{"id":"https://openalex.org/W4392902288","doi":"https://doi.org/10.1109/access.2024.3376681","title":"Mechanism and Analytical Model for Switching Transient Process in SiC 3L-ANPC Converter","display_name":"Mechanism and Analytical Model for Switching Transient Process in SiC 3L-ANPC Converter","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4392902288","doi":"https://doi.org/10.1109/access.2024.3376681"},"language":"en","primary_location":{"id":"doi:10.1109/access.2024.3376681","is_oa":true,"landing_page_url":"http://dx.doi.org/10.1109/access.2024.3376681","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10471394.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10471394.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5008086623","display_name":"Lina Wang","orcid":"https://orcid.org/0000-0003-4919-0645"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lina Wang","raw_affiliation_strings":["School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-4919-0645","affiliations":[{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063871272","display_name":"Junming Chang","orcid":"https://orcid.org/0009-0008-6704-3538"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Junming Chang","raw_affiliation_strings":["School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0009-0008-6704-3538","affiliations":[{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101243315","display_name":"Zezhuo Yuan","orcid":"https://orcid.org/0009-0000-8265-702X"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zezhuo Yuan","raw_affiliation_strings":["School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111148968","display_name":"Zaiqia Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zaiqia Wu","raw_affiliation_strings":["School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101319145","display_name":"Fengtian Jiang","orcid":"https://orcid.org/0009-0006-3660-6428"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fengtian Jiang","raw_affiliation_strings":["School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.3462,"has_fulltext":true,"cited_by_count":2,"citation_normalized_percentile":{"value":0.54741367,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":"12","issue":null,"first_page":"40842","last_page":"40855"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.6646693348884583},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5875336527824402},{"id":"https://openalex.org/keywords/transient-analysis","display_name":"Transient analysis","score":0.5754638314247131},{"id":"https://openalex.org/keywords/mechanism","display_name":"Mechanism (biology)","score":0.5444825887680054},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.402084618806839},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4020202159881592},{"id":"https://openalex.org/keywords/transient-response","display_name":"Transient response","score":0.22201430797576904},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1545838713645935},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.12536874413490295},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.0774821937084198}],"concepts":[{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.6646693348884583},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5875336527824402},{"id":"https://openalex.org/C2989121073","wikidata":"https://www.wikidata.org/wiki/Q1309019","display_name":"Transient analysis","level":3,"score":0.5754638314247131},{"id":"https://openalex.org/C89611455","wikidata":"https://www.wikidata.org/wiki/Q6804646","display_name":"Mechanism (biology)","level":2,"score":0.5444825887680054},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.402084618806839},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4020202159881592},{"id":"https://openalex.org/C85761212","wikidata":"https://www.wikidata.org/wiki/Q1974593","display_name":"Transient response","level":2,"score":0.22201430797576904},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1545838713645935},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12536874413490295},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0774821937084198},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2024.3376681","is_oa":true,"landing_page_url":"http://dx.doi.org/10.1109/access.2024.3376681","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10471394.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:7e1315ef75f3412ca43fcfe95bfa28c5","is_oa":true,"landing_page_url":"https://doaj.org/article/7e1315ef75f3412ca43fcfe95bfa28c5","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 12, Pp 40842-40855 (2024)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2024.3376681","is_oa":true,"landing_page_url":"http://dx.doi.org/10.1109/access.2024.3376681","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10471394.