{"id":"https://openalex.org/W4393372093","doi":"https://doi.org/10.1109/access.2024.3383836","title":"Illumination Induced Negative Differential Resistance in InGaAs Avalanche Photodiode","display_name":"Illumination Induced Negative Differential Resistance in InGaAs Avalanche Photodiode","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4393372093","doi":"https://doi.org/10.1109/access.2024.3383836"},"language":"en","primary_location":{"id":"doi:10.1109/access.2024.3383836","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3383836","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10487920.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10487920.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5009597489","display_name":"Afshan Khaliq","orcid":"https://orcid.org/0000-0002-5400-191X"},"institutions":[{"id":"https://openalex.org/I135237710","display_name":"Zhejiang Normal University","ror":"https://ror.org/01vevwk45","country_code":"CN","type":"education","lineage":["https://openalex.org/I135237710"]},{"id":"https://openalex.org/I4400573310","display_name":"Hangzhou City University","ror":"https://ror.org/01wck0s05","country_code":null,"type":"education","lineage":["https://openalex.org/I4400573310"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Afshan Khaliq","raw_affiliation_strings":["Laboratory of Single-Photon Detection and Imaging Techniques, Zhejiang Engineering Research Center for Edge Intelligence Technology and Equipment, School of Information and Electrical Engineering, Hangzhou City University, Hangzhou, Zhejiang, China","Department of Physics, Zhejiang Normal University, Jinhua, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratory of Single-Photon Detection and Imaging Techniques, Zhejiang Engineering Research Center for Edge Intelligence Technology and Equipment, School of Information and Electrical Engineering, Hangzhou City University, Hangzhou, Zhejiang, China","institution_ids":["https://openalex.org/I4400573310"]},{"raw_affiliation_string":"Department of Physics, Zhejiang Normal University, Jinhua, China","institution_ids":["https://openalex.org/I135237710"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101876902","display_name":"Xinyi Zhou","orcid":null},"institutions":[{"id":"https://openalex.org/I4400573310","display_name":"Hangzhou City University","ror":"https://ror.org/01wck0s05","country_code":null,"type":"education","lineage":["https://openalex.org/I4400573310"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xinyi Zhou","raw_affiliation_strings":["Laboratory of Single-Photon Detection and Imaging Techniques, Zhejiang Engineering Research Center for Edge Intelligence Technology and Equipment, School of Information and Electrical Engineering, Hangzhou City University, Hangzhou, Zhejiang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratory of Single-Photon Detection and Imaging Techniques, Zhejiang Engineering Research Center for Edge Intelligence Technology and Equipment, School of Information and Electrical Engineering, Hangzhou City University, Hangzhou, Zhejiang, China","institution_ids":["https://openalex.org/I4400573310"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110688261","display_name":"Hongyu Chai","orcid":null},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hong-Yu Chai","raw_affiliation_strings":["Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048622280","display_name":"Munir Ali","orcid":"https://orcid.org/0000-0002-9558-0946"},"institutions":[{"id":"https://openalex.org/I4400573310","display_name":"Hangzhou City University","ror":"https://ror.org/01wck0s05","country_code":null,"type":"education","lineage":["https://openalex.org/I4400573310"]},{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Munir Ali","raw_affiliation_strings":["Laboratory of Single-Photon Detection and Imaging Techniques, Zhejiang Engineering Research Center for Edge Intelligence Technology and Equipment, School of Information and Electrical Engineering, Hangzhou City University, Hangzhou, Zhejiang, China","ZJU-Hangzhou Global Scientific and Technological Innovation Center, ZJU-UIUC Joint Institute, School of Micro-Nano Electronics, Zhejiang University, Hangzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratory of Single-Photon Detection and Imaging Techniques, Zhejiang Engineering Research Center for Edge Intelligence Technology and Equipment, School of Information and Electrical Engineering, Hangzhou City University, Hangzhou, Zhejiang, China","institution_ids":["https://openalex.org/I4400573310"]},{"raw_affiliation_string":"ZJU-Hangzhou Global Scientific and Technological Innovation Center, ZJU-UIUC Joint Institute, School of Micro-Nano Electronics, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100722389","display_name":"Hao Wu","orcid":"https://orcid.org/0000-0001-5128-1306"},"institutions":[{"id":"https://openalex.org/I4400573310","display_name":"Hangzhou City