{"id":"https://openalex.org/W4410614081","doi":"https://doi.org/10.1109/access.2025.3572563","title":"Artificial Intelligence Techniques With Digital Twin for Fault Diagnosis in Interconnected Systems: A Review","display_name":"Artificial Intelligence Techniques With Digital Twin for Fault Diagnosis in Interconnected Systems: A Review","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4410614081","doi":"https://doi.org/10.1109/access.2025.3572563"},"language":"en","primary_location":{"id":"doi:10.1109/access.2025.3572563","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3572563","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2025.3572563","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5117642104","display_name":"Imen Nakti","orcid":null},"institutions":[{"id":"https://openalex.org/I8636806","display_name":"University of Sousse","ror":"https://ror.org/00dmpgj58","country_code":"TN","type":"education","lineage":["https://openalex.org/I8636806"]}],"countries":["TN"],"is_corresponding":false,"raw_author_name":"Imen Nakti","raw_affiliation_strings":["Laboratory of Advanced Technology and Intelligent Systems, ENISO, University of Sousse, Sousse, Tunisia","Laboratory of Advanced Technology and Intelligent systems, ENISO, University of Sousse, Sousse, Tunisia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratory of Advanced Technology and Intelligent Systems, ENISO, University of Sousse, Sousse, Tunisia","institution_ids":["https://openalex.org/I8636806"]},{"raw_affiliation_string":"Laboratory of Advanced Technology and Intelligent systems, ENISO, University of Sousse, Sousse, Tunisia","institution_ids":["https://openalex.org/I8636806"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043479229","display_name":"Majdi Mansouri","orcid":"https://orcid.org/0000-0001-6390-4304"},"institutions":[{"id":"https://openalex.org/I47818738","display_name":"Sultan Qaboos University","ror":"https://ror.org/04wq8zb47","country_code":"OM","type":"education","lineage":["https://openalex.org/I47818738"]}],"countries":["OM"],"is_corresponding":false,"raw_author_name":"Majdi Mansouri","raw_affiliation_strings":["Department of Electrical and Computer Engineering, College of Engineering, Sultan Qaboos University, Muscat, Oman"],"raw_orcid":"https://orcid.org/0000-0001-6390-4304","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, College of Engineering, Sultan Qaboos University, Muscat, Oman","institution_ids":["https://openalex.org/I47818738"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089610480","display_name":"Rami Al\u2010Hmouz","orcid":"https://orcid.org/0000-0001-8710-0706"},"institutions":[{"id":"https://openalex.org/I47818738","display_name":"Sultan Qaboos University","ror":"https://ror.org/04wq8zb47","country_code":"OM","type":"education","lineage":["https://openalex.org/I47818738"]}],"countries":["OM"],"is_corresponding":false,"raw_author_name":"Rami Al-Hmouz","raw_affiliation_strings":["Department of Electrical and Computer Engineering, College of Engineering, Sultan Qaboos University, Muscat, Oman"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, College of Engineering, Sultan Qaboos University, Muscat, Oman","institution_ids":["https://openalex.org/I47818738"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5062601949","display_name":"Atef Khedher","orcid":"https://orcid.org/0000-0001-5836-8244"},"institutions":[{"id":"https://openalex.org/I8636806","display_name":"University of Sousse","ror":"https://ror.org/00dmpgj58","country_code":"TN","type":"education","lineage":["https://openalex.org/I8636806"]}],"countries":["TN"],"is_corresponding":false,"raw_author_name":"Atef Khedher","raw_affiliation_strings":["Laboratory of Advanced Technology and Intelligent Systems, ENISO, University of Sousse, Sousse, Tunisia","Laboratory of Advanced Technology and Intelligent systems, ENISO, University of Sousse, Sousse, Tunisia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratory of Advanced Technology and Intelligent Systems, ENISO, University of Sousse, Sousse, Tunisia","institution_ids":["https://openalex.org/I8636806"]},{"raw_affiliation_string":"Laboratory of Advanced Technology and Intelligent systems, ENISO, University of Sousse, Sousse, Tunisia","institution_ids":["https://openalex.org/I8636806"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":3.721,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.93912286,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":98,"max":99},"biblio":{"volume":"13","issue":null,"first_page":"91860","last_page":"91874"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9879000186920166,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9879000186920166,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9549000263214111,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9114999771118164,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6974561810493469},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.47918546199798584},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.429370254278183}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6974561810493469},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.47918546199798584},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.429370254278183},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2025.3572563","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3572563","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:bcf08f9fb822443d9721225398ddcc86","is_oa":true,"landing_page_url":"https://doaj.org/article/bcf08f9fb822443d9721225398ddcc86","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 13, Pp 91860-91874 (2025)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2025.3572563","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3572563","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/13","display_name":"Climate