{"id":"https://openalex.org/W4412605308","doi":"https://doi.org/10.1109/access.2025.3591987","title":"YOLOv5-MDS: Target Detection Model for PCB Defect Inspection Based on YOLOv5 Integrated With Mamba Architecture","display_name":"YOLOv5-MDS: Target Detection Model for PCB Defect Inspection Based on YOLOv5 Integrated With Mamba Architecture","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4412605308","doi":"https://doi.org/10.1109/access.2025.3591987"},"language":"en","primary_location":{"id":"doi:10.1109/access.2025.3591987","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3591987","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2025.3591987","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5086187597","display_name":"Deming Guo","orcid":null},"institutions":[{"id":"https://openalex.org/I187400657","display_name":"South China Normal University","ror":"https://ror.org/01kq0pv72","country_code":"CN","type":"education","lineage":["https://openalex.org/I187400657"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Deming Guo","raw_affiliation_strings":["School of Data Science and Engineering, South China Normal University, Shanwei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Data Science and Engineering, South China Normal University, Shanwei, China","institution_ids":["https://openalex.org/I187400657"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100646089","display_name":"Qi Xi","orcid":"https://orcid.org/0000-0001-7704-3453"},"institutions":[{"id":"https://openalex.org/I187400657","display_name":"South China Normal University","ror":"https://ror.org/01kq0pv72","country_code":"CN","type":"education","lineage":["https://openalex.org/I187400657"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qi Xi","raw_affiliation_strings":["School of Data Science and Engineering, South China Normal University, Shanwei, China"],"raw_orcid":"https://orcid.org/0000-0001-7704-3453","affiliations":[{"raw_affiliation_string":"School of Data Science and Engineering, South China Normal University, Shanwei, China","institution_ids":["https://openalex.org/I187400657"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100363511","display_name":"Long Zhang","orcid":"https://orcid.org/0000-0002-1042-6414"},"institutions":[{"id":"https://openalex.org/I187400657","display_name":"South China Normal University","ror":"https://ror.org/01kq0pv72","country_code":"CN","type":"education","lineage":["https://openalex.org/I187400657"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Long Zhang","raw_affiliation_strings":["School of Data Science and Engineering, South China Normal University, Shanwei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Data Science and Engineering, South China Normal University, Shanwei, China","institution_ids":["https://openalex.org/I187400657"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100378594","display_name":"Jing Wang","orcid":"https://orcid.org/0000-0002-8213-3725"},"institutions":[{"id":"https://openalex.org/I187400657","display_name":"South China Normal University","ror":"https://ror.org/01kq0pv72","country_code":"CN","type":"education","lineage":["https://openalex.org/I187400657"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jing Wang","raw_affiliation_strings":["School of Data Science and Engineering, South China Normal University, Shanwei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Data Science and Engineering, South China Normal University, Shanwei, China","institution_ids":["https://openalex.org/I187400657"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109580224","display_name":"YingYing Ye","orcid":null},"institutions":[{"id":"https://openalex.org/I187400657","display_name":"South China Normal University","ror":"https://ror.org/01kq0pv72","country_code":"CN","type":"education","lineage":["https://openalex.org/I187400657"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yilong Ye","raw_affiliation_strings":["School of Data Science and Engineering, South China Normal University, Shanwei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Data Science and Engineering, South China Normal University, Shanwei, China","institution_ids":["https://openalex.org/I187400657"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5114803126","display_name":"Ziyi Zeng","orcid":null},"institutions":[{"id":"https://openalex.org/I187400657","display_name":"South China Normal University","ror":"https://ror.org/01kq0pv72","country_code":"CN","type":"education","lineage":["https://openalex.org/I187400657"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ziyi Zeng","raw_affiliation_strings":["School of Data Science and Engineering, South China Normal University, Shanwei, China"],"raw_orcid":"https://orcid.org/0009-0002-9478-5031","affiliations":[{"raw_affiliation_string":"School of Data Science and Engineering, South China Normal University, Shanwei, China","institution_ids":["https://openalex.org/I187400657"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I187400657"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":1.7081,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.8601642,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":96},"biblio":{"volume":"13","issue":null,"first_page":"136612","last_page":"136624"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9853000044822693,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9853000044822693,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/architecture","display_name":"Architecture","score":0.6315563321113586},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5973039865493774},{"id":"https://openalex.org/keywords/geography","display_name":"Geography","score":0.05644664168357849}],"concepts":[{"id":"https://openalex.org/C123657996","wikidata":"https://www.wikidata.org/wiki/Q12271","display_name":"Architecture","level":2,"score":0.6315563321113586},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5973039865493774},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.05644664168357849},{"id":"https://openalex.org/C166957645","wikidata":"https://www.wikidata.org/wiki/Q23498","display_name":"Archaeology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2025.3591987","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3591987","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:a321c03f289f4bb188c95c8309bde945","is_oa":true,"landing_page_url":"https://doaj.org/article/a321c03f289f4bb188c95c8309bde945","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 