{"id":"https://openalex.org/W4401210515","doi":"https://doi.org/10.1109/access.2024.3436919","title":"An Insulator Location and Defect Detection Method Based on Improved YOLOv8","display_name":"An Insulator Location and Defect Detection Method Based on Improved YOLOv8","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4401210515","doi":"https://doi.org/10.1109/access.2024.3436919"},"language":"en","primary_location":{"id":"doi:10.1109/access.2024.3436919","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3436919","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2024.3436919","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101515089","display_name":"Zhongsheng Li","orcid":null},"institutions":[{"id":"https://openalex.org/I4210111970","display_name":"Fujian Electric Power Survey & Design Institute","ror":"https://ror.org/0233jyt67","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210111970"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhongsheng Li","raw_affiliation_strings":["School of Traffic Engineering, Fujian Polytechnic of Water Conservancy and Electric Power, Yongan, China"],"raw_orcid":"https://orcid.org/0009-0004-5454-6364","affiliations":[{"raw_affiliation_string":"School of Traffic Engineering, Fujian Polytechnic of Water Conservancy and Electric Power, Yongan, China","institution_ids":["https://openalex.org/I4210111970"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5106164321","display_name":"Chenda Jiang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210111970","display_name":"Fujian Electric Power Survey & Design Institute","ror":"https://ror.org/0233jyt67","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210111970"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chenda Jiang","raw_affiliation_strings":["School of Electric Power Engineering, Fujian Polytechnic of Water Conservancy and Electric Power, Yongan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electric Power Engineering, Fujian Polytechnic of Water Conservancy and Electric Power, Yongan, China","institution_ids":["https://openalex.org/I4210111970"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5001598682","display_name":"Z. Li","orcid":null},"institutions":[{"id":"https://openalex.org/I4210111970","display_name":"Fujian Electric Power Survey & Design Institute","ror":"https://ror.org/0233jyt67","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210111970"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhongliang Li","raw_affiliation_strings":["School of Traffic Engineering, Fujian Polytechnic of Water Conservancy and Electric Power, Yongan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Traffic Engineering, Fujian Polytechnic of Water Conservancy and Electric Power, Yongan, China","institution_ids":["https://openalex.org/I4210111970"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210111970"],"apc_list":{"value":1995,"currency":"USD","value_usd":1995},"apc_paid":{"value":1995,"currency":"USD","value_usd":1995},"fwci":3.3555,"has_fulltext":false,"cited_by_count":22,"citation_normalized_percentile":{"value":0.93809437,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":100},"biblio":{"volume":"12","issue":null,"first_page":"106781","last_page":"106792"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11019","display_name":"Image Enhancement Techniques","score":0.991100013256073,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","score":0.9800999760627747,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8017091155052185},{"id":"https://openalex.org/keywords/insulator","display_name":"Insulator (electricity)","score":0.5972966551780701},{"id":"https://openalex.org/keywords/electric-power-transmission","display_name":"Electric power transmission","score":0.5147597789764404},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.5004594326019287},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.45309239625930786},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.3994830846786499},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.34387731552124023},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3170449733734131},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.2978585362434387},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09586551785469055},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.08620437979698181}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8017091155052185},{"id":"https://openalex.org/C212702","wikidata":"https://www.wikidata.org/wiki/Q178150","display_name":"Insulator (electricity)","level":2,"score":0.5972966551780701},{"id":"https://openalex.org/C140311924","wikidata":"https://www.wikidata.org/wiki/Q200928","display_name":"Electric power