University","ror":"https://ror.org/01wck0s05","country_code":null,"type":"education","lineage":["https://openalex.org/I4400573310"]},{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hao Wu","raw_affiliation_strings":["Laboratory of Single-Photon Detection and Imaging Techniques, Zhejiang Engineering Research Center for Edge Intelligence Technology and Equipment, School of Information and Electrical Engineering, Hangzhou City University, Hangzhou, Zhejiang, China","College of Optical Science and Engineering, Zhejiang University, Hangzhou, Zhejiang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratory of Single-Photon Detection and Imaging Techniques, Zhejiang Engineering Research Center for Edge Intelligence Technology and Equipment, School of Information and Electrical Engineering, Hangzhou City University, Hangzhou, Zhejiang, China","institution_ids":["https://openalex.org/I4400573310"]},{"raw_affiliation_string":"College of Optical Science and Engineering, Zhejiang University, Hangzhou, Zhejiang, China","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020353432","display_name":"Oussama Gassab","orcid":"https://orcid.org/0000-0003-1808-3257"},"institutions":[{"id":"https://openalex.org/I4400573310","display_name":"Hangzhou City University","ror":"https://ror.org/01wck0s05","country_code":null,"type":"education","lineage":["https://openalex.org/I4400573310"]},{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Oussama Gassab","raw_affiliation_strings":["Laboratory of Single-Photon Detection and Imaging Techniques, Zhejiang Engineering Research Center for Edge Intelligence Technology and Equipment, School of Information and Electrical Engineering, Hangzhou City University, Hangzhou, Zhejiang, China","College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, Zhejiang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratory of Single-Photon Detection and Imaging Techniques, Zhejiang Engineering Research Center for Edge Intelligence Technology and Equipment, School of Information and Electrical Engineering, Hangzhou City University, Hangzhou, Zhejiang, China","institution_ids":["https://openalex.org/I4400573310"]},{"raw_affiliation_string":"College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, Zhejiang, China","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008587089","display_name":"Hong Liu","orcid":"https://orcid.org/0000-0001-8688-7041"},"institutions":[{"id":"https://openalex.org/I4400573310","display_name":"Hangzhou City University","ror":"https://ror.org/01wck0s05","country_code":null,"type":"education","lineage":["https://openalex.org/I4400573310"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hong Liu","raw_affiliation_strings":["Laboratory of Single-Photon Detection and Imaging Techniques, Zhejiang Engineering Research Center for Edge Intelligence Technology and Equipment, School of Information and Electrical Engineering, Hangzhou City University, Hangzhou, Zhejiang, China"],"raw_orcid":"https://orcid.org/0000-0001-8688-7041","affiliations":[{"raw_affiliation_string":"Laboratory of Single-Photon Detection and Imaging Techniques, Zhejiang Engineering Research Center for Edge Intelligence Technology and Equipment, School of Information and Electrical Engineering, Hangzhou City University, Hangzhou, Zhejiang, China","institution_ids":["https://openalex.org/I4400573310"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101781202","display_name":"Duo Xiao","orcid":"https://orcid.org/0009-0004-3308-1131"},"institutions":[{"id":"https://openalex.org/I4400573310","display_name":"Hangzhou City University","ror":"https://ror.org/01wck0s05","country_code":null,"type":"education","lineage":["https://openalex.org/I4400573310"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Duo Xiao","raw_affiliation_strings":["Laboratory of Single-Photon Detection and Imaging Techniques, Zhejiang Engineering Research Center for Edge Intelligence Technology and Equipment, School of Information and Electrical Engineering, Hangzhou City University, Hangzhou, Zhejiang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratory of Single-Photon Detection and Imaging Techniques, Zhejiang Engineering Research Center for Edge Intelligence Technology and Equipment, School of Information and Electrical Engineering, Hangzhou City University, Hangzhou, Zhejiang, China","institution_ids":["https://openalex.org/I4400573310"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047203500","display_name":"Xiaoguang Yang","orcid":"https://orcid.org/0000-0003-2265-4251"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiao-Guang Yang","raw_affiliation_strings":["Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5013645993","display_name":"Sichao Du","orcid":"https://orcid.org/0000-0003-3060-5759"},"institutions":[{"id":"https://openalex.org/I4400573310","display_name":"Hangzhou City University","ror":"https://ror.org/01wck0s05","country_code":null,"type":"education","lineage":["https://openalex.org/I4400573310"]},{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Sichao Du","raw_affiliation_strings":["Laboratory