{"id":"https://openalex.org/W4410226688","doi":"https://doi.org/10.1109/access.2025.3568378","title":"Curvature Scale Space Corner Detection-Based Registration Algorithm for Infrared and Visible Light Images of Power Equipment","display_name":"Curvature Scale Space Corner Detection-Based Registration Algorithm for Infrared and Visible Light Images of Power Equipment","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4410226688","doi":"https://doi.org/10.1109/access.2025.3568378"},"language":"en","primary_location":{"id":"doi:10.1109/access.2025.3568378","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3568378","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2025.3568378","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100862868","display_name":"Hongyan Han","orcid":null},"institutions":[{"id":"https://openalex.org/I113940042","display_name":"Shanghai University","ror":"https://ror.org/006teas31","country_code":"CN","type":"education","lineage":["https://openalex.org/I113940042"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"HongYan Han","raw_affiliation_strings":["School of Materials Science and Engineering, Shanghai University, Shanghai, China"],"raw_orcid":"https://orcid.org/0009-0001-3980-6138","affiliations":[{"raw_affiliation_string":"School of Materials Science and Engineering, Shanghai University, Shanghai, China","institution_ids":["https://openalex.org/I113940042"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5107519513","display_name":"Z.H. Wang","orcid":"https://orcid.org/0000-0002-6471-637X"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210092495","display_name":"Suzhou Institute of Nano-tech and Nano-bionics","ror":"https://ror.org/0027d9x02","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210092495"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"ZhengGuang Wang","raw_affiliation_strings":["Chinese Academy of Sciences, Suzhou Institute of Nano-Tech and Nano-Bionics (SINANO), Suzhou, China","Suzhou Institute of Nano-Tech and Nano-Bionics (SINANO), Chinese Academy of Sciences, Suzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chinese Academy of Sciences, Suzhou Institute of Nano-Tech and Nano-Bionics (SINANO), Suzhou, China","institution_ids":["https://openalex.org/I4210092495","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Suzhou Institute of Nano-Tech and Nano-Bionics (SINANO), Chinese Academy of Sciences, Suzhou, China","institution_ids":["https://openalex.org/I4210092495","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007936726","display_name":"Peng Ding","orcid":"https://orcid.org/0009-0009-4904-2432"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210092495","display_name":"Suzhou Institute of Nano-tech and Nano-bionics","ror":"https://ror.org/0027d9x02","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210092495"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Peng Ding","raw_affiliation_strings":["Chinese Academy of Sciences, Suzhou Institute of Nano-Tech and Nano-Bionics (SINANO), Suzhou, China","Suzhou Institute of Nano-Tech and Nano-Bionics (SINANO), Chinese Academy of Sciences, Suzhou, China"],"raw_orcid":"https://orcid.org/0009-0009-4904-2432","affiliations":[{"raw_affiliation_string":"Chinese Academy of Sciences, Suzhou Institute of Nano-Tech and Nano-Bionics (SINANO), Suzhou, China","institution_ids":["https://openalex.org/I4210092495","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Suzhou Institute of Nano-Tech and Nano-Bionics (SINANO), Chinese Academy of Sciences, Suzhou, China","institution_ids":["https://openalex.org/I4210092495","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Nan Liu","orcid":"https://orcid.org/0009-0000-6736-2995"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210092495","display_name":"Suzhou Institute of Nano-tech and Nano-bionics","ror":"https://ror.org/0027d9x02","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210092495"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Nan Liu","raw_affiliation_strings":["Chinese Academy of Sciences, Suzhou Institute of Nano-Tech and Nano-Bionics (SINANO), Suzhou, China","Suzhou Institute of Nano-Tech and Nano-Bionics (SINANO), Chinese Academy of Sciences, Suzhou, China"],"raw_orcid":"https://orcid.org/0009-0000-6736-2995","affiliations":[{"raw_affiliation_string":"Chinese Academy of Sciences, Suzhou Institute of Nano-Tech and Nano-Bionics (SINANO), Suzhou, China","institution_ids":["https://openalex.org/I4210092495","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Suzhou Institute of