{"id":"https://openalex.org/W4406321424","doi":"https://doi.org/10.1109/access.2025.3528745","title":"SpaceCAM: A 16 nm FinFET Low-Power Soft-Error Tolerant TCAM Design for Space Communication Applications","display_name":"SpaceCAM: A 16 nm FinFET Low-Power Soft-Error Tolerant TCAM Design for Space Communication Applications","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4406321424","doi":"https://doi.org/10.1109/access.2025.3528745"},"language":"en","primary_location":{"id":"doi:10.1109/access.2025.3528745","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3528745","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2025.3528745","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5013568195","display_name":"Itay Merlin","orcid":"https://orcid.org/0009-0005-3405-3594"},"institutions":[{"id":"https://openalex.org/I13955877","display_name":"Bar-Ilan University","ror":"https://ror.org/03kgsv495","country_code":"IL","type":"education","lineage":["https://openalex.org/I13955877"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Itay Merlin","raw_affiliation_strings":["EnICS Laboratories, Faculty of Engineering, Bar-Ilan University, Ramat Gan, Israel","EnICS Labs, Faculty of Engineering, Bar-Ilan University, Ramat-Gan, Israel"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"EnICS Laboratories, Faculty of Engineering, Bar-Ilan University, Ramat Gan, Israel","institution_ids":["https://openalex.org/I13955877"]},{"raw_affiliation_string":"EnICS Labs, Faculty of Engineering, Bar-Ilan University, Ramat-Gan, Israel","institution_ids":["https://openalex.org/I13955877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049933324","display_name":"Benjamin Zambrano","orcid":"https://orcid.org/0000-0002-1301-3447"},"institutions":[{"id":"https://openalex.org/I45204951","display_name":"University of Calabria","ror":"https://ror.org/02rc97e94","country_code":"IT","type":"education","lineage":["https://openalex.org/I45204951"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Benjamin Zambrano","raw_affiliation_strings":["Department of Computer Engineering, Modeling, Electronics and Systems, University of Calabria, Rende, Italy"],"raw_orcid":"https://orcid.org/0000-0002-1301-3447","affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, Modeling, Electronics and Systems, University of Calabria, Rende, Italy","institution_ids":["https://openalex.org/I45204951"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016654766","display_name":"Marco Lanuzza","orcid":"https://orcid.org/0000-0002-6480-9218"},"institutions":[{"id":"https://openalex.org/I45204951","display_name":"University of Calabria","ror":"https://ror.org/02rc97e94","country_code":"IT","type":"education","lineage":["https://openalex.org/I45204951"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Marco Lanuzza","raw_affiliation_strings":["Department of Computer Engineering, Modeling, Electronics and Systems, University of Calabria, Rende, Italy"],"raw_orcid":"https://orcid.org/0000-0002-6480-9218","affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, Modeling, Electronics and Systems, University of Calabria, Rende, Italy","institution_ids":["https://openalex.org/I45204951"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065902823","display_name":"Alexander Fish","orcid":"https://orcid.org/0000-0002-4994-1536"},"institutions":[{"id":"https://openalex.org/I13955877","display_name":"Bar-Ilan University","ror":"https://ror.org/03kgsv495","country_code":"IL","type":"education","lineage":["https://openalex.org/I13955877"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Alexander Fish","raw_affiliation_strings":["EnICS Laboratories, Faculty of Engineering, Bar-Ilan University, Ramat Gan, Israel","EnICS Labs, Faculty of Engineering, Bar-Ilan University, Ramat-Gan, Israel"],"raw_orcid":"https://orcid.org/0000-0002-4994-1536","affiliations":[{"raw_affiliation_string":"EnICS Laboratories, Faculty of Engineering, Bar-Ilan University, Ramat Gan, Israel","institution_ids":["https://openalex.org/I13955877"]},{"raw_affiliation_string":"EnICS Labs, Faculty of Engineering, Bar-Ilan University, Ramat-Gan, Israel","institution_ids":["https://openalex.org/I13955877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073646733","display_name":"Avner Haran","orcid":"https://orcid.org/0000-0002-0623-7637"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Avner Haran","raw_affiliation_strings":["Soreq NRC, Yavne, Israel"],"raw_orcid":"https://orcid.org/0000-0002-0623-7637","affiliations":[{"raw_affiliation_string":"Soreq NRC, Yavne, Israel","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5007161424","display_name":"Leonid Yavits","orcid":"https://orcid.org/0000-0001-5248-3997"},"institutions":[{"id":"https://openalex.org/I13955877","display_name":"Bar-Ilan