of Single-Photon Detection and Imaging Techniques, Zhejiang Engineering Research Center for Edge Intelligence Technology and Equipment, School of Information and Electrical Engineering, Hangzhou City University, Hangzhou, Zhejiang, China","College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, Zhejiang, China"],"raw_orcid":"https://orcid.org/0000-0003-3060-5759","affiliations":[{"raw_affiliation_string":"Laboratory of Single-Photon Detection and Imaging Techniques, Zhejiang Engineering Research Center for Edge Intelligence Technology and Equipment, School of Information and Electrical Engineering, Hangzhou City University, Hangzhou, Zhejiang, China","institution_ids":["https://openalex.org/I4400573310"]},{"raw_affiliation_string":"College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, Zhejiang, China","institution_ids":["https://openalex.org/I76130692"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":10,"corresponding_author_ids":["https://openalex.org/A5009597489"],"corresponding_institution_ids":["https://openalex.org/I135237710","https://openalex.org/I4400573310"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":14.762,"has_fulltext":true,"cited_by_count":75,"citation_normalized_percentile":{"value":0.99428129,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":98,"max":100},"biblio":{"volume":"12","issue":null,"first_page":"50595","last_page":"50604"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9815000295639038,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9815000295639038,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10022","display_name":"Semiconductor Quantum Structures and Devices","score":0.9793999791145325,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":0.977400004863739,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/avalanche-photodiode","display_name":"Avalanche photodiode","score":0.8654428720474243},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.6091232299804688},{"id":"https://openalex.org/keywords/differential","display_name":"Differential (mechanical device)","score":0.5592794418334961},{"id":"https://openalex.org/keywords/indium-gallium-arsenide","display_name":"Indium gallium arsenide","score":0.5527311563491821},{"id":"https://openalex.org/keywords/single-photon-avalanche-diode","display_name":"Single-photon avalanche diode","score":0.5396047234535217},{"id":"https://openalex.org/keywords/photodiode","display_name":"Photodiode","score":0.4749491214752197},{"id":"https://openalex.org/keywords/gallium-arsenide","display_name":"Gallium arsenide","score":0.4680801331996918},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.46309566497802734},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.2809069752693176},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.17129391431808472},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.09129366278648376}],"concepts":[{"id":"https://openalex.org/C109679912","wikidata":"https://www.wikidata.org/wiki/Q175932","display_name":"Avalanche photodiode","level":3,"score":0.8654428720474243},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6091232299804688},{"id":"https://openalex.org/C93226319","wikidata":"https://www.wikidata.org/wiki/Q193137","display_name":"Differential (mechanical device)","level":2,"score":0.5592794418334961},{"id":"https://openalex.org/C2779769603","wikidata":"https://www.wikidata.org/wiki/Q2618059","display_name":"Indium gallium arsenide","level":3,"score":0.5527311563491821},{"id":"https://openalex.org/C193361668","wikidata":"https://www.wikidata.org/wiki/Q7523761","display_name":"Single-photon avalanche diode","level":4,"score":0.5396047234535217},{"id":"https://openalex.org/C751236","wikidata":"https://www.wikidata.org/wiki/Q175943","display_name":"Photodiode","level":2,"score":0.4749491214752197},{"id":"https://openalex.org/C510052550","wikidata":"https://www.wikidata.org/wiki/Q422819","display_name":"Gallium arsenide","level":2,"score":0.4680801331996918},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.46309566497802734},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2809069752693176},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.17129391431808472},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.09129366278648376},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2024.3383836","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3383836","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10487920.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:a13bebdbd1f74f7fbbcd4e0c7447d312","is_oa":true,"landing_page_url":"https://doaj.org/article/a13bebdbd1f74f7fbbcd4e0c7447d312","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 12, Pp 50595-50604 (2024)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2024.3383836","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3383836","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10487920.