Nano-Tech and Nano-Bionics (SINANO), Chinese Academy of Sciences, Suzhou, China","institution_ids":["https://openalex.org/I4210092495","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039569199","display_name":"Zhenyao Li","orcid":"https://orcid.org/0009-0007-7443-2876"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210092495","display_name":"Suzhou Institute of Nano-tech and Nano-bionics","ror":"https://ror.org/0027d9x02","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210092495"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"ZhenYao Li","raw_affiliation_strings":["Chinese Academy of Sciences, Suzhou Institute of Nano-Tech and Nano-Bionics (SINANO), Suzhou, China","Suzhou Institute of Nano-Tech and Nano-Bionics (SINANO), Chinese Academy of Sciences, Suzhou, China"],"raw_orcid":"https://orcid.org/0009-0007-7443-2876","affiliations":[{"raw_affiliation_string":"Chinese Academy of Sciences, Suzhou Institute of Nano-Tech and Nano-Bionics (SINANO), Suzhou, China","institution_ids":["https://openalex.org/I4210092495","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Suzhou Institute of Nano-Tech and Nano-Bionics (SINANO), Chinese Academy of Sciences, Suzhou, China","institution_ids":["https://openalex.org/I4210092495","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000357121","display_name":"Zhanqiang Ru","orcid":"https://orcid.org/0000-0002-3498-3063"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210092495","display_name":"Suzhou Institute of Nano-tech and Nano-bionics","ror":"https://ror.org/0027d9x02","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210092495"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"ZhanQiang Ru","raw_affiliation_strings":["Chinese Academy of Sciences, Suzhou Institute of Nano-Tech and Nano-Bionics (SINANO), Suzhou, China","Suzhou Institute of Nano-Tech and Nano-Bionics (SINANO), Chinese Academy of Sciences, Suzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-3498-3063","affiliations":[{"raw_affiliation_string":"Chinese Academy of Sciences, Suzhou Institute of Nano-Tech and Nano-Bionics (SINANO), Suzhou, China","institution_ids":["https://openalex.org/I4210092495","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Suzhou Institute of Nano-Tech and Nano-Bionics (SINANO), Chinese Academy of Sciences, Suzhou, China","institution_ids":["https://openalex.org/I4210092495","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037835120","display_name":"Wenqing Zhu","orcid":"https://orcid.org/0000-0001-5055-4771"},"institutions":[{"id":"https://openalex.org/I113940042","display_name":"Shanghai University","ror":"https://ror.org/006teas31","country_code":"CN","type":"education","lineage":["https://openalex.org/I113940042"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"WenQing Zhu","raw_affiliation_strings":["School of Materials Science and Engineering, Shanghai University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0001-5055-4771","affiliations":[{"raw_affiliation_string":"School of Materials Science and Engineering, Shanghai University, Shanghai, China","institution_ids":["https://openalex.org/I113940042"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5007307269","display_name":"Helun Song","orcid":null},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210092495","display_name":"Suzhou Institute of Nano-tech and Nano-bionics","ror":"https://ror.org/0027d9x02","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210092495"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"HeLun Song","raw_affiliation_strings":["Chinese Academy of Sciences, Suzhou Institute of Nano-Tech and Nano-Bionics (SINANO), Suzhou, China","Suzhou Institute of Nano-Tech and Nano-Bionics (SINANO), Chinese Academy of Sciences, Suzhou, China"],"raw_orcid":"https://orcid.org/0009-0008-2924-9404","affiliations":[{"raw_affiliation_string":"Chinese Academy of Sciences, Suzhou Institute of Nano-Tech and Nano-Bionics (SINANO), Suzhou, China","institution_ids":["https://openalex.org/I4210092495","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Suzhou Institute of Nano-Tech and Nano-Bionics (SINANO), Chinese Academy of Sciences, Suzhou, China","institution_ids":["https://openalex.org/I4210092495","https://openalex.org/I19820366"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.9253,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.74448231,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":97,"max":98},"biblio":{"volume":"13","issue":null,"first_page":"83320","last_page":"83334"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","score":0.9843999743461609,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","score":0.9843999743461609,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.9825999736785889,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14158","display_name":"Optical