{"id":"https://openalex.org/W4390204343","doi":"https://doi.org/10.1109/access.2023.3347425","title":"Detection of Series Arcs in Low-Voltage AC Power Lines Using Load Side Voltage Sag and Waveform Similarity Comparison","display_name":"Detection of Series Arcs in Low-Voltage AC Power Lines Using Load Side Voltage Sag and Waveform Similarity Comparison","publication_year":2023,"publication_date":"2023-12-25","ids":{"openalex":"https://openalex.org/W4390204343","doi":"https://doi.org/10.1109/access.2023.3347425"},"language":"en","primary_location":{"id":"doi:10.1109/access.2023.3347425","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3347425","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10374021.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10374021.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5061253156","display_name":"Kaijie Wang","orcid":"https://orcid.org/0009-0005-2020-6385"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kaijie Wang","raw_affiliation_strings":["State Key Laboratory of Advanced Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China","School of Electrical and Electronic Engineering, State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Huazhong University of Science and Technology, Wuhan, China"],"raw_orcid":"https://orcid.org/0009-0005-2020-6385","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Advanced Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]},{"raw_affiliation_string":"School of Electrical and Electronic Engineering, State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100398299","display_name":"Xiangning Lin","orcid":"https://orcid.org/0009-0009-1000-8552"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiangning Lin","raw_affiliation_strings":["State Key Laboratory of Advanced Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China","School of Electrical and Electronic Engineering, State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Huazhong University of Science and Technology, Wuhan, China"],"raw_orcid":"https://orcid.org/0009-0009-1000-8552","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Advanced Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]},{"raw_affiliation_string":"School of Electrical and Electronic Engineering, State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080872963","display_name":"Fanrong Wei","orcid":"https://orcid.org/0000-0003-4889-6355"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fanrong Wei","raw_affiliation_strings":["State Key Laboratory of Advanced Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China","School of Electrical and Electronic Engineering, State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Huazhong University of Science and Technology, Wuhan, China"],"raw_orcid":"https://orcid.org/0000-0003-4889-6355","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Advanced Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]},{"raw_affiliation_string":"School of Electrical and Electronic Engineering, State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5067038710","display_name":"Wei Hu","orcid":"https://orcid.org/0000-0002-9767-548X"},"institutions":[{"id":"https://openalex.org/I17442442","display_name":"State Grid Corporation of China (China)","ror":"https://ror.org/05twwhs70","country_code":"CN","type":"company","lineage":["https://openalex.org/I17442442"]},{"id":"https://openalex.org/I4387152397","display_name":"State Grid Hebei Electric Power Company","ror":"https://ror.org/02v4yxp84","country_code":null,"type":"company","lineage":["https://openalex.org/I4387152397"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hu Wei","raw_affiliation_strings":["State Grid Hubei Electric Power Research Institute, State Grid Hubei Electric Power Company Ltd., Wuhan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Grid Hubei Electric Power Research Institute, State Grid Hubei Electric Power Company Ltd., Wuhan, China","institution_ids":["https://openalex.org/I17442442","https://openalex.org/I4387152397"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2075,"currency":"USD","value_usd":2075},"apc_paid":{"value":2075,"currency":"USD","value_usd":2075},"fwci":0.4189,"has_fulltext":true,"cited_by_count":5,"citation_normalized_percentile":{"value":0.56307428,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":"12","issue":null,"first_page":"1483","last_page":"1496"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":0.9607999920845032,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.867057740688324},{"id":"https://openalex.org/keywords/voltage-sag","display_name":"Voltage sag","score":0.7199594378471375},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6508110761642456},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6359509229660034},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.5096383094787598},{"id":"https://openalex.org/keywords/hausdorff-distance","display_name":"Hausdorff distance","score":0.47470512986183167},{"id":"https://openalex.org/keywords/arc","display_name":"Arc (geometry)","score":0.4602877199649811},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.45147648453712463},{"id":"https://openalex.org/keywords/distortion","display_name":"Distortion (music)","score":0.4434624910354614},{"id":"https://openalex.org/keywords/similarity","display_name":"Similarity (geometry)","score":0.4367815852165222},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3745366632938385},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.300967276096344},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20661035180091858},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1790933609008789},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.15036210417747498},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.10417291522026062},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.0961134135723114},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.08532056212425232},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.06930378079414368},{"id":"https://openalex.org/keywords/power-quality","display_name":"Power