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Climate action","score":0.550000011920929,"id":"https://metadata.un.org/sdg/13"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320322927","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4393372093.pdf","grobid_xml":"https://content.openalex.org/works/W4393372093.grobid-xml"},"referenced_works_count":50,"referenced_works":["https://openalex.org/W1523016511","https://openalex.org/W1973993605","https://openalex.org/W1975496472","https://openalex.org/W1980602780","https://openalex.org/W1990759845","https://openalex.org/W1995189195","https://openalex.org/W2000249248","https://openalex.org/W2017381368","https://openalex.org/W2022339836","https://openalex.org/W2026023028","https://openalex.org/W2033822652","https://openalex.org/W2036805357","https://openalex.org/W2036906963","https://openalex.org/W2040661894","https://openalex.org/W2046385093","https://openalex.org/W2051665984","https://openalex.org/W2067338950","https://openalex.org/W2071663819","https://openalex.org/W2089895902","https://openalex.org/W2102596348","https://openalex.org/W2108238208","https://openalex.org/W2125786640","https://openalex.org/W2162636026","https://openalex.org/W2168215366","https://openalex.org/W2285369944","https://openalex.org/W2315813575","https://openalex.org/W2321198521","https://openalex.org/W2331811639","https://openalex.org/W2411838685","https://openalex.org/W2541627234","https://openalex.org/W2572125998","https://openalex.org/W2909516247","https://openalex.org/W2941316198","https://openalex.org/W2945476610","https://openalex.org/W2973004701","https://openalex.org/W2979933728","https://openalex.org/W2987334222","https://openalex.org/W2991011588","https://openalex.org/W3101058046","https://openalex.org/W3101552038","https://openalex.org/W3166407536","https://openalex.org/W3198078589","https://openalex.org/W4200516935","https://openalex.org/W4225551950","https://openalex.org/W4226476584","https://openalex.org/W4243809133","https://openalex.org/W4283462554","https://openalex.org/W4361306790","https://openalex.org/W4386306500","https://openalex.org/W4388642319"],"related_works":["https://openalex.org/W2314105963","https://openalex.org/W3156845399","https://openalex.org/W2041021839","https://openalex.org/W2347118923","https://openalex.org/W1833779192","https://openalex.org/W2049625409","https://openalex.org/W2115627936","https://openalex.org/W2502247641","https://openalex.org/W2117151138","https://openalex.org/W1983349717"],"abstract_inverted_index":{"This":[0],"work":[1],"presents":[2],"a":[3,91,103],"novel":[4],"InGaAs/InP":[5,167],"avalanche":[6,53,120],"photodiode":[7],"fabricated":[8],"in":[9,68,102,112,122,154],"the":[10,46,52,73,100,108,113,123,133,138,150,155,162],"separate":[11],"absorption,":[12],"grading,":[13],"charge,":[14],"and":[15,49,65,118],"multiplication":[16,31,67,124],"configuration":[17],"operated":[18],"at":[19,85],"non-cryogenic":[20],"conditions":[21],"under":[22,173],"low-frequency":[23],"ramp":[24,74],"gating.":[25,75],"An":[26],"optimized":[27],"three":[28],"stage":[29],"InP":[30],"layer":[32],"of":[33,89,93,116],"1\u03bc":[34],"<italic":[35,145],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[36,146],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">m</i>":[37],"thickness":[38],"offers":[39],"extended":[40],"linear":[41,66],"mode":[42],"operation":[43],"by":[44],"reducing":[45],"punch-through":[47],"voltage":[48,87],"indefinitely":[50],"increasing":[51],"threshold":[54],"voltage.":[55],"A":[56],"large":[57],"background":[58],"dark":[59],"current":[60],"is":[61,97,137],"observed":[62],"following":[63],"steady,":[64],"approximately":[69],"direct":[70],"relationship":[71],"with":[72],"For":[76],"1310":[77],"nm":[78],"short-wave":[79],"infrared,":[80],"normal":[81],"incidence":[82],"pulsed":[83],"illumination":[84,109],"instant-to-peak":[86],"ratios":[88],"(0.11,0.2,0.6,0.89,0.98,0.9),":[90],"sort":[92],"negative":[94],"differential":[95],"resistance":[96],"incorporated":[98],"into":[99],"device":[101],"qualitative":[104],"sense,":[105],"owing":[106],"to":[107],"induced":[110],"switching/variations":[111],"intrinsic":[114],"values":[115],"electron":[117],"hole":[119],"coefficients":[121],"region.":[125],"Under":[126],"fixed":[127],"illumination,":[128],"an":[129],"interesting":[130],"deduction":[131],"from":[132],"transient":[134],"photo":[135],"response":[136],"slow":[139],"quenching":[140],"phenomenon":[141],"prolonging":[142],"~120":[143],"\u03bc":[144],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">s</i>":[147],"for":[148,164,169],"all":[149],"electrical":[151],"field":[152],"establishments":[153],"device.":[156],"The":[157],"related":[158],"measurement":[159],"scheme":[160],"paves":[161],"way":[163],"futuristic":[165],"ramp-driven":[166],"APDs":[168],"detecting":[170],"SWIR":[171],"wavelengths":[172],"required":[174],"low":[175],"power":[176],"consumption":[177],"environments.":[178]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":41},{"year":2024,"cited_by_count":32}],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2025-10-10T00:00:00"}