.org/W4214827973","https://openalex.org/W2315243270","https://openalex.org/W4231557335","https://openalex.org/W2394158014","https://openalex.org/W2065422689","https://openalex.org/W2370623581","https://openalex.org/W2130432129","https://openalex.org/W2552440346","https://openalex.org/W1978071414","https://openalex.org/W2136426426"],"abstract_inverted_index":{"Although":[0],"the":[1,26,39,52,73,120,126,130],"N-1":[2],"criterion":[3],"is":[4,33,93],"widely":[5],"applied,":[6],"cascading":[7,44],"failures":[8],"and":[9,107,110,141],"large-scale":[10],"blackouts":[11],"still":[12],"occur":[13],"in":[14,25,57,115],"power":[15],"systems.":[16],"Thus,":[17],"incorporating":[18],"N-k":[19],"(k":[20],">":[21],"1)":[22],"security":[23],"constraints":[24,77],"Security-Constrained":[27],"Optimal":[28],"Power":[29],"Flow":[30],"(SCOPF)":[31],"problem":[32,86],"essential,":[34],"with":[35],"N-2":[36,49,76,97,150],"contingencies":[37,50],"being":[38],"most":[40],"probable":[41],"cause":[42],"of":[43,54,75],"failures.":[45],"However,":[46],"modeling":[47],"all":[48],"increases":[51],"number":[53,74],"constraints,":[55],"resulting":[56],"excessive":[58],"computational":[59,143],"burden.":[60],"To":[61],"address":[62],"this,":[63],"we":[64],"propose":[65],"a":[66,89],"statistical":[67],"constraint":[68],"screening":[69],"method":[70],"that":[71,125],"reduces":[72,129],"by":[78,136,145],"75%,":[79],"from":[80],"19,108":[81],"to":[82,95,138],"4,744,":[83],"significantly":[84],"decreasing":[85],"size.":[87],"Additionally,":[88],"closed-form":[90],"LODF-based":[91],"formulation":[92],"developed":[94],"evaluate":[96],"post-contingency":[98],"flows":[99],"without":[100],"network":[101],"topology":[102],"reconstruction.":[103],"Two":[104],"optimization":[105],"models-separate":[106],"unified-are":[108],"proposed":[109],"compared":[111],"for":[112],"generation":[113],"rescheduling":[114],"SCOPF.":[116],"Simulation":[117],"results":[118],"on":[119],"IEEE":[121],"39-bus":[122],"system":[123],"demonstrate":[124],"unified":[127],"model":[128],"total":[131],"preventive":[132],"action":[133],"cost":[134],"(PAC)":[135],"up":[137],"7,417":[139],"$/h":[140],"decreases":[142],"time":[144],"32%,":[146],"while":[147],"ensuring":[148],"complete":[149],"contingency":[151],"security.":[152]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2025-10-10T00:00:00"}