{"id":"https://openalex.org/W4402742671","doi":"https://doi.org/10.1109/access.2024.3465850","title":"A G-Band SiGe BiCMOS LNA with an Area Efficient Built-In Temperature Compensation Circuit and Robust to TID Radiation","display_name":"A G-Band SiGe BiCMOS LNA with an Area Efficient Built-In Temperature Compensation Circuit and Robust to TID Radiation","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4402742671","doi":"https://doi.org/10.1109/access.2024.3465850"},"language":"en","primary_location":{"id":"doi:10.1109/access.2024.3465850","is_oa":true,"landing_page_url":"http://dx.doi.org/10.1109/access.2024.3465850","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"http://dx.doi.org/10.1109/access.2024.3465850","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5030189796","display_name":"Alvaro Urain","orcid":"https://orcid.org/0000-0001-8209-0625"},"institutions":[{"id":"https://openalex.org/I88155538","display_name":"Universidad de Navarra","ror":"https://ror.org/02rxc7m23","country_code":"ES","type":"education","lineage":["https://openalex.org/I88155538"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Alvaro Urain","raw_affiliation_strings":["Tecnun, University of Navarra, San Sebastian, Donostia, Spain"],"raw_orcid":"https://orcid.org/0000-0001-8209-0625","affiliations":[{"raw_affiliation_string":"Tecnun, University of Navarra, San Sebastian, Donostia, Spain","institution_ids":["https://openalex.org/I88155538"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013139227","display_name":"David del Rio","orcid":"https://orcid.org/0000-0002-8164-6545"},"institutions":[{"id":"https://openalex.org/I88155538","display_name":"Universidad de Navarra","ror":"https://ror.org/02rxc7m23","country_code":"ES","type":"education","lineage":["https://openalex.org/I88155538"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"David Del Rio","raw_affiliation_strings":["Tecnun, University of Navarra, San Sebastian, Donostia, Spain"],"raw_orcid":"https://orcid.org/0000-0002-8164-6545","affiliations":[{"raw_affiliation_string":"Tecnun, University of Navarra, San Sebastian, Donostia, Spain","institution_ids":["https://openalex.org/I88155538"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075695526","display_name":"C. Luj\u00e1n\u2010Mart\u00ednez","orcid":"https://orcid.org/0000-0003-4389-7375"},"institutions":[{"id":"https://openalex.org/I79238269","display_name":"Universidad de Sevilla","ror":"https://ror.org/03yxnpp24","country_code":"ES","type":"education","lineage":["https://openalex.org/I79238269"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"C. Luj\u00e1n-Mart\u00ednez","raw_affiliation_strings":["Department of Electronic Engineering, University of Sevilla, Spain"],"raw_orcid":"https://orcid.org/0000-0003-4389-7375","affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, University of Sevilla, Spain","institution_ids":["https://openalex.org/I79238269"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031719665","display_name":"Mikko Kantanen","orcid":"https://orcid.org/0009-0002-6721-7506"},"institutions":[{"id":"https://openalex.org/I87653560","display_name":"VTT Technical Research Centre of Finland","ror":"https://ror.org/04b181w54","country_code":"FI","type":"nonprofit","lineage":["https://openalex.org/I4210089493","https://openalex.org/I87653560"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Mikko Kantanen","raw_affiliation_strings":["VTT Technical Research Centre of Finland, Espoo, Finland"],"raw_orcid":"https://orcid.org/0009-0002-6721-7506","affiliations":[{"raw_affiliation_string":"VTT Technical Research Centre of Finland, Espoo, Finland","institution_ids":["https://openalex.org/I87653560"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5079283578","display_name":"Roc Berenguer","orcid":"https://orcid.org/0000-0003-0313-7152"},"institutions":[{"id":"https://openalex.org/I88155538","display_name":"Universidad de Navarra","ror":"https://ror.org/02rxc7m23","country_code":"ES","type":"education","lineage":["https://openalex.org/I88155538"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Roc Berenguer","raw_affiliation_strings":["Tecnun, University of Navarra, San Sebastian, Donostia, Spain"],"raw_orcid":"https://orcid.org/0000-0003-0313-7152","affiliations":[{"raw_affiliation_string":"Tecnun, University of Navarra, San Sebastian, Donostia, Spain","institution_ids":["https://openalex.org/I88155538"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1995,"currency":"USD","value_usd":1995},"apc_paid":{"value":1995,"currency":"USD","value_usd":1995},"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.07871952,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.6318594217300415},{"id":"https://openalex.org/keywords/bicmos","display_name":"BiCMOS","score":0.6174035668373108},{"id":"https://openalex.org/keywords/radiation","display_name":"Radiation","score":0.5166938304901123},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4792332947254181},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.47479456663131714},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.428870290517807},{"id":"https://openalex.org/keywords/silicon-germanium","display_name":"Silicon-germanium","score":0.41002708673477173},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4077921211719513},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3312370181083679},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.23798057436943054},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21518400311470032},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.20326051115989685},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.17414048314094543},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.11432275176048279},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.07983112335205078}],"concepts":[{