{"id":"https://openalex.org/W4403759030","doi":"https://doi.org/10.1109/access.2024.3486329","title":"Deep Neural Network Using Transfer Learning Technique for MOSFETs With Different Gate Lengths in Avalanche Region","display_name":"Deep Neural Network Using Transfer Learning Technique for MOSFETs With Different Gate Lengths in Avalanche Region","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4403759030","doi":"https://doi.org/10.1109/access.2024.3486329"},"language":"en","primary_location":{"id":"doi:10.1109/access.2024.3486329","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3486329","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2024.3486329","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5088644827","display_name":"Chie\u2010In Lee","orcid":"https://orcid.org/0000-0002-9890-5240"},"institutions":[{"id":"https://openalex.org/I142974352","display_name":"National Sun Yat-sen University","ror":"https://ror.org/00mjawt10","country_code":"TW","type":"education","lineage":["https://openalex.org/I142974352"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Chie-In Lee","raw_affiliation_strings":["Department of Electrical Engineering, National Sun Yat-sen University, Kaohsiung, Taiwan","Department of Electrical Engineering and Institute of Communications Engineering, National Sun Yat-sen University, Kaohsiung, Taiwan"],"raw_orcid":"https://orcid.org/0000-0002-9890-5240","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Sun Yat-sen University, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I142974352"]},{"raw_affiliation_string":"Department of Electrical Engineering and Institute of Communications Engineering, National Sun Yat-sen University, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I142974352"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101906600","display_name":"Shiyan Zhang","orcid":"https://orcid.org/0000-0001-8498-9714"},"institutions":[{"id":"https://openalex.org/I142974352","display_name":"National Sun Yat-sen University","ror":"https://ror.org/00mjawt10","country_code":"TW","type":"education","lineage":["https://openalex.org/I142974352"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Shi-Yan Zhang","raw_affiliation_strings":["Department of Electrical Engineering, National Sun Yat-sen University, Kaohsiung, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Sun Yat-sen University, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I142974352"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104183932","display_name":"Shih-Chieh Li","orcid":null},"institutions":[{"id":"https://openalex.org/I142974352","display_name":"National Sun Yat-sen University","ror":"https://ror.org/00mjawt10","country_code":"TW","type":"education","lineage":["https://openalex.org/I142974352"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Shih-Chieh Li","raw_affiliation_strings":["Department of Electrical Engineering, National Sun Yat-sen University, Kaohsiung, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Sun Yat-sen University, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I142974352"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000996084","display_name":"Jia-Han Yang","orcid":null},"institutions":[{"id":"https://openalex.org/I142974352","display_name":"National Sun Yat-sen University","ror":"https://ror.org/00mjawt10","country_code":"TW","type":"education","lineage":["https://openalex.org/I142974352"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Jia-Han Yang","raw_affiliation_strings":["Department of Electrical Engineering, National Sun Yat-sen University, Kaohsiung, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Sun Yat-sen University, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I142974352"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5005000418","display_name":"Jian Su","orcid":"https://orcid.org/0000-0002-0785-6528"},"institutions":[{"id":"https://openalex.org/I142974352","display_name":"National Sun Yat-sen University","ror":"https://ror.org/00mjawt10","country_code":"TW","type":"education","lineage":["https://openalex.org/I142974352"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Jian Cheng Su","raw_affiliation_strings":["Department of Electrical Engineering, National Sun Yat-sen University, Kaohsiung, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Sun Yat-sen University, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I142974352"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5088644827"],"corresponding_institution_ids":["https://openalex.org/I142974352"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.2003,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.52725894,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"12","issue":null,"first_page":"157988","last_page":"157995"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9724000096321106,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9724000096321106,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9702000021934509,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9455999732017517,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.5948206186294556},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.48395612835884094},{"id":"https://openalex.org/keywords/transfer-of-learning","display_name":"Transfer of learning","score":0.4662930369377136},{"id":"https://openalex.org/keywords/transfer","display_name":"Transfer (computing)","score":0.42838892340660095},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.4163694679737091},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.4135097861289978},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3940584063529968},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3876473307609558},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.35017526149749756},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.2028244137763977},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.0893283486366272}],"concepts":[{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.5948206186294556},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.48395612835884094},{"id":"https://openalex.org/C150899416","wikidata":"https://www.wikidata.org/wiki/Q1820378","display_name":"Transfer of learning","level":2,"score":0.4662930369377136},{"id":"https://openalex.org/C2776175482","wikidata":"https://www.wikidata.org/wiki/Q1195816","display_name":"Transfer (computing)","level":2,"score":0.42838892340660095},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.4163694679737091},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.4135097861289978},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3940584063529968},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3876473307609558},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.35017526149749756},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.2028244137763977},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.0893283486366272}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2024.3486329","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3486329","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:7aa4a80e4be649d8847d1d5a6d03eb4f","is_oa":true,"landing_page_url":"https://doaj.org/article/7aa4a80e4be649d8847d1d5a6d03eb4f","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 12, Pp 157988-157995 (2024)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2024.3486329","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3486329","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3459412077","display_name":null,"funder_award_id":"MOST 109-2221-E-110-057-MY3","funder_id":"https://openalex.org/F4320331164","funder_display_name":"National Science and Technology Council"},{"id":"https://openalex.org/G5410158334","display_name":null,"funder_award_id":"NSTC 112-2221-E-110-030-MY2","funder_id":"https://openalex.org/F4320331164","funder_display_name":"National Science and Technology Council"}],"funders":[{"id":"https://openalex.org/F4320331164","display_name":"National Science and Technology Council","ror":"https://ror.org/00wnb9798"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W99485931","https://openalex.org/W1661368752","https://openalex.org/W1937060092","https://openalex.org/W1979580630","https://openalex.org/W1984705805","https://openalex.org/W2028783822","https://openalex.org/W2113862478","https://openalex.org/W2165698076","https://openalex.org/W2172415194","https://openalex.org/W2533480158","https://openalex.org/W2593577643","https://openalex.org/W2913045390","https://openalex.org/W3005262551","https://openalex.org/W3039565917","https://openalex.org/W3176929032","https://openalex.org/W3206758681","https://openalex.org/W4297229820","https://openalex.org/W4297564142","https://openalex.org/W4387700624","https://openalex.org/W6676001293"],"related_works":["https://openalex.org/W4206357785","https://openalex.org/W4281381188","https://openalex.org/W3192840557","https://openalex.org/W2951211570","https://openalex.org/W4375928479","https://openalex.org/W3167935049","https://openalex.org/W3023427754","https://openalex.org/W3131673289","https://openalex.org/W4393011546","https://openalex.org/W3198847674"],"abstract_inverted_index":{"In":[0],"this":[1,74,132],"paper,":[2],"a":[3,29,43],"transfer":[4],"learning":[5],"technique":[6],"was":[7],"first":[8],"utilized":[9],"to":[10,41,88,140],"obtain":[11,42],"deep":[12,44],"neural":[13,45,94],"network":[14,95],"models":[15,48,122],"for":[16,49,152],"different":[17,50,110],"gate":[18,51],"lengths":[19,52],"in":[20,116,123,157],"the":[21,26,37,64,70,80,83,91,105,124,148,158],"avalanche":[22,161],"breakdown":[23,125,162],"regime.":[24],"Once":[25],"characteristics":[27],"of":[28,82,90],"gate-length":[30],"metal-oxide-semiconductor":[31],"field-effect":[32],"transistor":[33],"are":[34,39,53,115],"measured":[35,61],"and":[36,59,67,79,100,113,145,160],"data":[38,62,72],"used":[40],"network,":[46],"behavioral":[47,121],"established":[54],"by":[55],"fewer":[56],"hidden":[57],"layers":[58],"less":[60],"at":[63,109],"desired":[65],"biases":[66],"frequencies.":[68],"Therefore,":[69],"training":[71],"through":[73],"method":[75],"is":[76,86],"significantly":[77],"reduced":[78],"accuracy":[81],"testing":[84],"dataset":[85],"comparable":[87],"that":[89],"conventional":[92],"artificial":[93],"technique.":[96,133],"The":[97],"predicted,":[98],"measured,":[99],"simulated":[101],"results":[102],"based":[103],"on":[104],"transit":[106],"time":[107,151],"theory":[108],"bias":[111],"voltages":[112],"frequencies":[114],"good":[117],"agreement.":[118],"Multibias":[119],"S-parameter":[120],"regime":[126],"can":[127,136,146],"be":[128,138],"efficiently":[129],"built":[130],"using":[131],"This":[134],"approach":[135],"even":[137],"applied":[139],"other":[141],"advanced":[142],"technology":[143],"nodes":[144],"shorten":[147],"model":[149],"building":[150],"CMOS":[153],"circuit":[154],"design":[155],"operating":[156],"saturation":[159],"regions.":[163]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-12-27T23:08:20.325037","created_date":"2025-10-10T00:00:00"}