{"id":"https://openalex.org/W4411948811","doi":"https://doi.org/10.1109/access.2025.3585151","title":"RT-DETR-Pro: An Enhanced RT-DETR Model for Visual Detection of Photovoltaic Module Defects","display_name":"RT-DETR-Pro: An Enhanced RT-DETR Model for Visual Detection of Photovoltaic Module Defects","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4411948811","doi":"https://doi.org/10.1109/access.2025.3585151"},"language":"en","primary_location":{"id":"doi:10.1109/access.2025.3585151","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3585151","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2025.3585151","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5086295190","display_name":"Yingmei Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I180662265","display_name":"China Mobile (China)","ror":"https://ror.org/05gftfe97","country_code":"CN","type":"company","lineage":["https://openalex.org/I180662265"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yunliang Chen","raw_affiliation_strings":["China Mobile Shanghai ICT Company Ltd., Shanghai, China"],"raw_orcid":"https://orcid.org/0009-0004-2380-6485","affiliations":[{"raw_affiliation_string":"China Mobile Shanghai ICT Company Ltd., Shanghai, China","institution_ids":["https://openalex.org/I180662265"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109204293","display_name":"M.N. Shan","orcid":null},"institutions":[{"id":"https://openalex.org/I180662265","display_name":"China Mobile (China)","ror":"https://ror.org/05gftfe97","country_code":"CN","type":"company","lineage":["https://openalex.org/I180662265"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mingtao Shan","raw_affiliation_strings":["China Mobile Shanghai ICT Company Ltd., Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"China Mobile Shanghai ICT Company Ltd., Shanghai, China","institution_ids":["https://openalex.org/I180662265"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060081919","display_name":"Wei Zhou","orcid":"https://orcid.org/0009-0001-8370-4817"},"institutions":[{"id":"https://openalex.org/I180662265","display_name":"China Mobile (China)","ror":"https://ror.org/05gftfe97","country_code":"CN","type":"company","lineage":["https://openalex.org/I180662265"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Zhou","raw_affiliation_strings":["China Mobile Shanghai ICT Company Ltd., Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"China Mobile Shanghai ICT Company Ltd., Shanghai, China","institution_ids":["https://openalex.org/I180662265"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101294934","display_name":"Bing Ma","orcid":null},"institutions":[{"id":"https://openalex.org/I180662265","display_name":"China Mobile (China)","ror":"https://ror.org/05gftfe97","country_code":"CN","type":"company","lineage":["https://openalex.org/I180662265"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bing Ma","raw_affiliation_strings":["China Mobile Shanghai ICT Company Ltd., Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"China Mobile Shanghai ICT Company Ltd., Shanghai, China","institution_ids":["https://openalex.org/I180662265"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110450735","display_name":"Xiao Mei","orcid":"https://orcid.org/0009-0005-4461-886X"},"institutions":[{"id":"https://openalex.org/I180662265","display_name":"China Mobile (China)","ror":"https://ror.org/05gftfe97","country_code":"CN","type":"company","lineage":["https://openalex.org/I180662265"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xun Mei","raw_affiliation_strings":["China Mobile Shanghai ICT Company Ltd., Shanghai, China"],"raw_orcid":"https://orcid.org/0009-0005-4461-886X","affiliations":[{"raw_affiliation_string":"China Mobile Shanghai ICT Company Ltd., Shanghai, China","institution_ids":["https://openalex.org/I180662265"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I180662265"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":5.2574,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.9564382,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":95,"max":100},"biblio":{"volume":"13","issue":null,"first_page":"116473","last_page":"116479"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10468","display_name":"Photovoltaic System Optimization Techniques","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/2105","display_name":"Renewable Energy, Sustainability and the Environment"},"field":{"id":"https://openalex.org/fields/21","display_name":"Energy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.9936000108718872,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/photovoltaic-system","display_name":"Photovoltaic system","score":0.7080588340759277},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4585956633090973},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.08512327075004578},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.06752529740333557}],"concepts":[{"id":"https://openalex.org/C41291067","wikidata":"https://www.wikidata.org/wiki/Q1897785","display_name":"Photovoltaic