Systems and Laser Technology","score":0.9779000282287598,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/infrared","display_name":"Infrared","score":0.6162766218185425},{"id":"https://openalex.org/keywords/curvature","display_name":"Curvature","score":0.6037536263465881},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5642684698104858},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.5588687658309937},{"id":"https://openalex.org/keywords/scale","display_name":"Scale (ratio)","score":0.5144596099853516},{"id":"https://openalex.org/keywords/space","display_name":"Space (punctuation)","score":0.5097231268882751},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4976530373096466},{"id":"https://openalex.org/keywords/corner-detection","display_name":"Corner detection","score":0.4934331476688385},{"id":"https://openalex.org/keywords/scale-space","display_name":"Scale space","score":0.46326354146003723},{"id":"https://openalex.org/keywords/image-registration","display_name":"Image registration","score":0.4153788685798645},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.37447589635849},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.19661611318588257},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.19543853402137756},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.18442171812057495},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.15073713660240173},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.1457187831401825}],"concepts":[{"id":"https://openalex.org/C158355884","wikidata":"https://www.wikidata.org/wiki/Q11388","display_name":"Infrared","level":2,"score":0.6162766218185425},{"id":"https://openalex.org/C195065555","wikidata":"https://www.wikidata.org/wiki/Q214881","display_name":"Curvature","level":2,"score":0.6037536263465881},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5642684698104858},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5588687658309937},{"id":"https://openalex.org/C2778755073","wikidata":"https://www.wikidata.org/wiki/Q10858537","display_name":"Scale (ratio)","level":2,"score":0.5144596099853516},{"id":"https://openalex.org/C2778572836","wikidata":"https://www.wikidata.org/wiki/Q380933","display_name":"Space (punctuation)","level":2,"score":0.5097231268882751},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4976530373096466},{"id":"https://openalex.org/C39499422","wikidata":"https://www.wikidata.org/wiki/Q697320","display_name":"Corner detection","level":3,"score":0.4934331476688385},{"id":"https://openalex.org/C99102927","wikidata":"https://www.wikidata.org/wiki/Q3058184","display_name":"Scale space","level":4,"score":0.46326354146003723},{"id":"https://openalex.org/C166704113","wikidata":"https://www.wikidata.org/wiki/Q861092","display_name":"Image registration","level":3,"score":0.4153788685798645},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.37447589635849},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.19661611318588257},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.19543853402137756},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.18442171812057495},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.15073713660240173},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.1457187831401825},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2025.3568378","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3568378","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:18291570e6eb4c9cb49f97954634262b","is_oa":true,"landing_page_url":"https://doaj.org/article/18291570e6eb4c9cb49f97954634262b","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 13, Pp 83320-83334 (2025)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2025.3568378","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3568378","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2984842019","display_name":null,"funder_award_id":"2024YFA1208502","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"},{"id":"https://openalex.org/G4328675835","display_name":null,"funder_award_id":"SZS2022007","funder_id":"https://openalex.org/F4320335953","funder_display_name":"Jilin Scientific and Technological Development Program"},{"id":"https://openalex.org/G976995550","display_name":null,"funder_award_id":"BK20243029","funder_id":"https://openalex.org/F4320334982","funder_display_name":"Basic