{"id":"https://openalex.org/W4408100186","doi":"https://doi.org/10.1109/access.2025.3547333","title":"A Building Block to the Design of Partial Discharge Free HV and MV Cables: Modeling Defects and Discharge Inception Voltage","display_name":"A Building Block to the Design of Partial Discharge Free HV and MV Cables: Modeling Defects and Discharge Inception Voltage","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4408100186","doi":"https://doi.org/10.1109/access.2025.3547333"},"language":"en","primary_location":{"id":"doi:10.1109/access.2025.3547333","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3547333","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2025.3547333","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5027146086","display_name":"Gian Carlo Montanari","orcid":"https://orcid.org/0000-0003-2025-8693"},"institutions":[{"id":"https://openalex.org/I103163165","display_name":"Florida State University","ror":"https://ror.org/05g3dte14","country_code":"US","type":"education","lineage":["https://openalex.org/I103163165"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Gian Carlo Montanari","raw_affiliation_strings":["Center for Advanced Power Systems, Florida State University, Tallahassee, FL, USA"],"raw_orcid":"https://orcid.org/0000-0003-2025-8693","affiliations":[{"raw_affiliation_string":"Center for Advanced Power Systems, Florida State University, Tallahassee, FL, USA","institution_ids":["https://openalex.org/I103163165"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Muhammad Shafiq","orcid":"https://orcid.org/0000-0002-2272-0899"},"institutions":[{"id":"https://openalex.org/I103163165","display_name":"Florida State University","ror":"https://ror.org/05g3dte14","country_code":"US","type":"education","lineage":["https://openalex.org/I103163165"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Muhammad Shafiq","raw_affiliation_strings":["Center for Advanced Power Systems, Florida State University, Tallahassee, FL, USA"],"raw_orcid":"https://orcid.org/0000-0002-2272-0899","affiliations":[{"raw_affiliation_string":"Center for Advanced Power Systems, Florida State University, Tallahassee, FL, USA","institution_ids":["https://openalex.org/I103163165"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5058516306","display_name":"Myneni Sukesh Babu","orcid":"https://orcid.org/0000-0001-7508-1528"},"institutions":[{"id":"https://openalex.org/I103163165","display_name":"Florida State University","ror":"https://ror.org/05g3dte14","country_code":"US","type":"education","lineage":["https://openalex.org/I103163165"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sukesh Babu Myneni","raw_affiliation_strings":["Center for Advanced Power Systems, Florida State University, Tallahassee, FL, USA"],"raw_orcid":"https://orcid.org/0000-0001-7508-1528","affiliations":[{"raw_affiliation_string":"Center for Advanced Power Systems, Florida State University, Tallahassee, FL, USA","institution_ids":["https://openalex.org/I103163165"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I103163165"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.8164,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.65505796,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":97},"biblio":{"volume":"13","issue":null,"first_page":"40649","last_page":"40657"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10781","display_name":"Plasma Diagnostics and Applications","score":0.9100000262260437,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12804","display_name":"Thermal Analysis in Power Transmission","score":0.9010000228881836,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/partial-discharge","display_name":"Partial discharge","score":0.8629657626152039},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5626294612884521},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4858946204185486},{"id":"https://openalex.org/keywords/block","display_name":"Block (permutation group theory)","score":0.47540053725242615},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4718760550022125},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3338070511817932},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24887973070144653},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.05887240171432495}],"concepts":[{"id":"https://openalex.org/C130143024","wikidata":"https://www.wikidata.org/wiki/Q1929972","display_name":"Partial discharge","level":3,"score":0.8629657626152039},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5626294612884521},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4858946204185486},{"id":"https://openalex.org/C2777210771","wikidata":"https://www.wikidata.org/wiki/Q4927124","display_name":"Block (permutation group theory)","level":2,"score":0.47540053725242615},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4718760550022125},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3338070511817932},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24887973070144653},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.05887240171432495},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2025.3547333","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3547333","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:b5a24eec0c4042c185475d17adc54212","is_oa":true,"landing_page_url":"https://doaj.org/article/b5a24eec0c4042c185475d17adc54212","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 13, Pp 40649-40657 (2025)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2025.3547333","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3547333","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Sustainable cities and communities","score":0.6200000047683716,"id":"https://metadata.un.org/sdg/11"}],"awards":[{"id":"https://openalex.org/G2718282239","display_name":null,"funder_award_id":"N000142112124","funder_id":"https://openalex.org/F4320337345","funder_display_name":"Office of Naval Research"}],"funders":[{"id":"https://openalex.org/F4320337345","display_name":"Office of Naval Research","ror":"https://ror.org/00rk2pe57"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W1879557527","https://openalex.org/W2050732058","https://openalex.org/W2051542965","https://openalex.org/W2081341221","https://openalex.org/W2090484961","https://openalex.org/W2096902902","https://openalex.org/W2127707207","https://openalex.org/W2143257327","https://openalex.org/W2149022101","https://openalex.org/W2149097302","https://openalex.org/W2156951000","https://openalex.org/W2499673163","https://openalex.org/W2548140191","https://openalex.org/W2914200188","https://openalex.org/W3004798739","https://openalex.org/W3034357204","https://openalex.org/W3046957048","https://openalex.org/W3090111049","https://openalex.org/W3120784776","https://openalex.org/W3128691598","https://openalex.org/W3194052897","https://openalex.org/W4312645560","https://openalex.org/W4313518310","https://openalex.org/W4361853982","https://openalex.org/W4379259674","https://openalex.org/W4385453616","https://openalex.org/W4386159341","https://openalex.org/W4386766587","https://openalex.org/W4401211655","https://openalex.org/W4402686870"],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2393409683","https://openalex.org/W4282008660","https://openalex.org/W2834849852","https://openalex.org/W2536936696","https://openalex.org/W2955994650","https://openalex.org/W2066632781","https://openalex.org/W2294135824","https://openalex.org/W4287846872"],"abstract_inverted_index":{"It":[0],"is":[1,28,129],"well":[2],"assessed":[3],"that":[4],"partial":[5,23,45,75,89,150],"discharges,":[6],"PD,":[7],"are":[8,41],"one":[9],"of":[10,14,88,99,121,149],"the":[11,80,122,147],"major":[12],"causes":[13],"MV":[15],"and":[16,26,72,97,112,133,145],"HV":[17],"cable":[18,51,85],"system":[19],"breakdown,":[20],"thus":[21],"investigating":[22],"discharge":[24,76],"phenomenology":[25],"harmfulness":[27],"a":[29],"key":[30],"topic":[31],"in":[32,50,65,115],"relation":[33],"to":[34,43,55,91,108,143],"electric":[35],"asset":[36],"component":[37],"reliability.":[38],"Defects,":[39],"which":[40,138],"able":[42],"generate":[44],"discharges":[46,90,151],"can":[47,60,139],"be":[48,62,92,140],"ineludible":[49],"systems,":[52],"from":[53],"manufacturing":[54],"on-field":[56],"assembly,":[57],"but":[58],"they":[59],"also":[61],"structural,":[63],"as":[64],"impregnated":[66],"EHV":[67],"cables.":[68],"Associating":[69],"defect":[70],"type":[71,96,148],"size":[73,98],"with":[74],"inception":[77,124],"voltage":[78],"at":[79,101],"design":[81],"stage":[82],"could":[83],"allow":[84],"systems":[86],"free":[87],"designed,":[93],"for":[94],"given":[95],"defects,":[100,154],"nominal":[102],"voltage.":[103,125],"This":[104],"paper":[105],"shows":[106],"how":[107],"model":[109],"successfully":[110],"internal":[111],"surface":[113],"defects":[114],"cables":[116],"providing":[117],"an":[118,127],"accurate":[119],"estimate":[120,128],"PD":[123,135],"Such":[126],"validated":[130],"through":[131],"innovative":[132],"automatic":[134],"measurement":[136],"software":[137],"able,":[141],"automatically,":[142],"acquire":[144],"identify":[146],"generated":[152],"by":[153],"rejecting":[155],"efficiently":[156],"noise.":[157]},"counts_by_year":[{"year":2025,"cited_by_count":3}],"updated_date":"2026-08-01T09:00:35.917206","created_date":"2025-03-04T00:00:00"}