13, Pp 136612-136624 (2025)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2025.3591987","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3591987","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G929666221","display_name":null,"funder_award_id":"2023A011","funder_id":"https://openalex.org/F4320327832","funder_display_name":"Shantou Science and Technology Project"}],"funders":[{"id":"https://openalex.org/F4320327832","display_name":"Shantou Science and Technology Project","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":50,"referenced_works":["https://openalex.org/W639708223","https://openalex.org/W1536680647","https://openalex.org/W2102605133","https://openalex.org/W2183341477","https://openalex.org/W2193145675","https://openalex.org/W2194775991","https://openalex.org/W2565639579","https://openalex.org/W2752782242","https://openalex.org/W2962766617","https://openalex.org/W2963150697","https://openalex.org/W2963857746","https://openalex.org/W2963923251","https://openalex.org/W2982083293","https://openalex.org/W3014641072","https://openalex.org/W3018757597","https://openalex.org/W3034429256","https://openalex.org/W3034713821","https://openalex.org/W3034971973","https://openalex.org/W3122173535","https://openalex.org/W3194790201","https://openalex.org/W3204713564","https://openalex.org/W4288375226","https://openalex.org/W4289752563","https://openalex.org/W4297676427","https://openalex.org/W4308094875","https://openalex.org/W4312443924","https://openalex.org/W4312638717","https://openalex.org/W4318484048","https://openalex.org/W4323060405","https://openalex.org/W4382280585","https://openalex.org/W4384787458","https://openalex.org/W4385245566","https://openalex.org/W4386076325","https://openalex.org/W4389352643","https://openalex.org/W4390873058","https://openalex.org/W4400933314","https://openalex.org/W4403770406","https://openalex.org/W6637373629","https://openalex.org/W6726497184","https://openalex.org/W6750227808","https://openalex.org/W6758365457","https://openalex.org/W6762718338","https://openalex.org/W6774097037","https://openalex.org/W6780688020","https://openalex.org/W6793164127","https://openalex.org/W6852177738","https://openalex.org/W6859298233","https://openalex.org/W6860762246","https://openalex.org/W6873881505","https://openalex.org/W6877138805"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W4391913857","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W4396696052"],"abstract_inverted_index":{"The":[0],"Printed":[1],"Circuit":[2],"Board":[3],"(PCB),":[4],"which":[5],"serves":[6],"as":[7],"the":[8,23,73,113,122,126,131,139,147,156,167,201,206,263],"foundational":[9],"component":[10],"of":[11,27,75,125,159,266],"numerous":[12],"electronic":[13],"devices,":[14,221],"exhibits":[15],"a":[16,93,213],"complex":[17],"relationship":[18],"between":[19],"its":[20],"quality":[21],"and":[22,25,57,68,81,103,110,146,234,250],"lifespan":[24],"performance":[26,215],"those":[28],"products.":[29],"However,":[30],"annual":[31],"losses":[32],"are":[33,83],"significantly":[34],"contributed":[35],"to":[36,53,63,120,154,169,200,205],"by":[37,129,232,236],"PCB":[38,45,195],"defects":[39,46],"arising":[40],"from":[41,109],"various":[42],"production":[43],"factors.":[44],"present":[47],"significant":[48,190,241],"challenges":[49],"in":[50,72,192,255,268],"detection,":[51],"due":[52],"their":[54],"small":[55],"size":[56],"irregular":[58],"distribution.":[59],"Existing":[60],"methods":[61],"struggle":[62],"effectively":[64],"detect":[65],"these":[66],"minute":[67],"scattered":[69],"defects,":[70],"especially":[71],"context":[74],"industrial":[76,269],"production,":[77],"where":[78],"high":[79],"accuracy":[80,179,193],"speed":[82],"paramount.":[84],"To":[85],"address":[86],"this":[87],"issue,":[88],"YOLOv5-MDS":[89,222,267],"has":[90],"been":[91],"proposed,":[92],"convolutional":[94,160],"neural":[95],"network":[96],"(CNN)":[97],"specifically":[98],"designed":[99],"for":[100,194],"image":[101],"segmentation":[102],"classification.":[104],"This":[105,150],"model":[106,128,168,188,211],"is":[107],"derived":[108],"enhanced":[111],"on":[112,219],"YOLOv5":[114,127],"model.":[115,203],"Our":[116,174],"primary":[117],"objective":[118],"was":[119],"refine":[121],"neck":[123],"section":[124],"integrating":[130],"Mamba":[132],"architecture":[133],"within":[134],"it.":[135],"Additionally,":[136],"we":[137],"optimized":[138],"intersection":[140],"over":[141],"union":[142],"(IoU)":[143],"calculation":[144],"method":[145],"upsampling":[148],"module.":[149],"strategic":[151],"integration":[152],"aims":[153],"overcome":[155],"inherent":[157],"limitation":[158],"operations\u2019":[161],"local":[162],"receptive":[163],"fields,":[164],"thereby":[165],"enabling":[166],"capture":[170],"features":[171],"more":[172],"effectively.":[173],"proposed":[175,210],"improvements":[176,191],"enhance":[177],"detection":[178,197,225],"while":[180,238],"maintaining":[181],"computational":[182],"efficiency.Experimental":[183],"results":[184,260],"demonstrate":[185],"that":[186],"our":[187,209],"achieves":[189,212],"defect":[196],"tasks":[198],"compared":[199],"baseline":[202,207],"Compared":[204],"model,":[208],"34.3%":[214],"improvement.":[216],"When":[217],"benchmarked":[218],"edge":[220],"demonstrates":[223],"superior":[224],"capabilities":[226],"with":[227],"mAP95":[228],"values":[229],"exceeding":[230],"YOLOv8n":[231,249],"11.0%":[233],"YOLOv11n":[235,254],"0.9%,":[237],"simultaneously":[239],"showing":[240],"efficiency":[242],"advantages":[243],"-":[244],"operating":[245],"29%":[246],"faster":[247,252],"than":[248,253],"57%":[251],"inference":[256],"speed.":[257],"These":[258],"comparative":[259],"comprehensively":[261],"validate":[262],"practical":[264],"applicability":[265],"deployment":[270],"scenarios.":[271]},"counts_by_year":[{"year":2025,"cited_by_count":2}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}