{"id":"https://openalex.org/W4407782665","doi":"https://doi.org/10.1109/access.2025.3544109","title":"A New Model of Trapped Charge Sources in Switching Transient Studies in the Presence of Shunt Reactors","display_name":"A New Model of Trapped Charge Sources in Switching Transient Studies in the Presence of Shunt Reactors","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4407782665","doi":"https://doi.org/10.1109/access.2025.3544109"},"language":"en","primary_location":{"id":"doi:10.1109/access.2025.3544109","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3544109","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2025.3544109","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046548363","display_name":"Mohsen Akafi-Mobarakeh","orcid":"https://orcid.org/0000-0002-6237-2331"},"institutions":[{"id":"https://openalex.org/I97626857","display_name":"University of Birjand","ror":"https://ror.org/03g4hym73","country_code":"IR","type":"education","lineage":["https://openalex.org/I97626857"]}],"countries":["IR"],"is_corresponding":true,"raw_author_name":"Mohsen Akafi-Mobarakeh","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Birjand, Birjand, Iran"],"raw_orcid":"https://orcid.org/0000-0002-6237-2331","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Birjand, Birjand, Iran","institution_ids":["https://openalex.org/I97626857"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044049795","display_name":"Reza Shariatinasab","orcid":"https://orcid.org/0000-0001-5007-7557"},"institutions":[{"id":"https://openalex.org/I97626857","display_name":"University of Birjand","ror":"https://ror.org/03g4hym73","country_code":"IR","type":"education","lineage":["https://openalex.org/I97626857"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Reza Shariatinasab","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Birjand, Birjand, Iran"],"raw_orcid":"https://orcid.org/0000-0001-5007-7557","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Birjand, Birjand, Iran","institution_ids":["https://openalex.org/I97626857"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035300094","display_name":"Pierluigi Siano","orcid":"https://orcid.org/0000-0002-0975-0241"},"institutions":[{"id":"https://openalex.org/I131729948","display_name":"University of Salerno","ror":"https://ror.org/0192m2k53","country_code":"IT","type":"education","lineage":["https://openalex.org/I131729948"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Pierluigi Siano","raw_affiliation_strings":["Department of Management and Innovation Systems, University of Salerno, Fisciano, Italy","Department of Management & Innovation Systems, University of Salerno Via Giovanni Paolo II, 132, Fisciano, (SA), Italy"],"raw_orcid":"https://orcid.org/0000-0002-0975-0241","affiliations":[{"raw_affiliation_string":"Department of Management and Innovation Systems, University of Salerno, Fisciano, Italy","institution_ids":["https://openalex.org/I131729948"]},{"raw_affiliation_string":"Department of Management & Innovation Systems, University of Salerno Via Giovanni Paolo II, 132, Fisciano, (SA), Italy","institution_ids":["https://openalex.org/I131729948"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056451976","display_name":"Behrooz Vahidi","orcid":"https://orcid.org/0000-0002-9430-9468"},"institutions":[{"id":"https://openalex.org/I158248296","display_name":"Amirkabir University of Technology","ror":"https://ror.org/04gzbav43","country_code":"IR","type":"education","lineage":["https://openalex.org/I158248296"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Behrooz Vahidi","raw_affiliation_strings":["Department of Electrical Engineering, Amirkabir University of Technology (Tehran Polytechnic), Tehran, Iran","Department of Electrical Engineering, Amir Kabir University of Technology, Tehran, Iran"],"raw_orcid":"https://orcid.org/0000-0002-9430-9468","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Amirkabir University of Technology (Tehran Polytechnic), Tehran, Iran","institution_ids":["https://openalex.org/I158248296"]},{"raw_affiliation_string":"Department of Electrical Engineering, Amir Kabir University of Technology, Tehran, Iran","institution_ids":["https://openalex.org/I158248296"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109388299","display_name":"Hamid Reza Najafi","orcid":null},"institutions":[{"id":"https://openalex.org/I97626857","display_name":"University of Birjand","ror":"https://ror.org/03g4hym73","country_code":"IR","type":"education","lineage":["https://openalex.org/I97626857"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Hamid Reza Najafi","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Birjand, Birjand, Iran"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Birjand, Birjand, Iran","institution_ids":["https://openalex.org/I97626857"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5046548363"],"corresponding_institution_ids":["https://openalex.org/I97626857"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.02738236,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"13","issue":null,"first_page":"37118","last_page":"37127"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9918000102043152,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9918000102043152,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9909999966621399,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.970300018787384,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.6810798048973083},{"id":"https://openalex.org/keywords/shunt","display_name":"Shunt (medical)","score":0.6771788597106934},{"id":"https://openalex.org/keywords/transient-analysis","display_name":"Transient analysis","score":0.6470105648040771},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.40267378091812134},{"id":"https://openalex.org/keywords/nuclear-engineering","display_name":"Nuclear engineering","score":0.3354197144508362},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.32870179414749146},{"id":"https://openalex.org/keywords/transient-response","display_name":"Transient response","score":0.28871792554855347},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.21828460693359375},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12456625699996948},{"id":"https://openalex.org/keywords/medicine","display_name":"Medicine","score":0.096438467502594},{"id":"https://openalex.org/keywords/cardiology","display_name":"Cardiology","score":0.08857673406600952}],"concepts":[{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.6810798048973083},{"id":"https://openalex.org/C2780968331","wikidata":"https://www.wikidata.org/wiki/Q1890115","display_name":"Shunt (medical)","level":2,"score":0.6771788597106934},{"id":"https://openalex.org/C2989121073","wikidata":"https://www.wikidata.org/wiki/Q1309019","display_name":"Transient analysis","level":3,"score":0.6470105648040771},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.40267378091812134},{"id":"https://openalex.org/C116915560","wikidata":"https://www.wikidata.org/wiki/Q83504","display_name":"Nuclear engineering","level":1,"score":0.3354197144508362},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.32870179414749146},{"id":"https://openalex.org/C85761212","wikidata":"https://www.wikidata.org/wiki/Q1974593","display_name":"Transient response","level":2,"score":0.28871792554855347},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.21828460693359375},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12456625699996948},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.096438467502594},{"id":"https://openalex.org/C164705383","wikidata":"https://www.wikidata.org/wiki/Q10379","display_name":"Cardiology","level":1,"score":0.08857673406600952},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2025.3544109","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3544109","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:31d9f531c5134732a3ead14641be934b","is_oa":true,"landing_page_url":"https://doaj.org/article/31d9f531c5134732a3ead14641be934b","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 13, Pp 37118-37127 (2025)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2025.3544109","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3544109","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G4032401980","display_name":null,"funder_award_id":"PNRR-C9-I8-760090/23.05.2023 CF30/14.11.2022","funder_id":"https://openalex.org/F4320336370","funder_display_name":"Ontario Ministry of Research and Innovation"}],"funders":[{"id":"https://openalex.org/F4320336370","display_name":"Ontario Ministry of Research and Innovation","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2758798772","https://openalex.org/W2081338125","https://openalex.org/W4406350055","https://openalex.org/W4239924455","https://openalex.org/W2001630809","https://openalex.org/W4244925124","https://openalex.org/W2377879397","https://openalex.org/W1577327694","https://openalex.org/W2887517211","https://openalex.org/W1909312109"],"abstract_inverted_index":{"Insulation":[0],"coordination":[1],"studies":[2],"are":[3,125],"of":[4,64,77,102,108,133],"great":[5],"importance":[6],"in":[7,25,40,71,114,144,171,174],"power":[8],"grid":[9],"reliability.":[10],"In":[11],"this":[12],"paper,":[13],"a":[14,78,115,119,151,175],"new":[15],"method":[16],"is":[17,31,52,87,112,167,183],"proposed":[18,50,84,160],"for":[19,67],"modeling":[20],"trapped":[21],"charge":[22],"sources":[23],"(TCS)":[24],"switching":[26,165],"transient":[27,69],"studies.":[28],"The":[29,49],"TCS":[30,66,85],"used":[32],"to":[33,81],"take":[34],"into":[35],"account":[36],"the":[37,56,62,74,83,91,100,106,109,123,134,138,141,145,155,159,162],"voltage":[38,96,142,153],"stored":[39],"line":[41,80,164,179],"capacitors":[42],"during":[43],"reclosing":[44],"operation":[45],"after":[46],"fault":[47],"occurrence.":[48],"model":[51],"designed":[53],"based":[54],"on":[55],"active":[57],"filter":[58],"concept,":[59],"thus":[60],"overcoming":[61],"limitations":[63],"conventional":[65],"simulating":[68],"states":[70],"EMTP/ATPDraw.":[72],"Given":[73],"natural":[75],"frequencies":[76,93],"transmission":[79,178],"which":[82,98,182],"(PTCS)":[86],"connected,":[88],"it":[89,111],"injects":[90],"appropriate":[92],"and":[94,122,149,185],"eliminates":[95,140],"oscillations":[97,143],"limit":[99],"use":[101],"TCS.":[103],"To":[104],"verify":[105],"efficiency":[107],"PTCS,":[110],"implemented":[113],"real":[116],"system":[117],"with":[118,128,154],"shunt":[120],"reactor,":[121],"results":[124,135,173],"then":[126],"compared":[127],"field":[129],"measurements.":[130],"A":[131],"comparison":[132],"shows":[136],"that":[137],"PTCS":[139],"simulation":[146],"before":[147],"closing":[148],"provides":[150],"smooth":[152],"desired":[156],"amplitude.":[157],"Using":[158],"model,":[161],"maximum":[163],"overvoltage":[166],"correctly":[168],"calculated;":[169],"this,":[170],"turn,":[172],"more":[176],"accurate":[177],"insulation":[180],"design,":[181],"technically":[184],"economically":[186],"beneficial.":[187]},"counts_by_year":[],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2025-10-10T00:00:00"}