{"id":"https://openalex.org/W4403331472","doi":"https://doi.org/10.1109/access.2024.3479090","title":"Reliability of Industrial-Scale Telescopes in the Event of Seismic Failures","display_name":"Reliability of Industrial-Scale Telescopes in the Event of Seismic Failures","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4403331472","doi":"https://doi.org/10.1109/access.2024.3479090"},"language":"en","primary_location":{"id":"doi:10.1109/access.2024.3479090","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3479090","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2024.3479090","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5090419018","display_name":"Anthony D. Cho","orcid":"https://orcid.org/0000-0001-7471-5605"},"institutions":[{"id":"https://openalex.org/I116419501","display_name":"Universidad Mayor","ror":"https://ror.org/00pn44t17","country_code":"CL","type":"education","lineage":["https://openalex.org/I116419501"]}],"countries":["CL"],"is_corresponding":true,"raw_author_name":"Anthony D. Cho","raw_affiliation_strings":["Escuela de Ingenier&#x00ED;a, Facultad de Ciencias, Ingenier&#x00ED;a y Tecnolog&#x00ED;a, Universidad Mayor, Santiago, Chile"],"raw_orcid":"https://orcid.org/0000-0001-7471-5605","affiliations":[{"raw_affiliation_string":"Escuela de Ingenier&#x00ED;a, Facultad de Ciencias, Ingenier&#x00ED;a y Tecnolog&#x00ED;a, Universidad Mayor, Santiago, Chile","institution_ids":["https://openalex.org/I116419501"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025564132","display_name":"Dora Jim\u00e9nez","orcid":"https://orcid.org/0000-0002-0675-6488"},"institutions":[{"id":"https://openalex.org/I116419501","display_name":"Universidad Mayor","ror":"https://ror.org/00pn44t17","country_code":"CL","type":"education","lineage":["https://openalex.org/I116419501"]}],"countries":["CL"],"is_corresponding":false,"raw_author_name":"Dora Jim\u00e9nez","raw_affiliation_strings":["Escuela de Ingenier&#x00ED;a, Facultad de Ciencias, Ingenier&#x00ED;a y Tecnolog&#x00ED;a, Universidad Mayor, Santiago, Chile"],"raw_orcid":"https://orcid.org/0000-0002-0675-6488","affiliations":[{"raw_affiliation_string":"Escuela de Ingenier&#x00ED;a, Facultad de Ciencias, Ingenier&#x00ED;a y Tecnolog&#x00ED;a, Universidad Mayor, Santiago, Chile","institution_ids":["https://openalex.org/I116419501"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113429946","display_name":"Esnil Guevara","orcid":"https://orcid.org/0009-0000-1595-9044"},"institutions":[{"id":"https://openalex.org/I4210113179","display_name":"Finis Terrae University","ror":"https://ror.org/0225snd59","country_code":"CL","type":"education","lineage":["https://openalex.org/I4210113179"]}],"countries":["CL"],"is_corresponding":false,"raw_author_name":"Esnil Guevara","raw_affiliation_strings":["Centro de Econom&#x00ED;a y Negocios Sostenibles, Universidad Finis Terrae, Santiago, Chile"],"raw_orcid":"https://orcid.org/0009-0000-1595-9044","affiliations":[{"raw_affiliation_string":"Centro de Econom&#x00ED;a y Negocios Sostenibles, Universidad Finis Terrae, Santiago, Chile","institution_ids":["https://openalex.org/I4210113179"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5090419018"],"corresponding_institution_ids":["https://openalex.org/I116419501"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.17982482,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"12","issue":null,"first_page":"149760","last_page":"149786"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13891","display_name":"Engineering Diagnostics and Reliability","score":0.9430000185966492,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13891","display_name":"Engineering Diagnostics and Reliability","score":0.9430000185966492,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7204284071922302},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6176166534423828},{"id":"https://openalex.org/keywords/scale","display_name":"Scale (ratio)","score":0.5835464000701904},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5606783628463745},{"id":"https://openalex.org/keywords/event","display_name":"Event (particle physics)","score":0.5291524529457092},{"id":"https://openalex.org/keywords/seismology","display_name":"Seismology","score":0.37765341997146606},{"id":"https://openalex.org/keywords/remote-sensing","display_name":"Remote sensing","score":0.3388601541519165},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.22735491394996643},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19112780690193176},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09216997027397156}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7204284071922302},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6176166534423828},{"id":"https://openalex.org/C2778755073","wikidata":"https://www.wikidata.org/wiki/Q10858537","display_name":"Scale (ratio)","level":2,"score":0.5835464000701904},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5606783628463745},{"id":"https://openalex.org/C2779662365","wikidata":"https://www.wikidata.org/wiki/Q5416694","display_name":"Event (particle physics)","level":2,"score":0.5291524529457092},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.37765341997146606},{"id":"https://openalex.org/C62649853","wikidata":"https://www.wikidata.org/wiki/Q199687","display_name":"Remote sensing","level":1,"score":0.3388601541519165},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.22735491394996643},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19112780690193176},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09216997027397156},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2024.3479090","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3479090","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:8f2df3cf34f04fd098ca9b3a058eeae6","is_oa":true,"landing_page_url":"https://doaj.org/article/8f2df3cf34f04fd098ca9b3a058eeae6","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 12, Pp 149760-149786 (2024)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2024.3479090","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3479090","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":44,"referenced_works":["https://openalex.org/W197143460","https://openalex.org/W2023826651","https://openalex.org/W2043644637","https://openalex.org/W2051192424","https://openalex.org/W2054423898","https://openalex.org/W2055683917","https://openalex.org/W2060453196","https://openalex.org/W2069671013","https://openalex.org/W2122463045","https://openalex.org/W2277817011","https://openalex.org/W2361733783","https://openalex.org/W2586069805","https://openalex.org/W2789634121","https://openalex.org/W2808798366","https://openalex.org/W2844676215","https://openalex.org/W2846854892","https://openalex.org/W2886751442","https://openalex.org/W2898058206","https://openalex.org/W3004710663","https://openalex.org/W3038752360","https://openalex.org/W3088016527","https://openalex.org/W3105899688","https://openalex.org/W3181018970","https://openalex.org/W3185750840","https://openalex.org/W4200121728","https://openalex.org/W4206025375","https://openalex.org/W4221165027","https://openalex.org/W4283754671","https://openalex.org/W4285299373","https://openalex.org/W4285803861","https://openalex.org/W4312502670","https://openalex.org/W4323891862","https://openalex.org/W4376138287","https://openalex.org/W4377080239","https://openalex.org/W4382141553","https://openalex.org/W4385824765","https://openalex.org/W4386475753","https://openalex.org/W4387710175","https://openalex.org/W4387910398","https://openalex.org/W4389764834","https://openalex.org/W4390519918","https://openalex.org/W4391832608","https://openalex.org/W6861890382","https://openalex.org/W7039351726"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3005535424","https://openalex.org/W2994319598","https://openalex.org/W2047067935","https://openalex.org/W1607054433","https://openalex.org/W2110842462"],"abstract_inverted_index":{"Natural":[0],"disasters":[1,27],"have":[2],"the":[3,23,34,45,49,55,63,70,89,112,122,139,155,173,178],"potential":[4],"to":[5,10,61,87,110,154],"pose":[6],"a":[7,78,96],"significant":[8],"threat":[9],"property,":[11],"critical":[12],"infrastructure,":[13],"human":[14],"health":[15],"and":[16,18,82,135,163],"safety,":[17],"some":[19],"others.":[20],"One":[21],"of":[22,36,65,72,92,98,114,116,141,177],"most":[24,40,50],"relevant":[25],"natural":[26,37,128],"is":[28,169],"earthquakes,":[29],"which":[30],"are":[31,48],"high":[32],"on":[33,172],"list":[35],"phenomena":[38],"that":[39,167],"affect":[41],"infrastructures":[42],"and,":[43],"at":[44,144],"same":[46],"time,":[47],"unpredictable.":[51],"This":[52],"study":[53],"uses":[54,104],"probabilistic":[56],"seismic":[57,79],"risk":[58],"analysis":[59,140],"method":[60,109,131,151],"estimate":[62],"condition":[64],"an":[66,73,145],"industrial-scale":[67,158],"telescope":[68,94,118,142],"after":[69],"effect":[71],"earthquake.":[74],"The":[75,101,149],"approach":[76],"considers":[77],"source":[80],"model":[81],"ground":[83],"motion":[84],"prediction":[85],"equations":[86],"evaluate":[88],"intensity":[90],"measure":[91],"each":[93,117],"as":[95],"function":[97],"its":[99,127],"location.":[100],"implemented":[102],"simulation":[103],"reliability":[105,168],"via":[106],"Monte":[107],"Carlo":[108],"discover":[111],"probability":[113],"failure":[115],"taking":[119],"into":[120,138],"consideration":[121],"fragility":[123,176],"curves":[124],"described":[125],"by":[126],"structure.":[129],"Their":[130],"incorporates":[132],"terrain":[133],"characteristics":[134],"component":[136],"robustness":[137,174],"performance":[143],"affordable":[146],"computational":[147],"cost.":[148],"proposed":[150],"was":[152,165],"applied":[153],"observatories":[156],"using":[157],"telescopes":[159],"established":[160],"in":[161],"Chile,":[162],"it":[164],"confirmed":[166],"highly":[170],"dependent":[171],"or":[175],"infrastructure.":[179]},"counts_by_year":[],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2025-10-10T00:00:00"}
