{"id":"https://openalex.org/W4405270421","doi":"https://doi.org/10.1109/access.2024.3515463","title":"Deep-Learning Methods for Defect Inspection of Plated Through Holes With Clustering-Based Auto-Labeling and GAN-Based Model Training","display_name":"Deep-Learning Methods for Defect Inspection of Plated Through Holes With Clustering-Based Auto-Labeling and GAN-Based Model Training","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4405270421","doi":"https://doi.org/10.1109/access.2024.3515463"},"language":"en","primary_location":{"id":"doi:10.1109/access.2024.3515463","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3515463","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2024.3515463","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109462855","display_name":"Cheng-Tai Hsieh","orcid":null},"institutions":[{"id":"https://openalex.org/I192168892","display_name":"National University of Kaohsiung","ror":"https://ror.org/013zjb662","country_code":"TW","type":"education","lineage":["https://openalex.org/I192168892"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Chang-Yeh Hsieh","raw_affiliation_strings":["Department of Electrical Engineering, National University of Kaohsiung, Kaohsiung, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National University of Kaohsiung, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I192168892"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104159588","display_name":"Ling-Shen Tseng","orcid":null},"institutions":[{"id":"https://openalex.org/I192168892","display_name":"National University of Kaohsiung","ror":"https://ror.org/013zjb662","country_code":"TW","type":"education","lineage":["https://openalex.org/I192168892"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Ling-Shen Tseng","raw_affiliation_strings":["Department of Electrical Engineering, National University of Kaohsiung, Kaohsiung, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National University of Kaohsiung, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I192168892"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108428276","display_name":"Yi-Han Chen","orcid":"https://orcid.org/0000-0003-1054-0353"},"institutions":[{"id":"https://openalex.org/I192168892","display_name":"National University of Kaohsiung","ror":"https://ror.org/013zjb662","country_code":"TW","type":"education","lineage":["https://openalex.org/I192168892"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yi-Han Chen","raw_affiliation_strings":["Department of Electrical Engineering, National University of Kaohsiung, Kaohsiung, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National University of Kaohsiung, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I192168892"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040044830","display_name":"Chiung-Hui Tsai","orcid":"https://orcid.org/0000-0002-2250-4715"},"institutions":[{"id":"https://openalex.org/I192168892","display_name":"National University of Kaohsiung","ror":"https://ror.org/013zjb662","country_code":"TW","type":"education","lineage":["https://openalex.org/I192168892"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chiung-Hui Tsai","raw_affiliation_strings":["Department of Electrical Engineering, National University of Kaohsiung, Kaohsiung, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National University of Kaohsiung, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I192168892"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101424597","display_name":"Chih\u2010Hung Wu","orcid":"https://orcid.org/0000-0002-8109-068X"},"institutions":[{"id":"https://openalex.org/I192168892","display_name":"National University of Kaohsiung","ror":"https://ror.org/013zjb662","country_code":"TW","type":"education","lineage":["https://openalex.org/I192168892"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chih-Hung Wu","raw_affiliation_strings":["Department of Electrical Engineering, National University of Kaohsiung, Kaohsiung, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National University of Kaohsiung, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I192168892"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5109462855"],"corresponding_institution_ids":["https://openalex.org/I192168892"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.3244221,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"12","issue":null,"first_page":"190598","last_page":"190610"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.991599977016449,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11301","display_name":"Advanced Surface Polishing Techniques","score":0.991100013256073,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cluster-analysis","display_name":"Cluster analysis","score":0.7145204544067383},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6499345302581787},{"id":"https://openalex.org/keywords/training","display_name":"Training (meteorology)","score":0.5850513577461243},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.5495181083679199},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5380766987800598},{"id":"https://openalex.org/keywords/training-set","display_name":"Training set","score":0.492088258266449},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.4433711767196655},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.35818687081336975},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.30029773712158203},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.057910382747650146}],"concepts":[{"id":"https://openalex.org/C73555534","wikidata":"https://www.wikidata.org/wiki/Q622825","display_name":"Cluster analysis","level":2,"score":0.7145204544067383},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6499345302581787},{"id":"https://openalex.org/C2777211547","wikidata":"https://www.wikidata.org/wiki/Q17141490","display_name":"Training (meteorology)","level":2,"score":0.5850513577461243},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.5495181083679199},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5380766987800598},{"id":"https://openalex.org/C51632099","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Training set","level":2,"score":0.492088258266449},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4433711767196655},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.35818687081336975},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.30029773712158203},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.057910382747650146},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2024.3515463","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3515463","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:e002fbe0ceb04cbf95b41523b5cbbc46","is_oa":true,"landing_page_url":"https://doaj.org/article/e002fbe0ceb04cbf95b41523b5cbbc46","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 12, Pp 190598-190610 (2024)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2024.3515463","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3515463","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1123436842","display_name":null,"funder_award_id":"NSTC 110-2221-E-390-018","funder_id":"https://openalex.org/F4320322795","funder_display_name":"Ministry of Science and Technology, Taiwan"},{"id":"https://openalex.org/G1291131018","display_name":null,"funder_award_id":"MOST 109-2221-E-390-016","funder_id":"https://openalex.org/F4320322795","funder_display_name":"Ministry of Science and Technology, Taiwan"},{"id":"https://openalex.org/G6211095067","display_name":null,"funder_award_id":"MOST 109-2221-E-390-016","funder_id":"https://openalex.org/F4320322108","funder_display_name":"Ministry of Science and Technology"},{"id":"https://openalex.org/G7259055137","display_name":null,"funder_award_id":"110-2221-E-390-018-","funder_id":"https://openalex.org/F4320331164","funder_display_name":"National Science and Technology Council"}],"funders":[{"id":"https://openalex.org/F4320322108","display_name":"Ministry of Science and Technology","ror":"https://ror.org/032e49973"},{"id":"https://openalex.org/F4320322795","display_name":"Ministry of Science and Technology, Taiwan","ror":"https://ror.org/02kv4zf79"},{"id":"https://openalex.org/F4320331164","display_name":"National Science and Technology Council","ror":"https://ror.org/00wnb9798"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W1977556410","https://openalex.org/W1987971958","https://openalex.org/W2531409750","https://openalex.org/W2747355315","https://openalex.org/W2885863158","https://openalex.org/W2886256586","https://openalex.org/W2895572611","https://openalex.org/W2963150697","https://openalex.org/W2989569326","https://openalex.org/W3034713821","https://openalex.org/W3114273261","https://openalex.org/W3137715528","https://openalex.org/W3162778129","https://openalex.org/W3169651898","https://openalex.org/W3171165618","https://openalex.org/W3173395783","https://openalex.org/W3193024002","https://openalex.org/W3206900642","https://openalex.org/W4205553873","https://openalex.org/W4226378622","https://openalex.org/W4287887190","https://openalex.org/W4319663674","https://openalex.org/W4379470918","https://openalex.org/W6637568146","https://openalex.org/W6686164453","https://openalex.org/W6687483927","https://openalex.org/W6765779288","https://openalex.org/W6779669310","https://openalex.org/W6779823529","https://openalex.org/W6785652829"],"related_works":["https://openalex.org/W230091440","https://openalex.org/W2233261550","https://openalex.org/W2810751659","https://openalex.org/W258997015","https://openalex.org/W2997094352","https://openalex.org/W4375867731","https://openalex.org/W3216976533","https://openalex.org/W4394050964","https://openalex.org/W2551249631","https://openalex.org/W3000197790"],"abstract_inverted_index":{"This":[0,133],"paper":[1],"presents":[2],"the":[3,26,37,60,80,93,127,130],"integration":[4],"of":[5,13,30,39,95,123,129,161],"several":[6],"deep":[7,137],"learning":[8,138],"techniques":[9,139],"for":[10,50,65,74],"defect":[11,144],"inspection":[12],"plated":[14],"through-hole":[15],"(PTH)":[16],"on":[17,59,117],"printed":[18],"circuit":[19],"boards":[20],"(PCBs).":[21],"In":[22],"our":[23],"proposed":[24],"system,":[25],"object":[27],"detection":[28,100,131,145],"technology":[29],"You":[31],"Only":[32],"Look":[33],"Once":[34],"(YOLO)":[35],"allocates":[36],"position":[38],"PTHs;":[40],"a":[41,113,142,149],"semi-automatic":[42],"clustering":[43],"mechanism":[44,71,115],"distinguishes":[45],"normal":[46],"and":[47,78,109,125,155],"defective":[48],"PTHs":[49,77,154],"collecting":[51],"training":[52,97],"data.":[53],"A":[54,69],"convolution":[55],"neural":[56],"network":[57,86],"based":[58,116],"ResNet":[61],"framework":[62],"is":[63,72,88],"established":[64],"detecting":[66],"PTH":[67,143],"defects.":[68],"retrain":[70],"designed":[73],"retracting":[75],"misclassified":[76],"updating":[79],"recognition":[81],"model.":[82,132],"The":[83,99],"generative":[84],"adversarial":[85],"(GAN)":[87],"employed":[89],"to":[90,140],"deal":[91],"with":[92,106],"insufficiency":[94],"negative":[96],"samples.":[98],"model":[101],"can":[102],"achieve":[103],"98.96%":[104],"accuracy":[105,128,160],"continuous":[107],"retraining":[108],"data":[110],"augmentation.":[111],"Further,":[112],"filtering":[114],"template":[118],"analysis":[119],"eliminates":[120],"ambiguous":[121],"outputs":[122],"GAN":[124],"improves":[126],"study":[134],"integrates":[135],"these":[136],"establish":[141],"system":[146],"tested":[147],"in":[148],"PCB":[150],"manufactory":[151],"against":[152],"real":[153],"gained":[156],"an":[157],"overall":[158],"prediction":[159],"99.48%.":[162]},"counts_by_year":[],"updated_date":"2026-04-09T08:11:56.329763","created_date":"2025-10-10T00:00:00"}