{"id":"https://openalex.org/W4389470563","doi":"https://doi.org/10.1109/access.2023.3340618","title":"SECURE: A Segmentation Quality Evaluation Metric on SEM Images for Reverse Engineering on Integrated Circuits","display_name":"SECURE: A Segmentation Quality Evaluation Metric on SEM Images for Reverse Engineering on Integrated Circuits","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4389470563","doi":"https://doi.org/10.1109/access.2023.3340618"},"language":"en","primary_location":{"id":"doi:10.1109/access.2023.3340618","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3340618","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10347213.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10347213.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101716532","display_name":"Ronald S. Wilson","orcid":"https://orcid.org/0000-0001-6169-434X"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ronald Wilson","raw_affiliation_strings":["Florida Institute for National Security (FINS), University of Florida, Gainesville, FL, USA"],"raw_orcid":"https://orcid.org/0000-0001-6169-434X","affiliations":[{"raw_affiliation_string":"Florida Institute for National Security (FINS), University of Florida, Gainesville, FL, USA","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040726498","display_name":"Olivia P. Dizon-Paradis","orcid":"https://orcid.org/0000-0002-6879-8624"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Olivia P. Dizon-Paradis","raw_affiliation_strings":["Florida Institute for National Security (FINS), University of Florida, Gainesville, FL, USA"],"raw_orcid":"https://orcid.org/0000-0002-6879-8624","affiliations":[{"raw_affiliation_string":"Florida Institute for National Security (FINS), University of Florida, Gainesville, FL, USA","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009243659","display_name":"Domenic Forte","orcid":"https://orcid.org/0000-0002-2794-7320"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Domenic Forte","raw_affiliation_strings":["Florida Institute for National Security (FINS), University of Florida, Gainesville, FL, USA"],"raw_orcid":"https://orcid.org/0000-0002-2794-7320","affiliations":[{"raw_affiliation_string":"Florida Institute for National Security (FINS), University of Florida, Gainesville, FL, USA","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5055751228","display_name":"Damon L. Woodard","orcid":"https://orcid.org/0000-0002-0471-177X"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Damon L. Woodard","raw_affiliation_strings":["Florida Institute for National Security (FINS), University of Florida, Gainesville, FL, USA"],"raw_orcid":"https://orcid.org/0000-0002-0471-177X","affiliations":[{"raw_affiliation_string":"Florida Institute for National Security (FINS), University of Florida, Gainesville, FL, USA","institution_ids":["https://openalex.org/I33213144"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.2454,"has_fulltext":true,"cited_by_count":2,"citation_normalized_percentile":{"value":0.54885709,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":95},"biblio":{"volume":"11","issue":null,"first_page":"137798","last_page":"137809"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9886999726295471,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7883156538009644},{"id":"https://openalex.org/keywords/segmentation","display_name":"Segmentation","score":0.6753745675086975},{"id":"https://openalex.org/keywords/context","display_name":"Context (archaeology)","score":0.6659067869186401},{"id":"https://openalex.org/keywords/metric","display_name":"Metric (unit)","score":0.6490697860717773},{"id":"https://openalex.org/keywords/quality-assurance","display_name":"Quality assurance","score":0.5822458863258362},{"id":"https://openalex.org/keywords/reverse-engineering","display_name":"Reverse engineering","score":0.5457966327667236},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5227565765380859},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.4611108601093292},{"id":"https://openalex.org/keywords/workflow","display_name":"Workflow","score":0.45777106285095215},{"id":"https://openalex.org/keywords/automation","display_name":"Automation","score":0.4408782720565796},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4212830066680908},{"id":"https://openalex.org/keywords/image-segmentation","display_name":"Image segmentation","score":0.4171428084373474},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3361673951148987},{"id":"https://openalex.org/keywords/database","display_name":"Database","score":0.21622046828269958},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.09262767434120178}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7883156538009644},{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.6753745675086975},{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.6659067869186401},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.6490697860717773},{"id":"https://openalex.org/C106436119","wikidata":"https://www.wikidata.org/wiki/Q836575","display_name":"Quality assurance","level":3,"score":0.5822458863258362},{"id":"https://openalex.org/C207850805","wikidata":"https://www.wikidata.org/wiki/Q269608","display_name":"Reverse