{"id":"https://openalex.org/W4402449720","doi":"https://doi.org/10.1109/access.2024.3457750","title":"Mitigation of Single Event Upset Effects in Nanosheet FET 6T SRAM Cell","display_name":"Mitigation of Single Event Upset Effects in Nanosheet FET 6T SRAM Cell","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4402449720","doi":"https://doi.org/10.1109/access.2024.3457750"},"language":"en","primary_location":{"id":"doi:10.1109/access.2024.3457750","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3457750","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2024.3457750","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5051360047","display_name":"Minji Bang","orcid":"https://orcid.org/0009-0005-3198-6743"},"institutions":[{"id":"https://openalex.org/I189442560","display_name":"Gyeongsang National University","ror":"https://ror.org/00saywf64","country_code":"KR","type":"education","lineage":["https://openalex.org/I189442560"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Minji Bang","raw_affiliation_strings":["Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju-si, Republic of Korea","Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju, Republic of Korea"],"raw_orcid":"https://orcid.org/0009-0005-3198-6743","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju-si, Republic of Korea","institution_ids":["https://openalex.org/I189442560"]},{"raw_affiliation_string":"Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju, Republic of Korea","institution_ids":["https://openalex.org/I189442560"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089228201","display_name":"Jonghyeon Ha","orcid":"https://orcid.org/0000-0001-7830-9321"},"institutions":[{"id":"https://openalex.org/I189442560","display_name":"Gyeongsang National University","ror":"https://ror.org/00saywf64","country_code":"KR","type":"education","lineage":["https://openalex.org/I189442560"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jonghyeon Ha","raw_affiliation_strings":["Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju-si, Republic of Korea","Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju, Republic of Korea"],"raw_orcid":"https://orcid.org/0000-0001-7830-9321","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju-si, Republic of Korea","institution_ids":["https://openalex.org/I189442560"]},{"raw_affiliation_string":"Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju, Republic of Korea","institution_ids":["https://openalex.org/I189442560"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029499561","display_name":"Minki Suh","orcid":"https://orcid.org/0009-0004-9256-4627"},"institutions":[{"id":"https://openalex.org/I189442560","display_name":"Gyeongsang National University","ror":"https://ror.org/00saywf64","country_code":"KR","type":"education","lineage":["https://openalex.org/I189442560"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Minki Suh","raw_affiliation_strings":["Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju-si, Republic of Korea","Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju, Republic of Korea"],"raw_orcid":"https://orcid.org/0009-0004-9256-4627","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju-si, Republic of Korea","institution_ids":["https://openalex.org/I189442560"]},{"raw_affiliation_string":"Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju, Republic of Korea","institution_ids":["https://openalex.org/I189442560"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111085760","display_name":"Dabok Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I189442560","display_name":"Gyeongsang National University","ror":"https://ror.org/00saywf64","country_code":"KR","type":"education","lineage":["https://openalex.org/I189442560"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Dabok Lee","raw_affiliation_strings":["Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju-si, Republic of Korea","Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju, Republic of Korea"],"raw_orcid":"https://orcid.org/0009-0000-7408-978X","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju-si, Republic of Korea","institution_ids":["https://openalex.org/I189442560"]},{"raw_affiliation_string":"Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju, Republic of Korea","institution_ids":["https://openalex.org/I189442560"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000971932","display_name":"Minsang Ryu","orcid":"https://orcid.org/0009-0000-5117-210X"},"institutions":[{"id":"https://openalex.org/I189442560","display_name":"Gyeongsang National University","ror":"https://ror.org/00saywf64","country_code":"KR","type":"education","lineage":["https://openalex.org/I189442560"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Minsang Ryu","raw_affiliation_strings":["Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju-si, Republic of Korea","Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju, Republic of Korea"],"raw_orcid":"https://orcid.org/0009-0000-5117-210X","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju-si, Republic of Korea","institution_ids":["https://openalex.org/I189442560"]},{"raw_affiliation_string":"Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju, Republic of Korea","institution_ids":["https://openalex.org/I189442560"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030049476","display_name":"Jin\u2010Woo