{"id":"https://openalex.org/W4401990909","doi":"https://doi.org/10.1109/access.2024.3451705","title":"Fault-Tolerant Dual Channels Three-Phase PMSM for Aerospace Applications","display_name":"Fault-Tolerant Dual Channels Three-Phase PMSM for Aerospace Applications","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4401990909","doi":"https://doi.org/10.1109/access.2024.3451705"},"language":"en","primary_location":{"id":"doi:10.1109/access.2024.3451705","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3451705","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2024.3451705","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5080129957","display_name":"Muhammad Raza Khowja","orcid":"https://orcid.org/0000-0003-3075-9440"},"institutions":[{"id":"https://openalex.org/I142263535","display_name":"University of Nottingham","ror":"https://ror.org/01ee9ar58","country_code":"GB","type":"education","lineage":["https://openalex.org/I142263535"]}],"countries":["GB"],"is_corresponding":true,"raw_author_name":"Muhammad Raza Khowja","raw_affiliation_strings":["PEMC Research Group, University of Nottingham, Nottingham, U.K"],"affiliations":[{"raw_affiliation_string":"PEMC Research Group, University of Nottingham, Nottingham, U.K","institution_ids":["https://openalex.org/I142263535"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100635467","display_name":"Kuldeep Singh","orcid":"https://orcid.org/0000-0001-9116-7663"},"institutions":[{"id":"https://openalex.org/I142263535","display_name":"University of Nottingham","ror":"https://ror.org/01ee9ar58","country_code":"GB","type":"education","lineage":["https://openalex.org/I142263535"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Kuldeep Singh","raw_affiliation_strings":["PEMC Research Group, University of Nottingham, Nottingham, U.K"],"affiliations":[{"raw_affiliation_string":"PEMC Research Group, University of Nottingham, Nottingham, U.K","institution_ids":["https://openalex.org/I142263535"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011821713","display_name":"Antonino La Rocca","orcid":"https://orcid.org/0000-0002-2775-2777"},"institutions":[{"id":"https://openalex.org/I142263535","display_name":"University of Nottingham","ror":"https://ror.org/01ee9ar58","country_code":"GB","type":"education","lineage":["https://openalex.org/I142263535"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Antonino la Rocca","raw_affiliation_strings":["PEMC Research Group, University of Nottingham, Nottingham, U.K"],"affiliations":[{"raw_affiliation_string":"PEMC Research Group, University of Nottingham, Nottingham, U.K","institution_ids":["https://openalex.org/I142263535"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047935766","display_name":"Gaurang Vakil","orcid":"https://orcid.org/0000-0003-1303-4288"},"institutions":[{"id":"https://openalex.org/I142263535","display_name":"University of Nottingham","ror":"https://ror.org/01ee9ar58","country_code":"GB","type":"education","lineage":["https://openalex.org/I142263535"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Gaurang Vakil","raw_affiliation_strings":["PEMC Research Group, University of Nottingham, Nottingham, U.K"],"affiliations":[{"raw_affiliation_string":"PEMC Research Group, University of Nottingham, Nottingham, U.K","institution_ids":["https://openalex.org/I142263535"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5106900358","display_name":"Ramkumar Ramnathan","orcid":null},"institutions":[{"id":"https://openalex.org/I142263535","display_name":"University of Nottingham","ror":"https://ror.org/01ee9ar58","country_code":"GB","type":"education","lineage":["https://openalex.org/I142263535"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Ramkumar Ramnathan","raw_affiliation_strings":["PEMC Research Group, University of Nottingham, Nottingham, U.K"],"affiliations":[{"raw_affiliation_string":"PEMC Research Group, University of Nottingham, Nottingham, U.K","institution_ids":["https://openalex.org/I142263535"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108166814","display_name":"Chris Gerada","orcid":"https://orcid.org/0000-0003-4707-4480"},"institutions":[{"id":"https://openalex.org/I142263535","display_name":"University of Nottingham","ror":"https://ror.org/01ee9ar58","country_code":"GB","type":"education","lineage":["https://openalex.org/I142263535"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Chris Gerada","raw_affiliation_strings":["PEMC Research Group, University of Nottingham, Nottingham, U.K"],"affiliations":[{"raw_affiliation_string":"PEMC Research Group, University of Nottingham, Nottingham, U.K","institution_ids":["https://openalex.org/I142263535"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5080129957"],"corresponding_institution_ids":["https://openalex.org/I142263535"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":1.7508,"has_fulltext":true,"cited_by_count":8,"citation_normalized_percentile":{"value":0.85054292,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"12","issue":null,"first_page":"126845","last_page":"126857"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9448999762535095,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9448999762535095,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11854","display_name":"Laser-induced spectroscopy and plasma","score":0.9089999794960022,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9049999713897705,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/aerospace","display_name":"Aerospace","score":0.7203042507171631},{"id":"https://openalex.org/keywords/dual","display_name":"Dual (grammatical number)","score":0.6776183843612671},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6072670221328735},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.5736114382743835},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.41808727383613586},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3337860703468323},{"id":"https://openalex.org/keywords/aerospace-engineering","display_name":"Aerospace