{"id":"https://openalex.org/W4391621123","doi":"https://doi.org/10.1109/access.2024.3363832","title":"Reliability Analysis Based on Markov Model, Economic Feasibility, and Efficiency Comparison for a Cascaded H-Bridge Multilevel Inverter Capable of Generating 27 Levels","display_name":"Reliability Analysis Based on Markov Model, Economic Feasibility, and Efficiency Comparison for a Cascaded H-Bridge Multilevel Inverter Capable of Generating 27 Levels","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4391621123","doi":"https://doi.org/10.1109/access.2024.3363832"},"language":"en","primary_location":{"id":"doi:10.1109/access.2024.3363832","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3363832","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10424980.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10424980.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102614710","display_name":"Seong Jin Lim","orcid":null},"institutions":[{"id":"https://openalex.org/I189442560","display_name":"Gyeongsang National University","ror":"https://ror.org/00saywf64","country_code":"KR","type":"education","lineage":["https://openalex.org/I189442560"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seong Jin Lim","raw_affiliation_strings":["Department of Mechatronics Engineering, Gyeongsang National University, Jinju, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mechatronics Engineering, Gyeongsang National University, Jinju, South Korea","institution_ids":["https://openalex.org/I189442560"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054281714","display_name":"Sun-Pil Kim","orcid":"https://orcid.org/0000-0003-0693-742X"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Sun-Pil Kim","raw_affiliation_strings":["G&#x0026;EPS Company Ltd., Jangseong, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"G&#x0026;EPS Company Ltd., Jangseong, South Korea","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101781095","display_name":"Feel\u2010soon Kang","orcid":"https://orcid.org/0000-0001-5748-5211"},"institutions":[{"id":"https://openalex.org/I189442560","display_name":"Gyeongsang National University","ror":"https://ror.org/00saywf64","country_code":"KR","type":"education","lineage":["https://openalex.org/I189442560"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Feel-Soon Kang","raw_affiliation_strings":["Department of Mechatronics Engineering, Gyeongsang National University, Jinju, South Korea"],"raw_orcid":"https://orcid.org/0000-0001-5748-5211","affiliations":[{"raw_affiliation_string":"Department of Mechatronics Engineering, Gyeongsang National University, Jinju, South Korea","institution_ids":["https://openalex.org/I189442560"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5019708670","display_name":"Sung\u2010Geun Song","orcid":null},"institutions":[{"id":"https://openalex.org/I4210131650","display_name":"Korea Electronics Technology Institute","ror":"https://ror.org/039k6f508","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2801339556","https://openalex.org/I4210089395","https://openalex.org/I4210131650"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sung-Geun Song","raw_affiliation_strings":["Energy Conversion Research Centre, Korea Electronics Technology Institute, Gwangju, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Energy Conversion Research Centre, Korea Electronics Technology Institute, Gwangju, South Korea","institution_ids":["https://openalex.org/I4210131650"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":1.5577,"has_fulltext":true,"cited_by_count":9,"citation_normalized_percentile":{"value":0.82131017,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"12","issue":null,"first_page":"21530","last_page":"21542"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.98089998960495,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/total-harmonic-distortion","display_name":"Total harmonic distortion","score":0.7329412698745728},{"id":"https://openalex.org/keywords/h-bridge","display_name":"H bridge","score":0.6680117845535278},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.5848188996315002},{"id":"https://openalex.org/keywords/markov-chain","display_name":"Markov chain","score":0.57230144739151},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5688948631286621},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5390059947967529},{"id":"https://openalex.org/keywords/inverter","display_name":"Inverter","score":0.4936729371547699},{"id":"https://openalex.org/keywords/bridge","display_name":"Bridge (graph theory)","score":0.45976585149765015},{"id":"https://openalex.org/keywords/markov-model","display_name":"Markov model","score":0.45828524231910706},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4461982250213623},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.4217483401298523},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.417294442653656},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.39339685440063477},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.34091126918792725},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.259141743183136},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.22024333477020264},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.11731314659118652},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10405004024505615}],"concepts":[{"id":"https://openalex.org/C42156128","wikidata":"https://www.wikidata.org/wiki/Q162641","display_name":"Total harmonic distortion","level":3,"score":0.7329412698745728},{"id":"https://openalex.org/C2778512005","wikidata":"https://www.wikidata.org/wiki/Q1545300","display_name":"H bridge","level":4,"score":0.6680117845535278},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.5848188996315002},{"id":"https://openalex.org/C98763669","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov chain","level":2,"score":0.57230144739151},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5688948631286621},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5390059947967529},{"id":"https://openalex.org/C11190779","wikidata":"https://www.wikidata.org/wiki/Q664575","display_name":"Inverter","level":3,"score":0.4936729371547699},{"id":"https://openalex.org/C100776233","wikidata":"https://www.wikidata.org/wiki/Q2532492","display_name":"Bridge (graph theory)","level":2,"score":0.45976585149765015},{"id":"https://openalex.org/C163836022","wikidata":"https://www.wikidata.org/wiki/Q6771326","display_name":"Markov