{"id":"https://openalex.org/W4404307343","doi":"https://doi.org/10.1109/access.2024.3498004","title":"A Detection Algorithm for Surface Defects of Printed Circuit Board Based on Improved YOLOv8","display_name":"A Detection Algorithm for Surface Defects of Printed Circuit Board Based on Improved YOLOv8","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4404307343","doi":"https://doi.org/10.1109/access.2024.3498004"},"language":"en","primary_location":{"id":"doi:10.1109/access.2024.3498004","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3498004","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2024.3498004","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5114949183","display_name":"Lei Yao","orcid":"https://orcid.org/0000-0001-6791-0330"},"institutions":[{"id":"https://openalex.org/I148128674","display_name":"University of Shanghai for Science and Technology","ror":"https://ror.org/00ay9v204","country_code":"CN","type":"education","lineage":["https://openalex.org/I148128674"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lei Yao","raw_affiliation_strings":["School of Electrical Engineering, University of Shanghai for Science and Technology, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0001-6791-0330","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, University of Shanghai for Science and Technology, Shanghai, China","institution_ids":["https://openalex.org/I148128674"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5114618309","display_name":"Bing Zhao","orcid":"https://orcid.org/0009-0003-2852-8800"},"institutions":[{"id":"https://openalex.org/I148128674","display_name":"University of Shanghai for Science and Technology","ror":"https://ror.org/00ay9v204","country_code":"CN","type":"education","lineage":["https://openalex.org/I148128674"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bing Zhao","raw_affiliation_strings":["School of Electrical Engineering, University of Shanghai for Science and Technology, Shanghai, China"],"raw_orcid":"https://orcid.org/0009-0003-2852-8800","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, University of Shanghai for Science and Technology, Shanghai, China","institution_ids":["https://openalex.org/I148128674"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044876673","display_name":"X. Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I148128674","display_name":"University of Shanghai for Science and Technology","ror":"https://ror.org/00ay9v204","country_code":"CN","type":"education","lineage":["https://openalex.org/I148128674"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xihui Wang","raw_affiliation_strings":["School of Mechanical Engineering, University of Shanghai for Science and Technology, Shanghai, China"],"raw_orcid":"https://orcid.org/0009-0007-1752-3528","affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, University of Shanghai for Science and Technology, Shanghai, China","institution_ids":["https://openalex.org/I148128674"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Sihan Mei","orcid":"https://orcid.org/0009-0003-3953-3920"},"institutions":[{"id":"https://openalex.org/I148128674","display_name":"University of Shanghai for Science and Technology","ror":"https://ror.org/00ay9v204","country_code":"CN","type":"education","lineage":["https://openalex.org/I148128674"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Sihan Mei","raw_affiliation_strings":["School of Electrical Engineering, University of Shanghai for Science and Technology, Shanghai, China"],"raw_orcid":"https://orcid.org/0009-0003-3953-3920","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, University of Shanghai for Science and Technology, Shanghai, China","institution_ids":["https://openalex.org/I148128674"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5002752893","display_name":"Yulun Chi","orcid":"https://orcid.org/0000-0001-7197-2227"},"institutions":[{"id":"https://openalex.org/I148128674","display_name":"University of Shanghai for Science and Technology","ror":"https://ror.org/00ay9v204","country_code":"CN","type":"education","lineage":["https://openalex.org/I148128674"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yulun Chi","raw_affiliation_strings":["School of Mechanical Engineering, University of Shanghai for Science and Technology, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0001-7197-2227","affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, University of Shanghai for Science and