{"id":"https://openalex.org/W4410358633","doi":"https://doi.org/10.1109/access.2025.3570075","title":"Anomaly-Focused Augmentation Method for Industrial Visual Inspection","display_name":"Anomaly-Focused Augmentation Method for Industrial Visual Inspection","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4410358633","doi":"https://doi.org/10.1109/access.2025.3570075"},"language":"en","primary_location":{"id":"doi:10.1109/access.2025.3570075","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3570075","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2025.3570075","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5024631232","display_name":"Melvin Alexis Lara de Le\u00f3n","orcid":"https://orcid.org/0000-0002-1531-8041"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Melvin A. Lara","raw_affiliation_strings":["Department of Cybernetics and Biomedical Engineering, Faculty of Electrical Engineering and Computer Science, Ostrava, Czech Republic"],"affiliations":[{"raw_affiliation_string":"Department of Cybernetics and Biomedical Engineering, Faculty of Electrical Engineering and Computer Science, Ostrava, Czech Republic","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047918826","display_name":"Ibrahim A. Hameed","orcid":"https://orcid.org/0000-0003-1252-260X"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Ibrahim A. Hameed","raw_affiliation_strings":["Department of Cybernetics and Biomedical Engineering, Faculty of Electrical Engineering and Computer Science, Ostrava, Czech Republic"],"affiliations":[{"raw_affiliation_string":"Department of Cybernetics and Biomedical Engineering, Faculty of Electrical Engineering and Computer Science, Ostrava, Czech Republic","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5022495477","display_name":"Ji\u0159\u00ed Koziorek","orcid":"https://orcid.org/0000-0002-7138-887X"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jiri Koziorek","raw_affiliation_strings":["Department of Cybernetics and Biomedical Engineering, Faculty of Electrical Engineering and Computer Science, Ostrava, Czech Republic"],"affiliations":[{"raw_affiliation_string":"Department of Cybernetics and Biomedical Engineering, Faculty of Electrical Engineering and Computer Science, Ostrava, Czech Republic","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5024631232"],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.14017771,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"13","issue":null,"first_page":"89118","last_page":"89139"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9894000291824341,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9894000291824341,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6161649823188782},{"id":"https://openalex.org/keywords/anomaly","display_name":"Anomaly (physics)","score":0.5229806900024414},{"id":"https://openalex.org/keywords/visual-inspection","display_name":"Visual inspection","score":0.5062896013259888},{"id":"https://openalex.org/keywords/anomaly-detection","display_name":"Anomaly detection","score":0.49330535531044006},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.43379008769989014},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4192812740802765}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6161649823188782},{"id":"https://openalex.org/C12997251","wikidata":"https://www.wikidata.org/wiki/Q567560","display_name":"Anomaly (physics)","level":2,"score":0.5229806900024414},{"id":"https://openalex.org/C168820333","wikidata":"https://www.wikidata.org/wiki/Q448889","display_name":"Visual inspection","level":2,"score":0.5062896013259888},{"id":"https://openalex.org/C739882","wikidata":"https://www.wikidata.org/wiki/Q3560506","display_name":"Anomaly detection","level":2,"score":0.49330535531044006},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.43379008769989014},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4192812740802765},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2025.3570075","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3570075","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:c9c0be3a291f4cd3870f68ddcf3e7890","is_oa":true,"landing_page_url":"https://doaj.org/article/c9c0be3a291f4cd3870f68ddcf3e7890","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 13, Pp 89118-89139 (2025)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2025.3570075","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3570075","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":44,"referenced_works":["https://openalex.org/W1481562241","https://openalex.org/W2133665775","https://openalex.org/W2148617077","https://openalex.org/W2724455719","https://openalex.org/W2884561390","https://openalex.org/W2923486253","https://openalex.org/W2942077508","https://openalex.org/W2963108767","https://openalex.org/W2963459241","https://openalex.org/W2972059106","https://openalex.org/W2975317124","https://openalex.org/W2982763192","https://openalex.org/W3009184501","https://openalex.org/W3012374719","https://openalex.org/W3035574324","https://openalex.org/W3043547428","https://openalex.org/W3147184966","https://openalex.org/W3197438232","https://openalex.org/W4205486372","https://openalex.org/W4240032041","https://openalex.org/W4309703584","https://openalex.org/W4311400544","https://openalex.org/W4320525814","https://openalex.org/W4386075924","https://openalex.org/W4386832602","https://openalex.org/W4402727074","https://openalex.org/W4402754148","https://openalex.org/W4402774219","https://openalex.org/W4402782221","https://openalex.org/W4403562375","https://openalex.org/W4403791567","https://openalex.org/W4403905772","https://openalex.org/W6678815747","https://openalex.org/W6712588444","https://openalex.org/W6718379498","https://openalex.org/W6752215718","https://openalex.org/W6757857098","https://openalex.org/W6765779288","https://openalex.org/W6790978476","https://openalex.org/W6810907425","https://openalex.org/W6849361065","https://openalex.org/W6853287796","https://openalex.org/W6869646869","https://openalex.org/W6873256562"],"related_works":["https://openalex.org/W2806741695","https://openalex.org/W2772917594","https://openalex.org/W2036807459","https://openalex.org/W2058170566","https://openalex.org/W2755342338","https://openalex.org/W2166024367","https://openalex.org/W3116076068","https://openalex.org/W2229312674","https://openalex.org/W2951359407","https://openalex.org/W2079911747"],"abstract_inverted_index":{"In":[0],"industrial":[1],"inspection,":[2],"the":[3,20,64,85,100,127,137,142,149,154,167,170],"detection":[4,34,158],"of":[5,23,26,87,108,141,156,169],"surface":[6],"defects\u2014such":[7],"as":[8],"scratches,":[9],"dents,":[10],"or":[11],"other":[12],"defects\u2014is":[13],"crucial":[14],"for":[15,31,84],"ensuring":[16],"product":[17],"quality.":[18],"However,":[19],"limited":[21],"availability":[22],"annotated":[24],"images":[25,109],"such":[27],"defects":[28,68],"poses":[29],"challenges":[30],"developing":[32],"reliable":[33],"models.":[35],"This":[36,82],"paper":[37],"proposes":[38],"a":[39,53,94,124],"novel":[40],"image":[41],"augmentation":[42,128,163],"algorithm":[43,92],"to":[44,98,116,135,161],"address":[45],"this":[46],"limitation":[47],"by":[48],"generating":[49],"synthetic":[50],"imperfections":[51],"from":[52],"small":[54],"sample":[55],"set.":[56],"Unlike":[57],"traditional":[58],"approaches":[59],"that":[60,148],"augment":[61],"entire":[62],"images,":[63],"proposed":[65,150],"approach":[66],"isolates":[67],"and":[69,105,110,139],"applies":[70,112],"spatial":[71,101],"transformations":[72],"(e.g.,":[73],"rotation,":[74],"shear)":[75],"before":[76],"blending":[77],"them":[78],"into":[79],"background":[80,106],"images.":[81,121,172],"allows":[83],"creation":[86],"diverse":[88],"training":[89,134],"datasets.":[90],"The":[91],"employs":[93],"2D":[95],"binary":[96],"map":[97],"encode":[99],"relationship":[102],"between":[103],"defect":[104,157],"regions":[107],"then":[111],"an":[113],"AI-driven":[114],"model":[115],"generate":[117],"new":[118],"realistic":[119],"blended":[120],"By":[122],"leveraging":[123],"generator-discriminator":[125],"framework,":[126],"process":[129],"is":[130],"iteratively":[131],"refined":[132],"during":[133],"maintain":[136],"style":[138],"texture":[140],"original":[143],"imperfections.":[144],"Experimental":[145],"results":[146],"show":[147],"method":[151],"significantly":[152],"enhances":[153],"performance":[155],"models":[159],"compared":[160],"existing":[162],"techniques":[164],"while":[165],"preserving":[166],"realism":[168],"generated":[171]},"counts_by_year":[],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-05-15T00:00:00"}