{"id":"https://openalex.org/W4389776687","doi":"https://doi.org/10.1109/access.2023.3343566","title":"PDDD-Net: Defect Detection Network Based on Parallel Attention Mechanism and Dual-Channel Spatial Pyramid Pooling","display_name":"PDDD-Net: Defect Detection Network Based on Parallel Attention Mechanism and Dual-Channel Spatial Pyramid Pooling","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4389776687","doi":"https://doi.org/10.1109/access.2023.3343566"},"language":"en","primary_location":{"id":"doi:10.1109/access.2023.3343566","is_oa":true,"landing_page_url":"http://dx.doi.org/10.1109/access.2023.3343566","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/10360803.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/10360803.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5001641450","display_name":"Tingting Sui","orcid":"https://orcid.org/0000-0003-3230-7181"},"institutions":[{"id":"https://openalex.org/I4210156189","display_name":"Shanghai Dianji University","ror":"https://ror.org/055fene14","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210156189"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tingting Sui","raw_affiliation_strings":["School of Electronic Information Engineering, Shanghai Dianji University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0003-3230-7181","affiliations":[{"raw_affiliation_string":"School of Electronic Information Engineering, Shanghai Dianji University, Shanghai, China","institution_ids":["https://openalex.org/I4210156189"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5063689343","display_name":"Junwen Wang","orcid":"https://orcid.org/0009-0001-5804-5952"},"institutions":[{"id":"https://openalex.org/I4210156189","display_name":"Shanghai Dianji University","ror":"https://ror.org/055fene14","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210156189"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Junwen Wang","raw_affiliation_strings":["School of Electronic Information Engineering, Shanghai Dianji University, Shanghai, China"],"raw_orcid":"https://orcid.org/0009-0001-5804-5952","affiliations":[{"raw_affiliation_string":"School of Electronic Information Engineering, Shanghai Dianji University, Shanghai, China","institution_ids":["https://openalex.org/I4210156189"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210156189"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":1.2352,"has_fulltext":true,"cited_by_count":7,"citation_normalized_percentile":{"value":0.82888535,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":"11","issue":null,"first_page":"141764","last_page":"141775"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9959999918937683,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","score":0.9904000163078308,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/pooling","display_name":"Pooling","score":0.7904301881790161},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6995433568954468},{"id":"https://openalex.org/keywords/dual","display_name":"Dual (grammatical number)","score":0.6555798053741455},{"id":"https://openalex.org/keywords/pyramid","display_name":"Pyramid (geometry)","score":0.6200879216194153},{"id":"https://openalex.org/keywords/mechanism","display_name":"Mechanism (biology)","score":0.5153100490570068},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.45185792446136475},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.3852870464324951},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2711048722267151}],"concepts":[{"id":"https://openalex.org/C70437156","wikidata":"https://www.wikidata.org/wiki/Q7228652","display_name":"Pooling","level":2,"score":0.7904301881790161},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6995433568954468},{"id":"https://openalex.org/C2780980858","wikidata":"https://www.wikidata.org/wiki/Q110022","display_name":"Dual (grammatical number)","level":2,"score":0.6555798053741455},{"id":"https://openalex.org/C142575187","wikidata":"https://www.wikidata.org/wiki/Q3358290","display_name":"Pyramid (geometry)","level":2,"score":0.6200879216194153},{"id":"https://openalex.org/C89611455","wikidata":"https://www.wikidata.org/wiki/Q6804646","display_name":"Mechanism (biology)","level":2,"score":0.5153100490570068},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.45185792446136475},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.3852870464324951},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2711048722267151},{"id":"https://openalex.org/C124952713","wikidata":"https://www.wikidata.org/wiki/Q8242","display_name":"Literature","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2023.3343566","is_oa":true,"landing_page_url":"http://dx.doi.org/10.1109/access.2023.3343566","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/10360803.