engineering","level":2,"score":0.5457966327667236},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5227565765380859},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.4611108601093292},{"id":"https://openalex.org/C177212765","wikidata":"https://www.wikidata.org/wiki/Q627335","display_name":"Workflow","level":2,"score":0.45777106285095215},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.4408782720565796},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4212830066680908},{"id":"https://openalex.org/C124504099","wikidata":"https://www.wikidata.org/wiki/Q56933","display_name":"Image segmentation","level":3,"score":0.4171428084373474},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3361673951148987},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.21622046828269958},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.09262767434120178},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C136264566","wikidata":"https://www.wikidata.org/wiki/Q159810","display_name":"Economy","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C2780378061","wikidata":"https://www.wikidata.org/wiki/Q25351891","display_name":"Service (business)","level":2,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2023.3340618","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3340618","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10347213.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:584b4a9de26c46b39938816c32778af0","is_oa":true,"landing_page_url":"https://doaj.org/article/584b4a9de26c46b39938816c32778af0","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 11, Pp 137798-137809 (2023)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2023.3340618","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3340618","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10347213.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.5899999737739563,"id":"https://metadata.un.org/sdg/8","display_name":"Decent work and economic growth"}],"awards":[{"id":"https://openalex.org/G3201655822","display_name":null,"funder_award_id":"2131480","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"}],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4389470563.pdf","grobid_xml":"https://content.openalex.org/works/W4389470563.grobid-xml"},"referenced_works_count":23,"referenced_works":["https://openalex.org/W1565539145","https://openalex.org/W1591013007","https://openalex.org/W2009009482","https://openalex.org/W2150928734","https://openalex.org/W2161998562","https://openalex.org/W2221643708","https://openalex.org/W2336864643","https://openalex.org/W2790110459","https://openalex.org/W2799706597","https://openalex.org/W2889428515","https://openalex.org/W2904881001","https://openalex.org/W2936917976","https://openalex.org/W2942856793","https://openalex.org/W2965818883","https://openalex.org/W2996913104","https://openalex.org/W3023117289","https://openalex.org/W3119128204","https://openalex.org/W3176686472","https://openalex.org/W3200448432","https://openalex.org/W4234446968","https://openalex.org/W4361868121","https://openalex.org/W4386859020","https://openalex.org/W6777116346"],"related_works":["https://openalex.org/W2363831530","https://openalex.org/W2363845219","https://openalex.org/W2381057835","https://openalex.org/W1789649838","https://openalex.org/W1981780420","https://openalex.org/W2182707996","https://openalex.org/W2051831113","https://openalex.org/W1984362519","https://openalex.org/W45233828","https://openalex.org/W2964988449"],"abstract_inverted_index":{"Comprehensive":[0],"hardware":[1,46,151],"assurance":[2,47,152],"and":[3,35,42,66,91,161],"failure":[4],"analysis":[5],"methods":[6],"require":[7],"exhaustive":[8],"validation":[9,130,163],"of":[10,26,32,54,111,137,149,170],"the":[11,45,57,62,75,127,142,147,150,168,171],"design":[12,112,128],"layout":[13,113,129],"through":[14],"post-silicon":[15],"imaging.":[16],"Overlooked":[17],"segmentation":[18,59,68,79],"errors":[19],"in":[20,30,44],"such":[21],"images":[22,140],"cause":[23],"significant":[24],"inflation":[25],"resource":[27],"requirements,":[28],"both":[29],"terms":[31],"human":[33],"resources":[34],"process":[36,153,157],"time":[37],"frame,":[38],"for":[39,83,94,132],"fault":[40],"isolation":[41],"debugging":[43],"process.":[48],"Further,":[49],"due":[50],"to":[51,64,102,166],"their":[52],"lack":[53,61],"contextual":[55],"awareness,":[56],"existing":[58],"measures":[60],"ability":[63],"detect":[65],"suppress":[67],"errors.":[69],"In":[70],"this":[71,104],"paper,":[72],"we":[73],"introduce":[74],"first":[76],"reference-less":[77],"context-aware":[78],"quality":[80],"evaluation":[81],"metric":[82,121],"scanning":[84],"electron":[85],"microscopy":[86],"images,":[87],"called":[88],"Structural":[89],"Equivalency":[90],"Connection":[92],"Uniformity":[93],"Reverse":[95],"Engineering":[96],"(":[97],"<italic":[98],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[99],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">SECURE</i>":[100],"),":[101],"alleviate":[103],"issue":[105],"by":[106],"capturing":[107],"an":[108],"implicit":[109],"understanding":[110],"from":[114,145],"weakly":[115],"labeled":[116],"unpaired":[117],"images.":[118],"The":[119],"proposed":[120],"can":[122],"be":[123],"seamlessly":[124],"integrated":[125],"into":[126],"workflow":[131],"in-line":[133],"rejection":[134],"or":[135],"correction":[136],"corrupted":[138,143],"segmented":[139],"preventing":[141],"data":[144],"compromising":[146],"reliability":[148],"while":[154],"simultaneously":[155],"supporting":[156],"automation.":[158],"Exhaustive":[159],"qualitative":[160],"quantitative":[162],"is":[164],"provided":[165],"support":[167],"efficacy":[169],"metric.":[172]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}