system","level":2,"score":0.7080588340759277},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4585956633090973},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.08512327075004578},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.06752529740333557}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2025.3585151","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3585151","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:9d943953e5fe4ad0a72d7595cab905eb","is_oa":true,"landing_page_url":"https://doaj.org/article/9d943953e5fe4ad0a72d7595cab905eb","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 13, Pp 116473-116479 (2025)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2025.3585151","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3585151","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.6200000047683716,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":32,"referenced_works":["https://openalex.org/W639708223","https://openalex.org/W1993801643","https://openalex.org/W2102605133","https://openalex.org/W2752782242","https://openalex.org/W2903179760","https://openalex.org/W2963037989","https://openalex.org/W2963857746","https://openalex.org/W2964241181","https://openalex.org/W2965922140","https://openalex.org/W3017579440","https://openalex.org/W3034971973","https://openalex.org/W3094502228","https://openalex.org/W3096609285","https://openalex.org/W3122239467","https://openalex.org/W3135137479","https://openalex.org/W3205619345","https://openalex.org/W3217139832","https://openalex.org/W4220830549","https://openalex.org/W4221146106","https://openalex.org/W4226013992","https://openalex.org/W4280513978","https://openalex.org/W4282825047","https://openalex.org/W4289752563","https://openalex.org/W4312312588","https://openalex.org/W4372347372","https://openalex.org/W4385245566","https://openalex.org/W4402754006","https://openalex.org/W4406874673","https://openalex.org/W6784094891","https://openalex.org/W6804794748","https://openalex.org/W6809665764","https://openalex.org/W6811230874"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W4391913857","https://openalex.org/W2358668433","https://openalex.org/W2386968573","https://openalex.org/W2395064349","https://openalex.org/W4396701345","https://openalex.org/W2376932109"],"abstract_inverted_index":{"An":[0],"enhanced":[1],"RT-DETR":[2,43,104,136,162],"(Real-Time":[3],"Detection":[4],"Transformer)":[5],"model,":[6],"RT-DETR-Pro,":[7],"is":[8,38,66,89],"proposed":[9,190],"to":[10,45],"address":[11],"the":[12,41,51,102,134,160,175],"problem":[13],"of":[14,21,56,177],"low":[15],"recognition":[16],"rates":[17],"for":[18,126,141,183,196,205],"visual":[19],"detection":[20,29,124],"PV":[22,85,97,185,198],"(photovoltaic)":[23],"module":[24,37,86,98,186,199],"defects":[25],"by":[26,49,163],"traditional":[27],"object":[28],"methods.":[30],"Firstly,":[31],"an":[32,60,193],"EMA":[33],"(Efficient":[34],"Multi-Scale":[35],"Attention)":[36],"integrated":[39],"into":[40],"vanilla":[42],"model":[44,81,105,109,137,147,168],"optimize":[46],"feature":[47,57,63,72],"representation":[48,73],"reshaping":[50],"channel":[52],"and":[53,80,106,112,180],"batch":[54],"dimensions":[55],"maps.":[58],"Secondly,":[59],"improved":[61],"neck":[62],"fusion":[64],"strategy":[65],"adopted,":[67],"which":[68],"not":[69],"only":[70],"improves":[71],"capability":[74],"but":[75],"also":[76],"reduces":[77],"computational":[78],"costs":[79],"complexity.":[82],"Finally,":[83],"a":[84,96],"image":[87],"dataset":[88],"constructed":[90],"using":[91],"production":[92,99],"line":[93],"data":[94],"from":[95],"factory.":[100],"Both":[101],"original":[103,135,161],"our":[107,145,166],"RT-DETR-Pro":[108,121,146,167],"are":[110],"trained":[111],"evaluated":[113],"on":[114],"this":[115],"dataset.":[116],"Experimental":[117],"results":[118,130],"demonstrate":[119],"that":[120,132],"can":[122],"increase":[123],"accuracy":[125,179],"hard-to-identify":[127],"defects.":[128],"The":[129,189],"show":[131],"while":[133],"exhibited":[138],"missed":[139],"detections":[140],"subtle":[142],"small-target":[143],"defects,":[144,155],"shows":[148],"significant":[149],"enhancement":[150],"in":[151,172],"detecting":[152],"such":[153],"inconspicuous":[154],"with":[156],"86.9%":[157],"mAP50,":[158],"outperforming":[159],"4.5%.":[164],"Additionally,":[165],"achieves":[169],"144":[170],"FPS":[171],"inference,":[173],"meeting":[174],"requirements":[176],"both":[178],"real-time":[181],"performance":[182],"industrial":[184,206],"quality":[187,200],"inspection.":[188],"method":[191],"provides":[192],"effective":[194],"solution":[195],"automated":[197],"inspection,":[201],"demonstrating":[202],"strong":[203],"potential":[204],"applications.":[207]},"counts_by_year":[{"year":2026,"cited_by_count":7},{"year":2025,"cited_by_count":2}],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}