{"id":"https://openalex.org/W4401414744","doi":"https://doi.org/10.1109/access.2024.3440410","title":"Multi-Band NIR-Based Low-Light Image Enhancement via Dual-Teacher Cross Attention","display_name":"Multi-Band NIR-Based Low-Light Image Enhancement via Dual-Teacher Cross Attention","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4401414744","doi":"https://doi.org/10.1109/access.2024.3440410"},"language":"en","primary_location":{"id":"doi:10.1109/access.2024.3440410","is_oa":true,"landing_page_url":"http://dx.doi.org/10.1109/access.2024.3440410","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"http://dx.doi.org/10.1109/access.2024.3440410","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5041832371","display_name":"Jeong-Hyeok Park","orcid":null},"institutions":[{"id":"https://openalex.org/I197347611","display_name":"Korea University","ror":"https://ror.org/047dqcg40","country_code":"KR","type":"education","lineage":["https://openalex.org/I197347611"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jeong-Hyeok Park","raw_affiliation_strings":["School of Electrical Engineering, Korea University, Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea University, Seoul, South Korea","institution_ids":["https://openalex.org/I197347611"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110804277","display_name":"Dong-Min Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I197347611","display_name":"Korea University","ror":"https://ror.org/047dqcg40","country_code":"KR","type":"education","lineage":["https://openalex.org/I197347611"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Dong-Min Lee","raw_affiliation_strings":["School of Electrical Engineering, Korea University, Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea University, Seoul, South Korea","institution_ids":["https://openalex.org/I197347611"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101856154","display_name":"Tae-Hyeon Kim","orcid":"https://orcid.org/0000-0002-2308-3182"},"institutions":[{"id":"https://openalex.org/I197347611","display_name":"Korea University","ror":"https://ror.org/047dqcg40","country_code":"KR","type":"education","lineage":["https://openalex.org/I197347611"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Tae-Hyeon Kim","raw_affiliation_strings":["School of Electrical Engineering, Korea University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-2308-3182","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea University, Seoul, South Korea","institution_ids":["https://openalex.org/I197347611"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100643662","display_name":"Taesung Park","orcid":"https://orcid.org/0000-0002-8294-590X"},"institutions":[{"id":"https://openalex.org/I197347611","display_name":"Korea University","ror":"https://ror.org/047dqcg40","country_code":"KR","type":"education","lineage":["https://openalex.org/I197347611"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Tae-Sung Park","raw_affiliation_strings":["School of Electrical Engineering, Korea University, Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea University, Seoul, South Korea","institution_ids":["https://openalex.org/I197347611"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5024668714","display_name":"Jong\u2010Ok Kim","orcid":"https://orcid.org/0000-0001-7022-2408"},"institutions":[{"id":"https://openalex.org/I197347611","display_name":"Korea University","ror":"https://ror.org/047dqcg40","country_code":"KR","type":"education","lineage":["https://openalex.org/I197347611"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jong-Ok Kim","raw_affiliation_strings":["School of Electrical Engineering, Korea University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0001-7022-2408","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea University, Seoul, South Korea","institution_ids":["https://openalex.org/I197347611"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I197347611"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.6427,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.68711731,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":98},"biblio":{"volume":"12","issue":null,"first_page":"111360","last_page":"111370"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11019","display_name":"Image Enhancement Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11019","display_name":"Image Enhancement Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11105","display_name":"Advanced Image Processing Techniques","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11659","display_name":"Advanced Image Fusion Techniques","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7724968194961548},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6439909934997559},{"id":"https://openalex.org/keywords/rgb-color-model","display_name":"RGB color model","score":0.6350913643836975},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.49773600697517395},{"id":"https://openalex.org/keywords/light-sensitivity","display_name":"Light