{"id":"https://openalex.org/W4389169778","doi":"https://doi.org/10.1109/access.2023.3338536","title":"Quantitative Shape Discrimination of Metal Surface Defects Based on Alternating Current Field Measurement","display_name":"Quantitative Shape Discrimination of Metal Surface Defects Based on Alternating Current Field Measurement","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4389169778","doi":"https://doi.org/10.1109/access.2023.3338536"},"language":"en","primary_location":{"id":"doi:10.1109/access.2023.3338536","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3338536","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10336762.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10336762.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5082038581","display_name":"Zhiqiang Song","orcid":"https://orcid.org/0009-0000-5120-3447"},"institutions":[{"id":"https://openalex.org/I77631543","display_name":"Wuxi Institute of Technology","ror":"https://ror.org/00ab95029","country_code":"CN","type":"education","lineage":["https://openalex.org/I77631543"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Zhiqiang Song","raw_affiliation_strings":["School of Automation, Wuxi University, Jiangsu, Wuxi, China","School of Automation, Wuxi University, Wuxi, Jiangsu, China"],"raw_orcid":"https://orcid.org/0009-0000-5120-3447","affiliations":[{"raw_affiliation_string":"School of Automation, Wuxi University, Jiangsu, Wuxi, China","institution_ids":["https://openalex.org/I77631543"]},{"raw_affiliation_string":"School of Automation, Wuxi University, Wuxi, Jiangsu, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034592798","display_name":"R. Hou","orcid":"https://orcid.org/0009-0006-5601-3590"},"institutions":[{"id":"https://openalex.org/I77631543","display_name":"Wuxi Institute of Technology","ror":"https://ror.org/00ab95029","country_code":"CN","type":"education","lineage":["https://openalex.org/I77631543"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Rongxi Hou","raw_affiliation_strings":["School of Automation, Wuxi University, Jiangsu, Wuxi, China","School of Automation, Wuxi University, Wuxi, Jiangsu, China"],"raw_orcid":"https://orcid.org/0009-0006-5601-3590","affiliations":[{"raw_affiliation_string":"School of Automation, Wuxi University, Jiangsu, Wuxi, China","institution_ids":["https://openalex.org/I77631543"]},{"raw_affiliation_string":"School of Automation, Wuxi University, Wuxi, Jiangsu, China","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102961988","display_name":"Feng Jiang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210108723","display_name":"Changzhou Institute of Technology","ror":"https://ror.org/020mrfq61","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210108723"]},{"id":"https://openalex.org/I77631543","display_name":"Wuxi Institute of Technology","ror":"https://ror.org/00ab95029","country_code":"CN","type":"education","lineage":["https://openalex.org/I77631543"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Feng Jiang","raw_affiliation_strings":["School of Automation, Wuxi University, Jiangsu, Wuxi, China","School of Automation, Wuxi University, Wuxi, Jiangsu, China","School of Electrical and Information Engineering, Changzhou Institute of Technology, Changzhou, Jiangsu, China"],"raw_orcid":"https://orcid.org/0009-0009-3184-594X","affiliations":[{"raw_affiliation_string":"School of Automation, Wuxi University, Jiangsu, Wuxi, China","institution_ids":["https://openalex.org/I77631543"]},{"raw_affiliation_string":"School of Automation, Wuxi University, Wuxi, Jiangsu, China","institution_ids":[]},{"raw_affiliation_string":"School of Electrical and Information Engineering, Changzhou Institute of Technology, Changzhou, Jiangsu, China","institution_ids":["https://openalex.org/I4210108723"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5082038581"],"corresponding_institution_ids":["https://openalex.org/I77631543"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.16396256,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"11","issue":null,"first_page":"136577","last_page":"136589"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/eddy-current","display_name":"Eddy current","score":0.6851085424423218},{"id":"https://openalex.org/keywords/magnetic-field","display_name":"Magnetic field","score":0.6445150971412659},{"id":"https://openalex.org/keywords/eddy-current-testing","display_name":"Eddy-current testing","score":0.6252577900886536},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.5577775239944458},{"id":"https://openalex.org/keywords/nondestructive-testing","display_name":"Nondestructive testing","score":0.5524307489395142},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.5515338778495789},{"id":"https://openalex.org/keywords/surface","display_name":"Surface (topology)","score":0.5301690101623535},{"id":"https://openalex.org/keywords/electric-field","display_name":"Electric field","score":0.505779504776001},{"id":"https://openalex.org/keywords/signal-processing","display_name":"Signal processing","score":0.4728337228298187},{"id":"https://openalex.org/keywords/finite-element-method","display_name":"Finite element method","score":0.45875290036201477},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.45653682947158813},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3904150128364563},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3739010691642761},{"id":"https://openalex.org/keywords/nuclear-magnetic-resonance","display_name":"Nuclear magnetic resonance","score":0.3433539867401123},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3388693630695343},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3180791735649109},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.23280423879623413},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.20742568373680115},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.13994571566581726},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.113715261220932}],"concepts":[{"id":"https://openalex.org/C131357438","wikidata":"https://www.wikidata.org/wiki/Q208598","display_name":"Eddy current","level":2,"score":0.6851085424423218},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.6445150971412659},{"id":"https://openalex.org/C6441794","wikidata":"https://www.wikidata.org/wiki/Q1420867","display_name":"Eddy-current testing","level":3,"score":0.6252577900886536},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.5577775239944458},{"id":"https://openalex.org/C56529433","wikidata":"https://www.wikidata.org/wiki/Q626700","display_name":"Nondestructive