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.6318594217300415},{"id":"https://openalex.org/C62427370","wikidata":"https://www.wikidata.org/wiki/Q173416","display_name":"BiCMOS","level":4,"score":0.6174035668373108},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.5166938304901123},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4792332947254181},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.47479456663131714},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.428870290517807},{"id":"https://openalex.org/C2780389399","wikidata":"https://www.wikidata.org/wiki/Q367849","display_name":"Silicon-germanium","level":3,"score":0.41002708673477173},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4077921211719513},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3312370181083679},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.23798057436943054},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21518400311470032},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.20326051115989685},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.17414048314094543},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.11432275176048279},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.07983112335205078},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/access.2024.3465850","is_oa":true,"landing_page_url":"http://dx.doi.org/10.1109/access.2024.3465850","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:idus.us.es:11441/163444","is_oa":true,"landing_page_url":"https://hdl.handle.net/11441/163444","pdf_url":"https://idus.us.es/bitstreams/dfcd6bf7-e3d1-431d-b867-e43e9c99e855/download","source":{"id":"https://openalex.org/S4306401665","display_name":"Deposito de Investigacion Universidad de Sevilla (University of Seville)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I79238269","host_organization_name":"Universidad de Sevilla","host_organization_lineage":["https://openalex.org/I79238269"],"host_organization_lineage_names":[],"type":"repository"},"license":"public-domain","license_id":"https://openalex.org/licenses/public-domain","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"journal article"},{"id":"pmh:oai:doaj.org/article:7112626058d8425dba913919428506a8","is_oa":true,"landing_page_url":"https://doaj.org/article/7112626058d8425dba913919428506a8","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 12, Pp 138180-138191 (2024)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2024.3465850","is_oa":true,"landing_page_url":"http://dx.doi.org/10.1109/access.2024.3465850","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.7900000214576721,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G8353735444","display_name":null,"funder_award_id":"PID2019-109984RB-C44","funder_id":"https://openalex.org/F4320323737","funder_display_name":"Ministerio de Ciencia y Tecnolog\u00eda"}],"funders":[{"id":"https://openalex.org/F4320323737","display_name":"Ministerio de Ciencia y Tecnolog\u00eda","ror":"https://ror.org/034900433"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W1594634106","https://openalex.org/W1492027935","https://openalex.org/W2140183546","https://openalex.org/W2510447057","https://openalex.org/W2105454559","https://openalex.org/W2537721720","https://openalex.org/W2517605246","https://openalex.org/W2140681148","https://openalex.org/W2133337640","https://openalex.org/W2123028129"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,82,101,110,121,130,144,158,199],"BiCMOS":[4],"low-noise":[5],"amplifier":[6,42],"(LNA)":[7],"operating":[8],"at":[9,135],"G-band":[10],"(140":[11],"to":[12,45,57,160,174,190],"220":[13],"GHz)":[14],"that":[15],"is":[16,79,183],"robust":[17],"against":[18],"harsh":[19],"operation":[20],"conditions,":[21],"namely":[22],"large":[23],"temperature":[24,68,74,84,162],"variations":[25,69,156],"and":[26,53,93,129,142,153,167,195,208],"radiation":[27,178],"exposure.":[28],"A":[29],"SiGe":[30],"technology":[31],"(IHP\u2019s":[32],"0.13-$\\mathrm":[33],"{\\mu":[34],"}$m":[35],"SG13G2)":[36],"has":[37,100],"been":[38],"used":[39],"for":[40,48],"the":[41,65,72,77,90,105,115,118,176],"design,":[43],"due":[44],"its":[46,54],"suitability":[47],"millimeter":[49],"wave":[50],"(mmW)":[51],"frequencies":[52],"built-in":[55],"tolerance":[56],"total":[58],"ionizing":[59],"dose":[60],"(TID)":[61],"radiation.":[62],"To":[63],"address":[64],"impact":[66],"of":[67,76,117,126,132,147,180],"on":[70,104],"HBTs,":[71],"negative":[73],"dependence":[75],"gain":[78,131,152,207],"compensated":[80],"with":[81,114,120,143],"positive":[83],"dependent":[85],"collector":[86],"current,":[87],"generated":[88],"by":[89],"proposed":[91],"on-chip":[92],"compact":[94],"(0.0035":[95],"mm2)":[96],"biasing":[97],"circuit.":[98],"It":[99],"negligible":[102],"degradation":[103],"LNA":[106],"performance,":[107],"which":[108],"shows":[109],"measured":[111,151],"performance":[112],"comparable":[113],"state":[116],"art":[119],"minimum":[122],"noise":[123,154,209],"figure":[124,155],"(NF)":[125],"9":[127],"dB":[128,134,166,204],"18.1":[133],"room":[136],"temperature,":[137],"centered":[138],"around":[139],"195":[140],"GHz":[141],"3-dB":[145],"bandwidth":[146],"25":[148],"GHz.":[149],"The":[150],"over":[157],"\u221220\u00b0C":[159],"80\u00b0C":[161],"range":[163],"are":[164,188],"\u00b11.1":[165],"\u00b11.5":[168],"dB,":[169],"respectively.":[170],"Finally,":[171],"an":[172],"experiment":[173],"study":[175],"TID":[177],"response":[179],"mmW":[181],"LNAs":[182],"carried":[184],"out.":[185],"Fabricated":[186],"samples":[187],"exposed":[189],"250":[191],"krad(Si),":[192],"1.5":[193],"Mrad(Si)":[194],"2":[196],"Mrad(Si),":[197],"exhibiting":[198],"variation":[200],"smaller":[201],"than":[202],"1":[203],"in":[205],"both":[206],"figure.":[210]},"counts_by_year":[],"updated_date":"2026-09-01T08:31:24.195828","created_date":"2025-10-10T00:00:00"}