{"id":"https://openalex.org/W4411995904","doi":"https://doi.org/10.1109/access.2025.3585636","title":"A Layout-Based Method for Analog Fault Injection in the Context of Functional Safety","display_name":"A Layout-Based Method for Analog Fault Injection in the Context of Functional Safety","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4411995904","doi":"https://doi.org/10.1109/access.2025.3585636"},"language":"en","primary_location":{"id":"doi:10.1109/access.2025.3585636","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3585636","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2025.3585636","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5118808144","display_name":"Raffi Der Yeghiayan","orcid":null},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Raffi Der Yeghiayan","raw_affiliation_strings":["STMicroelectronics, Cornaredo, Italy"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Cornaredo, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029378094","display_name":"P. Vilmercati","orcid":"https://orcid.org/0000-0002-3872-8828"},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Paolo Vilmercati","raw_affiliation_strings":["STMicroelectronics, Cornaredo, Italy"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Cornaredo, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064664899","display_name":"Giancarlo Storti Gajani","orcid":"https://orcid.org/0000-0001-8182-7891"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Giancarlo Storti Gajani","raw_affiliation_strings":["Dipartimento di Elettronica, Informazione e Bioingegneria (DEIB), Politecnico di Milano, Milan, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Elettronica, Informazione e Bioingegneria (DEIB), Politecnico di Milano, Milan, Italy","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5118808145","display_name":"Gianluca D\u2019Alesio","orcid":null},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Gianluca D\u2019Alesio","raw_affiliation_strings":["STMicroelectronics, Cornaredo, Italy"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Cornaredo, Italy","institution_ids":["https://openalex.org/I4210154781"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5118808144"],"corresponding_institution_ids":["https://openalex.org/I4210154781"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.17613971,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"13","issue":null,"first_page":"119831","last_page":"119841"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9937999844551086,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9937999844551086,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9919000267982483,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9909999966621399,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6691197156906128},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.6020618081092834},{"id":"https://openalex.org/keywords/context","display_name":"Context (archaeology)","score":0.595126748085022},{"id":"https://openalex.org/keywords/functional-safety","display_name":"Functional safety","score":0.5789747834205627},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3965833783149719},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3207404911518097},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14730286598205566},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.09602248668670654},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.08867502212524414}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6691197156906128},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.6020618081092834},{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.595126748085022},{"id":"https://openalex.org/C148493468","wikidata":"https://www.wikidata.org/wiki/Q2646951","display_name":"Functional safety","level":2,"score":0.5789747834205627},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3965833783149719},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3207404911518097},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14730286598205566},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.09602248668670654},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.08867502212524414},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/access.2025.3585636","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3585636","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:19b2f698928a4f9e8eb43bd0fd4af6bf","is_oa":true,"landing_page_url":"https://doaj.org/article/19b2f698928a4f9e8eb43bd0fd4af6bf","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 13, Pp 119831-119841 (2025)","raw_type":"article"},{"id":"pmh:oai:re.public.polimi.it:11311/1294065","is_oa":true,"landing_page_url":"https://hdl.handle.net/11311/1294065","pdf_url":null,"source":{"id":"https://openalex.org/S4306400312","display_name":"Virtual Community of Pathological Anatomy (University of Castilla La Mancha)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I79189158","host_organization_name":"University of Castilla-La Mancha","host_organization_lineage":["https://openalex.org/I79189158"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"doi:10.1109/access.2025.3585636","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3585636","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Climate action","score":0.550000011920929,"id":"https://metadata.un.org/sdg/13"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1970655797","https://openalex.org/W2059074447","https://openalex.org/W2075120365","https://openalex.org/W2099035744","https://openalex.org/W2120956034","https://openalex.org/W2570637191","https://openalex.org/W3007644171","https://openalex.org/W3038743613","https://openalex.org/W4385237263","https://openalex.org/W6704531615"],"related_works":["https://openalex.org/W2767601850","https://openalex.org/W2617887951","https://openalex.org/W2175282463","https://openalex.org/W2246057640","https://openalex.org/W140071659","https://openalex.org/W2120051590","https://openalex.org/W2538450276","https://openalex.org/W1894599085","https://openalex.org/W2550610062","https://openalex.org/W2112914176"],"abstract_inverted_index":{"Digital":[0],"and":[1,27,39,86,98,110,167],"analog":[2,64,124,139],"circuits":[3,81,166],"are":[4,149],"fundamental":[5],"components":[6,143],"embedded":[7],"across":[8],"a":[9,91,108,134,182,199],"vast":[10],"array":[11],"of":[12,41,59,80,102,128,157,165,171,185,202,207],"applications,":[13],"including":[14],"but":[15],"not":[16],"limited":[17],"to":[18,54,94,132,138,153,180,231],"consumer":[19],"electronics,":[20],"automotive":[21,68,84],"systems,":[22],"aerospace":[23],"technologies,":[24],"medical":[25],"instrumentation,":[26],"industrial":[28],"automation.":[29],"The":[30,57,126],"critical":[31,222],"role":[32],"they":[33],"play":[34],"in":[35,82,114,123,144],"ensuring":[36],"the":[37,73,77,83,115,145,155,163,169,172,175,186,191,196,208,215],"functionality":[38,164],"efficiency":[40],"modern":[42],"technological":[43],"systems":[44],"introduces":[45],"significant":[46],"risks,":[47],"as":[48,90,151],"failures":[49],"or":[50,224],"defects":[51],"can":[52,228],"lead":[53],"catastrophic":[55],"consequences.":[56],"focus":[58],"this":[60,100,129],"work":[61,130],"is":[62,107,120,131],"on":[63],"fault":[65,88,105,158],"injection":[66,89,106],"for":[67,76],"applications.":[69],"ISO":[70,212],"26262":[71,213],"sets":[72],"global":[74],"standard":[75],"functional":[78],"safety":[79,96,170,193,234],"domain":[85],"identifies":[87],"key":[92],"method":[93,136,216],"assess":[95],"metrics":[97,235],"validate":[99],"class":[101],"circuits.":[103,125],"Although":[104,195],"well-known":[109],"widely":[111],"adopted":[112],"strategy":[113],"digital":[116],"domain,":[117],"its":[118],"usage":[119],"less":[121],"widespread":[122],"purpose":[127],"propose":[133],"layout-based":[135],"addressed":[137],"circuits,":[140],"where":[141],"parasitic":[142],"post-layout":[146],"extracted":[147],"schematics":[148],"used":[150],"indicators":[152],"assign":[154],"likelihood":[156],"occurrence":[159],"that":[160,227],"may":[161],"affect":[162],"impact":[168],"application.":[173],"Moreover,":[174],"proposed":[176],"approach":[177],"leverages":[178],"simulations":[179],"enable":[181],"quantitative":[183],"assessment":[184],"diagnostic":[187],"coverage":[188],"achieved":[189],"by":[190,211],"implemented":[192],"mechanisms.":[194],"results":[197],"show":[198],"Diagnostic":[200],"Coverage":[201],"91.82%,":[203],"which":[204],"falls":[205],"short":[206],"assumed":[209],"99%":[210],"[1],":[214],"provides":[217],"valuable":[218],"insight":[219],"into":[220],"identifying":[221],"architecture":[223],"layout":[225],"patterns":[226],"be":[229],"improved":[230],"achieve":[232],"better":[233],"while":[236],"maintaining":[237],"electrical":[238],"performance.":[239]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}