Research Program of Jiangsu Province"}],"funders":[{"id":"https://openalex.org/F4320334982","display_name":"Basic Research Program of Jiangsu Province","ror":null},{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null},{"id":"https://openalex.org/F4320335953","display_name":"Jilin Scientific and Technological Development Program","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":41,"referenced_works":["https://openalex.org/W109390732","https://openalex.org/W764651262","https://openalex.org/W1532362218","https://openalex.org/W1975726413","https://openalex.org/W2034432063","https://openalex.org/W2042436171","https://openalex.org/W2063297209","https://openalex.org/W2066941820","https://openalex.org/W2104853049","https://openalex.org/W2111308925","https://openalex.org/W2117228865","https://openalex.org/W2117454465","https://openalex.org/W2118153703","https://openalex.org/W2119605622","https://openalex.org/W2126060993","https://openalex.org/W2126635242","https://openalex.org/W2130017587","https://openalex.org/W2133059825","https://openalex.org/W2145023731","https://openalex.org/W2146807548","https://openalex.org/W2151103935","https://openalex.org/W2740578684","https://openalex.org/W2758117027","https://openalex.org/W2759228241","https://openalex.org/W2799112149","https://openalex.org/W2891631795","https://openalex.org/W2891881665","https://openalex.org/W2895716796","https://openalex.org/W2898488184","https://openalex.org/W2898848437","https://openalex.org/W2963059198","https://openalex.org/W2979473749","https://openalex.org/W3023803490","https://openalex.org/W3043075211","https://openalex.org/W3044137644","https://openalex.org/W3045585143","https://openalex.org/W3095041605","https://openalex.org/W4213063899","https://openalex.org/W4320001373","https://openalex.org/W6600697508","https://openalex.org/W6718003766"],"related_works":["https://openalex.org/W1437729647","https://openalex.org/W2392357933","https://openalex.org/W3196977071","https://openalex.org/W2142287731","https://openalex.org/W2350699021","https://openalex.org/W1972037731","https://openalex.org/W2387061843","https://openalex.org/W2281841372","https://openalex.org/W2033156724","https://openalex.org/W2374392618"],"abstract_inverted_index":{"To":[0],"address":[1],"the":[2,125],"challenges":[3],"of":[4,16],"incomplete":[5],"feature":[6,24,42,46,70,104,119,143],"representation":[7],"and":[8,49,76,88,137],"insufficient":[9],"localization":[10],"accuracy":[11,136],"in":[12,72,79,131],"multimodal":[13,54,150],"fault":[14],"diagnosis":[15],"electrical":[17,155],"equipment,":[18],"this":[19],"paper":[20],"proposes":[21],"a":[22,39,58,83,89,148],"dual-modal":[23],"co-registration":[25],"algorithm":[26],"termed":[27],"Contour":[28],"Angle":[29],"Orientation":[30],"-Speeded":[31],"Up":[32],"Robust":[33],"Features":[34],"(CAO-SURF).":[35],"The":[36,140],"methodology":[37],"establishes":[38,147],"three-stage":[40],"progressive":[41],"enhancement":[43],"framework":[44],"through":[45],"space":[47,144],"fusion":[48,152],"adaptive":[50],"registration":[51,135],"mechanisms":[52],"for":[53,154],"sensing":[55],"data.":[56],"First,":[57],"Modal":[59],"Perception-Based":[60],"Canny":[61],"Edge":[62],"Detection":[63],"Strategy":[64,93],"(MP-Canny)":[65],"is":[66],"developed":[67,100,142],"to":[68,101],"resolve":[69],"sparsity":[71],"low-contrast":[73],"infrared":[74],"images":[75],"noise":[77],"interference":[78],"visible-light":[80],"images.":[81],"Subsequently,":[82],"contour":[84],"angle":[85],"orientation":[86],"(CAO)":[87],"Null-Value":[90],"Area":[91],"Compensation":[92],"(NVACS)-based":[94],"gradient":[95],"field":[96],"reconstruction":[97],"model":[98],"are":[99],"achieve":[102],"rotation-invariant":[103],"representation.":[105],"Finally,":[106],"an":[107],"improved":[108],"SURF":[109],"descriptor":[110],"integrated":[111],"with":[112],"bidirectional":[113],"geometric":[114],"constraint":[115],"matching":[116],"significantly":[117],"enhances":[118],"robustness.":[120],"Systematic":[121],"ablation":[122],"experiments":[123],"demonstrate":[124],"proposed":[126],"method":[127],"outperforms":[128],"state-of-the-art":[129],"approaches":[130],"core":[132],"metrics":[133],"including":[134],"recall":[138],"rate.":[139],"innovatively":[141],"collaboration":[145],"mechanism":[146],"novel":[149],"information":[151],"paradigm":[153],"equipment":[156],"condition":[157],"monitoring.":[158]},"counts_by_year":[{"year":2026,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}
