{"id":"https://openalex.org/W4394773614","doi":"https://doi.org/10.1109/access.2024.3387947","title":"Rapid Detection of PCB Defects Based on YOLOx-Plus and FPGA","display_name":"Rapid Detection of PCB Defects Based on YOLOx-Plus and FPGA","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4394773614","doi":"https://doi.org/10.1109/access.2024.3387947"},"language":"en","primary_location":{"id":"doi:10.1109/access.2024.3387947","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3387947","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10497598.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10497598.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043768026","display_name":"Yajing Pan","orcid":"https://orcid.org/0009-0006-3930-1080"},"institutions":[{"id":"https://openalex.org/I163151501","display_name":"Hangzhou Normal University","ror":"https://ror.org/014v1mr15","country_code":"CN","type":"education","lineage":["https://openalex.org/I163151501"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yajing Pan","raw_affiliation_strings":["Hangzhou Normal University, Hangzhou, China"],"raw_orcid":"https://orcid.org/0009-0006-3930-1080","affiliations":[{"raw_affiliation_string":"Hangzhou Normal University, Hangzhou, China","institution_ids":["https://openalex.org/I163151501"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100714347","display_name":"Lei Zhang","orcid":"https://orcid.org/0000-0003-2192-0466"},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lei Zhang","raw_affiliation_strings":["Hebei University of Technology, Tianjin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5058416894","display_name":"Yujie Zhang","orcid":"https://orcid.org/0009-0006-6234-2382"},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yujie Zhang","raw_affiliation_strings":["Hebei University of Technology, Tianjin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":3.9486,"has_fulltext":true,"cited_by_count":13,"citation_normalized_percentile":{"value":0.93453037,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":95,"max":99},"biblio":{"volume":"12","issue":null,"first_page":"61343","last_page":"61358"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.3206000030040741,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.3206000030040741,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.685447096824646},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.46793267130851746},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.32766684889793396}],"concepts":[{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.685447096824646},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.46793267130851746},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.32766684889793396}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2024.3387947","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3387947","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10497598.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:ae0af090b8654c6ea1d319f3062801d1","is_oa":true,"landing_page_url":"https://doaj.org/article/ae0af090b8654c6ea1d319f3062801d1","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 12, Pp 61343-61358 (2024)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2024.3387947","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3387947","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10497598.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4394773614.pdf","grobid_xml":"https://content.openalex.org/works/W4394773614.grobid-xml"},"referenced_works_count":29,"referenced_works":["https://openalex.org/W2310823760","https://openalex.org/W2753059567","https://openalex.org/W2895540242","https://openalex.org/W2907579173","https://openalex.org/W2914219486","https://openalex.org/W3020975691","https://openalex.org/W3034713821","https://openalex.org/W3045773105","https://openalex.org/W3107010849","https://openalex.org/W3160653769","https://openalex.org/W3160929742","https://openalex.org/W4214723909","https://openalex.org/W4281790833","https://openalex.org/W4294151799","https://openalex.org/W4296181154","https://openalex.org/W4296426316","https://openalex.org/W4308602927","https://openalex.org/W4312424983","https://openalex.org/W4312638717","https://openalex.org/W4315852132","https://openalex.org/W4318484048","https://openalex.org/W4361275271","https://openalex.org/W4362471027","https://openalex.org/W4362664238","https://openalex.org/W4376279961","https://openalex.org/W4376852379","https://openalex.org/W4386380484","https://openalex.org/W4389560796","https://openalex.org/W4389768346"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2748952813","https://openalex.org/W2111241003","https://openalex.org/W2390279801","https://openalex.org/W4200391368","https://openalex.org/W2358668433","https://openalex.org/W2096844293","https://openalex.org/W2363944576","https://openalex.org/W2351041855","https://openalex.org/W2570254841"],"abstract_inverted_index":{"Printed":[0],"circuit":[1,10],"boards":[2],"(PCBs)":[3],"are":[4],"a":[5,68,228],"common":[6],"structure":[7,100],"in":[8,62,217],"electrical":[9],"systems.":[11],"During":[12],"the":[13,34,37,55,91,98,140,151,153,159,163,171,178,192,201,221],"production":[14],"process,":[15],"PCBs":[16],"may":[17],"encounter":[18],"issues":[19],"such":[20],"as":[21],"short":[22],"circuits,":[23,25],"open":[24],"spikes,":[26],"and":[27,50,59,77,121,126,135,147,161,191,210,226],"missing":[28],"holes,":[29],"which":[30],"can":[31,212],"severely":[32],"affect":[33],"functionality":[35],"of":[36,85,93,101,167,223,231],"circuit.":[38],"However,":[39],"existing":[40,224],"PCB":[41,63,70,203,218],"defect":[42,71,103,204],"detection":[43,48,52,61,72,83,104,165,185,205],"methods":[44],"suffer":[45],"from":[46],"low":[47],"accuracy":[49,58,166],"slow":[51],"speed.":[53],"Considering":[54],"requirements":[56],"for":[57],"real-time":[60],"factories,":[64],"this":[65,86,96],"paper":[66,87],"introduces":[67],"rapid":[69,148],"method":[73,206],"based":[74,207],"on":[75,90,158,208],"FPGA":[76,138,160,211],"YOLOx":[78,102,129],"Plus":[79],"algorithm.":[80],"The":[81,196],"core":[82],"algorithm":[84,105,141,155],"is":[88,106,142,169,174,181,187],"improved":[89,188],"basis":[92],"YOLOx.":[94],"In":[95,150],"paper,":[97],"network":[99,111,133,172],"first":[107],"improved,":[108],"introducing":[109],"three":[110],"modules:":[112],"weak":[113],"data":[114],"enhancement,":[115,125],"parameter":[116],"free":[117],"attention":[118],"mechanism":[119],"SimAM,":[120],"FPN+PAN":[122],"composite":[123],"feature":[124],"naming":[127],"it":[128],"Plus.Then,":[130],"by":[131,176,183,189],"quantizing":[132],"parameters":[134],"designing":[136],"an":[137],"accelerator,":[139],"accelerated":[143],"to":[144],"achieve":[145],"accurate":[146],"detection.":[149],"experiment,":[152],"YOLOx-Plus":[154,168,209],"was":[156],"deployed":[157],"verified,":[162],"average":[164],"93.2%,":[170],"loss":[173],"reduced":[175],"1.036,":[177],"model":[179],"size":[180],"compressed":[182],"64%,":[184],"speed":[186],"68.1%,":[190],"FPS":[193],"reaches":[194],"72.6.":[195],"experimental":[197],"results":[198],"show":[199],"that":[200],"proposed":[202],"efficiently":[213],"detect":[214],"typical":[215],"defects":[216],"boards,":[219],"overcome":[220],"limitations":[222],"methods,":[225],"have":[227],"wide":[229],"range":[230],"practical":[232],"applications.":[233]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":9},{"year":2024,"cited_by_count":3}],"updated_date":"2026-06-13T07:54:00.901334","created_date":"2025-10-10T00:00:00"}