action","score":0.4300000071525574}],"awards":[],"funders":[{"id":"https://openalex.org/F4320322573","display_name":"Sultan Qaboos University","ror":"https://ror.org/04wq8zb47"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":93,"referenced_works":["https://openalex.org/W2134295053","https://openalex.org/W2416799949","https://openalex.org/W2493697924","https://openalex.org/W2791925478","https://openalex.org/W3097471692","https://openalex.org/W3120394327","https://openalex.org/W3142292878","https://openalex.org/W3149839747","https://openalex.org/W3159767275","https://openalex.org/W3170647102","https://openalex.org/W3207857242","https://openalex.org/W3213439721","https://openalex.org/W3213755975","https://openalex.org/W4200612054","https://openalex.org/W4205512943","https://openalex.org/W4205977910","https://openalex.org/W4206842007","https://openalex.org/W4210702638","https://openalex.org/W4210741351","https://openalex.org/W4214900601","https://openalex.org/W4220831070","https://openalex.org/W4225510469","https://openalex.org/W4225839279","https://openalex.org/W4225984473","https://openalex.org/W4238082094","https://openalex.org/W4285032067","https://openalex.org/W4285261690","https://openalex.org/W4288427527","https://openalex.org/W4290785730","https://openalex.org/W4293155325","https://openalex.org/W4295096366","https://openalex.org/W4296121638","https://openalex.org/W4296250115","https://openalex.org/W4296437375","https://openalex.org/W4296488800","https://openalex.org/W4296913260","https://openalex.org/W4297973406","https://openalex.org/W4304693606","https://openalex.org/W4308578406","https://openalex.org/W4308906783","https://openalex.org/W4309326585","https://openalex.org/W4309688700","https://openalex.org/W4313326430","https://openalex.org/W4313362273","https://openalex.org/W4317727238","https://openalex.org/W4317931974","https://openalex.org/W4318148761","https://openalex.org/W4318763889","https://openalex.org/W4319300573","https://openalex.org/W4320731847","https://openalex.org/W4321603944","https://openalex.org/W4324032847","https://openalex.org/W4361794457","https://openalex.org/W4362499017","https://openalex.org/W4366980306","https://openalex.org/W4367843921","https://openalex.org/W4371766247","https://openalex.org/W4377292722","https://openalex.org/W4379053483","https://openalex.org/W4379053982","https://openalex.org/W4383031976","https://openalex.org/W4385062369","https://openalex.org/W4385209714","https://openalex.org/W4386373623","https://openalex.org/W4386585654","https://openalex.org/W4387150541","https://openalex.org/W4388834351","https://openalex.org/W4389497086","https://openalex.org/W4389713122","https://openalex.org/W4390675566","https://openalex.org/W4390933786","https://openalex.org/W4391053798","https://openalex.org/W4391169697","https://openalex.org/W4392183641","https://openalex.org/W4393394744","https://openalex.org/W4394065206","https://openalex.org/W4399359669","https://openalex.org/W4399988343","https://openalex.org/W4400488219","https://openalex.org/W4401023107","https://openalex.org/W4401163939","https://openalex.org/W4404524706","https://openalex.org/W4404787824","https://openalex.org/W4404860533","https://openalex.org/W4405179526","https://openalex.org/W4405781847","https://openalex.org/W4405847819","https://openalex.org/W4405908399","https://openalex.org/W4408013700","https://openalex.org/W4408453984","https://openalex.org/W6847170218","https://openalex.org/W6869567780","https://openalex.org/W6910546390"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W4391913857","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W4396696052"],"abstract_inverted_index":{"As":[0],"industrial":[1,139],"systems":[2,135],"become":[3,16],"more":[4],"complex":[5],"and":[6,11,51,55,71,94,112,121,126],"interconnected,":[7],"diagnosing":[8],"faults":[9],"accurately":[10],"in":[12,136],"real":[13],"time":[14],"has":[15],"increasingly":[17],"challenging.":[18],"This":[19],"paper":[20],"explores":[21],"how":[22],"combining":[23],"artificial":[24],"intelligence":[25,40],"with":[26,123],"digital":[27],"twin":[28],"technology":[29],"can":[30],"address":[31],"these":[32,88],"challenges.":[33],"We":[34,98],"focus":[35],"on":[36],"developing":[37,130],"hybrid":[38],"Artificial":[39],"models":[41,61],"that":[42],"leverage":[43],"diverse":[44],"data":[45],"sources":[46],"to":[47,67,90,118],"enhance":[48,68],"fault":[49,133],"detection":[50],"diagnosis,":[52],"enabling":[53],"secure":[54],"distributed":[56],"diagnostics.":[57],"Digital":[58],"twins,":[59],"virtual":[60],"of":[62,102],"physical":[63],"systems,":[64],"are":[65],"shown":[66],"predictive":[69],"maintenance":[70],"decision-making":[72],"by":[73],"providing":[74],"real-time":[75],"system":[76],"insights.":[77],"What":[78],"sets":[79],"our":[80],"work":[81],"apart":[82],"is":[83,117],"the":[84,100],"way":[85],"we":[86],"integrate":[87],"technologies":[89],"create":[91],"scalable,":[92],"adaptive,":[93],"context-aware":[95],"diagnostic":[96],"solutions.":[97],"demonstrate":[99],"potential":[101],"this":[103],"approach":[104],"across":[105],"applications":[106],"such":[107],"as":[108],"smart":[109],"grids,":[110],"manufacturing,":[111],"autonomous":[113],"systems.":[114],"Our":[115],"goal":[116],"provide":[119],"researchers":[120],"practitioners":[122],"a":[124],"practical":[125],"forward-looking":[127],"framework":[128],"for":[129],"intelligent,":[131],"reliable":[132],"diagnosis":[134],"today\u2019s":[137],"data-rich":[138],"environments.":[140]},"counts_by_year":[{"year":2026,"cited_by_count":6},{"year":2025,"cited_by_count":6}],"updated_date":"2026-07-28T07:46:37.118299","created_date":"2025-10-10T00:00:00"}