engineering","score":0.19639703631401062},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1784919798374176},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.14959385991096497},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.08752056956291199}],"concepts":[{"id":"https://openalex.org/C167740415","wikidata":"https://www.wikidata.org/wiki/Q2876213","display_name":"Aerospace","level":2,"score":0.7203042507171631},{"id":"https://openalex.org/C2780980858","wikidata":"https://www.wikidata.org/wiki/Q110022","display_name":"Dual (grammatical number)","level":2,"score":0.6776183843612671},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6072670221328735},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.5736114382743835},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.41808727383613586},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3337860703468323},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.19639703631401062},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1784919798374176},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.14959385991096497},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.08752056956291199},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C124952713","wikidata":"https://www.wikidata.org/wiki/Q8242","display_name":"Literature","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/access.2024.3451705","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3451705","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:nottingham-repository.worktribe.com:38913803","is_oa":true,"landing_page_url":"https://nottingham-repository.worktribe.com/output/38913803","pdf_url":"https://nottingham-repository.worktribe.com/file/38913803/1/Fault-Tolerant_Dual_Channels_Three-Phase_PMSM_for_Aerospace_Applications","source":{"id":"https://openalex.org/S4306402483","display_name":"Repository@Nottingham (University of Nottingham)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I142263535","host_organization_name":"University of Nottingham","host_organization_lineage":["https://openalex.org/I142263535"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"publishedVersion"},{"id":"pmh:oai:doaj.org/article:eb1de99e236c49f3b973e227fd317a7f","is_oa":true,"landing_page_url":"https://doaj.org/article/eb1de99e236c49f3b973e227fd317a7f","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 12, Pp 126845-126857 (2024)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2024.3451705","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3451705","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":32,"referenced_works":["https://openalex.org/W1987949773","https://openalex.org/W1988048851","https://openalex.org/W2008383924","https://openalex.org/W2030188963","https://openalex.org/W2043893822","https://openalex.org/W2051598030","https://openalex.org/W2070733684","https://openalex.org/W2103316936","https://openalex.org/W2124192278","https://openalex.org/W2144869573","https://openalex.org/W2146091323","https://openalex.org/W2238503449","https://openalex.org/W2508497978","https://openalex.org/W2624838696","https://openalex.org/W2773858911","https://openalex.org/W2793723836","https://openalex.org/W2891834658","https://openalex.org/W2898916808","https://openalex.org/W2910746876","https://openalex.org/W2976876443","https://openalex.org/W3001588654","https://openalex.org/W3036716955","https://openalex.org/W3041809862","https://openalex.org/W3105618638","https://openalex.org/W3119831359","https://openalex.org/W3138530265","https://openalex.org/W3209969760","https://openalex.org/W4212979219","https://openalex.org/W4285281002","https://openalex.org/W4285585312","https://openalex.org/W4395112523","https://openalex.org/W6690591099"],"related_works":["https://openalex.org/W4225795411","https://openalex.org/W2809744190","https://openalex.org/W2511013388","https://openalex.org/W2044192478","https://openalex.org/W2064861618","https://openalex.org/W4378695326","https://openalex.org/W29956273","https://openalex.org/W2356599848","https://openalex.org/W2089786029","https://openalex.org/W4253188448"],"abstract_inverted_index":{"In":[0],"safety-critical":[1],"applications":[2],"such":[3,17],"as":[4,18],"aerospace":[5],"and":[6,22,54,130],"marine,":[7],"electrical":[8],"machines":[9,49],"are":[10],"limited":[11],"to":[12,31,70,105,124,164],"meet":[13,71],"several":[14],"stringent":[15],"requirements":[16],"physical,":[19],"electrical,":[20],"magnetic":[21],"thermal":[23,117],"isolation":[24],"between":[25,138],"two":[26],"three-phase":[27],"channels,":[28],"in":[29,82,110],"order":[30],"be":[32],"considered":[33],"for":[34,97],"fault-tolerant":[35,46,73],"operation":[36],"throughout":[37],"its":[38],"service":[39],"life.":[40],"This":[41,122],"paper":[42],"presents":[43],"novel":[44,129],"sectored":[45,56],"PM":[47],"synchronous":[48],"which":[50,88],"include":[51],"single,":[52],"double":[53],"four":[55,136,140],"designs":[57],"where":[58],"one":[59],"pole":[60],"pair":[61],"section":[62],"of":[63,84,102,127,161],"the":[64,72,93,106,111,125,135,139,152,165],"machine\u2019s":[65],"stator":[66],"is":[67,79,89],"cut":[68],"out":[69,81],"constraints.":[74],"A":[75],"detailed":[76],"electromagnetic":[77,86],"analysis":[78],"carried":[80],"terms":[83],"their":[85],"performance":[87],"then":[90],"compared":[91,163],"with":[92],"benchmark":[94,166],"30s/10p":[95],"combination":[96],"a":[98,114,128,150],"given":[99],"output":[100],"power":[101,108],"50kW.":[103],"Due":[104],"heightened":[107],"density":[109,154],"innovative":[112],"design,":[113],"highly":[115],"effective":[116],"management":[118],"system":[119,145],"became":[120],"necessary.":[121],"led":[123],"identification":[126],"efficient":[131,143],"cooling":[132,144],"configuration.":[133],"Leveraging":[134],"gaps":[137],"sectors,":[141],"an":[142,159],"was":[146],"successfully":[147],"implemented.":[148],"As":[149],"result,":[151],"current":[153],"increased":[155],"by":[156],"18.2%,":[157],"representing":[158],"increase":[160],"2A/mm2":[162],"machine":[167],"design.":[168]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":2}],"updated_date":"2026-03-10T16:38:18.471706","created_date":"2025-10-10T00:00:00"}