{"id":"https://openalex.org/W4395027647","doi":"https://doi.org/10.1109/access.2024.3392621","title":"Spacer Dielectric Analysis of Multi-Channel Nanosheet FET for Nanoscale Applications","display_name":"Spacer Dielectric Analysis of Multi-Channel Nanosheet FET for Nanoscale Applications","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4395027647","doi":"https://doi.org/10.1109/access.2024.3392621"},"language":"en","primary_location":{"id":"doi:10.1109/access.2024.3392621","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3392621","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10506905.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10506905.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5063573599","display_name":"Asisa Kumar Panigrahy","orcid":"https://orcid.org/0000-0002-9491-5310"},"institutions":[{"id":"https://openalex.org/I4210138731","display_name":"ICFAI Foundation for Higher Education","ror":"https://ror.org/04p3pp808","country_code":"IN","type":"education","lineage":["https://openalex.org/I4210138731"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Asisa Kumar Panigrahy","raw_affiliation_strings":["Department of ECE, Faculty of Science and Technology (IcfaiTech), The ICFAI Foundation for Higher Education, Hyderabad, Telangana, India"],"raw_orcid":"https://orcid.org/0000-0002-9491-5310","affiliations":[{"raw_affiliation_string":"Department of ECE, Faculty of Science and Technology (IcfaiTech), The ICFAI Foundation for Higher Education, Hyderabad, Telangana, India","institution_ids":["https://openalex.org/I4210138731"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5092785143","display_name":"Veera Venkata Sai Amudalapalli","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Veera Venkata Sai Amudalapalli","raw_affiliation_strings":["Department of ECE, GRIET, Hyderabad, Telangana, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of ECE, GRIET, Hyderabad, Telangana, India","institution_ids":[]}]},{"author_position":"middle","author":{"id":null,"display_name":"Depuru Shobha Rani","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Depuru Shobha Rani","raw_affiliation_strings":["Department of Electrical and Electronics Engineering, Institute of Aeronautical Engineering, Hyderabad, Telangana, India","Department of Electrical and Electronics Engineering, Institute of Aeronautical Engineering, Hyderabad, Telangana, INDIA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronics Engineering, Institute of Aeronautical Engineering, Hyderabad, Telangana, India","institution_ids":[]},{"raw_affiliation_string":"Department of Electrical and Electronics Engineering, Institute of Aeronautical Engineering, Hyderabad, Telangana, INDIA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045743141","display_name":"Muralidhar Nayak Bhukya","orcid":"https://orcid.org/0000-0002-6782-0738"},"institutions":[{"id":"https://openalex.org/I4210133503","display_name":"Central University of Haryana","ror":"https://ror.org/03mtwkv54","country_code":"IN","type":"education","lineage":["https://openalex.org/I4210133503"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Muralidhar Nayak Bhukya","raw_affiliation_strings":["Department of Electrical Engineering, School of Engineering and Technology, Central University of Haryana, Mahendragarh, Haryana, India"],"raw_orcid":"https://orcid.org/0000-0002-6782-0738","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, School of Engineering and Technology, Central University of Haryana, Mahendragarh, Haryana, India","institution_ids":["https://openalex.org/I4210133503"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071218968","display_name":"Hima Bindu Valiveti","orcid":"https://orcid.org/0000-0001-5409-4186"},"institutions":[{"id":"https://openalex.org/I4210133503","display_name":"Central University of Haryana","ror":"https://ror.org/03mtwkv54","country_code":"IN","type":"education","lineage":["https://openalex.org/I4210133503"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Hima Bindu Valiveti","raw_affiliation_strings":["Department of Electrical Engineering, School of Engineering and Technology, Central University of Haryana, Mahendragarh, Haryana, India"],"raw_orcid":"https://orcid.org/0000-0001-5409-4186","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, School of Engineering and Technology, Central University of Haryana, Mahendragarh, Haryana, India","institution_ids":["https://openalex.org/I4210133503"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045929648","display_name":"V. Bharath Sreenivasulu","orcid":"https://orcid.org/0000-0003-3064-1522"},"institutions":[{"id":"https://openalex.org/I164861460","display_name":"Manipal Academy of Higher