{"id":"https://openalex.org/W4409311110","doi":"https://doi.org/10.1109/access.2025.3558750","title":"Performance and Cost of Dynamic Reliability: A 6G Industrial Environment Perspective","display_name":"Performance and Cost of Dynamic Reliability: A 6G Industrial Environment Perspective","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4409311110","doi":"https://doi.org/10.1109/access.2025.3558750"},"language":"en","primary_location":{"id":"doi:10.1109/access.2025.3558750","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3558750","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2025.3558750","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5011458485","display_name":"Gianluca Davoli","orcid":"https://orcid.org/0000-0001-8937-9624"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Gianluca Davoli","raw_affiliation_strings":["CNIT WiLab, Bologna, Italy"],"raw_orcid":"https://orcid.org/0000-0001-8937-9624","affiliations":[{"raw_affiliation_string":"CNIT WiLab, Bologna, Italy","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075938608","display_name":"Federico Tonini","orcid":"https://orcid.org/0000-0003-2905-1381"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Federico Tonini","raw_affiliation_strings":["CNIT WiLab, Bologna, Italy"],"raw_orcid":"https://orcid.org/0000-0003-2905-1381","affiliations":[{"raw_affiliation_string":"CNIT WiLab, Bologna, Italy","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036893834","display_name":"Davide Borsatti","orcid":"https://orcid.org/0000-0002-3121-5018"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Davide Borsatti","raw_affiliation_strings":["CNIT WiLab, Bologna, Italy"],"raw_orcid":"https://orcid.org/0000-0002-3121-5018","affiliations":[{"raw_affiliation_string":"CNIT WiLab, Bologna, Italy","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048539227","display_name":"Wint Yi Poe","orcid":null},"institutions":[{"id":"https://openalex.org/I4210129353","display_name":"Huawei Technologies (Germany)","ror":"https://ror.org/038cdme44","country_code":"DE","type":"company","lineage":["https://openalex.org/I2250955327","https://openalex.org/I4210129353"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Wint Yi Poe","raw_affiliation_strings":["Huawei Technologies, Munich, Germany","Huawei Technologies, Germany"],"raw_orcid":"https://orcid.org/0000-0002-7884-4540","affiliations":[{"raw_affiliation_string":"Huawei Technologies, Munich, Germany","institution_ids":["https://openalex.org/I4210129353"]},{"raw_affiliation_string":"Huawei Technologies, Germany","institution_ids":["https://openalex.org/I4210129353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089631314","display_name":"Riccardo Trivisonno","orcid":"https://orcid.org/0000-0003-4190-5781"},"institutions":[{"id":"https://openalex.org/I4210129353","display_name":"Huawei Technologies (Germany)","ror":"https://ror.org/038cdme44","country_code":"DE","type":"company","lineage":["https://openalex.org/I2250955327","https://openalex.org/I4210129353"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Riccardo Trivisonno","raw_affiliation_strings":["Huawei Technologies, Munich, Germany","Huawei Technologies, Germany"],"raw_orcid":"https://orcid.org/0000-0003-4190-5781","affiliations":[{"raw_affiliation_string":"Huawei Technologies, Munich, Germany","institution_ids":["https://openalex.org/I4210129353"]},{"raw_affiliation_string":"Huawei Technologies, Germany","institution_ids":["https://openalex.org/I4210129353"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5078624775","display_name":"Walter Cerroni","orcid":"https://orcid.org/0000-0002-4629-031X"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Walter Cerroni","raw_affiliation_strings":["CNIT WiLab, Bologna, Italy"],"raw_orcid":"https://orcid.org/0000-0002-4629-031X","affiliations":[{"raw_affiliation_string":"CNIT WiLab, Bologna, Italy","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.7777,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.71703151,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":"13","issue":null,"first_page":"77734","last_page":"77748"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.8955000042915344,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.8955000042915344,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.8937000036239624,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.8141000270843506,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/perspective","display_name":"Perspective (graphical)","score":0.6946998834609985},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6599205136299133},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5698182582855225},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5108203887939453},{"id":"https://openalex.org/keywords/risk-analysis","display_name":"Risk analysis (engineering)","score":0.32381218671798706},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.29553836584091187},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14391988515853882},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.12050995230674744},{"id":"https://openalex.org/keywords/business","display_name":"Business","score":0.09903520345687866}],"concepts":[{"id":"https://openalex.org/C12713177","wikidata":"https://www.wikidata.org/wiki/Q1900281","display_name":"Perspective (graphical)","level":2,"score":0.6946998834609985},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6599205136299133},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5698182582855225},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5108203887939453},{"id":"https://openalex.org/C112930515","wikidata":"https://www.wikidata.org/wiki/Q4389547","display_name":"Risk analysis (engineering)","level":1,"score":0.32381218671798706},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.29553836584091187},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14391988515853882},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.12050995230674744},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.09903520345687866},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/access.2025.3558750","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3558750","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:cris.unibo.it:11585/1015416","is_oa":true,"landing_page_url":"https://ieeexplore.ieee.org/document/10960392","pdf_url":null,"source":{"id":"https://openalex.org/S4306402579","display_name":"Archivio istituzionale della ricerca (Alma Mater Studiorum Universit\u00e0 di Bologna)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210117483","host_organization_name":"Istituto di Ematologia di Bologna","host_organization_lineage":["https://openalex.org/I4210117483"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"},{"id":"pmh:oai:doaj.org/article:85809e56738d400c90fd6676c604c6b9","is_oa":true,"landing_page_url":"https://doaj.org/article/85809e56738d400c90fd6676c604c6b9","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 13, Pp 77734-77748 (2025)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2025.3558750","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3558750","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W2794639091","https://openalex.org/W2796283700","https://openalex.org/W2889811970","https://openalex.org/W3155030480","https://openalex.org/W3187113103","https://openalex.org/W3208428924","https://openalex.org/W3214586412","https://openalex.org/W4224276594","https://openalex.org/W4317418802","https://openalex.org/W4366251214","https://openalex.org/W4367042006","https://openalex.org/W4375928691","https://openalex.org/W4385214421","https://openalex.org/W4387247671","https://openalex.org/W4387936727","https://openalex.org/W6848738471"],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W2033512842","https://openalex.org/W4233600955","https://openalex.org/W4322734194","https://openalex.org/W3116237489","https://openalex.org/W4404996554","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3005535424","https://openalex.org/W2994319598"],"abstract_inverted_index":{"The":[0,149,199],"use":[1],"of":[2,43,51,68,96,140,151,175,186,190,201,238],"robots":[3,195],"in":[4,59,65,101,160,167,235,236],"modern":[5],"manufacturing":[6],"facilities,":[7],"where":[8],"also":[9,17],"human":[10],"workers":[11],"operate,":[12],"offers":[13],"substantial":[14],"advantages,":[15],"but":[16],"introduces":[18],"safety":[19,57,74],"hazards":[20],"that":[21,54,86,210,231],"need":[22],"to":[23,83,91,110,119,155,182,205,218],"be":[24,77,84,111,125,212,233],"mitigated":[25],"with":[26,197,214],"all":[27,114],"possible":[28],"means.":[29],"Ultra-reliable":[30],"communication":[31,80],"services":[32],"offered":[33,222],"by":[34,127,170,179,194,223],"5G":[35,97,102,224],"mobile":[36],"networks":[37],"allow":[38,204],"for":[39],"automated":[40],"remote":[41],"control":[42],"the":[44,66,89,103,130,137,141,176,184,187,191,207,219,229],"machines,":[45],"thus":[46],"enabling":[47],"a":[48,60],"new":[49],"generation":[50],"network":[52,132,239],"applications":[53],"can":[55,124,211],"enforce":[56],"procedures":[58],"hyper-connected":[61],"industrial":[62,157],"environment.":[63],"However,":[64],"context":[67],"Human-Robot":[69],"Collaboration":[70],"scenarios":[71],"very":[72],"strict":[73],"requirements":[75],"must":[76,232],"satisfied,":[78],"determining":[79],"reliability":[81,104,133,153,216],"levels":[82],"guaranteed":[85],"go":[87],"beyond":[88],"up":[90],"10<sup":[92],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[93],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">\u22125</sup>":[94],"capabilities":[95],"ultra-reliable":[98],"deployments.":[99],"Moreover,":[100],"is":[105,164],"imposed":[106],"as":[107,226,228],"fixed":[108],"requirement":[109],"achieved":[112,213],"at":[113],"times,":[115],"which":[116],"may":[117],"lead":[118],"resource":[120,208],"overprovisioning.":[121],"Resource":[122],"efficiency":[123],"improved":[126],"dynamically":[128],"adapting":[129],"target":[131],"level":[134],"based":[135],"on":[136],"actual":[138],"needs":[139],"connected":[142],"devices,":[143],"still":[144],"guaranteeing":[145],"safe":[146],"human-robot":[147],"interactions.":[148],"idea":[150],"dynamic":[152,215],"applied":[154],"6G":[156],"environments,":[158],"introduced":[159],"our":[161,202],"previous":[162],"work,":[163],"further":[165],"investigated":[166],"this":[168],"paper":[169],"evaluating":[171],"performance":[172],"and":[173,178],"costs":[174],"approach,":[177],"exploring":[180],"how":[181],"leverage":[183],"knowledge":[185],"specific":[188],"nature":[189],"task":[192],"performed":[193],"cooperating":[196],"humans.":[198],"results":[200],"study":[203],"quantify":[206],"gain":[209],"compared":[217],"solution":[220],"currently":[221],"systems,":[225],"well":[227],"cost":[230],"factored":[234],"terms":[237],"signalling":[240],"overhead.":[241]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}