{"id":"https://openalex.org/W4408182455","doi":"https://doi.org/10.1109/access.2025.3548966","title":"The Effect of Asymmetric Transistor Aging on Systolic Arrays for Mission Critical Machine Learning Applications","display_name":"The Effect of Asymmetric Transistor Aging on Systolic Arrays for Mission Critical Machine Learning Applications","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4408182455","doi":"https://doi.org/10.1109/access.2025.3548966"},"language":"en","primary_location":{"id":"doi:10.1109/access.2025.3548966","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3548966","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2025.3548966","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5114793439","display_name":"Firas Ramadan","orcid":"https://orcid.org/0009-0006-6295-4557"},"institutions":[{"id":"https://openalex.org/I174306211","display_name":"Technion \u2013 Israel Institute of Technology","ror":"https://ror.org/03qryx823","country_code":"IL","type":"education","lineage":["https://openalex.org/I174306211"]}],"countries":["IL"],"is_corresponding":true,"raw_author_name":"Firas Ramadan","raw_affiliation_strings":["Faculty of Electrical and Computer Engineering, Technion—Israel Institute of Technology, Haifa, Israel","Faculty of Electrical and Computer Engineering, Technion - Israel Institute of Technology, Haifa, Israel"],"affiliations":[{"raw_affiliation_string":"Faculty of Electrical and Computer Engineering, Technion—Israel Institute of Technology, Haifa, Israel","institution_ids":["https://openalex.org/I174306211"]},{"raw_affiliation_string":"Faculty of Electrical and Computer Engineering, Technion - Israel Institute of Technology, Haifa, Israel","institution_ids":["https://openalex.org/I174306211"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067826739","display_name":"Gil Shomron","orcid":"https://orcid.org/0000-0003-3752-3270"},"institutions":[{"id":"https://openalex.org/I1304085615","display_name":"Nvidia (United Kingdom)","ror":"https://ror.org/02kr42612","country_code":"GB","type":"company","lineage":["https://openalex.org/I1304085615","https://openalex.org/I4210127875"]},{"id":"https://openalex.org/I80687555","display_name":"Israel Electric (Israel)","ror":"https://ror.org/01p8dnv11","country_code":"IL","type":"company","lineage":["https://openalex.org/I80687555"]}],"countries":["GB","IL"],"is_corresponding":false,"raw_author_name":"Gil Shomron","raw_affiliation_strings":["NVIDIA*, Würselen, Germany","NVIDIA, Israel"],"affiliations":[{"raw_affiliation_string":"NVIDIA*, Würselen, Germany","institution_ids":["https://openalex.org/I1304085615"]},{"raw_affiliation_string":"NVIDIA, Israel","institution_ids":["https://openalex.org/I80687555"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5060117713","display_name":"Freddy Gabbay","orcid":"https://orcid.org/0000-0002-6549-7957"},"institutions":[{"id":"https://openalex.org/I197251160","display_name":"Hebrew University of Jerusalem","ror":"https://ror.org/03qxff017","country_code":"IL","type":"education","lineage":["https://openalex.org/I197251160"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Freddy Gabbay","raw_affiliation_strings":["Faculty of Sciences, Institute of Applied Physics, The Hebrew University of Jerusalem, Jerusalem, Israel","Institute of Applied Physics, Faculty of Sciences, The Hebrew University of Jerusalem, Jerusalem, Israel"],"affiliations":[{"raw_affiliation_string":"Faculty of Sciences, Institute of Applied Physics, The Hebrew University of Jerusalem, Jerusalem, Israel","institution_ids":["https://openalex.org/I197251160"]},{"raw_affiliation_string":"Institute of Applied Physics, Faculty of Sciences, The Hebrew University of Jerusalem, Jerusalem, Israel","institution_ids":["https://openalex.org/I197251160"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5114793439"],"corresponding_institution_ids":["https://openalex.org/I174306211"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":2.2158,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.8685697,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":99},"biblio":{"volume":"13","issue":null,"first_page":"44041","last_page":"44061"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9940999746322632,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9842000007629395,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5617321133613586},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5400200486183167},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.19573020935058594},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17141711711883545}],"concepts":[{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5617321133613586},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5400200486183167},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.19573020935058594},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17141711711883545},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2025.3548966","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3548966","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:30c49a6ff95c49c88df6418e478ceadb","is_oa":true,"landing_page_url":"https://doaj.org/article/30c49a6ff95c49c88df6418e478ceadb","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 13, Pp 44041-44061 (2025)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2025.3548966","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3548966","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":60,"referenced_works":["https://openalex.org/W1584309135","https://openalex.org/W1982922587","https://openalex.org/W1988788315","https://openalex.org/W1991891926","https://openalex.org/W2017369466","https://openalex.org/W2021282846","https://openalex.org/W2022628721","https://openalex.org/W2057757361","https://openalex.org/W2059193309","https://openalex.org/W2069452468","https://openalex.org/W2089307123","https://openalex.org/W2097117768","https://openalex.org/W2098988964","https://openalex.org/W2102729267","https://openalex.org/W2126302041","https://openalex.org/W2144651789","https://openalex.org/W2157067268","https://openalex.org/W2171860505","https://openalex.org/W2194775991","https://openalex.org/W2203862213","https://openalex.org/W2592929672","https://openalex.org/W2606722458","https://openalex.org/W2618530766","https://openalex.org/W2791814097","https://openalex.org/W2883030312","https://openalex.org/W2944349874","https://openalex.org/W2963040191","https://openalex.org/W2963163009","https://openalex.org/W2964108906","https://openalex.org/W2989569745","https://openalex.org/W3033788476","https://openalex.org/W3035669514","https://openalex.org/W3036417075","https://openalex.org/W3048132237","https://openalex.org/W3093118868","https://openalex.org/W3096295711","https://openalex.org/W3110144974","https://openalex.org/W3131039502","https://openalex.org/W3139168127","https://openalex.org/W3145466197","https://openalex.org/W3171842021","https://openalex.org/W3184114148","https://openalex.org/W3184673655","https://openalex.org/W3185425515","https://openalex.org/W3212343347","https://openalex.org/W4206199830","https://openalex.org/W4206423823","https://openalex.org/W4248707645","https://openalex.org/W4280493558","https://openalex.org/W4280527083","https://openalex.org/W4280619532","https://openalex.org/W4281712239","https://openalex.org/W4285174335","https://openalex.org/W4317436377","https://openalex.org/W4387321084","https://openalex.org/W6676984168","https://openalex.org/W6790503700","https://openalex.org/W6790814326","https://openalex.org/W6840821813","https://openalex.org/W6848185429"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W4391913857","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W4396696052"],"abstract_inverted_index":{"Deep":[0],"neural":[1],"networks":[2],"(DNNs)":[3],"excel":[4],"in":[5,43,124,158],"various":[6],"applications,":[7],"such":[8],"as":[9],"computer":[10],"vision,":[11],"natural":[12],"language":[13],"processing,":[14],"and":[15,65,86,155,196,218,239],"other":[16],"mission-critical":[17,95,125],"systems.":[18,96,126],"As":[19],"the":[20,37,54,69,91,101,159,163,167,184,226],"computational":[21],"complexity":[22],"of":[23,56,71,94,103,166,180,188,200,228],"these":[24,72],"models":[25],"grows,":[26],"there":[27],"is":[28],"an":[29],"increasing":[30],"need":[31],"for":[32],"specialized":[33],"accelerators":[34,123],"to":[35,75,80,120,139],"handle":[36],"demanding":[38],"workloads.":[39],"In":[40,144],"response,":[41],"advancements":[42],"Very":[44],"Large":[45],"Scale":[46],"Integration":[47],"(VLSI)":[48],"process":[49],"nodes":[50,74],"have":[51],"significantly":[52,193],"intensified":[53],"development":[55],"machine":[57],"learning":[58],"(ML)":[59],"accelerators,":[60],"offering":[61],"enhanced":[62],"transistor":[63,76,105,151,230],"miniaturization":[64],"power":[66,238],"efficiency.":[67],"However,":[68],"susceptibility":[70],"advanced":[73],"aging":[77,152,231],"poses":[78],"risks":[79],"ML":[81,122,168,190,233],"accelerator":[82,234],"performance,":[83],"prediction":[84,186],"accuracy,":[85],"reliability,":[87],"which":[88,117],"can":[89,223],"impact":[90,102,227],"functional":[92],"safety":[93],"This":[97],"study":[98],"focuses":[99],"on":[100,113,232],"asymmetric":[104,134,150,229],"aging,":[106,135],"induced":[107],"by":[108,194,206],"Bias":[109],"Temperature":[110],"Instability":[111],"(BTI),":[112],"systolic":[114],"arrays":[115],"(SAs),":[116],"are":[118],"integral":[119],"many":[121],"Our":[127,170],"aging-aware":[128],"analysis":[129],"indicates":[130],"that":[131,149,174,222],"SAs":[132],"experience":[133],"causing":[136],"logical":[137],"elements":[138],"age":[140],"at":[141],"varying":[142],"rates.":[143],"addition,":[145],"our":[146],"simulations":[147],"show":[148,173],"introduces":[153],"persistent":[154],"transient":[156,181,201],"faults":[157],"SA\u2019s":[160],"datapath,":[161],"compromising":[162],"overall":[164],"resiliency":[165],"model.":[169],"simulation":[171],"results":[172],"even":[175],"with":[176,197,236],"less":[177],"than":[178],"1%":[179],"failure":[182,202],"events,":[183],"top-1":[185],"accuracy":[187],"ResNet-18":[189],"model":[191],"drops":[192,205],"32\u201350%":[195],"approximately":[198],"0.8%":[199],"events":[203],"PTQ4ViT":[204],"almost":[207],"90%.":[208],"To":[209],"address":[210],"this":[211],"issue,":[212],"we":[213],"propose":[214],"new":[215],"hardware":[216],"mechanisms":[217],"design":[219],"flow":[220],"solutions":[221],"successfully":[224],"mitigate":[225],"reliability":[235],"minimal":[237],"area":[240],"overhead.":[241]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2}],"updated_date":"2026-03-27T14:29:43.386196","created_date":"2025-10-10T00:00:00"}