Technology, Shanghai, China","institution_ids":["https://openalex.org/I148128674"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I148128674"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":2.7126,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.90051217,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"12","issue":null,"first_page":"170227","last_page":"170242"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9309999942779541,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9309999942779541,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.831840991973877},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5649919509887695},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.38142678141593933}],"concepts":[{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.831840991973877},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5649919509887695},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.38142678141593933},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2024.3498004","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3498004","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:ae0ea9f4ee5e43b88f56f8b218679a94","is_oa":true,"landing_page_url":"https://doaj.org/article/ae0ea9f4ee5e43b88f56f8b218679a94","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 12, Pp 170227-170242 (2024)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2024.3498004","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3498004","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3375867770","display_name":null,"funder_award_id":"51707121","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2051487156","https://openalex.org/W4252608911","https://openalex.org/W2184913151","https://openalex.org/W2389426768","https://openalex.org/W2073681303","https://openalex.org/W3147987719","https://openalex.org/W2599361292"],"abstract_inverted_index":{"Improving":[0],"detection":[1,24,149,216],"accuracy":[2],"is":[3,66,89,181],"a":[4,41,57],"challenging":[5],"task":[6],"when":[7],"detecting":[8],"defects":[9],"in":[10,26,150,224],"PCBs.":[11],"To":[12],"conquer":[13],"the":[14,49,70,75,80,93,103,111,121,134,137,146,151,178,184,187,205,211],"issue":[15],"of":[16,18,21,136,148,169,214],"degradation":[17],"recognition":[19],"performance":[20],"existing":[22],"intelligent":[23],"algorithms":[25],"different":[27],"environments,":[28],"we":[29,39],"present":[30],"an":[31],"improved":[32],"algorithm,":[33],"IEMA-YOLOv8,":[34],"based":[35],"on":[36],"YOLOv8.":[37],"First,":[38],"design":[40],"novel":[42],"Efficient":[43],"Multi-Scale":[44],"Attention":[45],"(EMA)":[46],"combined":[47],"with":[48,85,210],"Inverted":[50],"Residual":[51],"Mobile":[52],"Block":[53],"(IRMB)":[54],"to":[55,73,91,106,131],"form":[56],"new":[58],"attention":[59],"mechanism":[60],"called":[61],"IEMA.":[62],"The":[63,153],"IEMA":[64],"module":[65,72,88],"subsequently":[67],"incorporated":[68],"into":[69],"C2f":[71],"boost":[74],"model\u2019s":[76,104],"overall":[77],"performance.":[78],"Secondly,":[79],"Spatial":[81,95],"Pyramid":[82,96],"Pooling":[83,97],"Enhanced":[84],"ELAN":[86],"(SPPELAN)":[87],"employed":[90],"improve":[92],"original":[94,122,206],"Fast":[98],"(SPPF)":[99],"module,":[100],"thereby":[101],"bolstering":[102],"capacity":[105],"recognize":[107],"defective":[108],"regions.":[109],"Finally,":[110],"More":[112],"Focused":[113],"Intersection":[114,124],"over":[115,125],"Union":[116,126],"(Focaler-IoU)":[117],"loss":[118,128],"function":[119],"replaces":[120],"Complete":[123],"(CIoU)":[127],"function,":[129],"aiming":[130],"compensate":[132],"for":[133],"limitations":[135],"current":[138],"bounding":[139],"box":[140],"regression":[141],"methodology,":[142],"thus":[143],"further":[144],"enhancing":[145],"efficacy":[147],"task.":[152],"experimental":[154],"results":[155],"show":[156],"that":[157,177],"our":[158,218],"proposed":[159,219],"IEMA-YOLOv8":[160],"algorithm":[161,220],"has":[162,221],"precision,":[163],"recall,":[164],"mAP50,":[165],"and":[166,173,186,201],"mAP50:95":[167],"values":[168,196],"88.8%,":[170],"96.8%,":[171],"94.6%,":[172],"51%,":[174],"respectively,":[175],"provided":[176],"model":[179],"complexity":[180],"kept":[182],"basically":[183],"same":[185],"Frames":[188],"Per":[189],"Second":[190],"(FPS)":[191],"value":[192],"reaches":[193],"116.2.":[194],"These":[195],"are":[197],"1.1%,":[198],"3.6%,":[199],"4.9%,":[200],"6%":[202],"higher":[203],"than":[204],"YOLOv8n":[207],"algorithm.":[208],"Compared":[209],"YOLO":[212],"family":[213],"one-stage":[215],"models,":[217],"significant":[222],"advantages":[223],"defect":[225],"detection.":[226]},"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":8},{"year":2024,"cited_by_count":1}],"updated_date":"2026-08-12T21:12:35.861297","created_date":"2025-10-10T00:00:00"}