transmission","level":2,"score":0.5147597789764404},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.5004594326019287},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.45309239625930786},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3994830846786499},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.34387731552124023},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3170449733734131},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.2978585362434387},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09586551785469055},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.08620437979698181},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2024.3436919","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3436919","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:607a751517964a7a988a6a413e40d62d","is_oa":true,"landing_page_url":"https://doaj.org/article/607a751517964a7a988a6a413e40d62d","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 12, Pp 106781-106792 (2024)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2024.3436919","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3436919","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.6200000047683716}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":32,"referenced_works":["https://openalex.org/W1536680647","https://openalex.org/W2102605133","https://openalex.org/W2193145675","https://openalex.org/W2783876128","https://openalex.org/W2963037989","https://openalex.org/W2990763144","https://openalex.org/W3018757597","https://openalex.org/W3034971973","https://openalex.org/W3035414587","https://openalex.org/W3106250896","https://openalex.org/W3141919519","https://openalex.org/W3142719733","https://openalex.org/W3177052299","https://openalex.org/W3184439416","https://openalex.org/W3213467918","https://openalex.org/W4296904787","https://openalex.org/W4297775537","https://openalex.org/W4321382186","https://openalex.org/W4362564889","https://openalex.org/W4372347372","https://openalex.org/W4384652394","https://openalex.org/W4385800646","https://openalex.org/W4386047745","https://openalex.org/W4386076325","https://openalex.org/W4386264068","https://openalex.org/W4387587622","https://openalex.org/W4388513214","https://openalex.org/W6620707391","https://openalex.org/W6737664043","https://openalex.org/W6779586474","https://openalex.org/W6798838024","https://openalex.org/W6857622863"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3005535424","https://openalex.org/W2994319598","https://openalex.org/W2047067935","https://openalex.org/W1607054433","https://openalex.org/W2110842462"],"abstract_inverted_index":{"Ensuring":[0],"the":[1,8,18,41,53,70,87,99,116,119,124,130,142,196,212],"integrity":[2],"of":[3,12,25,101,118,160,166,176,181,216],"insulators":[4],"is":[5,105,170],"critical":[6],"for":[7,20,61,107],"reliability":[9],"and":[10,22,178,204,214],"safety":[11,213],"power":[13,29,217],"transmission":[14,218],"systems.":[15],"To":[16],"address":[17],"need":[19],"efficient":[21],"real-time":[23],"inspection":[24],"insulator":[26,201],"defects":[27,110,202],"on":[28],"lines,":[30],"this":[31],"paper":[32],"introduces":[33],"an":[34,76,163],"advanced":[35],"defect":[36],"detection":[37,82,185],"model":[38,45,145,169,198],"built":[39],"upon":[40],"YOLOv8":[42],"architecture.":[43],"The":[44,168],"incorporates":[46],"a":[47,92,147,155,173],"novel":[48],"C2f-Faster-EMA":[49],"module":[50,56,96],"that":[51,141],"modifies":[52],"original":[54],"C2f":[55],"used":[57],"in":[58,111],"YOLOv8\u2019s":[59],"backbone":[60],"feature":[62,94],"extraction.":[63],"This":[64],"adaptation":[65],"employs":[66],"FasterNet":[67],"to":[68,80,97,122,133,188,199,211],"reduce":[69],"model\u2019s":[71,131],"parameter":[72,174],"count,":[73],"while":[74],"incorporating":[75],"EMA-based":[77],"attention":[78],"mechanism":[79],"enhance":[81],"accuracy.":[83],"Additionally,":[84],"we":[85],"replace":[86],"conventional":[88],"PANet":[89],"structure":[90],"with":[91,154,205],"BiFPN-P":[93],"fusion":[95],"improve":[98],"extraction":[100],"shallow":[102],"features,":[103],"which":[104],"crucial":[106],"detecting":[108],"small-target":[109],"insulators.":[112],"Further":[113],"refinements":[114],"include":[115],"implementation":[117],"Inner-IoU":[120],"concept":[121],"augment":[123],"MPDIoU":[125],"loss":[126],"function,":[127],"thus":[128],"improving":[129],"ability":[132],"learn":[134],"from":[135],"challenging":[136],"samples.":[137],"Experimental":[138],"results":[139],"demonstrate":[140],"proposed":[143,197],"Insulator-YOLOv8s":[144],"achieves":[146],"superior":[148],"performance":[149],"over":[150],"existing":[151],"mainstream":[152],"algorithms,":[153],"mean":[156],"Average":[157],"Precision":[158],"(mAP)":[159],"91.5%":[161],"at":[162],"IoU":[164],"threshold":[165],"0.5.":[167],"characterized":[171],"by":[172],"count":[175],"5.66M":[177],"computational":[179],"requirements":[180],"21.1":[182],"GFLOPs,":[183],"achieving":[184],"speeds":[186],"up":[187],"113":[189],"frames":[190],"per":[191],"second.":[192],"These":[193],"enhancements":[194],"enable":[195],"identify":[200],"swiftly":[203],"high":[206],"accuracy,":[207],"thereby":[208],"contributing":[209],"significantly":[210],"maintenance":[215],"infrastructure.":[219]},"counts_by_year":[{"year":2026,"cited_by_count":5},{"year":2025,"cited_by_count":15},{"year":2024,"cited_by_count":2}],"updated_date":"2026-08-28T12:50:07.497085","created_date":"2025-10-10T00:00:00"}