University","ror":"https://ror.org/03kgsv495","country_code":"IL","type":"education","lineage":["https://openalex.org/I13955877"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Leonid Yavits","raw_affiliation_strings":["EnICS Laboratories, Faculty of Engineering, Bar-Ilan University, Ramat Gan, Israel","EnICS Labs, Faculty of Engineering, Bar-Ilan University, Ramat-Gan, Israel"],"raw_orcid":"https://orcid.org/0000-0001-5248-3997","affiliations":[{"raw_affiliation_string":"EnICS Laboratories, Faculty of Engineering, Bar-Ilan University, Ramat Gan, Israel","institution_ids":["https://openalex.org/I13955877"]},{"raw_affiliation_string":"EnICS Labs, Faculty of Engineering, Bar-Ilan University, Ramat-Gan, Israel","institution_ids":["https://openalex.org/I13955877"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":1.0704,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.75023513,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":98},"biblio":{"volume":"13","issue":null,"first_page":"12032","last_page":"12043"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6872715950012207},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.5982235074043274},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5021312236785889},{"id":"https://openalex.org/keywords/space","display_name":"Space (punctuation)","score":0.48963719606399536},{"id":"https://openalex.org/keywords/throughput","display_name":"Throughput","score":0.46977347135543823},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3552550673484802},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.2028222382068634},{"id":"https://openalex.org/keywords/wireless","display_name":"Wireless","score":0.1587393581867218},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.12175431847572327},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11702507734298706}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6872715950012207},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.5982235074043274},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5021312236785889},{"id":"https://openalex.org/C2778572836","wikidata":"https://www.wikidata.org/wiki/Q380933","display_name":"Space (punctuation)","level":2,"score":0.48963719606399536},{"id":"https://openalex.org/C157764524","wikidata":"https://www.wikidata.org/wiki/Q1383412","display_name":"Throughput","level":3,"score":0.46977347135543823},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3552550673484802},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.2028222382068634},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.1587393581867218},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12175431847572327},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11702507734298706},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2025.3528745","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3528745","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:5dca7ac27ff14c75b7489919bd04e0f8","is_oa":true,"landing_page_url":"https://doaj.org/article/5dca7ac27ff14c75b7489919bd04e0f8","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 13, Pp 12032-12043 (2025)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2025.3528745","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3528745","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.7599999904632568}],"awards":[{"id":"https://openalex.org/G2954317699","display_name":null,"funder_award_id":"1001702600","funder_id":"https://openalex.org/F4320324279","funder_display_name":"Ministry of Science and Technology of Thailand"},{"id":"https://openalex.org/G7379917482","display_name":null,"funder_award_id":"101047160","funder_id":"https://openalex.org/F4320334322","funder_display_name":"HORIZON EUROPE Framework Programme"},{"id":"https://openalex.org/G7626804827","display_name":null,"funder_award_id":"318141","funder_id":"https://openalex.org/F4320324279","funder_display_name":"Ministry of Science and Technology of Thailand"},{"id":"https://openalex.org/G8569890586","display_name":null,"funder_award_id":"101047160","funder_id":"https://openalex.org/F4320336370","funder_display_name":"Ontario Ministry of Research and Innovation"}],"funders":[{"id":"https://openalex.org/F4320324279","display_name":"Ministry of Science and Technology of Thailand","ror":"https://ror.org/02nfy5246"},{"id":"https://openalex.org/F4320334322","display_name":"HORIZON EUROPE Framework Programme","ror":null},{"id":"https://openalex.org/F4320336370","display_name":"Ontario Ministry of Research and