{"id":"https://openalex.org/W4400579154","doi":"https://doi.org/10.1109/access.2024.3427332","title":"Design Technology Co-Optimization and Time-Efficient Verification for Enhanced Pin Accessibility in the Post-3-nm Node","display_name":"Design Technology Co-Optimization and Time-Efficient Verification for Enhanced Pin Accessibility in the Post-3-nm Node","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4400579154","doi":"https://doi.org/10.1109/access.2024.3427332"},"language":"en","primary_location":{"id":"doi:10.1109/access.2024.3427332","is_oa":true,"landing_page_url":"http://dx.doi.org/10.1109/access.2024.3427332","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"http://dx.doi.org/10.1109/access.2024.3427332","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5040857221","display_name":"Jae Hoon Jeong","orcid":"https://orcid.org/0000-0001-8960-6954"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaehoon Jeong","raw_affiliation_strings":["Foundry Design Service Team, Samsung Electronics, Gyeonggi-do, South Korea"],"raw_orcid":"https://orcid.org/0000-0001-8960-6954","affiliations":[{"raw_affiliation_string":"Foundry Design Service Team, Samsung Electronics, Gyeonggi-do, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102450743","display_name":"Yunjeong Shin","orcid":"https://orcid.org/0009-0005-5089-9143"},"institutions":[{"id":"https://openalex.org/I31419693","display_name":"Kyungpook National University","ror":"https://ror.org/040c17130","country_code":"KR","type":"education","lineage":["https://openalex.org/I31419693"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yunjeong Shin","raw_affiliation_strings":["School of Electronic and Electrical Engineering, Kyungpook National University (KNU), Daegu, South Korea"],"raw_orcid":"https://orcid.org/0009-0005-5089-9143","affiliations":[{"raw_affiliation_string":"School of Electronic and Electrical Engineering, Kyungpook National University (KNU), Daegu, South Korea","institution_ids":["https://openalex.org/I31419693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102876837","display_name":"Hyundong Lee","orcid":"https://orcid.org/0000-0002-4329-7057"},"institutions":[{"id":"https://openalex.org/I31419693","display_name":"Kyungpook National University","ror":"https://ror.org/040c17130","country_code":"KR","type":"education","lineage":["https://openalex.org/I31419693"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyundong Lee","raw_affiliation_strings":["School of Electronic and Electrical Engineering, Kyungpook National University (KNU), Daegu, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-4329-7057","affiliations":[{"raw_affiliation_string":"School of Electronic and Electrical Engineering, Kyungpook National University (KNU), Daegu, South Korea","institution_ids":["https://openalex.org/I31419693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034027990","display_name":"Jonghyun Ko","orcid":"https://orcid.org/0000-0001-7763-7921"},"institutions":[{"id":"https://openalex.org/I31419693","display_name":"Kyungpook National University","ror":"https://ror.org/040c17130","country_code":"KR","type":"education","lineage":["https://openalex.org/I31419693"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jonghyun Ko","raw_affiliation_strings":["School of Electronic and Electrical Engineering, Kyungpook National University (KNU), Daegu, South Korea"],"raw_orcid":"https://orcid.org/0000-0001-7763-7921","affiliations":[{"raw_affiliation_string":"School of Electronic and Electrical Engineering, Kyungpook National University (KNU), Daegu, South Korea","institution_ids":["https://openalex.org/I31419693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064546341","display_name":"Jongbeom Kim","orcid":"https://orcid.org/0009-0005-4047-976X"},"institutions":[{"id":"https://openalex.org/I31419693","display_name":"Kyungpook National University","ror":"https://ror.org/040c17130","country_code":"KR","type":"education","lineage":["https://openalex.org/I31419693"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jongbeom Kim","raw_affiliation_strings":["School of Electronic and Electrical Engineering, Kyungpook National University (KNU), Daegu, South Korea"],"raw_orcid":"https://orcid.org/0009-0005-4047-976X","affiliations":[{"raw_affiliation_string":"School of Electronic and Electrical Engineering, Kyungpook National University (KNU), Daegu, South Korea","institution_ids":["https://openalex.org/I31419693"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5032455044","display_name":"Taigon Song","orcid":"https://orcid.org/0000-0001-5243-4132"},"institutions":[{"id":"https://openalex.org/I31419693","display_name":"Kyungpook National University","ror":"https://ror.org/040c17130","country_code":"KR","type":"education","lineage":["https://openalex.org/I31419693"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Taigon Song","raw_affiliation_strings":["School of Electronic and Electrical Engineering, Kyungpook National University (KNU), Daegu, South Korea"],"raw_orcid":"https://orcid.org/0000-0001-5243-4132","affiliations":[{"raw_affiliation_string":"School of Electronic and Electrical Engineering, Kyungpook National University (KNU), Daegu, South Korea","institution_ids":["https://openalex.org/I31419693"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.5192,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.63821069,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":98},"biblio":{"volume":"12","issue":null,"first_page":"97557","last_page":"97571"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7198046445846558},{"id":"https://openalex.org/keywords/routing","display_name":"Routing (electronic design automation)","score":0.6814252138137817},{"id":"https://openalex.org/keywords/standard-cell","display_name":"Standard cell","score":0.5950617790222168},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.5696073770523071},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5406103134155273},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5342212319374084},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.5307859182357788},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.4853891134262085},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.34385430812835693},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.33934682607650757},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.30856025218963623},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.19644775986671448},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13063105940818787},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1199994683265686}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7198046445846558},{"id":"https://openalex.org/C74172769","wikidata":"https://www.wikidata.org/wiki/Q1446839","display_name":"Routing (electronic design automation)","level":2,"score":0.6814252138137817},{"id":"https://openalex.org/C78401558","wikidata":"https://www.wikidata.org/wiki/Q464496","display_name":"Standard cell","level":3,"score":0.5950617790222168},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.5696073770523071},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5406103134155273},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5342212319374084},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.5307859182357788},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.4853891134262085},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.34385430812835693},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.33934682607650757},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.30856025218963623},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.19644775986671448},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13063105940818787},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1199994683265686},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2024.3427332","is_oa":true,"landing_page_url":"http://dx.doi.org/10.1109/access.2024.3427332","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:6f5ea368e0a14a169dbc0d283674ae9a","is_oa":true,"landing_page_url":"https://doaj.org/article/6f5ea368e0a14a169dbc0d283674ae9a","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 12, Pp 97557-97571 (2024)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2024.3427332","is_oa":true,"landing_page_url":"http://dx.doi.org/10.1109/access.2024.3427332","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1626937489","display_name":null,"funder_award_id":"2020M3H2A1078045","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"},{"id":"https://openalex.org/G8424448436","display_name":null,"funder_award_id":"2022R1I1A3073214","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"}],"funders":[{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"},{"id":"https://openalex.org/F4320332195","display_name":"Samsung","ror":"https://ror.org/04w3jy968"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":42,"referenced_works":["https://openalex.org/W1974338211","https://openalex.org/W1987067207","https://openalex.org/W2000719225","https://openalex.org/W2033258441","https://openalex.org/W2059802705","https://openalex.org/W2094370252","https://openalex.org/W2142968870","https://openalex.org/W2346205343","https://openalex.org/W2525604265","https://openalex.org/W2603213784","https://openalex.org/W2604305190","https://openalex.org/W2604486584","https://openalex.org/W2626325543","https://openalex.org/W2736534249","https://openalex.org/W2738393560","https://openalex.org/W2744406216","https://openalex.org/W2772390328","https://openalex.org/W2786876877","https://openalex.org/W2884772258","https://openalex.org/W2898911524","https://openalex.org/W2913102921","https://openalex.org/W2913404074","https://openalex.org/W2946427270","https://openalex.org/W2973557761","https://openalex.org/W2990292069","https://openalex.org/W2998732502","https://openalex.org/W3006619829","https://openalex.org/W3013000486","https://openalex.org/W3013288889","https://openalex.org/W3107950019","https://openalex.org/W3163595402","https://openalex.org/W3175294142","https://openalex.org/W3210272314","https://openalex.org/W3215101624","https://openalex.org/W4206244553","https://openalex.org/W4233568622","https://openalex.org/W4234740743","https://openalex.org/W4247837777","https://openalex.org/W4280546881","https://openalex.org/W4285676429","https://openalex.org/W4285676457","https://openalex.org/W4312576296"],"related_works":["https://openalex.org/W2072989701","https://openalex.org/W4205718258","https://openalex.org/W3090875125","https://openalex.org/W1989674257","https://openalex.org/W1738647919","https://openalex.org/W2098218272","https://openalex.org/W2143608234","https://openalex.org/W3000179092","https://openalex.org/W88258363","https://openalex.org/W1986774039"],"abstract_inverted_index":{"As":[0],"the":[1,17,28,33,46,56,100,179],"technology":[2,97,188],"nodes":[3,189],"approach":[4],"3":[5,201],"nm":[6,202],"and":[7,55,69,78,129,147,162,167,193,203],"beyond,":[8],"nanosheet":[9],"FETs":[10],"(NSFETs)":[11],"are":[12,93],"replacing":[13],"FinFETs.":[14],"However,":[15],"despite":[16],"migration":[18],"of":[19,30,44,52,58],"devices":[20],"from":[21],"FinFETs":[22],"to":[23,98,190,197],"NSFETs,":[24],"few":[25],"studies":[26],"report":[27,132],"impact":[29],"NSFETs":[31,59],"in":[32,67,106,110,139,170,186,200],"digital":[34],"VLSI\u2019s":[35],"perspective.":[36],"In":[37],"this":[38,83],"paper,":[39],"we":[40,86,120,131,152,177],"present":[41],"a":[42],"study":[43],"how":[45,133],"latest":[47],"device":[48,96],"technology,":[49],"back":[50],"end":[51],"line":[53],"(BEOL),":[54],"designs":[57,109,196],"aid":[60],"each":[61],"other":[62],"for":[63,74,143],"enhanced":[64],"pin":[65,101,122],"accessibility":[66,102,123],"layout":[68,89],"standard":[70,107],"cell":[71,108,141],"library":[72],"design":[73,90,154],"less":[75],"routing":[76,112,180],"congestion":[77,181],"low":[79],"power":[80,158],"consumption.":[81],"For":[82],"objective,":[84],"1)":[85],"discuss":[87],"five":[88],"methodologies":[91],"that":[92,104,183],"co-optimized":[94],"with":[95],"tackle":[99],"issues":[103,182],"arise":[105],"extremely-low":[111],"resource":[113],"environments":[114],"(e.g.,":[115],"4":[116],"Signal":[117],"Tracks),":[118],"2)":[119],"introduce":[121],"analysis":[124],"procedures":[125],"before":[126],"chip":[127],"P&R,":[128],"3)":[130],"local":[134],"trench":[135],"contact":[136],"(LTC)":[137],"helps":[138],"reducing":[140],"tracks":[142],"5":[144],"track":[145],"cells":[146],"less.":[148],"Using":[149],"our":[150,175],"methodology,":[151],"improve":[153],"metrics":[155],"such":[156],"as":[157],"consumption,":[159],"total":[160],"area,":[161],"wirelength":[163],"by":[164],"11.0%,":[165],"13.2%,":[166],"16.0%,":[168],"respectively":[169],"full-chip":[171,195],"scale":[172],"designs.":[173],"By":[174],"study,":[176],"expect":[178],"additionally":[184],"occur":[185],"advanced":[187],"be":[191,198],"handled":[192],"better":[194],"done":[199],"beyond.":[204]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":1}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}