{"id":"https://openalex.org/W4390872040","doi":"https://doi.org/10.1109/access.2024.3354177","title":"Low-Voltage Arc Fault Identification Using a Hybrid Method Based on Improved Salp Swarm Algorithm\u2013Variational Mode Decomposition\u2013 Random Forest","display_name":"Low-Voltage Arc Fault Identification Using a Hybrid Method Based on Improved Salp Swarm Algorithm\u2013Variational Mode Decomposition\u2013 Random Forest","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4390872040","doi":"https://doi.org/10.1109/access.2024.3354177"},"language":"en","primary_location":{"id":"doi:10.1109/access.2024.3354177","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3354177","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10399639.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10399639.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101646118","display_name":"Bin Li","orcid":"https://orcid.org/0000-0001-7885-7280"},"institutions":[{"id":"https://openalex.org/I176808543","display_name":"Liaoning Technical University","ror":"https://ror.org/01n2bd587","country_code":"CN","type":"education","lineage":["https://openalex.org/I176808543"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bin Li","raw_affiliation_strings":["School of Electrical and Control Engineering, Liaoning Technical University, Huludao, China"],"raw_orcid":"https://orcid.org/0000-0001-7885-7280","affiliations":[{"raw_affiliation_string":"School of Electrical and Control Engineering, Liaoning Technical University, Huludao, China","institution_ids":["https://openalex.org/I176808543"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103237370","display_name":"Jinglong Wu","orcid":"https://orcid.org/0009-0003-5535-1182"},"institutions":[{"id":"https://openalex.org/I176808543","display_name":"Liaoning Technical University","ror":"https://ror.org/01n2bd587","country_code":"CN","type":"education","lineage":["https://openalex.org/I176808543"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jinglong Wu","raw_affiliation_strings":["School of Electrical and Control Engineering, Liaoning Technical University, Huludao, China"],"raw_orcid":"https://orcid.org/0009-0003-5535-1182","affiliations":[{"raw_affiliation_string":"School of Electrical and Control Engineering, Liaoning Technical University, Huludao, China","institution_ids":["https://openalex.org/I176808543"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I176808543"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":1.7308,"has_fulltext":true,"cited_by_count":10,"citation_normalized_percentile":{"value":0.83758955,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"12","issue":null,"first_page":"15410","last_page":"15418"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9922999739646912,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10809","display_name":"Occupational Health and Safety Research","score":0.973800003528595,"subfield":{"id":"https://openalex.org/subfields/3614","display_name":"Radiological and Ultrasound Technology"},"field":{"id":"https://openalex.org/fields/36","display_name":"Health Professions"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.6626037359237671},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.6471068263053894},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.577713131904602},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4908507466316223},{"id":"https://openalex.org/keywords/hilbert\u2013huang-transform","display_name":"Hilbert\u2013Huang transform","score":0.4636918306350708},{"id":"https://openalex.org/keywords/random-forest","display_name":"Random forest","score":0.46045592427253723},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.44479745626449585},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4414251446723938},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.44002461433410645},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.4051869213581085},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.30528295040130615},{"id":"https://openalex.org/keywords/white-noise","display_name":"White noise","score":0.1299452781677246}],"concepts":[{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.6626037359237671},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.6471068263053894},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.577713131904602},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4908507466316223},{"id":"https://openalex.org/C25570617","wikidata":"https://www.wikidata.org/wiki/Q1006462","display_name":"Hilbert\u2013Huang transform","level":3,"score":0.4636918306350708},{"id":"https://openalex.org/C169258074","wikidata":"https://www.wikidata.org/wiki/Q245748","display_name":"Random forest","level":2,"score":0.46045592427253723},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.44479745626449585},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4414251446723938},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.44002461433410645},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4051869213581085},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.30528295040130615},{"id":"https://openalex.org/C112633086","wikidata":"https://www.wikidata.org/wiki/Q381287","display_name":"White noise","level":2,"score":0.1299452781677246},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2024.3354177","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3354177","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10399639.