{"id":"https://openalex.org/W4401691576","doi":"https://doi.org/10.1109/access.2024.3445913","title":"Estimation of Permittivity of Films Using the Free-Space Measurement Method at Ka-Band","display_name":"Estimation of Permittivity of Films Using the Free-Space Measurement Method at Ka-Band","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4401691576","doi":"https://doi.org/10.1109/access.2024.3445913"},"language":"en","primary_location":{"id":"doi:10.1109/access.2024.3445913","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3445913","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2024.3445913","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5059155071","display_name":"Daeyeong Yoon","orcid":"https://orcid.org/0000-0002-4811-4969"},"institutions":[{"id":"https://openalex.org/I57664883","display_name":"Ajou University","ror":"https://ror.org/03tzb2h73","country_code":"KR","type":"education","lineage":["https://openalex.org/I57664883"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Daeyeong Yoon","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Ajou University, Suwon-si, Gyeonggi-do, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-4811-4969","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Ajou University, Suwon-si, Gyeonggi-do, South Korea","institution_ids":["https://openalex.org/I57664883"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077417443","display_name":"Jihyung Kim","orcid":"https://orcid.org/0000-0002-3854-3145"},"institutions":[{"id":"https://openalex.org/I4210143937","display_name":"Hanwha Solutions (South Korea)","ror":"https://ror.org/05dmq6f22","country_code":"KR","type":"company","lineage":["https://openalex.org/I4210143937","https://openalex.org/I4403386467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jihyung Kim","raw_affiliation_strings":["Hanwha Systems, Yongin-si, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hanwha Systems, Yongin-si, South Korea","institution_ids":["https://openalex.org/I4210143937"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001685932","display_name":"Dong-Yeop Na","orcid":"https://orcid.org/0000-0003-1920-9122"},"institutions":[{"id":"https://openalex.org/I123900574","display_name":"Pohang University of Science and Technology","ror":"https://ror.org/04xysgw12","country_code":"KR","type":"education","lineage":["https://openalex.org/I123900574"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Dong-Yeop Na","raw_affiliation_strings":["Department of Electrical Engineering, Pohang University of Science and Technology, Pohang-si, South Korea"],"raw_orcid":"https://orcid.org/0000-0003-1920-9122","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Pohang University of Science and Technology, Pohang-si, South Korea","institution_ids":["https://openalex.org/I123900574"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5085096036","display_name":"Yong Bae Park","orcid":"https://orcid.org/0000-0002-7095-4614"},"institutions":[{"id":"https://openalex.org/I57664883","display_name":"Ajou University","ror":"https://ror.org/03tzb2h73","country_code":"KR","type":"education","lineage":["https://openalex.org/I57664883"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yong Bae Park","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Ajou University, Suwon-si, Gyeonggi-do, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-7095-4614","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Ajou University, Suwon-si, Gyeonggi-do, South Korea","institution_ids":["https://openalex.org/I57664883"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5059155071"],"corresponding_institution_ids":["https://openalex.org/I57664883"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":1.181,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.78765745,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":98},"biblio":{"volume":"12","issue":null,"first_page":"116105","last_page":"116113"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11723","display_name":"Optical Coatings and Gratings","score":0.9940000176429749,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11383","display_name":"Advanced Antenna and Metasurface Technologies","score":0.9934999942779541,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ka-band","display_name":"Ka band","score":0.8893115520477295},{"id":"https://openalex.org/keywords/permittivity","display_name":"Permittivity","score":0.754889965057373},{"id":"https://openalex.org/keywords/free-space","display_name":"Free space","score":0.7523902654647827},{"id":"https://openalex.org/keywords/space","display_name":"Space (punctuation)","score":0.46214163303375244},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4408467710018158},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.39530083537101746},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.32536500692367554},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.3102048337459564},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.2989886403083801},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.21291369199752808},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.17759361863136292}],"concepts":[{"id":"https://openalex.org/C2777720951","wikidata":"https://www.wikidata.org/wiki/Q967772","display_name":"Ka band","level":2,"score":0.8893115520477295},{"id":"https://openalex.org/C168651791","wikidata":"https://www.wikidata.org/wiki/Q211569","display_name":"Permittivity","level":3,"score":0.754889965057373},{"id":"https://openalex.org/C2988672794","wikidata":"https://www.wikidata.org/wiki/Q11475","display_name":"Free space","level":2,"score":0.7523902654647827},{"id":"https://openalex.org/C2778572836","wikidata":"https://www.wikidata.org/wiki/Q380933","display_name":"Space (punctuation)","level":2,"score":0.46214163303375244},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4408467710018158},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.39530083537101746},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.32536500692367554},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3102048337459564},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.2989886403083801},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.21291369199752808},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.17759361863136292},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2024.3445913","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3445913","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:77a5ab3a9e3a4fceaf8b0c5300f1d8ff","is_oa":true,"landing_page_url":"https://doaj.org/article/77a5ab3a9e3a4fceaf8b0c5300f1d8ff","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 12, Pp 116105-116113 (2024)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2024.3445913","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3445913","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":34,"referenced_works":["https://openalex.org/W1965770610","https://openalex.org/W1985069227","https://openalex.org/W2043382734","https://openalex.org/W2057419199","https://openalex.org/W2103386416","https://openalex.org/W2105158339","https://openalex.org/W2125214506","https://openalex.org/W2128823582","https://openalex.org/W2154251941","https://openalex.org/W2171126059","https://openalex.org/W2325850497","https://openalex.org/W2547388255","https://openalex.org/W2557676924","https://openalex.org/W2793812459","https://openalex.org/W2889928658","https://openalex.org/W2897546006","https://openalex.org/W2909893357","https://openalex.org/W2941501585","https://openalex.org/W2983465885","https://openalex.org/W3003257820","https://openalex.org/W3130522028","https://openalex.org/W3170003053","https://openalex.org/W3174021423","https://openalex.org/W3209424788","https://openalex.org/W4241214195","https://openalex.org/W4244223789","https://openalex.org/W4282959191","https://openalex.org/W4285214317","https://openalex.org/W4312191356","https://openalex.org/W4312336447","https://openalex.org/W4382999335","https://openalex.org/W4385894670","https://openalex.org/W6767319408","https://openalex.org/W6767706979"],"related_works":["https://openalex.org/W2325065740","https://openalex.org/W3191503318","https://openalex.org/W2771281804","https://openalex.org/W4401609558","https://openalex.org/W2091163199","https://openalex.org/W1652169971","https://openalex.org/W2146256150","https://openalex.org/W4401691576","https://openalex.org/W2162747093","https://openalex.org/W1993922163"],"abstract_inverted_index":{"This":[0],"work":[1],"introduces":[2],"a":[3,31,37,46,81],"refined":[4],"technique":[5,44,78],"for":[6,83,99],"the":[7,13,20,67,70,85],"estimation":[8,39],"of":[9,22,48,87],"films":[10],"permittivity":[11,26,72,86],"within":[12],"Ka-band":[14],"using":[15],"free-space":[16],"measurement":[17],"method.":[18],"Addressing":[19],"challenge":[21],"wrong":[23],"solutions":[24],"in":[25],"estimation,":[27],"our":[28],"approach":[29],"incorporates":[30],"frequency-dependent":[32],"objective":[33],"function,":[34],"to":[35,45],"find":[36],"unique":[38],"solution.":[40],"We":[41],"apply":[42],"this":[43],"variety":[47],"thin":[49,90],"and":[50,60,64,73,101],"flexible":[51,94],"substrates,":[52],"including":[53],"cycloolefin":[54],"polymer":[55],"(COP),":[56],"polyethylene":[57],"terephthalate":[58],"(PET),":[59],"polyimide":[61],"(PI)":[62],"films,":[63],"quantitatively":[65],"analyze":[66],"uncertainty":[68],"on":[69],"estimated":[71],"loss":[74],"tangent.":[75],"The":[76],"proposed":[77],"can":[79],"offer":[80],"method":[82],"determining":[84],"not":[88],"only":[89],"media":[91],"but":[92],"also":[93],"printed":[95],"circuit":[96],"boards":[97],"used":[98],"circuits":[100],"antennas.":[102]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":5}],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2025-10-10T00:00:00"}