Education","ror":"https://ror.org/02xzytt36","country_code":"IN","type":"education","lineage":["https://openalex.org/I164861460"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Vakkalakula Bharath Sreenivasulu","raw_affiliation_strings":["Department of Electronics and Communication Engineering, Manipal Institute of Technology Bengaluru, Manipal Academy of Higher Education, Manipal, Karnataka, India"],"raw_orcid":"https://orcid.org/0000-0003-3064-1522","affiliations":[{"raw_affiliation_string":"Department of Electronics and Communication Engineering, Manipal Institute of Technology Bengaluru, Manipal Academy of Higher Education, Manipal, Karnataka, India","institution_ids":["https://openalex.org/I164861460"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5066172531","display_name":"Raghunandan Swain","orcid":"https://orcid.org/0000-0002-4441-1659"},"institutions":[{"id":"https://openalex.org/I2799452066","display_name":"Maharaja Engineering College","ror":"https://ror.org/034pbde03","country_code":"IN","type":"education","lineage":["https://openalex.org/I2799452066","https://openalex.org/I33585257"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Raghunandan Swain","raw_affiliation_strings":["Department of ETC, Parala Maharaja Engineering College, Brahmapur, Odisha, India","Department of ETC, Parala Maharaja Engineering College, Berhampur, Odisha, INDIA"],"raw_orcid":"https://orcid.org/0000-0002-4441-1659","affiliations":[{"raw_affiliation_string":"Department of ETC, Parala Maharaja Engineering College, Brahmapur, Odisha, India","institution_ids":["https://openalex.org/I2799452066"]},{"raw_affiliation_string":"Department of ETC, Parala Maharaja Engineering College, Berhampur, Odisha, INDIA","institution_ids":["https://openalex.org/I2799452066"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5063573599"],"corresponding_institution_ids":["https://openalex.org/I4210138731"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":10.235,"has_fulltext":true,"cited_by_count":52,"citation_normalized_percentile":{"value":0.98791991,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":99,"max":100},"biblio":{"volume":"12","issue":null,"first_page":"73160","last_page":"73168"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/nanosheet","display_name":"Nanosheet","score":0.7877848744392395},{"id":"https://openalex.org/keywords/nanoscopic-scale","display_name":"Nanoscopic scale","score":0.6737111210823059},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6581343412399292},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.6352211236953735},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4948350787162781},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.47838297486305237},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.43150418996810913},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3749489188194275},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.31795424222946167},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.21397051215171814},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12112602591514587}],"concepts":[{"id":"https://openalex.org/C51967427","wikidata":"https://www.wikidata.org/wiki/Q17148232","display_name":"Nanosheet","level":2,"score":0.7877848744392395},{"id":"https://openalex.org/C45206210","wikidata":"https://www.wikidata.org/wiki/Q2415817","display_name":"Nanoscopic scale","level":2,"score":0.6737111210823059},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6581343412399292},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.6352211236953735},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4948350787162781},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.47838297486305237},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.43150418996810913},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3749489188194275},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.31795424222946167},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.21397051215171814},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12112602591514587}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2024.3392621","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3392621","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10506905.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:add9fc6864b041c39c460023a32e423d","is_oa":true,"landing_page_url":"https://doaj.org/article/add9fc6864b041c39c460023a32e423d","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 12, Pp 73160-73168 (2024)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2024.3392621","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3392621","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10506905.