{"id":"https://openalex.org/W4411550834","doi":"https://doi.org/10.1109/access.2025.3582346","title":"Diagnosis of Device Exception Based on Causality of Device Indicators","display_name":"Diagnosis of Device Exception Based on Causality of Device Indicators","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4411550834","doi":"https://doi.org/10.1109/access.2025.3582346"},"language":"en","primary_location":{"id":"doi:10.1109/access.2025.3582346","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3582346","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2025.3582346","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100358033","display_name":"Zhaohui Wang","orcid":"https://orcid.org/0000-0001-7994-7464"},"institutions":[{"id":"https://openalex.org/I4210141776","display_name":"China XD Group (China)","ror":"https://ror.org/04ceqst84","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210141776"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhaohui Wang","raw_affiliation_strings":["China Satellite Network Digital Technology Company Ltd., Xiong’an, China","China Satellite Network Digital Technology CO. LTD, Xiong’an, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"China Satellite Network Digital Technology Company Ltd., Xiong’an, China","institution_ids":["https://openalex.org/I4210141776"]},{"raw_affiliation_string":"China Satellite Network Digital Technology CO. LTD, Xiong’an, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":null,"display_name":"Yan Wei","orcid":null},"institutions":[{"id":"https://openalex.org/I4210141776","display_name":"China XD Group (China)","ror":"https://ror.org/04ceqst84","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210141776"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yan Wei","raw_affiliation_strings":["China Satellite Network Digital Technology Company Ltd., Xiong’an, China","China Satellite Network Digital Technology CO. LTD, Xiong’an, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"China Satellite Network Digital Technology Company Ltd., Xiong’an, China","institution_ids":["https://openalex.org/I4210141776"]},{"raw_affiliation_string":"China Satellite Network Digital Technology CO. LTD, Xiong’an, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":null,"display_name":"Longhua Shang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210141776","display_name":"China XD Group (China)","ror":"https://ror.org/04ceqst84","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210141776"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Longhua Shang","raw_affiliation_strings":["China Satellite Network Digital Technology Company Ltd., Xiong’an, China","China Satellite Network Digital Technology CO. LTD, Xiong’an, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"China Satellite Network Digital Technology Company Ltd., Xiong’an, China","institution_ids":["https://openalex.org/I4210141776"]},{"raw_affiliation_string":"China Satellite Network Digital Technology CO. LTD, Xiong’an, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009577440","display_name":"Shiwei Zhang","orcid":"https://orcid.org/0000-0001-8430-9512"},"institutions":[{"id":"https://openalex.org/I4210141776","display_name":"China XD Group (China)","ror":"https://ror.org/04ceqst84","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210141776"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shiwei Zhang","raw_affiliation_strings":["China Satellite Network Digital Technology Company Ltd., Xiong’an, China","China Satellite Network Digital Technology CO. LTD, Xiong’an, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"China Satellite Network Digital Technology Company Ltd., Xiong’an, China","institution_ids":["https://openalex.org/I4210141776"]},{"raw_affiliation_string":"China Satellite Network Digital Technology CO. LTD, Xiong’an, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111352149","display_name":"Shanjun Bao","orcid":null},"institutions":[{"id":"https://openalex.org/I4210141776","display_name":"China XD Group (China)","ror":"https://ror.org/04ceqst84","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210141776"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shixiong Bao","raw_affiliation_strings":["China Satellite Network Digital Technology Company Ltd., Xiong’an, China","China Satellite Network Digital Technology CO. LTD, Xiong’an, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"China Satellite Network Digital Technology Company Ltd., Xiong’an, China","institution_ids":["https://openalex.org/I4210141776"]},{"raw_affiliation_string":"China Satellite Network Digital Technology CO. LTD, Xiong’an, China","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5016933558","display_name":"Zhengren Li","orcid":"https://orcid.org/0000-0003-2908-2233"},"institutions":[{"id":"https://openalex.org/I139759216","display_name":"Beijing University of Posts and Telecommunications","ror":"https://ror.org/04w9fbh59","country_code":"CN","type":"education","lineage":["https://openalex.org/I139759216"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhengren Li","raw_affiliation_strings":["School of Economics and Management, Beijing University of Posts and Telecommunications, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-2908-2233","affiliations":[{"raw_affiliation_string":"School