{"id":"https://openalex.org/W4399665922","doi":"https://doi.org/10.1109/access.2024.3414840","title":"New Possibilistic Formalism Based on Confidence Levels for Metallic Surface Defect Classification","display_name":"New Possibilistic Formalism Based on Confidence Levels for Metallic Surface Defect Classification","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4399665922","doi":"https://doi.org/10.1109/access.2024.3414840"},"language":"en","primary_location":{"id":"doi:10.1109/access.2024.3414840","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3414840","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2024.3414840","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5079968778","display_name":"Jihen Frikha Elleuch","orcid":"https://orcid.org/0000-0002-0201-4831"},"institutions":[{"id":"https://openalex.org/I142899784","display_name":"University of Sfax","ror":"https://ror.org/04d4sd432","country_code":"TN","type":"education","lineage":["https://openalex.org/I142899784"]}],"countries":["TN"],"is_corresponding":false,"raw_author_name":"Jihen Frikha Elleuch","raw_affiliation_strings":["CEM Laboratory, National Engineering School of Sfax, Sfax University, Sfax, Tunisia"],"raw_orcid":"https://orcid.org/0000-0002-0201-4831","affiliations":[{"raw_affiliation_string":"CEM Laboratory, National Engineering School of Sfax, Sfax University, Sfax, Tunisia","institution_ids":["https://openalex.org/I142899784"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086179903","display_name":"Mouna Zouari Mehdi","orcid":"https://orcid.org/0000-0002-7061-3158"},"institutions":[{"id":"https://openalex.org/I142899784","display_name":"University of Sfax","ror":"https://ror.org/04d4sd432","country_code":"TN","type":"education","lineage":["https://openalex.org/I142899784"]}],"countries":["TN"],"is_corresponding":false,"raw_author_name":"Mouna Zouari Mehdi","raw_affiliation_strings":["CEM Laboratory, National Engineering School of Sfax, Sfax University, Sfax, Tunisia"],"raw_orcid":"https://orcid.org/0000-0002-7061-3158","affiliations":[{"raw_affiliation_string":"CEM Laboratory, National Engineering School of Sfax, Sfax University, Sfax, Tunisia","institution_ids":["https://openalex.org/I142899784"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021363213","display_name":"Habib M. Kammoun","orcid":"https://orcid.org/0000-0002-3330-8242"},"institutions":[{"id":"https://openalex.org/I142899784","display_name":"University of Sfax","ror":"https://ror.org/04d4sd432","country_code":"TN","type":"education","lineage":["https://openalex.org/I142899784"]}],"countries":["TN"],"is_corresponding":false,"raw_author_name":"Habib M. Kammoun","raw_affiliation_strings":["REsearch Groups in Intelligent Machines (ReGIM-Laboratory), National Engineering School of Sfax, Sfax University, Sfax, Tunisia"],"raw_orcid":"https://orcid.org/0000-0002-3330-8242","affiliations":[{"raw_affiliation_string":"REsearch Groups in Intelligent Machines (ReGIM-Laboratory), National Engineering School of Sfax, Sfax University, Sfax, Tunisia","institution_ids":["https://openalex.org/I142899784"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032682731","display_name":"Majd Bellaaj","orcid":"https://orcid.org/0000-0002-4979-1152"},"institutions":[{"id":"https://openalex.org/I142899784","display_name":"University of Sfax","ror":"https://ror.org/04d4sd432","country_code":"TN","type":"education","lineage":["https://openalex.org/I142899784"]}],"countries":["TN"],"is_corresponding":false,"raw_author_name":"Majd Bellaaj","raw_affiliation_strings":["CEM Laboratory, National Engineering School of Sfax, Sfax University, Sfax, Tunisia"],"raw_orcid":"https://orcid.org/0000-0002-4979-1152","affiliations":[{"raw_affiliation_string":"CEM Laboratory, National Engineering School of Sfax, Sfax University, Sfax, Tunisia","institution_ids":["https://openalex.org/I142899784"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5008162054","display_name":"Dorra Sellami","orcid":"https://orcid.org/0000-0002-7235-6984"},"institutions":[{"id":"https://openalex.org/I142899784","display_name":"University of