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1778662729","display_name":null,"funder_award_id":"52177167","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6131563405","display_name":null,"funder_award_id":"2019ZC051012","funder_id":"https://openalex.org/F4320322857","funder_display_name":"Aeronautical Science Foundation of China"},{"id":"https://openalex.org/G77269981","display_name":null,"funder_award_id":"51877005","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320322857","display_name":"Aeronautical Science Foundation of China","ror":"https://ror.org/02wq41p38"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4392902288.pdf","grobid_xml":"https://content.openalex.org/works/W4392902288.grobid-xml"},"referenced_works_count":24,"referenced_works":["https://openalex.org/W2007567509","https://openalex.org/W2081371843","https://openalex.org/W2096915251","https://openalex.org/W2167806448","https://openalex.org/W2886792463","https://openalex.org/W2897720876","https://openalex.org/W2948008893","https://openalex.org/W2964689960","https://openalex.org/W2971165464","https://openalex.org/W2972472847","https://openalex.org/W2983141371","https://openalex.org/W2998527742","https://openalex.org/W3004464897","https://openalex.org/W3022853838","https://openalex.org/W3026946294","https://openalex.org/W3044578873","https://openalex.org/W3080881049","https://openalex.org/W3094671723","https://openalex.org/W3111008079","https://openalex.org/W3126552376","https://openalex.org/W3183258235","https://openalex.org/W3199403667","https://openalex.org/W3208095836","https://openalex.org/W4365129444"],"related_works":["https://openalex.org/W2758798772","https://openalex.org/W2081338125","https://openalex.org/W4406350055","https://openalex.org/W4239924455","https://openalex.org/W2001630809","https://openalex.org/W4244925124","https://openalex.org/W2377879397","https://openalex.org/W1577327694","https://openalex.org/W2887517211","https://openalex.org/W1909312109"],"abstract_inverted_index":{"Silicon":[0],"carbide":[1],"three-level":[2],"active":[3],"neutral":[4],"point":[5],"clamped":[6],"converters":[7],"(SiC":[8],"3L-ANPC)":[9],"have":[10],"emerged":[11],"as":[12],"promising":[13],"solutions":[14],"for":[15,185,196],"medium-voltage":[16],"high-capacity":[17],"applications.":[18],"However,":[19],"compared":[20],"to":[21,62,76,96],"traditional":[22],"two-level":[23],"converters,":[24,203],"they":[25],"exhibit":[26],"a":[27,86,131,177],"relatively":[28],"higher":[29],"presence":[30],"of":[31,37,89,103,121,134,172,181,208],"stray":[32,53],"parameters.":[33],"The":[34,125,188],"combined":[35],"impact":[36],"high":[38],"<inline-formula":[39,45],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[40,46],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[41,47],"<tex-math":[42,48],"notation=\"LaTeX\">$\\text{d}v/\\text{d}t$":[43],"</tex-math></inline-formula>,":[44],"notation=\"LaTeX\">$\\text{d}i/\\text{d}t$":[49],"</tex-math></inline-formula>":[50],"and":[51,67,80,101,163],"multiple":[52],"parameters":[54,199],"during":[55],"the":[56,90,98,117,135,146,149,170,173,206],"switching":[57,78,91,118,136],"transient":[58,92,119,137,147,186],"process":[59,93,120],"can":[60],"lead":[61],"non-ideal":[63],"behaviors,":[64],"including":[65],"voltage":[66],"current":[68],"overshoots,":[69],"along":[70],"with":[71],"oscillations.":[72],"These":[73],"issues":[74],"contribute":[75],"increased":[77],"losses":[79],"limitations":[81],"in":[82,111,191,200,205],"power":[83],"handling.":[84],"Therefore,":[85],"thorough":[87],"evaluation":[88],"becomes":[94],"imperative":[95],"ensure":[97],"proper":[99],"design":[100],"protection":[102],"3L-ANPC":[104,123,202],"converters.":[105,124],"An":[106],"analytical":[107],"model":[108,126,150],"is":[109,127],"proposed":[110,174],"this":[112,192],"article":[113,193],"that":[114],"accurately":[115],"characterizes":[116],"SiC":[122,201],"developed":[128],"based":[129],"on":[130,141],"comprehensive":[132],"analysis":[133],"mechanism.":[138],"By":[139],"focusing":[140],"specific":[142],"pivotal":[143],"moments":[144,158],"within":[145],"process,":[148],"significantly":[151],"reduces":[152],"computational":[153],"time.":[154],"Moreover,":[155],"these":[156],"distinct":[157],"carry":[159],"explicit":[160],"physical":[161],"significance":[162],"possess":[164],"universal":[165],"applicability.":[166],"Experimental":[167],"results":[168],"validate":[169],"effectiveness":[171],"model,":[175],"showcasing":[176],"maximum":[178],"calculation":[179],"error":[180],"less":[182],"than":[183],"6%":[184],"overshoots.":[187],"insights":[189],"presented":[190],"provide":[194],"guidance":[195],"designing":[197],"circuit":[198],"aiding":[204],"mitigation":[207],"overvoltage":[209],"issues.":[210]},"counts_by_year":[{"year":2024,"cited_by_count":2}],"updated_date":"2025-12-22T23:10:17.713674","created_date":"2025-10-10T00:00:00"}