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:97176822e2794da79a8ccebe72034e11","is_oa":true,"landing_page_url":"https://doaj.org/article/97176822e2794da79a8ccebe72034e11","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 11, Pp 141764-141775 (2023)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2023.3343566","is_oa":true,"landing_page_url":"http://dx.doi.org/10.1109/access.2023.3343566","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/10005208/10360803.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G8684941703","display_name":null,"funder_award_id":"62103256","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4389776687.pdf","grobid_xml":"https://content.openalex.org/works/W4389776687.grobid-xml"},"referenced_works_count":46,"referenced_works":["https://openalex.org/W639708223","https://openalex.org/W1536680647","https://openalex.org/W2194775991","https://openalex.org/W2395611524","https://openalex.org/W2736973763","https://openalex.org/W2749684264","https://openalex.org/W2890751655","https://openalex.org/W2942285390","https://openalex.org/W2963037989","https://openalex.org/W2995283502","https://openalex.org/W2996788140","https://openalex.org/W3002587966","https://openalex.org/W3038952158","https://openalex.org/W3042764728","https://openalex.org/W3095853238","https://openalex.org/W3134724146","https://openalex.org/W3144663136","https://openalex.org/W3169323098","https://openalex.org/W3185152376","https://openalex.org/W3193024002","https://openalex.org/W3203426363","https://openalex.org/W3211193475","https://openalex.org/W4205386222","https://openalex.org/W4206391615","https://openalex.org/W4210960074","https://openalex.org/W4211121640","https://openalex.org/W4212965978","https://openalex.org/W4221015133","https://openalex.org/W4221094905","https://openalex.org/W4223589460","https://openalex.org/W4280510473","https://openalex.org/W4282935471","https://openalex.org/W4303987279","https://openalex.org/W4306392845","https://openalex.org/W4312161594","https://openalex.org/W4312368313","https://openalex.org/W4313216534","https://openalex.org/W4313398501","https://openalex.org/W4327967895","https://openalex.org/W4367016422","https://openalex.org/W4380992193","https://openalex.org/W4382982661","https://openalex.org/W4383333670","https://openalex.org/W4383502628","https://openalex.org/W4386597063","https://openalex.org/W4387348170"],"related_works":["https://openalex.org/W2953234277","https://openalex.org/W2022849497","https://openalex.org/W3081299480","https://openalex.org/W2407190427","https://openalex.org/W2919210741","https://openalex.org/W2907584218","https://openalex.org/W3002446410","https://openalex.org/W4390224712","https://openalex.org/W4322096758","https://openalex.org/W2952912015"],"abstract_inverted_index":{"Owing":[0],"to":[1,63,78,83,106,114,132,142],"the":[2,6,65,73,91,101,108,120,134,152,155,163,174],"small":[3,69],"size":[4],"of":[5,94,119],"defect":[7,27,52,70,121,180],"pixel":[8],"area":[9],"and":[10,19,32,43,89,162],"poor":[11],"defect-background":[12],"contrast":[13],"issues":[14],"in":[15,59,140],"industrial":[16],"images,":[17],"noise":[18],"missed":[20,144],"detection":[21,28,53,66,92,181,187],"can":[22],"easily":[23],"occur.":[24],"Therefore,":[25],"automated":[26],"is":[29,57,76,104,130],"both":[30],"necessary":[31],"challenging.":[33],"To":[34],"address":[35],"these":[36],"issues,":[37],"with":[38,184],"parallel":[39],"attention":[40],"mechanism":[41],"(PAM)":[42],"dual-channel":[44],"spatial":[45,110],"pyramid":[46,111],"pooling-fast":[47,112],"block":[48,75,103,113],"(DC_SPPF),":[49],"a":[50],"novel":[51],"network,":[54],"namely,":[55],"PDDD-Net,":[56],"proposed":[58,77,105,175],"this":[60],"paper.":[61],"First,":[62],"make":[64],"network":[67,177],"emphasize":[68],"areas":[71],"better,":[72],"PAM":[74],"be":[79],"embedded":[80],"into":[81],"YOLOv5":[82,141],"obtain":[84],"more":[85],"low-level":[86],"visual":[87],"features":[88,118],"improve":[90],"accuracy":[93],"microdefects.":[95],"Meanwhile,":[96],"by":[97],"fusing":[98],"multi-channel":[99],"features,":[100],"DC_SPPF":[102],"replace":[107],"raw":[109],"acquire":[115],"richer":[116],"discriminative":[117],"areas.":[122],"Finally,":[123],"The":[124,169],"soft":[125],"non-maximum":[126],"suppression":[127],"(Soft-NMS)":[128],"module":[129],"used":[131],"undertake":[133],"feature":[135],"candidate":[136],"box":[137],"filtering":[138],"task":[139],"reduce":[143],"detection.":[145],"Two":[146],"public":[147],"datasets":[148],"are":[149],"adopted":[150],"for":[151],"model":[153],"evaluation:":[154],"Tianchi":[156],"aluminum":[157],"profile":[158],"defects":[159],"dataset":[160,167],"(APDDD)":[161],"power":[164],"line":[165],"insulator":[166],"(CPLID).":[168],"experimental":[170],"results":[171],"indicate":[172],"that":[173],"PDDD-Net":[176],"exhibits":[178],"remarkable":[179],"performance":[182],"compared":[183],"other":[185],"related":[186],"methods.":[188]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":2}],"updated_date":"2025-12-25T23:11:45.687758","created_date":"2025-10-10T00:00:00"}