testing","level":2,"score":0.5524307489395142},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.5515338778495789},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.5301690101623535},{"id":"https://openalex.org/C60799052","wikidata":"https://www.wikidata.org/wiki/Q46221","display_name":"Electric field","level":2,"score":0.505779504776001},{"id":"https://openalex.org/C104267543","wikidata":"https://www.wikidata.org/wiki/Q208163","display_name":"Signal processing","level":3,"score":0.4728337228298187},{"id":"https://openalex.org/C135628077","wikidata":"https://www.wikidata.org/wiki/Q220184","display_name":"Finite element method","level":2,"score":0.45875290036201477},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.45653682947158813},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3904150128364563},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3739010691642761},{"id":"https://openalex.org/C46141821","wikidata":"https://www.wikidata.org/wiki/Q209402","display_name":"Nuclear magnetic resonance","level":1,"score":0.3433539867401123},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3388693630695343},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3180791735649109},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.23280423879623413},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.20742568373680115},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.13994571566581726},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.113715261220932},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2023.3338536","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3338536","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10336762.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:c333dc11627e4436b432255668cc4345","is_oa":true,"landing_page_url":"https://doaj.org/article/c333dc11627e4436b432255668cc4345","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 11, Pp 136577-136589 (2023)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2023.3338536","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2023.3338536","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10336762.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/10","display_name":"Reduced inequalities","score":0.5},{"id":"https://metadata.un.org/sdg/16","display_name":"Peace, Justice and strong institutions","score":0.47999998927116394}],"awards":[{"id":"https://openalex.org/G4838026181","display_name":null,"funder_award_id":"21KJA470003","funder_id":"https://openalex.org/F4320322769","funder_display_name":"Natural Science Foundation of Jiangsu Province"}],"funders":[{"id":"https://openalex.org/F4320321410","display_name":"Jiangsu University","ror":"https://ror.org/03jc41j30"},{"id":"https://openalex.org/F4320321605","display_name":"Government of Jiangsu Province","ror":"https://ror.org/004svx814"},{"id":"https://openalex.org/F4320322769","display_name":"Natural Science Foundation of Jiangsu Province","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4389169778.pdf","grobid_xml":"https://content.openalex.org/works/W4389169778.grobid-xml"},"referenced_works_count":20,"referenced_works":["https://openalex.org/W1480560153","https://openalex.org/W2008920555","https://openalex.org/W2024378658","https://openalex.org/W2129620089","https://openalex.org/W2286500549","https://openalex.org/W2299561968","https://openalex.org/W2523654185","https://openalex.org/W2790269345","https://openalex.org/W2900814507","https://openalex.org/W2915310138","https://openalex.org/W2944401305","https://openalex.org/W2946109102","https://openalex.org/W2971868094","https://openalex.org/W2978930494","https://openalex.org/W3193446740","https://openalex.org/W3206046099","https://openalex.org/W4224034954","https://openalex.org/W4280490400","https://openalex.org/W4385201757","https://openalex.org/W4386220223"],"related_works":["https://openalex.org/W2744634501","https://openalex.org/W2085805524","https://openalex.org/W2003522138","https://openalex.org/W2551942315","https://openalex.org/W2333795440","https://openalex.org/W2369672268","https://openalex.org/W1680801918","https://openalex.org/W2102849516","https://openalex.org/W1972402538","https://openalex.org/W4230069654"],"abstract_inverted_index":{"Quantitative":[0],"evaluation":[1,17,197],"of":[2,22,51,65,76,98,123,127,137,157,174,199],"defects":[3,25,77,129,138],"is":[4,33,40,59,78],"an":[5],"important":[6],"research":[7],"topic":[8],"in":[9,96,103,114],"non-destructive":[10],"testing.":[11],"In":[12],"this":[13],"paper,":[14],"a":[15,184],"quantitative":[16],"method":[18,39,182],"for":[19,120],"the":[20,44,52,63,73,83,134,145,164,172,195],"shape":[21,75,136,156],"metal":[23,200],"surface":[24,64,128,155],"based":[26],"on":[27],"alternating":[28],"current":[29,100,111],"field":[30,46,49,86,147],"measurement":[31],"technology":[32],"proposed.":[34],"The":[35,55,88,125,154],"finite":[36],"element":[37],"numerical":[38],"used":[41,60],"to":[42,61,69,82,106],"simulate":[43],"electric":[45],"and":[47,72,109,133,177,187],"magnetic":[48,85,101,112,146],"environment":[50],"test":[53],"system.":[54],"rectangular":[56],"probe":[57],"structure":[58],"scan":[62],"measured":[66],"object":[67],"according":[68,81],"designed":[70],"strategy,":[71],"specific":[74,119],"quantitatively":[79,141,162],"identified":[80,161],"obtained":[84],"signal.":[87],"results":[89],"show":[90],"that":[91],"there":[92],"are":[93,117],"significant":[94],"differences":[95],"sensitivity":[97],"eddy":[99,110],"fields":[102,113],"different":[104,121],"directions":[105],"defect":[107,158],"shapes,":[108],"same":[115],"direction":[116],"also":[118],"forms":[122],"defects.":[124],"symmetry":[126],"can":[130,139,159],"be":[131,140,160],"determined":[132],"cross-sectional":[135],"analyzed":[142],"by":[143,163],"measuring":[144],"<italic":[148,165],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[149,166],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">B<sub>x</sub></i>":[150],"scanning":[151,168],"curve":[152,169],"group.":[153],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">B<sub>z</sub></i>":[167],"group":[170],"after":[171],"extraction":[173],"characteristic":[175],"values":[176],"proper":[178],"data":[179],"processing.":[180],"This":[181],"provides":[183],"convenient,":[185],"simple,":[186],"high":[188],"precision":[189],"non-contact":[190],"detection":[191],"method,":[192],"which":[193],"improves":[194],"integrity":[196],"ability":[198],"structural":[201],"parts.":[202]},"counts_by_year":[],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2025-10-10T00:00:00"}