model","level":3,"score":0.45828524231910706},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4461982250213623},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.4217483401298523},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.417294442653656},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.39339685440063477},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.34091126918792725},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.259141743183136},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.22024333477020264},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.11731314659118652},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10405004024505615},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C126322002","wikidata":"https://www.wikidata.org/wiki/Q11180","display_name":"Internal medicine","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2024.3363832","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3363832","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10424980.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:a303418126da4382b56ffe2828df5b1a","is_oa":true,"landing_page_url":"https://doaj.org/article/a303418126da4382b56ffe2828df5b1a","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 12, Pp 21530-21542 (2024)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2024.3363832","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3363832","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10424980.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/8","score":0.4099999964237213,"display_name":"Decent work and economic growth"}],"awards":[{"id":"https://openalex.org/G3522527400","display_name":null,"funder_award_id":"20225500000120","funder_id":"https://openalex.org/F4320321681","funder_display_name":"Ministry of Trade, Industry and Energy"},{"id":"https://openalex.org/G7930204506","display_name":null,"funder_award_id":"20225500000120","funder_id":"https://openalex.org/F4320335199","funder_display_name":"Korea Institute of Energy Technology Evaluation and Planning"}],"funders":[{"id":"https://openalex.org/F4320321198","display_name":"Chonnam National University","ror":"https://ror.org/05kzjxq56"},{"id":"https://openalex.org/F4320321224","display_name":"Hanbat National University","ror":"https://ror.org/00x514t95"},{"id":"https://openalex.org/F4320321284","display_name":"Pusan National University","ror":"https://ror.org/01an57a31"},{"id":"https://openalex.org/F4320321318","display_name":"Gyeongsang National University","ror":"https://ror.org/00saywf64"},{"id":"https://openalex.org/F4320321681","display_name":"Ministry of Trade, Industry and Energy","ror":"https://ror.org/008nkqk13"},{"id":"https://openalex.org/F4320335199","display_name":"Korea Institute of Energy Technology Evaluation and Planning","ror":"https://ror.org/02zq38y32"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4391621123.pdf","grobid_xml":"https://content.openalex.org/works/W4391621123.grobid-xml"},"referenced_works_count":27,"referenced_works":["https://openalex.org/W1662092069","https://openalex.org/W2143714637","https://openalex.org/W3019918508","https://openalex.org/W3047686268","https://openalex.org/W3094249197","https://openalex.org/W3128123356","https://openalex.org/W3158455171","https://openalex.org/W3190038782","https://openalex.org/W3190196572","https://openalex.org/W4251720334","https://openalex.org/W4287890447","https://openalex.org/W4312304916","https://openalex.org/W4312686148","https://openalex.org/W4312707594","https://openalex.org/W4320005596","https://openalex.org/W4323519323","https://openalex.org/W4327522893","https://openalex.org/W4360993883","https://openalex.org/W4380536926","https://openalex.org/W4381733438","https://openalex.org/W4382568084","https://openalex.org/W4382753380","https://openalex.org/W4383751326","https://openalex.org/W4385062339","https://openalex.org/W4385152158","https://openalex.org/W4385338735","https://openalex.org/W4386072106"],"related_works":["https://openalex.org/W4282559249","https://openalex.org/W3038128203","https://openalex.org/W2377438693","https://openalex.org/W4390188066","https://openalex.org/W4391431539","https://openalex.org/W3112863214","https://openalex.org/W3112769978","https://openalex.org/W4221001366","https://openalex.org/W2588053373","https://openalex.org/W4365788340"],"abstract_inverted_index":{"A":[0],"cascaded":[1],"H-bridge":[2,19,40,68,78,92,142],"multilevel":[3],"inverter":[4,157],"(CHBMI)":[5],"can":[6,60],"increase":[7,36],"the":[8,16,46,54,124,137,168],"number":[9,17],"of":[10,18,56,73,98,126],"output":[11],"voltage":[12,96],"levels":[13],"by":[14,159],"increasing":[15],"modules,":[20,41],"thereby":[21],"achieving":[22],"low":[23],"dv/dt":[24],"stress":[25],"and":[26,45,87,109,118,163],"good":[27],"total":[28],"harmonic":[29],"distortion":[30],"(THD).":[31],"However,":[32],"as":[33],"switching":[34,164],"devices":[35],"due":[37],"to":[38,146,152],"increased":[39],"control":[42,83],"becomes":[43],"complicated,":[44],"failure":[47],"rate":[48],"may":[49],"rise.":[50],"This":[51],"paper":[52],"analyzes":[53],"reliability":[55,119,131],"a":[57,74,81,88,130,155],"CHBMI":[58],"that":[59],"generate":[61],"27":[62],"levels,":[63],"including":[64],"failures":[65],"in":[66],"some":[67],"modules.":[69],"The":[70],"Markov":[71],"model":[72],"method":[75,158],"with":[76,90,94],"13":[77],"modules":[79,93,143],"using":[80],"swapping":[82],"algorithm":[84],"(Type":[85,114],"1)":[86],"form":[89],"3":[91],"input":[95],"sources":[97],"V":[99],"<sub":[100,105,111],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[101,106,112],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">dc</sub>":[102,107,113],",":[103,108],"3V":[104],"9V":[110],"2)":[115],"was":[116,120],"obtained,":[117],"calculated.":[121],"To":[122],"analyze":[123],"effect":[125],"redundancy":[127],"on":[128,167],"reliability,":[129],"analysis":[132],"is":[133],"also":[134],"performed":[135],"for":[136],"two":[138,141],"cases":[139],"where":[140],"are":[144],"added":[145],"Type":[147],"1.":[148],"Finally,":[149],"we":[150],"aim":[151],"help":[153],"select":[154],"27-level":[156],"comparing":[160],"economic":[161],"feasibility":[162],"loss":[165],"based":[166],"cost":[169],"model.":[170]},"counts_by_year":[{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}