Sfax","ror":"https://ror.org/04d4sd432","country_code":"TN","type":"education","lineage":["https://openalex.org/I142899784"]}],"countries":["TN"],"is_corresponding":false,"raw_author_name":"Dorra Sellami","raw_affiliation_strings":["CEM Laboratory, National Engineering School of Sfax, Sfax University, Sfax, Tunisia"],"raw_orcid":"https://orcid.org/0000-0002-7235-6984","affiliations":[{"raw_affiliation_string":"CEM Laboratory, National Engineering School of Sfax, Sfax University, Sfax, Tunisia","institution_ids":["https://openalex.org/I142899784"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I142899784"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.5629,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.68876825,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":96},"biblio":{"volume":"12","issue":null,"first_page":"93010","last_page":"93019"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.992900013923645,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":0.9732999801635742,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/formalism","display_name":"Formalism (music)","score":0.6698988080024719},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.43915441632270813},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4226801097393036},{"id":"https://openalex.org/keywords/confidence-interval","display_name":"Confidence interval","score":0.41232770681381226},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.40342822670936584},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3373644948005676},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.302430123090744},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.21624937653541565}],"concepts":[{"id":"https://openalex.org/C73301696","wikidata":"https://www.wikidata.org/wiki/Q5469984","display_name":"Formalism (music)","level":3,"score":0.6698988080024719},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.43915441632270813},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4226801097393036},{"id":"https://openalex.org/C44249647","wikidata":"https://www.wikidata.org/wiki/Q208498","display_name":"Confidence interval","level":2,"score":0.41232770681381226},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.40342822670936584},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3373644948005676},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.302430123090744},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.21624937653541565},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C558565934","wikidata":"https://www.wikidata.org/wiki/Q2743","display_name":"Musical","level":2,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2024.3414840","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3414840","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:2752591fa49744228a389bc966726565","is_oa":true,"landing_page_url":"https://doaj.org/article/2752591fa49744228a389bc966726565","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 12, Pp 93010-93019 (2024)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2024.3414840","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3414840","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.8199999928474426,"display_name":"Climate action","id":"https://metadata.un.org/sdg/13"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":41,"referenced_works":["https://openalex.org/W156881790","https://openalex.org/W211198884","https://openalex.org/W1221208146","https://openalex.org/W1499982259","https://openalex.org/W1967160092","https://openalex.org/W2012496675","https://openalex.org/W2019950953","https://openalex.org/W2046099583","https://openalex.org/W2092072518","https://openalex.org/W2125629257","https://openalex.org/W2135460975","https://openalex.org/W2193145675","https://openalex.org/W2544831403","https://openalex.org/W2560172284","https://openalex.org/W2570343428","https://openalex.org/W2588054711","https://openalex.org/W2616601017","https://openalex.org/W2778653980","https://openalex.org/W2782536355","https://openalex.org/W2884563051","https://openalex.org/W2890391196","https://openalex.org/W2917344