{"id":"https://openalex.org/W4411172235","doi":"https://doi.org/10.1109/access.2025.3578378","title":"Avoiding Equivalent Test Executions in Software Product Line Testing","display_name":"Avoiding Equivalent Test Executions in Software Product Line Testing","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4411172235","doi":"https://doi.org/10.1109/access.2025.3578378"},"language":"en","primary_location":{"id":"doi:10.1109/access.2025.3578378","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3578378","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2025.3578378","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5080725291","display_name":"Pilsu Jung","orcid":"https://orcid.org/0009-0003-1778-8033"},"institutions":[{"id":"https://openalex.org/I189442560","display_name":"Gyeongsang National University","ror":"https://ror.org/00saywf64","country_code":"KR","type":"education","lineage":["https://openalex.org/I189442560"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Pilsu Jung","raw_affiliation_strings":["Department of Software Engineering, Gyeongsang National University, Jinju-si, Gyeongsangnam-do, South Korea"],"raw_orcid":"https://orcid.org/0009-0003-1778-8033","affiliations":[{"raw_affiliation_string":"Department of Software Engineering, Gyeongsang National University, Jinju-si, Gyeongsangnam-do, South Korea","institution_ids":["https://openalex.org/I189442560"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5032788290","display_name":"Jaeho Kim","orcid":"https://orcid.org/0000-0002-5268-0074"},"institutions":[{"id":"https://openalex.org/I189442560","display_name":"Gyeongsang National University","ror":"https://ror.org/00saywf64","country_code":"KR","type":"education","lineage":["https://openalex.org/I189442560"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaeho Kim","raw_affiliation_strings":["Department of Software Engineering, Gyeongsang National University, Jinju-si, Gyeongsangnam-do, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-5268-0074","affiliations":[{"raw_affiliation_string":"Department of Software Engineering, Gyeongsang National University, Jinju-si, Gyeongsangnam-do, South Korea","institution_ids":["https://openalex.org/I189442560"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I189442560"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.12049081,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"13","issue":null,"first_page":"106511","last_page":"106523"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9926000237464905,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10639","display_name":"Advanced Software Engineering Methodologies","score":0.9922000169754028,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6661778688430786},{"id":"https://openalex.org/keywords/software-testing","display_name":"Software testing","score":0.5647826194763184},{"id":"https://openalex.org/keywords/software-product-line","display_name":"Software product line","score":0.5483995079994202},{"id":"https://openalex.org/keywords/product-line","display_name":"Product line","score":0.531394362449646},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.47602230310440063},{"id":"https://openalex.org/keywords/white-box-testing","display_name":"White-box testing","score":0.4693523347377777},{"id":"https://openalex.org/keywords/model-based-testing","display_name":"Model-based testing","score":0.4600384831428528},{"id":"https://openalex.org/keywords/product","display_name":"Product (mathematics)","score":0.4186477065086365},{"id":"https://openalex.org/keywords/line","display_name":"Line (geometry)","score":0.41551458835601807},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.40844473242759705},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.34022119641304016},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.2786952257156372},{"id":"https://openalex.org/keywords/test-case","display_name":"Test case","score":0.24895137548446655},{"id":"https://openalex.org/keywords/software-system","display_name":"Software system","score":0.18563443422317505},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.16281932592391968},{"id":"https://openalex.org/keywords/software-construction","display_name":"Software construction","score":0.1454886496067047},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11952069401741028},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.09838688373565674},{"id":"https://openalex.org/keywords/manufacturing-engineering","display_name":"Manufacturing engineering","score":0.07815384864807129}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6661778688430786},{"id":"https://openalex.org/C2984328558","wikidata":"https://www.wikidata.org/wiki/Q188522","display_name":"Software testing","level":3,"score":0.5647826194763184},{"id":"https://openalex.org/C2778177629","wikidata":"https://www.wikidata.org/wiki/Q2111823","display_name":"Software product line","level":4,"score":0.5483995079994202},{"id":"https://openalex.org/C2988046880","wikidata":"https://www.wikidata.org/wiki/Q3084961","display_name":"Product line","level":2,"score":0.531394362449646},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.47602230310440063},{"id":"https://openalex.org/C162443782","wikidata":"https://www.wikidata.org/wiki/Q1066228","display_name":"White-box testing","level":5,"score":0.4693523347377777},{"id":"https://openalex.org/C165825675","wikidata":"https://www.wikidata.org/wiki/Q1399743","display_name":"Model-based