Han","orcid":"https://orcid.org/0000-0002-5118-1310"},"institutions":[{"id":"https://openalex.org/I1280536761","display_name":"Ames Research Center","ror":"https://ror.org/02acart68","country_code":"US","type":"facility","lineage":["https://openalex.org/I1280536761","https://openalex.org/I4210124779"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jin-Woo Han","raw_affiliation_strings":["Center for Nanotechnology, NASA Ames Research Center, Mountain View, CA, USA"],"raw_orcid":"https://orcid.org/0000-0002-5118-1310","affiliations":[{"raw_affiliation_string":"Center for Nanotechnology, NASA Ames Research Center, Mountain View, CA, USA","institution_ids":["https://openalex.org/I1280536761"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021180754","display_name":"Hyun Chul Sagong","orcid":"https://orcid.org/0009-0003-0236-6698"},"institutions":[{"id":"https://openalex.org/I4210095514","display_name":"Korea Automotive Technology Institute","ror":"https://ror.org/00sc3t321","country_code":"KR","type":"facility","lineage":["https://openalex.org/I4210095514"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyunchul Sagong","raw_affiliation_strings":["Department of Reliability Technology Research and Development, Korea Automotive Technology Institute (KATECH), Cheonan-si, Chungcheongnam-do, Republic of Korea","Department of Reliability Technology R&D, Korea Automotive Technology Institute(KATECH), Cheonan, Chungnam, Republic of Korea"],"raw_orcid":"https://orcid.org/0009-0003-0236-6698","affiliations":[{"raw_affiliation_string":"Department of Reliability Technology Research and Development, Korea Automotive Technology Institute (KATECH), Cheonan-si, Chungcheongnam-do, Republic of Korea","institution_ids":["https://openalex.org/I4210095514"]},{"raw_affiliation_string":"Department of Reliability Technology R&D, Korea Automotive Technology Institute(KATECH), Cheonan, Chungnam, Republic of Korea","institution_ids":["https://openalex.org/I4210095514"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100627580","display_name":"Hojoon Lee","orcid":"https://orcid.org/0000-0003-3031-0715"},"institutions":[{"id":"https://openalex.org/I4210095514","display_name":"Korea Automotive Technology Institute","ror":"https://ror.org/00sc3t321","country_code":"KR","type":"facility","lineage":["https://openalex.org/I4210095514"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hojoon Lee","raw_affiliation_strings":["Department of Reliability Technology Research and Development, Korea Automotive Technology Institute (KATECH), Cheonan-si, Chungcheongnam-do, Republic of Korea","Department of Reliability Technology R&D, Korea Automotive Technology Institute(KATECH), Cheonan, Chungnam, Republic of Korea"],"raw_orcid":"https://orcid.org/0000-0003-3031-0715","affiliations":[{"raw_affiliation_string":"Department of Reliability Technology Research and Development, Korea Automotive Technology Institute (KATECH), Cheonan-si, Chungcheongnam-do, Republic of Korea","institution_ids":["https://openalex.org/I4210095514"]},{"raw_affiliation_string":"Department of Reliability Technology R&D, Korea Automotive Technology Institute(KATECH), Cheonan, Chungnam, Republic of Korea","institution_ids":["https://openalex.org/I4210095514"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5037911372","display_name":"Jungsik Kim","orcid":"https://orcid.org/0000-0001-7798-3381"},"institutions":[{"id":"https://openalex.org/I189442560","display_name":"Gyeongsang National University","ror":"https://ror.org/00saywf64","country_code":"KR","type":"education","lineage":["https://openalex.org/I189442560"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jungsik Kim","raw_affiliation_strings":["Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju-si, Republic of Korea","Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju, Republic of Korea"],"raw_orcid":"https://orcid.org/0000-0001-7798-3381","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju-si, Republic of Korea","institution_ids":["https://openalex.org/I189442560"]},{"raw_affiliation_string":"Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju, Republic of Korea","institution_ids":["https://openalex.org/I189442560"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":9,"corresponding_author_ids":["https://openalex.org/A5051360047"],"corresponding_institution_ids":["https://openalex.org/I189442560"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.7833,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.7210966,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":98},"biblio":{"volume":"12","issue":null,"first_page":"130347","last_page":"130355"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.8862343430519104},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.7955689430236816},{"id":"https://openalex.org/keywords/upset","display_name":"Upset","score":0.7214257717132568},{"id":"https://openalex.org/keywords/nanosheet","display_name":"Nanosheet","score":0.6964418292045593},{"id":"https://openalex.org/keywords/event","display_name":"Event (particle