Innovation","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":61,"referenced_works":["https://openalex.org/W941595258","https://openalex.org/W1659671481","https://openalex.org/W1935628304","https://openalex.org/W1984126159","https://openalex.org/W1993415821","https://openalex.org/W2014466003","https://openalex.org/W2016445829","https://openalex.org/W2018251503","https://openalex.org/W2045448645","https://openalex.org/W2050431855","https://openalex.org/W2062143991","https://openalex.org/W2066312528","https://openalex.org/W2072075952","https://openalex.org/W2109926308","https://openalex.org/W2110850401","https://openalex.org/W2117061601","https://openalex.org/W2120978650","https://openalex.org/W2131771250","https://openalex.org/W2131913992","https://openalex.org/W2132196780","https://openalex.org/W2141068710","https://openalex.org/W2155051493","https://openalex.org/W2155771881","https://openalex.org/W2342755891","https://openalex.org/W2343627454","https://openalex.org/W2587844224","https://openalex.org/W2737058386","https://openalex.org/W2737640031","https://openalex.org/W2751321818","https://openalex.org/W2769731910","https://openalex.org/W2784101586","https://openalex.org/W2790072224","https://openalex.org/W2901644239","https://openalex.org/W2945209846","https://openalex.org/W2952706362","https://openalex.org/W2954322948","https://openalex.org/W2987965025","https://openalex.org/W2996327265","https://openalex.org/W2997361554","https://openalex.org/W3008392074","https://openalex.org/W3035315595","https://openalex.org/W3047759883","https://openalex.org/W3088899692","https://openalex.org/W3113196971","https://openalex.org/W3118103729","https://openalex.org/W3191703988","https://openalex.org/W4221050618","https://openalex.org/W4224224886","https://openalex.org/W4225350157","https://openalex.org/W4226401879","https://openalex.org/W4282041904","https://openalex.org/W4293731758","https://openalex.org/W4297830326","https://openalex.org/W4319459266","https://openalex.org/W4321021452","https://openalex.org/W4391019904","https://openalex.org/W4391130225","https://openalex.org/W4391582580","https://openalex.org/W4393032750","https://openalex.org/W6857149702","https://openalex.org/W7038183597"],"related_works":["https://openalex.org/W2041615232","https://openalex.org/W2167002145","https://openalex.org/W2149032943","https://openalex.org/W2106281713","https://openalex.org/W2154081718","https://openalex.org/W1544140237","https://openalex.org/W1599771994","https://openalex.org/W3149410719","https://openalex.org/W2108400598","https://openalex.org/W3146113752"],"abstract_inverted_index":{"The":[0,43],"Ternary":[1],"Content":[2],"Addressable":[3],"Memory":[4],"(TCAM)":[5],"is":[6,51,85,168],"a":[7,24,105,173,190],"crucial":[8],"component":[9],"of":[10,53,63,91,193],"satellite":[11],"communication":[12],"systems.":[13],"Space-oriented":[14],"TCAMs":[15],"face":[16],"unique":[17],"challenges,":[18],"as":[19,161,194,196],"they":[20],"must":[21],"operate":[22],"within":[23],"very":[25],"limited":[26],"energy":[27],"budget":[28],"and":[29,113],"are":[30],"susceptible":[31],"to":[32,39,74,95,144],"high":[33],"Soft":[34],"Error":[35],"Rates":[36],"(SER)":[37],"due":[38],"ionizing":[40],"particle":[41],"radiation.":[42],"Dual":[44],"Interlocked":[45],"Storage":[46],"Cell":[47],"(DICE)":[48],"based":[49],"memory":[50,125,186],"capable":[52],"withstanding":[54,119],"soft":[55,129,146],"errors.":[56],"However,":[57],"its":[58],"reliability":[59],"diminishes":[60],"in":[61,79,123],"presence":[62],"multiple":[64,120],"node":[65,121],"upsets.":[66],"Moreover,":[67],"recent":[68],"studies":[69],"indicate":[70],"that":[71,108],"DICE":[72],"resilience":[73],"even":[75],"single-node":[76],"upsets":[77,122],"degrades":[78],"advanced":[80],"technology":[81],"nodes.":[82],"This":[83],"issue":[84],"further":[86],"exacerbated":[87],"by":[88,132],"the":[89,92,110,152,162],"scaling":[90,117],"supply":[93,191],"voltage":[94,116,192],"reduce":[96],"power":[97],"consumption.":[98],"In":[99],"this":[100],"paper,":[101],"we":[102],"propose":[103],"SpaceCAM,":[104],"DICE-based":[106],"TCAM":[107],"overcomes":[109],"above":[111],"limitations":[112],"enables":[114,128],"aggressive":[115],"while":[118,200],"each":[124],"row.":[126],"SpaceCAM":[127,178],"error":[130],"tolerance":[131],"applying":[133],"an":[134,138],"approximate":[135],"rather":[136],"than":[137],"exact":[139],"search.":[140],"It":[141],"tolerates":[142],"up":[143],"5":[145],"errors":[147],"per":[148],"144-bit":[149],"row,":[150],"provided":[151],"minimum":[153],"Hamming":[154],"distance":[155],"between":[156],"stored":[157],"data":[158],"patterns":[159],"(such":[160],"Active":[163],"Control":[164],"List":[165],"(ACL)":[166],"rules)":[167],"26.":[169],"When":[170],"designed":[171],"using":[172],"16nm":[174],"FinFET":[175],"commercial":[176],"process,":[177],"<inline-formula":[179],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[180],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[181],"<tex-math":[182],"notation=\"LaTeX\">$144\\times":[183],"512$":[184],"</tex-math></inline-formula>-bit":[185],"core":[187],"operates":[188],"at":[189,202],"low":[195],"350mV,":[197],"consuming":[198],"2mW":[199],"running":[201],"500MHz.":[203]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}