testing","level":4,"score":0.4600384831428528},{"id":"https://openalex.org/C90673727","wikidata":"https://www.wikidata.org/wiki/Q901718","display_name":"Product (mathematics)","level":2,"score":0.4186477065086365},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.41551458835601807},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.40844473242759705},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.34022119641304016},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.2786952257156372},{"id":"https://openalex.org/C128942645","wikidata":"https://www.wikidata.org/wiki/Q1568346","display_name":"Test case","level":3,"score":0.24895137548446655},{"id":"https://openalex.org/C149091818","wikidata":"https://www.wikidata.org/wiki/Q2429814","display_name":"Software system","level":3,"score":0.18563443422317505},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.16281932592391968},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.1454886496067047},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11952069401741028},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.09838688373565674},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.07815384864807129},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2025.3578378","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3578378","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:4b399ea0cbd94edf8c0597dbe53e64b2","is_oa":true,"landing_page_url":"https://doaj.org/article/4b399ea0cbd94edf8c0597dbe53e64b2","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 13, Pp 106511-106523 (2025)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2025.3578378","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3578378","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G6939442161","display_name":null,"funder_award_id":"RS-2023-00209720","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"}],"funders":[{"id":"https://openalex.org/F4320321318","display_name":"Gyeongsang National University","ror":"https://ror.org/00saywf64"},{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":35,"referenced_works":["https://openalex.org/W163074494","https://openalex.org/W1490160828","https://openalex.org/W1560671530","https://openalex.org/W1983306745","https://openalex.org/W1987174293","https://openalex.org/W1993760289","https://openalex.org/W2014011458","https://openalex.org/W2023501626","https://openalex.org/W2065399007","https://openalex.org/W2065587836","https://openalex.org/W2075539908","https://openalex.org/W2084507645","https://openalex.org/W2090539172","https://openalex.org/W2107667898","https://openalex.org/W2115910430","https://openalex.org/W2152893457","https://openalex.org/W2154897437","https://openalex.org/W2187798471","https://openalex.org/W2339904014","https://openalex.org/W2477378326","https://openalex.org/W2608953129","https://openalex.org/W2794998956","https://openalex.org/W2894714382","https://openalex.org/W2990116723","https://openalex.org/W3021168592","https://openalex.org/W3033058566","https://openalex.org/W3112840095","https://openalex.org/W3170840759","https://openalex.org/W4234018049","https://openalex.org/W4238064055","https://openalex.org/W4308643068","https://openalex.org/W4388871940","https://openalex.org/W4394769335","https://openalex.org/W6751135602","https://openalex.org/W6751871541"],"related_works":["https://openalex.org/W2163809353","https://openalex.org/W3141846160","https://openalex.org/W4233789246","https://openalex.org/W4251582706","https://openalex.org/W4248586125","https://openalex.org/W4246810033","https://openalex.org/W2051414193","https://openalex.org/W1972612110","https://openalex.org/W2399803796","https://openalex.org/W1540928018"],"abstract_inverted_index":{"In":[0,20,49],"the":[1,34,39,45,71,92,112,126,151,162],"context":[2],"of":[3,14,29,80,129,134,153],"software":[4],"product":[5,104],"line":[6],"(SPL),":[7],"test":[8,35,54,82,89,93,99,127,136,154],"cases":[9],"are":[10,33],"reused":[11],"for":[12],"testing":[13,47,73],"multiple":[15],"products":[16],"that":[17,37,87,146],"have":[18,38],"commonality.":[19],"such":[21],"a":[22,103,108,122],"case,":[23],"their":[24],"executions":[25,36,55,83,90,100,155],"may":[26],"contain":[27],"repetitions":[28],"equivalent":[30,53,81,88,98,135],"executions,":[31],"which":[32],"identical":[40],"execution":[41,164],"flow":[42],"and":[43,68,84,115],"produce":[44],"same":[46],"result.":[48],"SPL":[50,72,114,130,143],"testing,":[51],"repeating":[52],"should":[56],"be":[57],"avoided":[58],"because":[59],"it":[60],"does":[61],"not":[62],"contribute":[63],"to":[64,124,161],"finding":[65],"new":[66],"faults":[67],"unnecessarily":[69],"increases":[70],"cost.":[74],"This":[75],"paper":[76],"defines":[77],"two":[78,142],"types":[79],"points":[85],"out":[86],"increase":[91],"redundancy.":[94],"To":[95],"show":[96],"how":[97],"occur":[101],"in":[102],"line,":[105],"we":[106,120],"conduct":[107],"preliminary":[109],"experiment":[110],"using":[111],"VendingMachine":[113],"its":[116],"evolved":[117],"versions.":[118],"Then":[119],"propose":[121],"method":[123,149,165],"reduce":[125],"redundancy":[128],"by":[131,156],"avoiding":[132],"repetition":[133],"executions.":[137],"Our":[138],"experimental":[139],"evaluation":[140],"with":[141],"systems":[144],"shows":[145],"our":[147],"proposed":[148],"reduces":[150],"number":[152],"57.4%":[157],"on":[158],"average":[159],"compared":[160],"exhaustive":[163],"without":[166],"sacrificing":[167],"fault":[168],"detection":[169],"effect.":[170]},"counts_by_year":[],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}