{"id":"https://openalex.org/W4403721365","doi":"https://doi.org/10.1109/access.2024.3486110","title":"YOLOv5-ACCOF Steel Surface Defect Detection Algorithm","display_name":"YOLOv5-ACCOF Steel Surface Defect Detection Algorithm","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4403721365","doi":"https://doi.org/10.1109/access.2024.3486110"},"language":"en","primary_location":{"id":"doi:10.1109/access.2024.3486110","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3486110","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2024.3486110","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5052805334","display_name":"Xin Hai-tao","orcid":"https://orcid.org/0009-0007-9378-990X"},"institutions":[{"id":"https://openalex.org/I41208885","display_name":"Harbin University of Commerce","ror":"https://ror.org/03zsxkw25","country_code":"CN","type":"education","lineage":["https://openalex.org/I41208885"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haitao Xin","raw_affiliation_strings":["School of Computer and Information Engineering, Harbin University of Commerce, Harbin, Heilongjiang, China"],"raw_orcid":"https://orcid.org/0009-0007-9378-990X","affiliations":[{"raw_affiliation_string":"School of Computer and Information Engineering, Harbin University of Commerce, Harbin, Heilongjiang, China","institution_ids":["https://openalex.org/I41208885"]}]},{"author_position":"last","author":{"id":null,"display_name":"Junpeng Song","orcid":"https://orcid.org/0009-0009-2476-0059"},"institutions":[{"id":"https://openalex.org/I41208885","display_name":"Harbin University of Commerce","ror":"https://ror.org/03zsxkw25","country_code":"CN","type":"education","lineage":["https://openalex.org/I41208885"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Junpeng Song","raw_affiliation_strings":["School of Computer and Information Engineering, Harbin University of Commerce, Harbin, Heilongjiang, China"],"raw_orcid":"https://orcid.org/0009-0009-2476-0059","affiliations":[{"raw_affiliation_string":"School of Computer and Information Engineering, Harbin University of Commerce, Harbin, Heilongjiang, China","institution_ids":["https://openalex.org/I41208885"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I41208885"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":2.0841,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.88297549,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"12","issue":null,"first_page":"157496","last_page":"157506"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9884999990463257,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9884999990463257,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5739585161209106},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4350689947605133}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5739585161209106},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4350689947605133}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2024.3486110","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3486110","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:af75b2c4552c4d9cad87e8d42c02fc54","is_oa":true,"landing_page_url":"https://doaj.org/article/af75b2c4552c4d9cad87e8d42c02fc54","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 12, Pp 157496-157506 (2024)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2024.3486110","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3486110","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W2109255472","https://openalex.org/W2565639579","https://openalex.org/W2630837129","https://openalex.org/W2944303778","https://openalex.org/W2963857746","https://openalex.org/W2987322772","https://openalex.org/W4285082122","https://openalex.org/W4289752563","https://openalex.org/W4293505591","https://openalex.org/W4296412923","https://openalex.org/W4296900139","https://openalex.org/W4312760378","https://openalex.org/W4387521448","https://openalex.org/W4390847956","https://openalex.org/W4391065299","https://openalex.org/W4391124054","https://openalex.org/W4393167116","https://openalex.org/W4393965959","https://openalex.org/W4399992735","https://openalex.org/W6739696289","https://openalex.org/W6745344627","https://openalex.org/W6843259600","https://openalex.org/W6860809172"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2051487156","https://openalex.org/W2073681303","https://openalex.org/W2390279801","https://openalex.org/W4391913857","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109"],"abstract_inverted_index":{"Steel":[0],"surface":[1,34],"defect":[2,35,151],"detection":[3,23,36,152,171],"is":[4,160],"critical":[5],"for":[6],"industrial":[7],"production":[8],"and":[9,21,118,200],"quality":[10],"control.":[11],"Traditional":[12],"methods,":[13],"however,":[14],"face":[15],"challenges":[16],"such":[17],"as":[18],"complex":[19,155],"scenes":[20],"the":[22,40,46,53,62,68,73,84,99,103,115,120,132,136,149,166,189],"of":[24,94,135],"small":[25],"defects.":[26],"To":[27],"address":[28],"these":[29],"issues,":[30],"we":[31,125],"propose":[32],"a":[33],"method":[37],"based":[38],"on":[39,64,175],"YOLOv5-ACCOF":[41,185],"architecture.":[42],"Our":[43],"approach":[44],"incorporates":[45],"Convolutional":[47],"Block":[48],"Attention":[49],"Module":[50],"(CBAM)":[51],"into":[52,131],"Backbone":[54,69],"core":[55],"feature":[56,108,116,141],"extraction":[57],"module":[58,97,101,134],"C3,":[59],"thereby":[60,110,147],"enhancing":[61,119],"focus":[63],"key":[65],"information":[66],"within":[67],"layer.":[70],"We":[71],"replace":[72],"conventional":[74],"SPPF":[75],"layer":[76],"with":[77],"Atrous":[78],"Spatial":[79],"Pyramid":[80],"Pooling":[81],"(ASPP),":[82],"improving":[83,111],"model\u2019s":[85,121,150],"capability":[86,153],"to":[87,162],"perceive":[88],"multi-scale":[89],"information.":[90],"The":[91,157],"Content-Aware":[92],"ReAssembly":[93],"Features":[95],"(CARAFE)":[96],"substitutes":[98],"upsampling":[100,122],"in":[102,114,154,202],"Neck":[104],"layer,":[105],"enabling":[106],"content-aware":[107],"reassembly,":[109],"detail":[112],"retention":[113],"maps":[117],"efficacy.":[123],"Additionally,":[124],"integrate":[126],"Omni-Directional":[127],"Dynamic":[128],"Convolution":[129],"(ODConv)":[130],"C3":[133],"Neck,":[137],"which":[138,164],"facilitates":[139],"richer":[140],"representation":[142],"through":[143],"multi-directional":[144],"convolution":[145],"operations,":[146],"augmenting":[148],"backgrounds.":[156],"loss":[158],"function":[159],"modified":[161],"Focaler-IoU,":[163],"improves":[165],"detector\u2019s":[167],"performance":[168],"across":[169],"various":[170],"tasks":[172],"by":[173],"focusing":[174],"different":[176],"regression":[177],"samples.":[178],"Experimental":[179],"results":[180],"demonstrate":[181],"that":[182],"our":[183],"proposed":[184],"model":[186],"significantly":[187],"outperforms":[188],"original":[190],"model,":[191],"exhibiting":[192],"robust":[193],"generalization":[194],"capabilities,":[195],"thus":[196],"verifying":[197],"its":[198],"effectiveness":[199],"feasibility":[201],"practical":[203],"applications.":[204]},"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":3}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}