{"id":"https://openalex.org/W4410359254","doi":"https://doi.org/10.1109/access.2025.3569970","title":"LDDFSF-YOLO11: A Lightweight Insulator Defect Detection Method Focusing on Small-Sized Features","display_name":"LDDFSF-YOLO11: A Lightweight Insulator Defect Detection Method Focusing on Small-Sized Features","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4410359254","doi":"https://doi.org/10.1109/access.2025.3569970"},"language":"en","primary_location":{"id":"doi:10.1109/access.2025.3569970","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3569970","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2025.3569970","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101479392","display_name":"Peng Shen","orcid":"https://orcid.org/0000-0003-0872-8672"},"institutions":[{"id":"https://openalex.org/I4210119087","display_name":"North China Institute of Aerospace Engineering","ror":"https://ror.org/02m7msy24","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210119087"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Peng Shen","raw_affiliation_strings":["North China Institute of Aerospace Engineering, Langfang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"North China Institute of Aerospace Engineering, Langfang, China","institution_ids":["https://openalex.org/I4210119087"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Keyu Mei","orcid":"https://orcid.org/0009-0004-4436-1374"},"institutions":[{"id":"https://openalex.org/I4210119087","display_name":"North China Institute of Aerospace Engineering","ror":"https://ror.org/02m7msy24","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210119087"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Keyu Mei","raw_affiliation_strings":["North China Institute of Aerospace Engineering, Langfang, China"],"raw_orcid":"https://orcid.org/0009-0004-4436-1374","affiliations":[{"raw_affiliation_string":"North China Institute of Aerospace Engineering, Langfang, China","institution_ids":["https://openalex.org/I4210119087"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Huiqiong Cao","orcid":null},"institutions":[{"id":"https://openalex.org/I4210119087","display_name":"North China Institute of Aerospace Engineering","ror":"https://ror.org/02m7msy24","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210119087"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huiqiong Cao","raw_affiliation_strings":["North China Institute of Aerospace Engineering, Langfang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"North China Institute of Aerospace Engineering, Langfang, China","institution_ids":["https://openalex.org/I4210119087"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013225043","display_name":"Yongxiang Zhao","orcid":"https://orcid.org/0000-0001-8209-6015"},"institutions":[{"id":"https://openalex.org/I4210119087","display_name":"North China Institute of Aerospace Engineering","ror":"https://ror.org/02m7msy24","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210119087"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yongxiang Zhao","raw_affiliation_strings":["North China Institute of Aerospace Engineering, Langfang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"North China Institute of Aerospace Engineering, Langfang, China","institution_ids":["https://openalex.org/I4210119087"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100419071","display_name":"Guoqing Zhang","orcid":"https://orcid.org/0000-0003-2169-9060"},"institutions":[{"id":"https://openalex.org/I4210119087","display_name":"North China Institute of Aerospace Engineering","ror":"https://ror.org/02m7msy24","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210119087"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guoqing Zhang","raw_affiliation_strings":["North China Institute of Aerospace Engineering, Langfang, China"],"raw_orcid":"https://orcid.org/0000-0003-2169-9060","affiliations":[{"raw_affiliation_string":"North China Institute of Aerospace Engineering, Langfang, China","institution_ids":["https://openalex.org/I4210119087"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210119087"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":3.8885,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.9325553,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":91,"max":99},"biblio":{"volume":"13","issue":null,"first_page":"90273","last_page":"90292"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.9884999990463257,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14319","display_name":"Currency Recognition and Detection","score":0.9817000031471252,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5754438042640686},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3757407069206238},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3546419143676758}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5754438042640686},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3757407069206238},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3546419143676758}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2025.3569970","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3569970","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:ae412ed920e04da3a2eec106453a12c1","is_oa":true,"landing_page_url":"https://doaj.org/article/ae412ed920e04da3a2eec106453a12c1","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 13, Pp 90273-90292 (2025)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2025.3569970","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3569970","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.7300000190734863}],"awards":[{"id":"https://openalex.org/G1874418463","display_name":null,"funder_award_id":"246Z7401G","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3748243312","display_name":null,"funder_award_id":"52305002","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":48,"referenced_works":["https://openalex.org/W639708223","https://openalex.org/W1536680647","https://openalex.org/W2037300398","https://openalex.org/W2193145675","https://openalex.org/W2194775991","https://openalex.org/W2783876128","https://openalex.org/W2807888105","https://openalex.org/W2897772777","https://openalex.org/W2962851801","https://openalex.org/W2963037989","https://openalex.org/W2963150697","https://openalex.org/W3018757597","https://openalex.org/W3106250896","https://openalex.org/W3134054343","https://openalex.org/W3200605425","https://openalex.org/W3208154594","https://openalex.org/W4229005974","https://openalex.org/W4283331019","https://openalex.org/W4285410123","https://openalex.org/W4287889566","https://openalex.org/W4293584584","https://openalex.org/W4297825346","https://openalex.org/W4320497577","https://openalex.org/W4376108443","https://openalex.org/W4385834357","https://openalex.org/W4386076325","https://openalex.org/W4386527666","https://openalex.org/W4389441979","https://openalex.org/W4392974018","https://openalex.org/W4396595989","https://openalex.org/W4396863911","https://openalex.org/W4396883987","https://openalex.org/W4401920092","https://openalex.org/W4402129107","https://openalex.org/W4404303854","https://openalex.org/W4404672134","https://openalex.org/W4406208448","https://openalex.org/W4406261219","https://openalex.org/W4406561591","https://openalex.org/W4406679561","https://openalex.org/W4406756309","https://openalex.org/W4408047696","https://openalex.org/W4408256364","https://openalex.org/W4408281549","https://openalex.org/W6750227808","https://openalex.org/W6802878479","https://openalex.org/W6873881505","https://openalex.org/W6941300330"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W4404995717","https://openalex.org/W2016187641","https://openalex.org/W4404725684","https://openalex.org/W4246450666","https://openalex.org/W4388998267","https://openalex.org/W4409278740","https://openalex.org/W2898370298"],"abstract_inverted_index":{"Insulators":[0],"are":[1,129],"essential":[2],"for":[3,26,64,242],"maintaining":[4],"electrical":[5],"isolation":[6],"in":[7,32,68,140,176,245,269,271],"transmission":[8,34,285],"lines,":[9],"with":[10,217],"the":[11,95,108,113,133,147,170,177,181,204,218,222,278],"timely":[12],"and":[13,30,44,61,90,122,142,154,203,230,235,255,264,280],"accurate":[14],"identification":[15],"of":[16,112,149,172,248,283],"their":[17],"defects":[18,67,139,268],"via":[19],"Unmanned":[20],"aerial":[21],"vehicle":[22],"(UAV)":[23],"being":[24],"crucial":[25],"ensuring":[27],"operational":[28],"stability":[29],"safety":[31],"high-voltage":[33,284],"lines.":[35,286],"Due":[36],"to":[37,87,106,131,136,157,168,188,277],"complex":[38,143,158,272],"environmental":[39],"conditions,":[40,47],"varying":[41],"viewing":[42],"angles,":[43],"unstable":[45],"lighting":[46],"existing":[48],"insulator":[49,77,92,201],"defect":[50,78],"detection":[51,79],"algorithms":[52],"still":[53],"face":[54],"challenges,":[55],"including":[56],"missed":[57,150],"detection,":[58,60],"false":[59,152],"inadequate":[62],"adaptability":[63,156],"detecting":[65],"small-sized":[66,85,138,249],"UAV":[69],"captured":[70],"images.":[71],"This":[72],"study":[73],"proposes":[74],"a":[75,98,118,123,198],"lightweight":[76],"method":[80],"(LDDFSF-YOLO11)":[81],"that":[82,215],"focuses":[83],"on":[84],"features":[86],"efficiently":[88],"detect":[89,137],"identify":[91,266],"defects.":[93],"In":[94,116,160],"LDDFSF-YOLO11":[96,223,260],"model,":[97],"focused":[99],"feature":[100,109,125],"extraction":[101,110],"module":[102,127],"(MFFEConv)":[103],"is":[104],"proposed":[105,130],"enhance":[107,132],"capability":[111],"backbone":[114],"network.":[115],"addition,":[117,161],"collaborative":[119],"attention":[120],"mechanism":[121],"multi-scale":[124],"fusion":[126],"(MDMF)":[128],"model\u2019s":[134],"ability":[135],"remote":[141],"backgrounds,":[144,273],"effectively":[145],"solving":[146],"problems":[148],"detections,":[151,153],"poor":[155],"backgrounds.":[159],"we":[162],"propose":[163],"an":[164],"RWLoss":[165],"loss":[166],"function":[167],"improve":[169,189],"accuracy":[171],"bounding":[173],"box":[174],"matching":[175],"model.":[178],"And":[179],"optimize":[180],"network":[182],"structure":[183],"through":[184],"channel":[185],"pruning":[186],"technology":[187],"model":[190,220,224,237,261],"lightweighting.":[191],"Finally,":[192],"experimental":[193,212],"validation":[194],"was":[195],"conducted":[196],"using":[197],"self":[199],"built":[200],"dataset":[202],"China":[205],"Power":[206],"Line":[207],"Insulator":[208],"Dataset":[209],"(CPLID).":[210],"The":[211,259],"results":[213],"showed":[214],"compared":[216],"baseline":[219],"YOLO11,":[221],"improved":[225],"AP50":[226],"by":[227,233,239],"9.8%,":[228],"8.2%,":[229],"5.4%,":[231],"mAP":[232],"7.1%,":[234],"reduced":[236],"size":[238],"56.1%,":[240],"accounting":[241],"only":[243],"4.2MB,":[244],"three":[246],"types":[247],"defects:":[250],"fractional":[251],"insulator,":[252,254,257],"drop":[253],"flash":[256],"respectively.":[258],"can":[262],"quickly":[263],"accurately":[265],"small-scale":[267],"insulators":[270],"making":[274],"important":[275],"contributions":[276],"safe":[279],"stable":[281],"operation":[282]},"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}