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:b08a36cb9854434ab34819b9aa9c9096","is_oa":true,"landing_page_url":"https://doaj.org/article/b08a36cb9854434ab34819b9aa9c9096","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 12, Pp 15410-15418 (2024)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2024.3354177","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3354177","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10399639.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Life in Land","score":0.6399999856948853,"id":"https://metadata.un.org/sdg/15"}],"awards":[{"id":"https://openalex.org/G4926490894","display_name":"\u77ff\u7528\u7535\u8fde\u63a5\u5668\u6545\u969c\u7535\u5f27\u4fe1\u53f7\u7279\u5f81\u53ca\u5176\u68c0\u6d4b\u65b9\u6cd5\u7814\u7a76","funder_award_id":"51674136","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6293096046","display_name":null,"funder_award_id":"20160019T","funder_id":"https://openalex.org/F4320325567","funder_display_name":"Liaoning Technical University"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320325567","display_name":"Liaoning Technical University","ror":"https://ror.org/01n2bd587"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4390872040.pdf","grobid_xml":"https://content.openalex.org/works/W4390872040.grobid-xml"},"referenced_works_count":40,"referenced_works":["https://openalex.org/W2000982976","https://openalex.org/W2039629833","https://openalex.org/W2046723010","https://openalex.org/W2124426982","https://openalex.org/W2572569838","https://openalex.org/W2755382782","https://openalex.org/W2799599955","https://openalex.org/W2914798213","https://openalex.org/W2943947171","https://openalex.org/W2969526674","https://openalex.org/W2980153045","https://openalex.org/W2982328364","https://openalex.org/W2996455563","https://openalex.org/W2998636431","https://openalex.org/W3008261766","https://openalex.org/W3047833017","https://openalex.org/W3083242752","https://openalex.org/W3090166999","https://openalex.org/W3091964688","https://openalex.org/W3109321937","https://openalex.org/W3115927263","https://openalex.org/W3119697583","https://openalex.org/W3158982562","https://openalex.org/W3161461318","https://openalex.org/W3181377088","https://openalex.org/W3190171433","https://openalex.org/W3204138030","https://openalex.org/W3215850420","https://openalex.org/W4205218586","https://openalex.org/W4226068325","https://openalex.org/W4226367113","https://openalex.org/W4226462879","https://openalex.org/W4226476518","https://openalex.org/W4280497090","https://openalex.org/W4311807129","https://openalex.org/W4312309054","https://openalex.org/W4312417992","https://openalex.org/W4319459285","https://openalex.org/W4385347085","https://openalex.org/W4387415013"],"related_works":["https://openalex.org/W3014107421","https://openalex.org/W2363056446","https://openalex.org/W2081563414","https://openalex.org/W2359718298","https://openalex.org/W2377062149","https://openalex.org/W2380939102","https://openalex.org/W154554909","https://openalex.org/W2578404781","https://openalex.org/W2361368121","https://openalex.org/W2065965834"],"abstract_inverted_index":{"The":[0,82],"current":[1,60,67],"of":[2,28,59,66,79],"the":[3,11,15,26,33,57,63,77,95,102,110,116,126,132,147],"residential":[4],"series":[5],"arc":[6,34,80,133],"fault":[7,16,29,35,117,134],"is":[8,19,53,85,106,150],"affected":[9],"by":[10],"load":[12],"type,":[13],"and":[14,22,69,98,118,143,146],"feature":[17,96],"change":[18],"not":[20,120],"obvious":[21],"contains":[23],"noise.":[24],"Therefore,":[25],"extraction":[27],"features":[30],"will":[31],"affect":[32],"detection":[36,148],"results.":[37],"To":[38],"solve":[39],"this":[40],"problem,":[41],"an":[42],"improved":[43],"salp":[44],"swarm":[45],"optimization":[46],"algorithm":[47,84],"combined":[48],"with":[49],"variational":[50],"mode":[51],"decomposition":[52,64],"proposed":[54],"to":[55,87,93,108],"extract":[56],"characteristics":[58,78],"signal,":[61,68],"improve":[62],"effect":[65],"construct":[70],"a":[71],"dataset":[72],"that":[73,131],"can":[74,113,135],"fully":[75],"reflect":[76],"fault.":[81],"ReliefF":[83],"designed":[86],"combine":[88],"minimum":[89],"redundancy":[90],"maximum":[91],"relevance":[92],"reduce":[94],"dimension":[97],"eliminate":[99],"redundancy.":[100],"Finally,":[101],"random":[103],"forest":[104],"model":[105],"used":[107],"diagnose":[109],"fault,":[111],"which":[112],"quickly":[114,137],"detect":[115],"does":[119],"cause":[121],"over-fitting.":[122],"Experiments":[123],"based":[124],"on":[125],"self-built":[127],"sample":[128],"set":[129],"prove":[130],"be":[136],"detected":[138],"under":[139],"different":[140],"acquisition":[141],"frequencies":[142],"noise":[144],"environments,":[145],"rate":[149],"more":[151],"than":[152],"95%.":[153]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2024-01-16T00:00:00"}