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G4848329434","display_name":null,"funder_award_id":"EE-9/2/2021-R&D-E","funder_id":"https://openalex.org/F4320325255","funder_display_name":"Ministry of Electronics and Information technology"}],"funders":[{"id":"https://openalex.org/F4320325255","display_name":"Ministry of Electronics and Information technology","ror":null}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4395027647.pdf","grobid_xml":"https://content.openalex.org/works/W4395027647.grobid-xml"},"referenced_works_count":26,"referenced_works":["https://openalex.org/W1519358564","https://openalex.org/W1985295496","https://openalex.org/W2070539463","https://openalex.org/W2319395362","https://openalex.org/W2611605980","https://openalex.org/W2810747979","https://openalex.org/W2884995603","https://openalex.org/W2967967264","https://openalex.org/W3047599718","https://openalex.org/W3121504151","https://openalex.org/W3131774269","https://openalex.org/W3159874509","https://openalex.org/W4206207265","https://openalex.org/W4226216701","https://openalex.org/W4285174817","https://openalex.org/W4297369887","https://openalex.org/W4320482281","https://openalex.org/W4321180790","https://openalex.org/W4376866842","https://openalex.org/W4379157477","https://openalex.org/W4385452297","https://openalex.org/W4385481370","https://openalex.org/W4385938235","https://openalex.org/W4386023027","https://openalex.org/W4390659287","https://openalex.org/W6744198415"],"related_works":["https://openalex.org/W3119082211","https://openalex.org/W4396734720","https://openalex.org/W3091852196","https://openalex.org/W4400260568","https://openalex.org/W2084951691","https://openalex.org/W4388294765","https://openalex.org/W3206721946","https://openalex.org/W798086848","https://openalex.org/W2338175038","https://openalex.org/W2957838220"],"abstract_inverted_index":{"This":[0],"work":[1],"investigates":[2],"the":[3,47,53,61,98,101,124,139],"effect":[4,45],"of":[5,15,46,100,123,138,152,160,167,176,203],"single":[6,85],"and":[7,33,108,171,195,208],"dual-":[8,196,209],"<italic":[9,20,144,148,192,197,205,210],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[10,21,145,149,156,193,198,206,211],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">k</i>":[11,22,194,199,207,212],"spacer":[12,50,55,75,86,213],"materials":[13],"consisting":[14],"different":[16],"dielectric":[17,214],"constants":[18],"(":[19],")":[23],"in":[24,52,70],"optimized":[25],"nano-channel":[26],"gate-stack":[27],"nanosheet":[28],"(NS-FET)":[29],"employing":[30],"hafnium":[31],"oxide":[32],"silicon":[34],"dioxide":[35],"as":[36],"gate":[37],"insulator":[38],"to":[39,96,116,131,147],"improve":[40],"its":[41],"sub-threshold":[42,164],"performance.":[43],"The":[44,65,88,111,179,201],"external":[48],"low-k":[49],"modification":[51,72],"dual-k":[54,74],"has":[56],"been":[57],"shown":[58],"by":[59,226],"adjusting":[60],"inner":[62],"high-k":[63],"spacer.":[64],"drain-induced":[66],"barrier":[67],"lowering":[68],"(DIBL)":[69],"this":[71,227],"with":[73,104,129,190],"is":[76,80,94,114,134,187,219],"14":[77,162],"mV/V,":[78,163],"which":[79],"a":[81,121],"significant":[82],"improvement":[83],"above":[84],"NS-FET.":[87],"Visual":[89],"TCAD":[90],"3D":[91],"Cogenda":[92],"tool":[93],"used":[95,115],"examine":[97],"performance":[99,127,202,232],"developed":[102],"NS-FET":[103,186,228],"air,":[105],"single,":[106],"dual-k,":[107],"hybrid":[109],"spacers.":[110,200],"CADENCE":[112],"platform":[113],"perform":[117],"circuit":[118],"aspects.":[119],"Additionally,":[120],"comparison":[122],"device":[125,141,231],"architecture\u2019s":[126],"study":[128],"respect":[130],"DC":[132,136],"characteristics":[133],"made.":[135],"parameters":[137],"proposed":[140],"are":[142],"established:":[143],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">I<sub>ON</sub></i>":[146],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">I<sub>OFF</sub></i>":[150],"ratio":[151],"approximately":[153,161,168],"10":[154],"<sup":[155],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">5</sup>":[157],",":[158],"DIBL":[159],"swing":[165],"(SS)":[166],"62":[169],"mV/dec,":[170],"low":[172,223],"threshold":[173],"voltage":[174],"(Vth)":[175],"0.38":[177],"V.":[178],"analysis":[180],"on":[181],"power":[182,224],"consumption":[183,225],"for":[184,216,234],"advanced":[185],"also":[188,220],"analyzed":[189],"single-":[191,204],"variation":[215],"CMOS":[217],"inverter":[218],"shown.":[221],"Furthermore,":[222],"ensures":[229],"improved":[230],"suitable":[233],"nanoscale":[235],"semiconductor":[236],"industries.":[237]},"counts_by_year":[{"year":2026,"cited_by_count":7},{"year":2025,"cited_by_count":30},{"year":2024,"cited_by_count":15}],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2025-10-10T00:00:00"}