physics)","score":0.5250834226608276},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.5220803618431091},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5087011456489563},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.19307157397270203},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.16536235809326172},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14673501253128052},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.11876565217971802},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.11090755462646484}],"concepts":[{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.8862343430519104},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.7955689430236816},{"id":"https://openalex.org/C2778002589","wikidata":"https://www.wikidata.org/wiki/Q2406791","display_name":"Upset","level":2,"score":0.7214257717132568},{"id":"https://openalex.org/C51967427","wikidata":"https://www.wikidata.org/wiki/Q17148232","display_name":"Nanosheet","level":2,"score":0.6964418292045593},{"id":"https://openalex.org/C2779662365","wikidata":"https://www.wikidata.org/wiki/Q5416694","display_name":"Event (particle physics)","level":2,"score":0.5250834226608276},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.5220803618431091},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5087011456489563},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.19307157397270203},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.16536235809326172},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14673501253128052},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.11876565217971802},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.11090755462646484},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2024.3457750","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3457750","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:c729c86dcf4b40dd8aafed6967dcc577","is_oa":true,"landing_page_url":"https://doaj.org/article/c729c86dcf4b40dd8aafed6967dcc577","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 12, Pp 130347-130355 (2024)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2024.3457750","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3457750","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.800000011920929,"id":"https://metadata.un.org/sdg/13","display_name":"Climate action"}],"awards":[{"id":"https://openalex.org/G1333878258","display_name":null,"funder_award_id":"RS-2023-00272892","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"}],"funders":[{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"},{"id":"https://openalex.org/F4320322202","display_name":"IC Design Education Center","ror":"https://ror.org/005v57z85"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W2037984196","https://openalex.org/W2071068906","https://openalex.org/W2071633158","https://openalex.org/W2141068710","https://openalex.org/W2150025103","https://openalex.org/W2166532333","https://openalex.org/W2534959516","https://openalex.org/W2554822897","https://openalex.org/W2744406216","https://openalex.org/W2890726243","https://openalex.org/W2898167007","https://openalex.org/W2912350987","https://openalex.org/W2922525369","https://openalex.org/W2948702813","https://openalex.org/W3039535106","https://openalex.org/W3145804890","https://openalex.org/W3157303364","https://openalex.org/W3158205732","https://openalex.org/W4225309503","https://openalex.org/W4297094403","https://openalex.org/W4313270730","https://openalex.org/W4376606661","https://openalex.org/W6758959293"],"related_works":["https://openalex.org/W2102538861","https://openalex.org/W3208260600","https://openalex.org/W2065552285","https://openalex.org/W2051386096","https://openalex.org/W2146628836","https://openalex.org/W2766443086","https://openalex.org/W2617585808","https://openalex.org/W658316774","https://openalex.org/W4297801900","https://openalex.org/W2620648979"],"abstract_inverted_index":{"The":[0,71,107],"effects":[1],"of":[2,17,61],"single":[3],"event":[4],"upset":[5],"(SEU)":[6],"by":[7],"alpha":[8,63],"particles":[9],"and":[10,65,104],"heavy":[11,66],"ions":[12,67],"on":[13,58],"the":[14,47,52,59,62,69,81,89,98,119,123,135,138],"data":[15],"flip":[16],"a":[18,128],"3":[19],"nm":[20],"technology":[21,38],"node":[22],"gate-all-around":[23],"(GAA)":[24],"nanosheet":[25],"field-effect":[26],"transistor":[27,55],"(NSFET)":[28],"6T":[29],"static":[30],"random-access":[31],"memory":[32],"(SRAM)":[33],"cell":[34],"was":[35,44],"studied":[36],"through":[37],"computer-aided":[39],"design":[40],"(TCAD)":[41],"simulations.":[42],"It":[43],"found":[45],"that":[46],"sensitivity":[48,117],"to":[49,88,102,137],"radiation":[50,116],"in":[51,68,76],"\u201coff\u201d":[53],"pull-down":[54],"varies":[56],"depending":[57],"position":[60],"particle":[64],"incident.":[70],"most":[72],"significant":[73],"radiation-induced":[74],"increase":[75],"electron":[77],"density":[78],"occurs":[79],"at":[80],"drain-channel":[82],"junction.":[83],"Heavy":[84],"ion":[85],"strikes":[86],"lead":[87],"lowest":[90],"threshold":[91],"linear":[92],"energy":[93],"transfer":[94],"(LETth)":[95],"value":[96],"during":[97],"hold":[99],"operation":[100],"compared":[101],"read":[103],"write":[105],"operations.":[106],"partial":[108],"bottom":[109],"dielectric":[110],"isolation":[111],"(PDI)":[112],"scheme":[113],"demonstrates":[114],"lower":[115],"than":[118],"conventional":[120],"scheme,":[121],"as":[122,127],"PDI":[124],"layer":[125],"acts":[126],"physical":[129],"barrier":[130],"preventing":[131],"charge":[132],"migration":[133],"from":[134],"substrate":[136],"drain.":[139]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3}],"updated_date":"2026-05-08T15:41:06.802602","created_date":"2025-10-10T00:00:00"}