quality","score":0.06411853432655334}],"concepts":[{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.867057740688324},{"id":"https://openalex.org/C2781134633","wikidata":"https://www.wikidata.org/wiki/Q14945479","display_name":"Voltage sag","level":4,"score":0.7199594378471375},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6508110761642456},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6359509229660034},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.5096383094787598},{"id":"https://openalex.org/C141898687","wikidata":"https://www.wikidata.org/wiki/Q1501997","display_name":"Hausdorff distance","level":2,"score":0.47470512986183167},{"id":"https://openalex.org/C83415579","wikidata":"https://www.wikidata.org/wiki/Q161973","display_name":"Arc (geometry)","level":2,"score":0.4602877199649811},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.45147648453712463},{"id":"https://openalex.org/C126780896","wikidata":"https://www.wikidata.org/wiki/Q899871","display_name":"Distortion (music)","level":4,"score":0.4434624910354614},{"id":"https://openalex.org/C103278499","wikidata":"https://www.wikidata.org/wiki/Q254465","display_name":"Similarity (geometry)","level":3,"score":0.4367815852165222},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3745366632938385},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.300967276096344},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20661035180091858},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1790933609008789},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.15036210417747498},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.10417291522026062},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0961134135723114},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.08532056212425232},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.06930378079414368},{"id":"https://openalex.org/C2779665505","wikidata":"https://www.wikidata.org/wiki/Q1780079","display_name":"Power quality","level":3,"score":0.06411853432655334},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2023.3347425","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3347425","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10374021.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:9fc62f0d362643c980405279af5c3e09","is_oa":true,"landing_page_url":"https://doaj.org/article/9fc62f0d362643c980405279af5c3e09","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 12, Pp 1483-1496 (2024)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2023.3347425","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3347425","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10374021.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1302193530","display_name":null,"funder_award_id":"2022YFE0120400","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"}],"funders":[{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4390204343.pdf","grobid_xml":"https://content.openalex.org/works/W4390204343.grobid-xml"},"referenced_works_count":23,"referenced_works":["https://openalex.org/W1492285446","https://openalex.org/W1829376396","https://openalex.org/W1978443272","https://openalex.org/W1998064754","https://openalex.org/W1998508081","https://openalex.org/W2008501409","https://openalex.org/W2014477082","https://openalex.org/W2082553827","https://openalex.org/W2118239632","https://openalex.org/W2136359393","https://openalex.org/W2477223685","https://openalex.org/W2542274068","https://openalex.org/W2572569838","https://openalex.org/W2947981924","https://openalex.org/W2966616969","https://openalex.org/W2980153045","https://openalex.org/W3119697583","https://openalex.org/W3161461318","https://openalex.org/W3173963592","https://openalex.org/W3209387760","https://openalex.org/W4280609768","https://openalex.org/W4378805016","https://openalex.org/W4384472178"],"related_works":["https://openalex.org/W3035563736","https://openalex.org/W3035889754","https://openalex.org/W1956246598","https://openalex.org/W2576844470","https://openalex.org/W2507979646","https://openalex.org/W1974895211","https://openalex.org/W1974719707","https://openalex.org/W2359435744","https://openalex.org/W2176409448","https://openalex.org/W2129841057"],"abstract_inverted_index":{"Aim":[0],"at":[1],"problems":[2],"that":[3,42,47,137],"the":[4,40,60,79,86,89,96,102,122,138,143,149],"similarity":[5],"between":[6],"series":[7],"arc":[8,18,24,57,72],"fault":[9,19,36,73,139],"current":[10,25],"waveform":[11,16,65,108],"and":[12,128],"nonlinear":[13],"load":[14,52,80,105],"currents":[15],"causes":[17],"identification":[20,140],"methods":[21],"based":[22,38],"on":[23,39,117],"to":[26,29,126,132],"be":[27],"prone":[28],"misjudgment.":[30],"This":[31],"paper":[32,68],"established":[33],"a":[34,70],"unified":[35],"criterion":[37,63],"conclusion":[41],"different":[43,119],"types":[44],"of":[45,51,104,142],"loads":[46],"exhibit":[48],"similar":[49],"magnitudes":[50],"side":[53,81,106],"voltage":[54,61,82,107,123],"sag":[55,62,83,124],"during":[56],"faults.":[58],"Combined":[59],"with":[64],"criteria,":[66],"this":[67],"proposed":[69,144],"novel":[71],"detection":[74,90,94],"method.":[75],"The":[76],"method":[77,97,145],"takes":[78],"value":[84],"exceeding":[85],"threshold":[87,125,131],"as":[88],"start":[91],"condition.":[92],"After":[93],"starts,":[95],"identifies":[98],"faults":[99],"by":[100],"calculating":[101],"degree":[103],"distortion":[109],"using":[110],"Hausdorff":[111,129],"distance":[112,130],"algorithm.":[113],"Simulations":[114],"were":[115],"conducted":[116],"five":[118],"loads,":[120],"setting":[121],"10.8V":[127],"39.26.":[133],"Test":[134],"results":[135],"show":[136],"accuracy":[141],"is":[146],"100%":[147],"under":[148],"above":[150],"thresholds.":[151]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":2}],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2025-10-10T00:00:00"}