sensitivity","score":0.41608306765556335},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.24512651562690735},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.1631375551223755}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7724968194961548},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6439909934997559},{"id":"https://openalex.org/C82990744","wikidata":"https://www.wikidata.org/wiki/Q166194","display_name":"RGB color model","level":2,"score":0.6350913643836975},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.49773600697517395},{"id":"https://openalex.org/C3020678936","wikidata":"https://www.wikidata.org/wiki/Q2014823","display_name":"Light sensitivity","level":2,"score":0.41608306765556335},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.24512651562690735},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.1631375551223755}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2024.3440410","is_oa":true,"landing_page_url":"http://dx.doi.org/10.1109/access.2024.3440410","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:57acae8510514c5d914696aacd2b985a","is_oa":true,"landing_page_url":"https://doaj.org/article/57acae8510514c5d914696aacd2b985a","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 12, Pp 111360-111370 (2024)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2024.3440410","is_oa":true,"landing_page_url":"http://dx.doi.org/10.1109/access.2024.3440410","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Quality Education","score":0.41999998688697815,"id":"https://metadata.un.org/sdg/4"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":42,"referenced_works":["https://openalex.org/W1821462560","https://openalex.org/W2032603438","https://openalex.org/W2037012979","https://openalex.org/W2054814429","https://openalex.org/W2058611593","https://openalex.org/W2064076387","https://openalex.org/W2076205488","https://openalex.org/W2121900453","https://openalex.org/W2147421915","https://openalex.org/W2164517370","https://openalex.org/W2566376500","https://openalex.org/W2749871042","https://openalex.org/W2892004916","https://openalex.org/W2896457183","https://openalex.org/W2897015430","https://openalex.org/W2911692648","https://openalex.org/W2962785568","https://openalex.org/W2963470893","https://openalex.org/W2969985801","https://openalex.org/W2970454332","https://openalex.org/W2970579464","https://openalex.org/W2981718299","https://openalex.org/W2985810937","https://openalex.org/W2997006708","https://openalex.org/W2999380099","https://openalex.org/W3003838261","https://openalex.org/W3034342078","https://openalex.org/W3035588244","https://openalex.org/W3089378715","https://openalex.org/W3094502228","https://openalex.org/W3117141117","https://openalex.org/W3120540810","https://openalex.org/W4226134668","https://openalex.org/W4226293332","https://openalex.org/W4283820755","https://openalex.org/W4288782906","https://openalex.org/W4312097430","https://openalex.org/W4312902661","https://openalex.org/W4313059954","https://openalex.org/W4313145053","https://openalex.org/W4382240242","https://openalex.org/W4386066362"],"related_works":["https://openalex.org/W2772917594","https://openalex.org/W2036807459","https://openalex.org/W2058170566","https://openalex.org/W2755342338","https://openalex.org/W2166024367","https://openalex.org/W3116076068","https://openalex.org/W2229312674","https://openalex.org/W2951359407","https://openalex.org/W2079911747","https://openalex.org/W1969923398"],"abstract_inverted_index":{"Low-light":[0],"images":[1],"often":[2],"lack":[3],"visibility":[4],"and":[5,7,14,65,80,97,123],"information,":[6],"traditional":[8],"methods":[9],"of":[10],"adjusting":[11],"camera":[12],"sensitivity":[13],"exposure":[15],"time":[16],"can":[17],"result":[18],"in":[19,105],"visual":[20],"quality":[21],"degradation.":[22],"In":[23],"this":[24],"paper,":[25],"we":[26],"propose":[27],"a":[28,55],"low-light":[29,85,107,118],"enhancement":[30,86],"method":[31,93],"that":[32],"utilizes":[33],"two":[34,116],"novel":[35],"approaches":[36],"to":[37,50,88],"address":[38],"these":[39],"issues.":[40],"The":[41,70],"first":[42],"approach":[43,72],"involves":[44,73],"using":[45],"multi-band":[46],"NIR":[47,64],"(Near":[48],"Infra-red)":[49],"preserve":[51],"structural":[52],"components,":[53],"while":[54],"transformer-based":[56],"cross-attention":[57],"module":[58],"efficiently":[59],"calculates":[60],"the":[61,89],"correlation":[62],"between":[63],"RGB":[66],"for":[67,115],"effective":[68],"fusion.":[69],"second":[71],"implementing":[74],"dual-teacher":[75],"knowledge":[76,87],"distillation,":[77],"where":[78],"normal-":[79],"mid-light":[81],"teacher":[82],"networks":[83],"transfer":[84],"student.":[90],"Our":[91],"proposed":[92],"produces":[94],"better":[95],"color":[96],"detail":[98],"restoration":[99],"results":[100],"than":[101],"existing":[102],"methods,":[103],"particularly":[104],"ultra":[106],"environments.":[108],"We":[109],"also":[110],"provide":[111],"our":[112],"own":[113],"datasets":[114],"different":[117],"conditions,":[119],"enabling":[120],"wide":[121],"evaluations":[122],"ablation":[124],"studies.":[125]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":1}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}