of Economics and Management, Beijing University of Posts and Telecommunications, Beijing, China","institution_ids":["https://openalex.org/I139759216"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.6576,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.65452144,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":"13","issue":null,"first_page":"110307","last_page":"110321"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14306","display_name":"Technology Assessment and Management","score":0.9060999751091003,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14306","display_name":"Technology Assessment and Management","score":0.9060999751091003,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/causality","display_name":"Causality (physics)","score":0.6177741289138794},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5668387413024902},{"id":"https://openalex.org/keywords/economic-indicator","display_name":"Economic indicator","score":0.441169798374176},{"id":"https://openalex.org/keywords/macroeconomics","display_name":"Macroeconomics","score":0.06392025947570801}],"concepts":[{"id":"https://openalex.org/C64357122","wikidata":"https://www.wikidata.org/wiki/Q1149766","display_name":"Causality (physics)","level":2,"score":0.6177741289138794},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5668387413024902},{"id":"https://openalex.org/C202353208","wikidata":"https://www.wikidata.org/wiki/Q1167393","display_name":"Economic indicator","level":2,"score":0.441169798374176},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.06392025947570801},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2025.3582346","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3582346","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:1992612f56ee4c6095aab28f87dbb091","is_oa":true,"landing_page_url":"https://doaj.org/article/1992612f56ee4c6095aab28f87dbb091","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 13, Pp 110307-110321 (2025)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2025.3582346","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3582346","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.4399999976158142,"display_name":"Reduced inequalities","id":"https://metadata.un.org/sdg/10"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W1965875070","https://openalex.org/W1979357005","https://openalex.org/W2033390084","https://openalex.org/W2051463173","https://openalex.org/W2108657028","https://openalex.org/W2122646361","https://openalex.org/W2143891888","https://openalex.org/W2147129131","https://openalex.org/W2968848985","https://openalex.org/W3021827168","https://openalex.org/W3137756630","https://openalex.org/W4285124025","https://openalex.org/W4293476335","https://openalex.org/W4302423442","https://openalex.org/W4323980184","https://openalex.org/W4379930959","https://openalex.org/W4385502132","https://openalex.org/W4385575551","https://openalex.org/W4388839491","https://openalex.org/W4390616921","https://openalex.org/W4390659208","https://openalex.org/W6774218346"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W4391913857","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W2081494945"],"abstract_inverted_index":{"Intelligent":[0],"Exception":[1],"diagnosis":[2,45],"has":[3],"achieved":[4],"significant":[5,138],"success":[6],"in":[7,25,28,35,150],"extracting":[8],"essential":[9],"information":[10,76],"from":[11,18,77],"sensor":[12],"data.":[13],"However,":[14],"these":[15,33,78],"methods":[16],"suffers":[17],"unstable":[19],"feature":[20],"extraction":[21],"performance":[22],"and":[23,43,69,98,144],"difficulties":[24],"detecting":[26],"anomalies":[27],"high-dimensional":[29],"spaces.":[30],"To":[31],"address":[32],"challenges,":[34],"this":[36],"work,":[37],"we":[38],"propose":[39],"an":[40],"anomaly":[41,147],"detection":[42,148],"fault":[44,96],"framework":[46,90,126],"that":[47,88],"integrates":[48],"causal":[49,60,66,113],"reasoning":[50,67],"with":[51,110],"graph":[52,71],"neural":[53,72],"networks":[54,73],"(CGNN).":[55],"Specifically,":[56],"our":[57,103],"model":[58],"constructs":[59],"graphs":[61],"of":[62,146],"monitoring":[63],"variables":[64],"using":[65],"algorithms":[68],"employs":[70],"to":[74,121],"extract":[75],"graphs.":[79],"Experimental":[80],"validation":[81],"on":[82],"the":[83,142],"extended-TE":[84],"process":[85],"dataset":[86],"demonstrates":[87],"ourCGNN":[89],"outperforms":[91],"baseline":[92],"algorithms,":[93],"achieving":[94],"faster":[95],"identification":[97],"higher":[99],"prediction":[100],"accuracy.":[101],"Importantly,":[102],"approach":[104],"can":[105],"accurately":[106],"diagnose":[107],"faults":[108],"even":[109],"limited":[111],"prior":[112],"knowledge":[114],"among":[115],"variables,":[116],"making":[117],"it":[118],"highly":[119],"adaptable":[120],"various":[122],"industrial":[123,152],"scenarios.":[124],"This":[125],"not":[127],"only":[128],"offers":[129],"practical":[130],"value":[131],"for":[132,140],"engineering":[133],"applications":[134],"but":[135],"also":[136],"provides":[137],"insights":[139],"improving":[141],"interpretability":[143],"reliability":[145],"systems":[149],"complex":[151],"environments.":[153]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-07-15T18:14:33.161393","created_date":"2025-10-10T00:00:00"}