403","https://openalex.org/W2944303778","https://openalex.org/W2953528808","https://openalex.org/W2998291476","https://openalex.org/W3012374719","https://openalex.org/W3037835384","https://openalex.org/W3106250896","https://openalex.org/W3120746423","https://openalex.org/W3163646131","https://openalex.org/W3208023024","https://openalex.org/W4247732714","https://openalex.org/W4283725835","https://openalex.org/W4285345668","https://openalex.org/W4292672344","https://openalex.org/W4299491078","https://openalex.org/W4313327864","https://openalex.org/W4316039570","https://openalex.org/W4381849166","https://openalex.org/W6760000479","https://openalex.org/W6843958726"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W1979597421","https://openalex.org/W2007980826","https://openalex.org/W2061531152","https://openalex.org/W3002753104","https://openalex.org/W2077600819","https://openalex.org/W2142036596","https://openalex.org/W2072657027","https://openalex.org/W2033914206","https://openalex.org/W2042327336"],"abstract_inverted_index":{"In":[0,12,165],"several":[1],"industrial":[2,40],"applications,":[3],"visual":[4],"inspection":[5],"impacts":[6],"production":[7],"and":[8,30,90,118,183,218],"quality":[9],"of":[10,14,38,73,79,81,111,113,142,156,191,234,248],"products.":[11],"case":[13],"surface":[15,60,187,235],"defect":[16,61,251],"on":[17,104,135,174],"metal":[18],"structures,":[19],"a":[20,70,88,122,129,139,153,161,170],"decision":[21],"should":[22,45],"be":[23,46],"made":[24],"to":[25,145,207],"discard":[26],"the":[27,43,58,77,109,126,157,192,224,225,232,246,249],"defective":[28],"piece":[29],"prevent":[31],"from":[32,76],"possible":[33],"failure":[34],"in":[35,121,231],"further":[36,140],"steps":[37],"an":[39,82,229],"process.":[41],"Accordingly,":[42,213],"decision-making":[44],"automated":[47],"using":[48,147],"advanced":[49],"image":[50],"processing":[51],"methods":[52,205],"which":[53],"must":[54],"take":[55],"into":[56],"consideration":[57],"various":[59],"types.":[62],"Nevertheless,":[63],"they":[64],"can":[65,86,107,119],"sometimes":[66,241],"look":[67],"similar":[68,206],"causing":[69],"high":[71],"level":[72,133],"ambiguity,":[74,95],"even":[75],"point":[78],"view":[80],"expert.":[83],"Possibility":[84],"theory":[85],"offer":[87],"formalism":[89,172],"allows":[91,152,228],"coping":[92],"with":[93,203],"such":[94],"yielding":[96],"more":[97,123],"reliable":[98],"decisions.":[99],"Moreover,":[100],"possibility":[101,146,154,175,226],"transform":[102],"based":[103,134,173],"probability":[105,144,178],"intervals":[106],"tackle":[108],"problem":[110],"lack":[112],"information":[114],"or":[115,210],"sampling":[116],"problem,":[117],"describe":[120],"realistic":[124],"way":[125],"features":[127],"within":[128],"specific":[130],"confidence":[131,163],"region":[132],"Goodman":[136],"concept.":[137],"Then,":[138],"transformation":[141],"interval":[143],"Masson":[148],"et":[149],"Denoeux":[150],"formalism,":[151],"mapping":[155],"different":[158],"classes":[159],"at":[160],"given":[162],"level.":[164],"this":[166],"paper,":[167],"we":[168],"propose":[169],"new":[171],"transform,":[176],"handling":[177],"intervals,":[179],"for":[180,245],"addressing":[181],"ambiguity":[182],"uncertainty":[184],"affecting":[185],"steel":[186],"defects.":[188],"The":[189],"effectiveness":[190],"proposed":[193],"method":[194],"is":[195],"largely":[196],"confirmed":[197],"by":[198,237],"carrying":[199],"out":[200],"comparative":[201],"studies":[202],"other":[204],"deep":[208],"learning":[209],"conventional":[211],"methods.":[212],"two":[214],"validation":[215],"databases":[216],"NEU-DET":[217],"GC10-DET":[219],"are":[220],"deployed,":[221],"demonstrating":[222],"that":[223],"approach":[227],"improvement":[230],"classification":[233],"defects":[236],"achieving":[238],"accuracy":[239],"rates":[240],"approaching":[242],"100%,":[243],"outperforming":[244],"majority":[247],"considered":[250],"types,":[252],"existing":[253],"approaches.":[254]},"counts_by_year":[{"year":2025,"cited_by_count":2}],"updated_date":"2025-12-22T23:10:17.713674","created_date":"2025-10-10T00:00:00"}